This application claims all benefits accruing under 35 U.S.C. § 119 from China Patent Application No. 202010482358.8, filed on May 29, 2020, in the China Intellectual Property Office, the contents of which are hereby incorporated by reference.
The present disclosure relates to a method for designing freeform surface imaging systems, especially relates to a method for freeform surface imaging systems with high degree of automation.
Freeform surfaces are optical surfaces that lack translational or rotational symmetry. Freeform surfaces not only improve an overall performance of an optical system but also bring novel functions to the optical system. With advancements in optical processing and testing, the freeform surfaces are becoming popular in an optical design field. The freeform surfaces bring more degrees of freedom to the optical system and increase a dimension of aberration equations.
There are three main ways for solving an initial solution of a freeform surface system. First, an existing design is taken as the initial solution. Second, the initial solution is determined based on aberration theories. For example, a nodal aberration theory (NAT) can be used to estimate a potential capability to correct aberrations in a freeform surface system with different structural forms, and enable full utilization of the degrees-of-freedom of freeform surfaces. Third, the initial solution is constructed based on an object-image relationship using direct design methods, such as methods based on differential equations, simultaneous multiple surface (SMS) methods, and construction-iteration (CI) methods.
In recent years, some procedures in conventional methods for designing the freeform surfaces system have been automated. However, conventional methods for designing the freeform surfaces system still highly rely on manual completion and have less automation. Therefore, conventional methods for designing the freeform surfaces system require higher designer experience, and waste time and human resources.
Implementations of the present technology will now be described, by way of example only, with reference to the attached figures, wherein:
The disclosure is illustrated by way of example and not by way of limitation in the figures of the accompanying drawings in which like references indicate similar elements. It should be noted that references to “another,” “an,” or “one” embodiment in this disclosure are not necessarily to the same embodiment, and such references mean “at least one.”
It will be appreciated that for simplicity and clarity of illustration, where appropriate, reference numerals have been repeated among the different figures to indicate corresponding or analogous elements. In addition, numerous specific details are set forth in order to provide a thorough understanding of the embodiments described herein. However, it will be understood by those of ordinary skill in the art that the embodiments described herein can be practiced without these specific details. In other instances, methods, procedures, and components have not been described in detail so as not to obscure the related relevant feature being described. Also, the description is not to be considered as limiting the scope of the embodiments described herein. The drawings are not necessarily to scale, and the proportions of certain parts have been exaggerated to illustrate details and features of the present disclosure better.
Several definitions that apply throughout this disclosure will now be presented.
The term “substantially” is defined to be essentially conforming to the particular dimension, shape, or other feature which is described, such that the component need not be exactly or strictly conforming to such a feature. The term “comprise,” when utilized, means “include, but not necessarily limited to”; it specifically indicates open-ended inclusion or membership in the so-described combination, group, series, and the like.
Referring to
S1: constructing a series of coaxial spherical systems with different optical power (OP) distributions, wherein the series of coaxial spherical systems with different OP distributions are defined as P1, P2, . . . , Pm, . . . , PM, and a set of P1, P2, . . . , Pm, . . . , PM is defined as a set {P}; and the OP distribution refers to a combination of radius of curvature and spaces between surfaces of the coaxial spherical system;
S2: tilting all optical elements of each coaxial spherical system in the set {P} by a series of angles to obtain a series of off-axis spherical systems, wherein the series of off-axis spherical systems are defined as Cm,1, Cm,2, . . . , Cm,s, . . . , Cm,S
S3: constructing a freeform surface imaging system based on each compact unobstructed off-axis spherical system in the set {{tilde over (C)}}m, to obtain a series of freeform surface imaging systems, and correcting an OP of an entire system in a process of constructing the series of freeform surface imaging systems, wherein the series of freeform imaging systems are defined as {tilde over (F)}m,1, {tilde over (F)}m,2, . . . , {tilde over (F)}m,t, . . . , {tilde over (F)}m,T
S4: improving an image quality of each of the series of freeform surface imaging systems in the set {{tilde over (F)}}m by calculating a surface shape of each optical element of each freeform surface imaging system in the set {{tilde over (F)}}m and finding an optimal tilt angle of an image surface, to obtained a series of freeform surface imaging systems with different structural forms and different OP distributions; and
S5: automatically evaluating an image quality of each of the series of freeform surface imaging system with different structural forms and different OP distributions based on an evaluation metric and outputting at least one freeform surface imaging system that meets a given requirements.
