1. Field of the Invention
The present invention relates to a method for increasing reliability of data accessing for a multi-level cell type non-volatile memory, and more particularly to a method by which specific data storage pages are selected and stored at least in a data storage block by jump connecting of a page jumper during data accessing of a computer system, thus the life of use of the memory can be elongated to assure integrity of the data in accessing.
2. Description of the Prior Art
NAND flash memories have the characteristics of little writing and erasing cycles, high density (large storage space) and low cost of manufacturing; by virtue that their I/O interfaces only allow continuous reading, they do not suit storing for computers, but do very much suit application on storage cards. Except storage cards which have been being used in large amount, cell phones, MP3 players and digital multi-medium players have also been being used in large amount as media for storing multi-medium files.
NAND flash memories are divided into two kinds of storing structures, i.e., the Single Level Cell (SLC) and Multi-level Cell (MLC). In the modes of using cells, an SLC flash memory is the same as an EEPROM, but the oxidized thin films in its floating gate and the source are thinner. After data writing into the SLC flash memory, by adding voltage to the electric charges of the floating gate, the electric charges stored can be erased through the source. With such mode, a data bit is stored (1 means erasing, 0 means writing). While an MLC flash memory uses electric charges of different levels in the floating gate, thereby a single transistor can be stored therein with information of multiple bits, and through the control of writing and sensing of the cells, the single transistor creates a multi-layer state.
Taking a 4 LC flash memory as an example, a cell includes two bits of which the smaller one is the least significant bit (LSB), while the larger one is the most significant bit (MSB) able to create a 4 layer state (00, 01, 11, 10) to be written into different pages of a block. Wherein, as shown in
In the process of data accessing, the computer system writes starting from the LSB page, and then continues on the MSB page. In writing in the MSB page, if an abnormal system power breaking is induced by abnormally plugging/unplugging or the phenomenon of exhausting of a battery, the MSB page and the data originally written in the LSB page will be damaged at the same time. Perhaps such a problem may have minor influence to a NAND flash memory during a 90 nm manufacturing process; however, following micro reducing of the manufacturing process, as is shown in
Additionally, for SLC and MLC flash memories, stability and complexity in storing 1 bit and multiple bits for cells of same capacity are different; an SLC flash memory is more stable than an MLC flash memory, and the speed of writing in the SLC flash memory is faster than that of the MLC flash memory. Although the MLC flash memory having multiple bits can increase storing capability, by an inherent physical limitation, theoretically, number of times of writing on the SLC flash memory is 100,000/block; the life of use of the SLC flash memory is ten times over that of the MLC flash memory having times of writing of only 10,000 times/block; i.e., the life of use of the MLC flash memory is shorter than that of the SLC flash memory.
In view of this, and for eliminating the above defects, the method for increasing reliability of data accessing for a multi-level cell type non-volatile memory not only can reduce the frequency of erasing of flash memory blocks to elongate the life of use of the multi-level cell type non-volatile memory, but also can assure integrity of the data in accessing. The inventor provided the present invention after studying and development without stopping and experience for many years.
The primary object of the present invention is to provide a method for increasing reliability of data accessing for a multi-level cell type non-volatile memory, in which by a step wherein at least a set of data storage pages in corresponding to a physical page of a storage cell are selected when a page jumper jumps over another data storage page in corresponding to the physical page of the same storage cell to do accessing for at least a data storage block, reducing of the frequency of erasing of data storage blocks can be effected to elongate the life of use of the multi-level cell type non-volatile memory.
The secondary object of the present invention is to provide a method for increasing reliability of data accessing for a multi-level cell type non-volatile memory, in which by a step wherein several data storage blocks are used to respectively access data for a computer system, synchronic damaging of data in accessing and data accessed originally created because of the accessing characteristic of the multi-level cell type non-volatile memory can be avoided when an abnormal system power breaking is induced, this can assure integrity of the data in accessing.
To get the above stated objects of the present invention, the method for increasing reliability of data accessing for a multi-level cell type non-volatile memory provided in the present invention comprises the following steps:
When in practicing, by jump connecting of the page jumper, one can select at least a set of data storage pages in corresponding to a physical page of a storage cell to do accessing for at least a data storage block; and by jump connecting of the page jumper which jumps over another data storage page in corresponding to the physical page of the same storage cell, one can do accessing for another data storage block without using the page jumper.
And there is another step in practicing: to merge the data storage blocks for accessing of the page jumper in a clean block, in order that a data storage block without the storage capacity of the page jumperâ–¡is formed, and the data in a plurality of data register blocks are erased.
And in practicing, the data storage block in accessing of the page jumper can be used as a data backup block of the data storage block being used in accessing of the computer system, and after data are checked to be no error, the data in the data backup block can be erased.
The present invention will be apparent after reading the detailed description of the preferred embodiment thereof in reference to the accompanying drawings.
As a person skilled in the art can know, any multi-level cell type (MLC) non-volatile memory is formed by combination in arrays, any storage cell has n bits, and the MLC non-volatile memory is divided into a plurality of data storage blocks, each data storage block is further divided into a plurality of data storage pages. The data storage blocks each is a minimum unit for executing data erasing; while each data storage page is a minimum unit for executing data programming.
Taking an 8LC (Level Cell) non-volatile memory as an example, generally speaking and as shown in
Referring to
Referring to
Please refer to
And when in practicing, the present invention can also be applied to various MLC non-volatile memories. Taking a 4LC (Level Cell) non-volatile memory as an example, any storage cell stores 2 bits, the page jumper only selects the LSB page formed from the least significant bit (LSB) of the 2 bits, rather than the MSB page formed from the most significant bit (MSB).
By the selection steps of the above page jumper, the data writing speed of the computer system can be increased, but the capacity of the data storage block is smaller. And as shown in
As shown in
Thereby when the data that the computer system is accessing onto the data storage block 14 are wrong, one can read the corresponding data storage pages in the two data storage blocks (15, 16) for backing up to obtain correct data. And after the computer system changes the data storage block in accessing, it waits for an appropriate time to erase the data in the data backup block. Further, before the erasing of the data in the data backup block, the data in the data storage block 14 when the computer system is accessing are verified to assure their correctness.
Therefore, the present invention has the following advantages:
In conclusion, according to the description disclosed above, the present invention surely can get the expected object thereof to provide a method for increasing reliability of data accessing for a multi-level cell type non-volatile memory, this not only can reduce the frequency of erasing of flash memory blocks to elongate the life of use of the multi-level cell type non-volatile memory, but also can assure integrity of the data in accessing.
While the embodiments given are only for illustrating the technical measures of the present invention; it will be apparent to those skilled in this art that various equivalent modifications or changes without departing from the spirit of this invention shall also fall within the scope of the appended claims.
Number | Date | Country | Kind |
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097120212 | May 2008 | TW | national |