Claims
- 1. A method of automatically sizing and biasing a circuit comprising the steps of:
(a) providing a database including a plurality of records related to cells that can be utilized to form a circuit, each record including (1) a layout of devices comprising the cell, (2) an interconnection scheme of the devices comprising the cell and (3) at least one cell parameter for the cell; (b) inputting a cell parameter of a cell that comprises a circuit; (c) comparing the cell parameter input in step (b) to one or more cell parameters stored in the database; (d) identifying a record in the database based on the comparison in step (c); and (e) determining from the record identified in step (d) a performance characteristic of the circuit.
- 2. The method as set forth in claim 1, further including the steps of:
inputting a device parameter for a device that comprises the circuit; and determining the performance characteristic for the circuit from the input device parameter.
- 3. The method as set forth in claim 1, wherein step (e) includes the steps of:
inputting data comprising the record identified in step (d) into a circuit simulator; and receiving from the circuit simulator the performance characteristic for the circuit.
- 4. The method as set forth in claim 1, wherein step (a) includes the steps of:
determining a layout of the devices comprising each cell; determining the interconnection scheme for the devices comprising each cell; inputting the layout and interconnecting scheme for each cell into a circuit simulator; receiving from the circuit simulator for each cell at least one cell parameter; and creating a record in the database for each cell, each record including the layout of the devices comprising the cell, the interconnection scheme for the devices comprising the cell and the at least one cell parameter for the cell.
- 5. The method as set forth in claim 1, wherein:
step (c) includes determining the cell parameter stored in the database that is most closely related to the cell parameter input in step (b); and step (d) includes identifying in the database the record that has the cell parameter that was determined to be the most closely related to the input cell parameter.
- 6. The method as set forth in claim 5, wherein the determination of the cell parameter stored in the database that is most closely related to the at least one cell parameter identified in step (b) is based on a weighting applied to the cell parameter of the record and the input cell parameter.
- 7. The method as set forth in claim 1, wherein step (c) includes the steps of:
determining at least one cell parameter constraint; determining from the cell parameters stored in the database a plurality of cell parameters that comply with the at least one cell parameter constraint; and determining from the plurality of cell parameters that comply with the at least one cell parameter constraint the cell parameter that is most closely related to the input cell parameter.
- 8. The method as set forth in claim 7, wherein step (d) includes the step of identifying in the database the record having the cell parameter that was determined to be the most closely related to the input cell parameter.
- 9. The method as set forth in claim 7, wherein the at least one cell parameter constraint comprises a constraint on at least one of a cell type and another cell parameter.
- 10. A method of automatically sizing and biasing a circuit formed from at least one cell having a plurality of interconnected devices, the method comprising the steps of:
(a) providing a database having a plurality of cell records stored therein, each cell record including a layout of devices, an interconnection scheme for the devices and at least one cell parameter; (b) receiving a cell parameter for a cell desired to be utilized to form a circuit; (c) identifying in the database the cell record that includes a cell parameter that has a predetermined relation to the cell parameter received in step (b); (d) extracting from the cell record identified in step (c) the layout of devices and the interconnection scheme for the devices; (e) simulating the circuit utilizing the layout of devices and the interconnection scheme for the devices extracted in step (d); and (f) determining a performance characteristic for the circuit simulated in step (e).
- 11. The method as set forth in claim 10, further including the steps of:
(g) determining if the performance characteristic determined in step (f) has a predetermined relation to a desired performance characteristic; and (h) if not, repeating steps (b)-(g) until the performance characteristic determined in step (f) has the predetermined relation to the desired performance characteristic, wherein a cell parameter received for each repetition of step (b) replaces a cell parameter received in a previous repetition of step (b).
- 12. The method as set forth in claim 11, further including, between steps (d) and (e), the steps of:
repeating steps (b)-(d) for each of a plurality of cells utilized to form the circuit; and interconnecting the extracted layouts and interconnection schemes for the identified cells.
- 13. The method as set forth in claim 10, further including, between steps (d) and (e), the steps of:
repeating steps (b)-(d) for each of a plurality of cells utilized to form the circuit; and interconnecting the extracted layouts and interconnection schemes for the identified cells.
- 14. The method as set forth in claim 10, wherein the predetermined relation in step (c) includes the cell parameter stored in the database that is most closely related to the cell parameter received in step (b).
- 15. The method as set forth in claim 14, wherein the determination of the cell parameter stored in the database that is most closely related to the cell parameter received in step (b) is based on a weighting applied to at least one of the cell parameters stored in the database and the cell parameter received in step (b).
- 16. The method as set forth in claim 10, wherein step (c) includes the steps of:
determining a constraint that can be applied to cell parameters stored in the database; determining cell parameters stored in the database that comply with the constraint; and determining from the constraint compliant cell parameters the cell parameter stored in the database that has the predetermined relation to the cell parameters received in step (b).
- 17. The method as set forth in claim 10, further including the step of receiving a device parameter for a device that forms the circuit, wherein step (e) further includes simulating the circuit utilizing the received device parameter.
- 18. The method as set forth in claim 10, wherein step (a) includes the steps of:
determining a layout of devices forming each cell; determining an interconnection scheme for the devices forming the cell; inputting into a circuit simulator for the cell the thus determined layout and interconnection scheme; receiving from the circuit simulator for the cell at least one cell parameter; and inputting into the database a cell record for the cell, where the cell includes the thus determined layout and interconnection scheme and the received cell parameter.
CROSS REFERENCE TO RELATED APPLICATIONS
[0001] This application claims the benefit of U.S. Provisional Patent Application Serial No. 60/301,595, filed Jun. 28, 2001.
Provisional Applications (1)
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Number |
Date |
Country |
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60301595 |
Jun 2001 |
US |