Referring to
Referring to
In step S1, the series of coaxial spherical systems with different OP distributions are constructed according to first-order optics and a known focal length. According to the knowledge of matrix optics, a reflection matrix Ri for reflection of the light ray at the spherical surface Si is:
where ni represents a refractive index of a medium between the spherical surface Si and the spherical surface Si+1; nn−1 represents a refractive index of a medium between the spherical surface Si−1 and the spherical surface Si; and ri represents the radius of curvature of the spherical surface Si.
A transition matrix of a light ray propagating from the spherical surface Si to the spherical surface Si+1 is:
wherein, di is a distance between the spherical surface Si and the spherical surface Si+1.
And a transfer matrix T (system matrix) for the entire system is:
wherein A, B, C, and D are functions of ri, di and ni. “A” can be expressed as A(ri, di, ni). Therefore, an image focal length of the coaxial spherical system can be expressed as:
Because the image focal length of the coaxial spherical system has been given, equation (4) represents an equation that the radius of curvature ri (i=1, 2, . . . , N) of the spherical surface Si and the distance between the spherical surface Si and the spherical surface Si+1 (i=1, 2, . . . , N−1). In a reflection system, a condition ni=−ni−1 applies; therefore, all the refractive indices in the equation (4) can be eliminated. Equation (4) has an infinite number of solutions and thus it is impossible to discuss all solutions to Equation (4). Given that there are manufacturability limits in practice, some solutions to Equation (4) should be disregarded. Related specific parameters include, for example: the size and sign of the radius of curvature of a mirror surface, a vector height of a mirror surface shape, and a distance between mirrors. In a process of solving, constraints on equations should be set according to an actual situation to narrow a solution space.
In Equation (4), there is a total of 2N−1 parameters for the radii of curvature and mirror distances, the radii of curvature are defined as r1, r2, . . . , rN, and the mirror distances are defined as d1, d2, . . . , dN−1. When the focal length of the coaxial spherical system is given, as long as 2N−2 parameters out of the 2N−1 parameters are given, it is possible to solve for a last remaining parameter. After the 2N−1 parameters are obtained, an additional parameter dN can be determined using the first order optics, the additional parameter dN represents a distance between a last spherical surface and the image surface. Therefore, there are a total of 2N parameters that describe the coaxial spherical system. Because there are infinite solutions to equation (4), there are infinite possible combinations of the values of the 2N parameters. The 2N parameters are placed together in a vector P=[r1, r2, . . . , rN−1, rN, d1, d2, . . . , dN−1, dN]. The vector P can be used to describe the OP distribution of the coaxial spherical system.
In one embodiment, the series of coaxial spherical systems with different OP distributions P1, P2, . . . , Pm, . . . , PM are used as a research object, and the set of P1, P2, . . . , Pm, . . . , PM is defined as the set {P}. The given 2N−2 parameters are assumed as r1, r2, . . . , rN−1, rN, d1, d2, . . . , dN−2, wherein a range of the radius of curvature ri (i=1, 2, . . . , N) of each mirror surface of each coaxial spherical system is [rmin, rmax] with an interval Δr. That is, sequences of the radii of curvature ri (i=1, 2, . . . , N) are given as rmin+Δr, rmin+2Δr, . . . , rmax. A range of the mirror distance of each coaxial spherical system di (i=1, 2, . . . , N−2) is [dmin, dmax] with an interval Δd. That is, sequences of mirror distances di (i=1, 2, . . . , N−2) are given as dmin+Δd, dmin+2Δd, . . . , dmax. When the values of r1, r2, . . . , rN−1, rN and d1, d2, . . . , dN−2 are determined, the corresponding dN−1 and dN can be solved. In this way, all the parameters can be obtained, and a series of different OP distribution forms {P} satisfying the image focal length focal length f are obtained.
