Claims
- 1. A method for fabricating an infrared-emitting light-emitting diode, which comprises:applying an active layer sequence on a semiconductor substrate, the active layer sequence emitting infrared radiation during operation of the active layer sequence, the active layer sequence, includes: forming a first AlGaAs cover layer on the semiconductor substrate using a metal organic vapor phase epitaxy (MOVPE) fabrication method; forming an active layer on the first AlGaAs cover layer using the MOVPE fabrication method; forming a second AlGaAs cover layer on the active layer using a liquid phase epitaxy (LPE) fabrication method; and depositing an electrically conductive coupling-out layer having a thickness of at least about 10 μm and being optically transparent in an infrared spectral region on the second AlGaAs cover layer using the LPE fabrication method.
- 2. The method according to claim 1, wherein the active layer contains GaAs.
- 3. The method according to claim 1, wherein the active layer contains AlGaAs.
- 4. The method according to claim 1, which comprises forming at least one of the first AlGaAs cover layer and the second AlGaAs cover layer with an Al content of about 10% to about 35%.
- 5. The method according to claim 1, which comprises depositing the electrically conductive coupling-out layer so as to be self-supporting and having the thickness of at least about 50 μm.
- 6. The method according to claim 5, which comprises removing the semiconductor substrate after the electrically conductive coupling-out layer has been deposited.
- 7. The method according to claim 1, which comprises forming the semiconductor substrate from GaAs.
- 8. The method according to claim 5, which comprises forming the electrically conductive coupling-out layer from AlGaAs with an Al content in a range of between about 20% to about 35%.
- 9. The method according to claim 5, which comprises producing the electrically conductive coupling-out layer in a number of individual LPE steps during the depositing step.
- 10. The method according to claim 1, which comprises depositing the electrically conductive coupling-out layer by a temperature difference LPE fabrication method.
- 11. A method for fabricating an infrared-emitting light-emitting diode array, which comprises:applying an active layer sequence on a semiconductor substrate having a diameter of more than two inches, the active layer sequence emitting infrared radiation during operation of the active layer sequence, the active layer sequence, includes: forming a first AlGaAs cover layer on the semiconductor substrate using a metal organic vapor phase epitaxy (MOVPE) fabrication method; forming an active layer on the first AlGaAs cover layer using the MOVPE fabrication method; and forming a second AlGaAs cover layer on the active layer using a liquid phase epitaxy (LPE) fabrication method; and fabricating the semiconductor substrate having the active layer sequence into a multiplicity of infrared-emitting light-emitting diodes.
Priority Claims (1)
Number |
Date |
Country |
Kind |
196 31 906 |
Aug 1996 |
DE |
|
CROSS-REFERENCE TO RELATED APPLICATION
This is a continuation of copending International Application PCT/DE97/01641, filed Aug. 4, 1997, which designated the United States.
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Continuations (1)
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Number |
Date |
Country |
Parent |
PCT/DE97/01641 |
Aug 1997 |
US |
Child |
09/246747 |
|
US |