Claims
- 1. A process for manufacturing on a movable receiving material a spectral selective absorbing layer for solar collectors, the spectral selective absorbing layer having a high solar absorption ability and a low thermal emittance, the process comprising:atomizing metal in a coating zone present in a chamber having a sputtering atmosphere, the atmosphere containing oxygen and at least one gas supporting the sputtering, whereby the atomized metal forms the cathode and the movable receiving material forms the anode, the anode and the cathode providing a difference in electrical potential and thereby a plasma gas, and depositing the atomized metal by sputtering on the movable receiving material, characterized by: providing an amount of oxygen in the coating zone of between about 1 and 50 cm3/min, kW to deposit a layer of the metal onto the movable receiving material, the amount of oxygen in the coating zone being selected to partly oxidize the deposited metal to provide a mixture of the metal and metal oxide wherein between about 40 and 80% of the metal is embedded into the metal oxide closest to the movable receiving material; and increasing the amount of oxygen at the end of the coating zone to decrease the amount of the metal embedded into the metal oxide to about zero at the surface of the layer, the metal atomized in the coating zone being selected from the group consisting of nickel, chromium, cobalt and molybdenum.
- 2. The process of claim 1, wherein the gas in the coating zone supporting the sputtering is argon.
- 3. The process of claim 1, wherein the amount of oxygen provided in the coating zone comprises about 10 cm3/min, kW.
- 4. The process of claim 1, wherein the amount of oxygen provided in the coating zone is selected to provide about 50% of metal embedded into the metal oxide closest to the movable receiving material.
- 5. The process of claim 1, wherein the metal comprises a nickel-chromium alloy having a chromium ratio of between about 4 and 30% and a grain size less than about 0.005 micrometer.
- 6. The process of claim 5, wherein the ratio of chromium is about 20% and the grain size is about 0.001 micrometer.
- 7. The process of claim 1, wherein the total thickness of the spectral selective absorbing layer is chosen as a function of the wave length of the solar radiation, the wave length having a range of between about 0.3 and 4 micrometers.
- 8. The process of claim 7, wherein the spectral selective absorbing layer has a thickness of between about 0.12 and 0.2 micrometer.
- 9. The process of claim 7, wherein the spectral selective absorbing layer has a thickness of about 0.16 micrometer.
- 10. The process of claim 2, wherein the movable receiving material passes through a pressure container (10) having a controlled atmosphere of between about 1×10-4 to about 10-2 mbar and at least a part (16) of the movable receiving material (11) is brought within an activity area before at least one sacrificing cathode (13) connected to an added effect of between about 5 and 100 W/cm2 of cathode area, said sacrificing cathode (13) comprising nickel, said sacrificing cathode (13) being brought into cooperation with oxygen and argon gas in an amount between about 5 and 100 cm3/min, kW.
- 11. The process of claim 10, wherein the atmosphere in the container (10) is about 6×10-3 mbar.
- 12. The process of claim 10, wherein the sacrificing cathode (13) is connected to an added effect of about 50 W/cm2.
- 13. The process of claim 10, wherein the argon gas is in an amount of about 30 cm3/min, kW.
- 14. The process of claim 1, wherein the sputtering is carried out in two steps, a first step wherein the oxygen is added at the end of the treatment zone of the first step in a direction of transport of the movable receiving material, and a second step wherein the oxygen is added in a direction opposite to the direction of transport of the movable receiving material at least in the beginning of the treatment zone of the second step.
- 15. The process of claim 14, comprising applying a second layer onto the surface of the spectral selective absorbing layer in a second step, the second step comprising adding to the oxygen in the sputtering atmosphere a reactive gas to provide the metal oxide with a lower refraction index.
- 16. The process of claim 15, wherein the reactive gas added in the second step comprises fluorine gas.
- 17. The process of claim 15, wherein the reactive gas added in the second step comprises chlorine gas.
- 18. The process of claim 15, wherein the thickness of the second layer is chosen as a function of the wave length of the solar radiation, the wave length having a range of between 0.3 and 4 micrometers.