Since there are infinite kinds of OP distribution forms {P} that satisfy the given image focal length f, a value range of the parameters in the series of different OP distribution forms {P} must be limited. When determining the value range of the radius of curvature ri (i=1, 2, . . . , N), the values of the radii of curvature and the positive/negative state of the OP of each mirror surface of the coaxial spherical system can be controlled. In one embodiment, the range of the radius of curvature of each mirror surface is [−1000 mm, 1000 mm]. In one embodiment, when determining the range of the mirror distance di (i=1, 2, . . . , N−2), three factors are considered; first, the values of the mirror distances should not be too large to avoid large system volumes. Second, the values of the mirror distance should not be too small, in order to off-axis the system and avoid blocking in the subsequent phases. Third, the differences between two arbitrary mirror distances should not be too large to guarantee system compactness. Because an overall optical system size is usually comparable to an entrance pupil size, an entrance pupil diameter (EPD) can be used as an unit length to describe the range of the mirror distance. In one embodiment, EPD≤|d1|≤4×EPD. If the value of Δr and the value of Δd are too high, there will be few output results; however, if the value of Δr and the value of Δd are too small, the number of output results will be increased, but more computation time will be consumed. Therefore, when determining the value of Δr and the value of Δd, a balance should be made between the number of final solutions and the calculation time. In one embodiment, the OP distribution form is P=[r1, r2, r3, d1, d2, d3], wherein a range of a radius of curvature of each of r1, r2, r3 is [−1000 mm, 1000 mm], and Δr=100 mm. A value of Δr is determined according to a percentage of the value range of the radius of curvature, and the value of Δr can be changed according to an absolute value of the radius of curvature. In one embodiment, the value of Δr is 5% of the radius of curvature r; a range of mirror distance d1 is EPD<|d1|<4×EPD, and a value interval of the mirror distance Δd1=EPD/2. The d2 and d3 can be solved based on the radius of curvature, the interval of the radius of curvature, the mirror distances and the interval of the mirror distances. Since the series of coaxial spherical systems are total reflection systems, d1<0, d2>0, d3<0. In one embodiment, the constraints are −2≤d2/d1≤−½, ½≤d3/d1≤2, d3≤−2×EPD, a volume of the coaxial spherical system should be controlled, to ensure the structure of the system is compact, and facilitate subsequent off-axis.
In step S2, tilting all optical elements of each coaxial spherical system in the set {P} by a series of angles under keeping an incident direction of light in the center field of the coaxial spherical system unchanged, to obtain a series of off-axis spherical systems with different structures. The series of off-axis spherical systems with different structures comprises structural forms with completely different structures, such as offset field or off-axis field, or a combination of the offset field and the off-axis field. Referring to
Since a propagation path of main lights of the central field between the surfaces in the off-axis spherical system is a polyline, the propagation path can be used to represent a structural form of the off-axis spherical system. A vector C is used to record a length of each segment of the polyline and an angle between adjacent segments. Referring to
When each angle θ1 in the structural form C changes continuously within a certain range, there is no obstruction in an off-axis spherical system corresponding to the structural form C. However, since the off-axis spherical system may have many different off-axis structural forms, there are also many possible value ranges for the angle in structural form C that meets the unobstructed condition, that is, a range of possible values of θi in the structural form C is not continuous. In order to solve all possible unobstructed structural forms corresponding to the OP distribution form P, first listing as many off-axis structural forms as possible, and then eliminating the obstructed systems from the off-axis structural forms in the subsequent steps, so as to obtain as many unobstructed off-axis spherical systems as possible.
A range of the angle θi and an interval of the angle θi are determined first. If the structural form C and a structural form C′ satisfy C=−C′, the structural form C and structural form C′ are actually the same. Therefore, in order to avoid re-considering the same structural form, a value range of θ1 is within (−180°, 0°) or (0°, 180°). For other angles θi, i=2, 3, . . . , N, a value range of θi is within (−360°, 0°) or within (0°, 360°). The value range of θi can be selected according to the requirements of the design structure constraints. In one embodiment, for an off-axis three-mirror spherical system, the value range of θ1 is (−180°, −120°), the value range of θ2 is [120°, 240° ], and the value range of θ3 is (−240°, −120°). If the interval Δθ of the angle θ1 is too large, the number of output results will be reduced, but a calculation amount of an entire calculation task will also be reduced. For a coaxial spherical system with an OP distribution form Pm, a series of off-axis spherical systems with different off-axis structures can be obtained through the range of the angle θ1 and the interval of the angle θ1. The series of off-axis spherical systems with different off-axis structural forms are represented by vectors as Cm,1, Cm,2, . . . , Cm,s, . . . , Cm,Sm, and the vectors Cm,1, Cm,2, . . . , Cm,s, . . . , Cm,Sm are denoted as the set {C}m. There are Sm elements in the set {C}m, whether the off-axis spherical system in the set {C}m is blocked should be determined.
