The present invention relates to a piezoelectric element and, more particularly, to failure detection in a piezoelectric element.
In a piezoelectric apparatus, failures such as an open circuit state can occur. To avoid further damage of the apparatus, a malfunction in the piezoelectric element must be detected quickly. To that end, devices for detecting a failure in a piezoelectric apparatus have been suggested (see e.g. U.S. Pat. No. 5,376,854, CN 105675960 A).
Previous methods for detecting a failure in a piezoelectric apparatus include exciting the piezoelectric element at its natural resonant frequency, monitoring the voltage generated by the piezoelectric element, and evaluating the recorded voltage signal, as this is for instance shown in U.S. Pat. No. 6,639,411 B1 or U.S. Pat. No. 6,870,377 B2. The recorded signal is then compared to a prototype signal, which has been recorded with a properly functioning piezoelectric element using a similar input. Thereby, the comparison of the two signals relies upon analyzing the ringdown of the excitation with a frequency at the transducer's resonance frequency.
A method for detecting an open circuit state failure in a piezoelectric element connection includes exciting a piezoelectric element with an excitation signal and monitoring and evaluating an electrical output signal generated by the piezoelectric element in response to the excitation signal. The excitation signal is a pulse train. A frequency of the pulse train is chosen such that the piezoelectric element acts as a low pass filter.
The invention will now be described by way of example with reference to the accompanying Figures, of which:
The accompanying drawings are incorporated into and form a part of the specification to illustrate several embodiments of the present invention. These drawings together with the description serve to explain the principles of the invention. The drawings are merely for the purpose of illustrating examples of how the invention can be made and used, and are not to be construed as limiting the invention to only the illustrated and described embodiments. Furthermore, several aspects of the embodiments may form—individually or in different combinations—solutions according to the present invention. Further features and advantages will become apparent from the following more particular description of the various embodiments of the invention, as illustrated in the accompanying drawings, in which like references refer to like elements. The following embodiments do not limit the scope of the claims.
As shown in
According to an embodiment of the present invention, a method is provided for detecting an open circuit state failure in a piezoelectric element connection. The testing apparatus, as shown in
The testing apparatus with the piezoelectric element 102 can be integrated in an electronic device, wherein the electronic device triggers a test run of the testing apparatus, e.g. when the device is booting, to make sure that the piezoelectric element 102 is working properly.
The testing method according to the first embodiment is sketched in
The frequency of the excitation signal is chosen well above the resonance frequency of the piezoelectric element 102. Specifically, the frequency is chosen high enough such that the piezoelectric element 102 cannot follow the excitation signal anymore and therefore acts as a low pass filter. This means that if the piezoelectric element 102 is functional, it modifies the excitation signal such that the output signal significantly differs from the excitation signal. In contrast, when there is an open circuit failure, the piezoelectric element 102 has no influence on the excitation signal and hence the output signal resembles the excitation signal. This characteristic will help distinguish between an open circuit state and a not open circuit state.
Generally, the frequency of the pulse train and the constants Vmin, Vmax and ε are determined empirically in a number of test runs such that the above requirements are met. Thereby, the test runs are repeated until the probability, that a value for the frequency of the pulse train and the constants Vmin, Vmax and ε occurs which is more extreme than the corresponding values from all previous runs, is smaller than a predefined value, e.g. p≤0.01.
Previous methods for detecting open circuit states recorded the output signal both during the excitation and during the following ringdown for further analysis. The disadvantage of this method is that environmental effects such as the propagation in a medium (e.g. liquid or air) or temperature influence the output signal during the ringdown and therefore distort the comparison of excitation and output signal. To avoid such effects, the present embodiment records the output signal, as shown in
When the recording of the output signal is finished, the recorded output signal must be analyzed in order to tell whether or not there is an open circuit state failure in the piezoelectric element connection, as shown in
For a better understanding of how the two output signals can be distinguished from each other, we look at
In case of a not open circuit state, as shown in
A second embodiment is equivalent to the first embodiment with one exception: in the first embodiment, the criterion for the circuit state being not open is that the output signal contains a significant number of samples with values in the interval [Vmin+ε, Vmax−ε]. In contrast, in the second embodiment, the criterion for the circuit state being not open is that the samples of the output signal with values bigger than Vmin+ε have a variance that significantly exceeds the variance of the samples of the excitation signal with values bigger than Vmin+ε. A necessary and sufficient condition for classifying the piezoelectric element 102 as properly functioning in this embodiment is that a variance of all values of the excitation signal higher than Vmin+ε and the variance of all values of the electrical output signal higher than Vmin+ε are significantly different.
The level of significance for classifying a piezoelectric element connection as properly functioning is determined empirically such that the number of false positives and false negatives matches the desired robustness.
A third embodiment equals the first embodiment with one exception: in the first embodiment, Vmin, Vmax and ε are chosen such that Vmin and Vmax are the minimum and the maximum of the excitation signal, respectively, and ε is the smallest number for which the excitation signal only takes values within the intervals [Vmin, Vmin+ε] or [Vmax−ε, Vmax].
In contrast, in the third embodiment the constant ε is defined as the smallest number for which another output signal, that has been recorded in a calibrating step in a pre-test with the piezoelectric element 102 removed from the test circuit, only takes values within the intervals [Vmin, Vmin+ε] or [Vmax−ε, Vmax], where Vmin and Vmax are the minimum and the maximum value of the another output signal, respectively.
The advantage of using the output signal of the test circuit with an open circuit state to define Vmin, Vmax and ε is that the pathway of the output signal is similar to the pathway of the output signal of the not open circuit state, whereas the excitation signal is directly available without passing through a pathway.
Number | Date | Country | Kind |
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18195891 | Sep 2018 | EP | regional |
This application is a continuation of PCT International Application No. PCT/EP2019/075202, filed on Sep. 19, 2019, which claims priority under 35 U.S.C. § 119 to European Patent Application No. 18195891.9, filed on Sep. 21, 2018.
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5220836 | Harms | Jun 1993 | A |
5376854 | Oouchi | Dec 1994 | A |
6639411 | Thomsen | Oct 2003 | B1 |
6870377 | Thomsen | Mar 2005 | B2 |
20010039484 | Freudenberg et al. | Nov 2001 | A1 |
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Number | Date | Country |
---|---|---|
105675960 | Jun 2016 | CN |
10325446 | Mar 2005 | DE |
2048343 | Apr 2009 | EP |
2014074290 | May 2014 | WO |
Entry |
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International Search Report, dated Dec. 16, 2019, 3 pages. |
Abstract of DE 10325446, dated Mar. 3, 2005, 2 pages. |
Abstract of CN 105675960, dated Jun. 15, 2016, 1 page. |
Number | Date | Country | |
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20210208192 A1 | Jul 2021 | US |
Number | Date | Country | |
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Parent | PCT/EP2019/075202 | Sep 2019 | US |
Child | 17205527 | US |