| International Test Conference 1988 Proceedings, Sep. 12, 1988, pp. 23-27, C. Branson et al. |
| International Test Conference 1988 Proceedings, Sep. 12, 1988, pp. 108-113, T. Tamama et al. |
| IEEE Design & Test of Computers, vol. 5, No. 5, Oct. 1988, IEEE, (New York), US), K. D. Wagner: "Clock System Design", pp. 9-27. |
| IEEE Journal of Solid-State Circuits, vol. 24, No. 5, Oct. 1989, IEEE, (New York, US), Tai-Ichi Otsuji et al: "A-10-PS Resolution, Process-Insensitive Timing Generator IC:", pp. 1412-1418. |
| IEEE Journal of Solid State Circuits, vol. SC-21, No. 2, Apr. 1986, IEEE, (New York, US), E. G. Friedman et al.: "Design and Analysis of a Hierachical Clock Distribution System for Synchronous Standard Cell/Macrocell VLSI" pp. 240-246. |
| International Search Report, Appln No. PCT/US 90/02775, Oct. 24, 1990. |
| 1988 International Test Conference, Paper 22.3, pp. 411-420, 1988 IEEE, Teradyne, Inc., to John Arena: "Evaluating the Limitations of High-Speed Board Testers". |