Second, the unobstructed off-axis spherical system is selected from the set {C}m. When judging whether there is obstruction in the off-axis spherical system, the off-axis spherical system is symmetric about the O-YZ plane is noticed. A projection of a light beam between the mirror surface Si and the mirror surface Si+1 in the O-YZ plane is defined as Bi, wherein i=0, 1, . . . , N. An area illuminated by a light beam on the mirror surface is defined as a working area of the mirror surface. A curve segment of a working area of the mirror surface Sj intercepted by the O-YZ plane is defined as E1(j)E2(j), wherein j=0, 1, . . . , N, I, and SI means image surface. A condition of no obstruction in the off-axis spherical system is: for any Bi(i=0, 1, . . . , N), any curve segment E1(j)E2(j) (j=1, 2, . . . , N, I) has no overlap with Bi. After filtering according to the condition, a series of unobstructed off-axis spherical systems with the OP distribution form Pm can be obtained, the series of unobstructed off-axis spherical systems are defined as
After obtaining the series of unobstructed off-axis spherical systems with different structural forms corresponding to each OP distribution form, the step of constructing the freeform imaging system can be proceed directly. In one embodiment, after the series of unobstructed off-axis spherical systems are obtained, a plurality of unobstructed off-axis spherical systems with a small folding angle of optical path at each mirror are further found from the series of unobstructed off-axis spherical system; and then the step of constructing the freeform imaging systems can be proceed, to obtain a plurality of compact freeform imaging systems. In one embodiment, the system that meets the given structural requirements are found from the series of unobstructed off-axis spherical systems, by changing the value range of the radius of curvature, the interval of the radius of curvature and setting an appropriate filter conditions. In one embodiment, the unobstructed off-axis spherical system is a three-mirror system, for an unobstructed off-axis structural form Cm,r with the OP distribution form Pm, a new vector Δ
For all folding forms, one or several off-axis spherical systems with a small folding angle of optical path can be found through a minimization method. The minimization method is as follows: since the value intervals of the radius of curvature are equal, it does not exist two vectors in the set {Δ
In one embodiment, further solving a series of off-axis spherical systems with a smaller optical path folding angle at each mirror based on the set {{tilde over (C)}}m by a dichotomy. Referring to
In step S3, since the OP of the entire system has changed after the off-axis process of eliminating the obstruction in step S2, the OP of each mirror should be fine-tuned to correct of the OP of the entire system. An OP correction process of the entire system should follow the following principles. First, the OP correction process can be fully automated; second, the structure of the system remains unchanged during the OP correction process; third, the OP of each mirror is fine-tuned.
In one embodiment, using a point-by-point construction method for freeform surface imaging system to correct the OP of the system. The point-by-point construction method calculates the freeform surface shape based on feature light rays and feature data points. The unobstructed off-axis spherical system is used as a starting point, a plurality of feature light rays corresponding to different aperture positions and different fields is fixed, and a plurality of intersections of the plurality of feature light rays and an optical surface is defined as a plurality of feature data points. Since a field of the plurality of feature light rays is known, according to an object-image relationship, the position coordinates of an image point corresponding to the plurality of feature light rays on the image surface can be determined when the optical system is ideal for imaging (referred to as the position coordinates of an ideal image point). Each of the plurality of feature data points contains two aspects of information, one is a coordinate of the feature data point on the optical surface, and the other is a normal direction of the feature data point on the optical surface. When constructing the freeform surface imaging system, a surface shape of each surface in the freeform surface imaging system is solved one by one in a certain order. In one embodiment, a three-mirror imaging system is solved in an order of tertiary mirror-primary mirror-secondary mirror. When solving a shape of a freeform surface, first, obtaining the starting points and the incident directions of the plurality of feature light rays incident on a surface to be solved through ray tracing. Starting from an initial feature data point on the surface to be sought, according to a principle of the nearest light, and the coordinates and normal directions of the feature data points that have been calculated, determining a next feature light ray and the coordinates of the feature data point corresponding to the next feature light ray. According to the object-image relationship of the system, the plurality of feature light rays starts from the plurality of feature data points on the surface to be solved, and finally reaches the corresponding ideal image points on the image surface. Therefore, according to Fermat's principle, a propagation direction of the next feature light ray leaving the freeform surface to be solved can be obtained. Combining with the incident direction of the next feature light ray on the surface, a normal direction of the feature data point corresponding to the next feature light ray can be obtained. Repeating the above steps until the coordinates and normals of all the plurality of feature data points are solved. Fitting the plurality of feature data points into the freeform surface by a fitting method that simultaneously considers coordinate and normal, to complete solving the shape of a freeform surface. According to the above method, the shape of each surface in the freeform surface imaging system is calculated one by one, therefore, the freeform surface imaging system is constructed.
