Chen et al, “A Procedure for Robust Design: Minimizing Variations Caused by Noise Factors and Control Factors”, Journal of Mechanical Design, Transactions of the ASME, vol. 118 No. 4, pp. 479-489 (1996).* |
Hsieh et al, “A Framework of Integrated Reliability Demonstration in System Development”, IEEE Proceedings of the Reliability and Maintainability Symposium, pp. 258-264 (Jan. 1999).* |
Thomas et al, “Devising a Test Strategy to Characterize System Reliability of Submicron Interconnect Wiring”, IEEE Third International Workshop on Statistical Metrology, pp. 82-87 (Jun. 1998).* |
Smith et al, “Worst Case Circuit Analysis—An Overview (Electronic Parts/Circuits Tolerance Analysis)”, 1996 IEEE Proceeding of Reliability and Maintainability Symposium, pp. 326-334 (Jan. 1996).* |
Hasnat et al, “A Manufacturing Sensitivity Analysis of 0.35 μm LDD MOSFET's”, IEEE Transactions on Semiconductor Manufacturing, vol. 7 Issue 1, pp. 53-59 (Feb. 1994).* |
MJ Harry, “The Vision of Six Sigma: A Roadmap for Breakthrough”, Sigma Publishing Co., 1994, pp. 2.2-2.8, 10.17-10.21, 22.18-22.20. |
W. Nelson, “Accelerated Testing: Statistical Models, Test Plans, And Data Analyses”, 1990, pp. 1-53. |
GJ Hahn, et al, “Statistical Models in Engineering”, John Wiley & Sons, Inc., 1967, pp. 236-257. |