- 19. The process of claim 18, wherein the thickness of the second layer is between about 0.02 and 0.1 micrometer.
- 20. The process of claim 18, wherein the thickness of the second layer is about 0.05 micrometer.
- 21. A spectral selective absorbing layer for solar collectors, the spectral selective absorbing layer having a high solar absorption ability and a low thermal emittance, the layer being applied on a receiving material byatomizing metal in a coating zone in a chamber having a sputtering atmosphere, the atmosphere containing oxygen and at least one gas supporting the sputtering, whereby the atomized metal forms the cathode and the receiving material forms the anode, the anode and the cathode providing a difference in electrical potential and thereby a plasma gas, and depositing the atomized metal by sputtering on the receiving material, characterized in that: the amount of oxygen in the coating zone is between about 1 and 50 cm3/min, kW to deposit a layer of the metal onto the receiving material, the amount of oxygen in the coating zone being selected to partly oxidize the deposited metal to provide a mixture of the metal and metal oxide wherein between about 40 and 80% of the metal is embedded into the metal oxide closest to the receiving material, and the amount of oxygen is increased at the end of the coating zone to decrease the amount of the metal embedded into the metal oxide to about zero at the surface of the layer, the metal atomized in the coating zone being selected from the group consisting of nickel, chromium, cobalt and molybdenum.
- 22. The layer of claim 21, wherein the gas in the coating zone supporting the sputtering is argon.
- 23. The layer of claim 21, wherein the amount of oxygen provided in the coating zone comprises about 10 cm3/min, kW.
- 24. The layer of claim 21, wherein the amount of oxygen provided in the coating zone is selected to provide about 50% of metal embedded into the metal oxide closest to the movable receiving material.
- 25. The layer of claim 21, wherein the metal comprises a nickel-chromium alloy having a chromium ratio of between about 4 and 30% and a grain size less than about 0.005 micrometer.
- 26. The layer of claim 25, wherein the ratio of chromium is about 20% and the grain size is about 0.001 micrometer.
- 27. The layer of claim 21, further comprising a second layer applied onto the surface of the spectral selective absorbing layer in a second step, the second step comprising adding to the oxygen in the sputtering atmosphere a reactive gas to provide the metal oxide with a lower refraction index.
- 28. The layer of claim 27, wherein the reactive gas added in the second step comprises fluorine gas.
- 29. The layer of claim 27, wherein the reactive gas added in the second step comprises chlorine gas.
Priority Claims (1)
| Number |
Date |
Country |
Kind |
| 9603393 |
Sep 1996 |
SE |
|
Parent Case Info
This application is a continuation of PCT International Application No. PCT/SE97/01545, filed Sep. 5, 1997.
US Referenced Citations (6)
| Number |
Name |
Date |
Kind |
|
4441974 |
Nishikawa et al. |
Apr 1984 |
|
|
4661229 |
Hemming et al. |
Apr 1987 |
|
|
4885070 |
Campbell et al. |
Dec 1989 |
|
|
5108571 |
Ludwig et al. |
Apr 1992 |
|
|
5135581 |
Tran et al. |
Aug 1992 |
|
|
5993622 |
Szczyrbowski et al. |
Nov 1999 |
|
Foreign Referenced Citations (6)
| Number |
Date |
Country |
| 3022714 |
Mar 1982 |
DE |
| 2079323 |
Jan 1982 |
GB |
| 57-13172 |
Jan 1982 |
JP |
| 07110401 |
Apr 1995 |
JP |
| WO 8706626 |
Nov 1987 |
WO |
| WO 9214860 |
Sep 1992 |
WO |
Non-Patent Literature Citations (2)
| Entry |
| International Search Report dated Jan. 16, 1998. |
| English abstract for JP 59-69658(A), Apr. 1984. |
Continuations (1)
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Number |
Date |
Country |
| Parent |
PCT/SE97/01545 |
Sep 1997 |
US |
| Child |
09/265495 |
|
US |