Each mirror of the unobstructed off-axis spherical system has a certain optical power, and the unobstructed off-axis spherical system meets the first-order imaging conditions. The point-by-point construction method can retain the structure of the system and fine-tune the optical power of each mirror in the system, to complete the correction of the optical power of the entire system. Therefore, the series of freeform imaging systems {tilde over (F)}m,1, {tilde over (F)}m,2, . . . , {tilde over (F)}m,t, . . . , {tilde over (F)}m,Tm are obtained, and the set of {tilde over (F)}m,1, {tilde over (F)}m,2, . . . , {tilde over (F)}m,t, . . . , {tilde over (F)}m,T
In step S4, on a premise that the OP distribution form and the off-axis structural form of the series of freeform surface systems in the set {{tilde over (F)}}m remain unchanged, the image quality of each of the series of freeform surface systems in the set {{tilde over (F)}}m is improved. In one embodiment, a point-by-point iteration is used to calculate the surface shape of the freeform surface imaging system and improve the image quality of the system.
The point-by-point iteration and the point-by-point construction method both solve the surface shape of each surface in the freeform surface imaging system according to the object-image relationship of the system and based on the feature light rays. However, in a process of the point-by-point iteration, the coordinates of the plurality of feature data points obtained by tracing are kept unchanged, only the normal directions of the plurality of feature data points are re-solved, and then a new freeform surface is obtained by fitting the original coordinates and the newly solved normal directions. In a round of iterative calculation, the surface shapes of all freeform surfaces are solved in a certain order, for example, in an order of tertiary mirror-primary mirror-secondary mirror in a three-mirror system. After a round of iterative calculation is completed, the image quality of the freeform surface imaging system needs to be evaluated. In one embodiment, an evaluation index is a root mean square (RMS) of the deviation between a plurality of actual intersections of the plurality of feature light rays with a target surface and the ideal target points. A RMS value is denoted as σ, and σ can be used as an evaluation parameter of the image quality during the process of the point-by-point iteration. A value of σ decreases and gradually converges as the process of the point-by-point iteration progresses. The process of the point-by-point iteration is stopped when the image quality of the system is better than the given threshold σitr. When the value of σ does not decrease, that is, the value of σ gradually converges to a certain value, the image quality of the freeform surface imaging system under current condition is difficult to continue to be improved. An improvement rate of image quality in the process of the point-by-point iteration is defined as τ=|σ′−σ|/σ, wherein σ′ is the image quality evaluation parameter of the iteration result of the current round of iterative calculation, and σ is the image quality evaluation parameter of the iteration result of the last round of iterative calculation. The process of the point-by-point iteration is stopped when τ is below a set threshold τitr.
In the process of the point-by-point iteration, the normal directions of the plurality of feature data points are solved according to the intersections of the plurality of feature light rays and the image surface are as the ideal image point, which can make the freeform surface imaging system without distortion system. In optical design, the image quality can be improved by sacrificing distortion. In the subsequent stages of the process of the point-by-point iteration, the distortion in the freeform surface imaging system has been controlled to a fairly low level. If the image quality improvement rate T is lower than a given threshold τigf, an “image quality priority” mode is activated. Under the “image quality priority” mode, in each round of iterative calculation, every time a surface is calculated, the position coordinates of the target image points corresponding to the plurality of feature light rays of each field are updated. The coordinates of new target image points are obtained by obtaining the actual intersection coordinates of all the plurality of feature light rays of the field on the image surface through ray tracing, and then taking an average of each dimension of the actual intersection coordinates to obtain the coordinates of new target image points. By continuously updating the target image point during each round of iterative calculation, more design results with image quality that meet the requirements can be obtained.
Examples of the method for point-by-point constructing the freeform surface imaging system and the method for fitting the plurality of feature data points into a freeform surface are taught by U.S. Pat. No. 10,101,204 to Zhu et al.
The optical power of the entire system is corrected by calculating the shape of the mirror surface, and the image quality of the freeform surface imaging system is improved by iterating the freeform surface shape of the mirror surface. Therefore, a position and an tilt angle of each mirror, a position of the image surface, and the surface shape of the optical surfaces have been considered. There is another factor that needs to be considered, that is, the tilt angle of the image surface.
The tilt angle of the image surface can be expressed by an angle β between the Y axis of the local coordinate system of the image surface and the Y axis of the global coordinate system. When the image surface of the optical system is perpendicular to the chief ray of the central field, the tilt angle of the image surface is defined as β0. In one embodiment, a optimal tilt angle of the image surface is found using a one-dimensional search method. One round of one-dimensional search for the optimal tilt angle of the image surface is processed as follow, a same off-axis spherical surface system is taken as a starting point, and only the tilt angle of the image surface is different in the process of constructing the freeform surface imaging system through the step S3 and step S4. When the tilt angle of the image surface is different, the image quality of the freeform surface imaging system is also different, and a tilt angle of the image surface corresponding to a freeform surface imaging system with the best image quality is the optimal tilt angle of the image surface. In one embodiment, multiple rounds of one-dimensional search for the optimal tilt angle of the image surface are performed, to further improve the image quality.
In one embodiment, one round of the one-dimensional search for the best tilt angle of the image plane is processed as follows: starting from β=β0 and using Δβ as an interval, and taking a value within a range [β0−βr, β0+βr] as β, wherein βr is a radius size of the range [β0−βr, β0+βr]. The values of β are defined as β1, β2, . . . , βb, . . . , βB, and the number of the tilt angle of the image plane is B. For a compact off-axis structure Cm under the OP distribution form Pm, taking the off-axis spherical system corresponding to the compact off-axis structure Cm as the starting point for calculation, and calculating the freeform surface imaging systems when the tilt angle of the image plane is β1, β2, . . . , βb, . . . , βB through step S3 and step S4 respectively; an image quality evaluation parameter of the freeform surface imaging systems is defined as θ1, σ2, . . . , σb, . . . , σB; finding the best image quality evaluation parameter from σ1, σ2, . . . , σb, . . . , σB and defining as ρ, and a tilt angle βopt of the image plane corresponding to p is the best tilt angle of the image plane in the current round of one-dimensional search. The only difference between a next round of one-dimensional search and the current round of one-dimensional search is that the value range of β has changed, and a value taken within a range [βopt−βr, βopt+βr] is as β. During performing multiple rounds of one-dimensional search, the image quality ρ of the freeform surface imaging system is continuously improved and gradually converged. If the image quality ρ of the freeform surface imaging system reaches a given threshold ρsrh, the one-dimensional search can be stopped. An image quality improvement rate ν is calculated by ν=(ρ′−ρ)/ρ, wherein ρ′ is the best image quality evaluation parameter of the freeform surface imaging system in a previous round of one-dimensional search, and ρ is the best image quality evaluation parameter of freeform surface imaging system in the current round of one-dimensional search. If the image quality improvement rate ν reaches a given threshold νsrh, the one-dimensional search can be stopped.
In a process of the one-dimensional search, since the tilt angle of the image surface has changed, the obstruction may appear in the freeform surface imaging system, therefore, it is necessary to judge the obstruction in the freeform surface imaging system at any time and eliminate the freeform surface imaging systems with obstruction.
A method of judging whether there is obstruction in the freeform surface imaging system is the same as the method in step S2. Once there is an obstruction in a freeform surface imaging system, the image quality evaluation parameter σ of the corresponding system is set to NaN, and then the next image plane tilt angle state is continue to be calculated. In one embodiment, a field expansion coefficient KF is used to expand the field of the freeform surface imaging system in the process of judging the obstruction, and an aperture expansion factor KD is used to expand the aperture of the system to ensure that there is enough space between the components in the freeform surface imaging system.
In one round of one-dimensional search, if except that the tilt angle of the image plane is β0, the image quality evaluation parameters of the freeform surface imaging systems corresponding to other tilt angles of image planes are NaN; there are obscurations in all freeform surface imaging systems that have been calculated, and the image quality improvement rate ν of the current round of one-dimensional search is zero.
When the image quality improvement rate ν is lower than a given threshold νsrh, an additional round of one-dimensional search can be added. If the image quality improvement rate of the additional round of one-dimensional search is still lower than the given threshold νsrh, the one-dimensional search process is terminated, and a freeform surface imaging system with the best image quality is as the final result.
Too many rounds of the one-dimensional search require too long calculation time. In one embodiment, a maximum number of rounds of one-dimensional search Rndmax is set. When the number of rounds of the one-dimensional search Rnd is greater than Rndmax, the one-dimensional search is terminated.
In step S5, the evaluation metric can be selected according to actual needs. In one embodiment, the evaluation metric is imaging quality metric. The imaging quality metric comprises a discrete spot size of image points on the image plane, an MTF of the system, a wave aberration of the full field, etc. In one embodiment, an average value of wave aberration RMS in the whole field of the freeform surface imaging system is required to be no less than 0.075λ. According to the imaging quality metric, the freeform surface imaging system meeting the design requirement is selected and outputted.
An entire framework flowchart of the method for designing freeform surface imaging system provided by the present invention is shown in
The method for designing freeform surface imaging system can be implemented via computer software. In one embodiment, a calculation program is developed using MATLAB. First a debugging of the calculation program is completed on a computer, and then a calculation work is completed on a high-performance computing platform “Exploration 100”.
In one embodiment, the method for designing freeform surface imaging system further comprises a step of manufacturing the freeform surface imaging system according to parameters of the freeform surface imaging system outputted in step S5, to obtain a physical component of the freeform surface imaging system.
The following are two examples of designing a freeform three-mirror imaging system using the method for designing freeform surface imaging system of the present invention.
The optical performance indexes of the freeform surface three-mirror imaging system to be designed and the parameters used in the design method are shown in Table 1 and Table 2.
After the system performance indexes and constraints are inputted into a computer, a computing task is completed in approximately 40.4 h without human interaction. Then CODE V is used as a tool to evaluate the image quality of the freeform surface three-mirror imaging system, 11×11 field points are sampled over the 8°×6° field, and the average of the root-mean-square (RMS) values of the wavefront error value at each field point when the wavelength λ=10 m is calculated. If the average value of the RMS value of wavefront error at all field points is no greater than 0.075λ, wherein λ is a primary wavelength, the image quality of the freeform surface three-mirror imaging system is considered to be diffraction-limited or near-diffraction-limited. A total of 127 freeform surface three-mirror imaging systems that satisfy the design requirements are obtained, and an average time to obtain one freeform surface three-mirror imaging system is 19.1 min.
The optical performance indexes of the freeform three-mirror imaging system to be designed and the parameters used in the design method are shown in Table 3 and Table 4.
In one embodiment, the working band is visible light. In a visible light system, a requirement of a accuracy in calculating the shape of the curved surface is high. Moreover, the relative aperture of the freeform surface three-mirror imaging system is relatively small, and the structure of the freeform surface three-mirror imaging system is more variety than the freeform surface three-mirror imaging system with a large relative aperture. A computing task is completed in approximately 34.6 h without human interaction, a total of 59 freeform surface imaging systems that satisfy the design requirements are obtained, and an average time to obtain one freeform surface imaging system is 35.2 min.
The method for designing freeform surface imaging system provided by the present invention has advantages as follows: first, as long as the optical parameters and structural constraints of an optical system are given, a series of freeform surface imaging systems with different structural forms and OP distribution forms can be obtained through automatic calculation without manual intervention. The image quality of the freeform surface imaging systems obtained by the method is close to or reaches the diffraction limit. The freeform surface imaging systems meet the given optical parameters and structural constraints, and the image quality parameters such as wave aberration and modulation transfer function MTF meet the design requirements. Second, in the final stage of optical design, after the image quality of the freeform surface three-mirror system meets the requirements, the designer only needs to select the best one from the many results as the final design result by comprehensively considering factors such as processing difficulty, system structure and shape, therefore, human resources and experience requirements for optical designers are greatly reduced. Third, the method provided by the present invention provides a new idea for liberating and expanding optical design productivity in the future, by realizing high-quality, multi-result, and automated freeform surface imaging system design.
It is to be understood that the above-described embodiments are intended to illustrate rather than limit the present disclosure. Variations may be made to the embodiments without departing from the spirit of the present disclosure as claimed. Elements associated with any of the above embodiments are envisioned to be associated with any other embodiments. The above-described embodiments illustrate the scope of the present disclosure but do not restrict the scope of the present disclosure.
Depending on the embodiment, certain of the steps of a method described may be removed, others may be added, and the sequence of steps may be altered. The description and the claims drawn to a method may include some indication in reference to certain steps. However, the indication used is only to be viewed for identification purposes and not as a suggestion as to an order for the steps.
Number | Date | Country | Kind |
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202010482358.8 | May 2020 | CN | national |
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