1. Technical Field
This disclosure generally relates to light emitting diodes (LEDs), and particularly to a method for manufacturing a light emitting diode having a wave-shaped Distributed Bragg Reflector layer.
2. Description of Related Art
A typical light emitting diode includes a substrate, a buffer layer formed on the substrate, an N-type semiconductor layer formed on the buffer layer, an active layer formed on the N-type semiconductor layer, and a P-type semiconductor layer formed on the active layer. However, light emitting towards the substrate from the active layer tends to be absorbed by the buffer layer and the substrate, which decreases the light efficiency of the light emitting diode.
What is needed, therefore, is a method for manufacturing a light emitting diode which can overcome the forgoing drawback.
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Si, or Sic.
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Each cavity 130 is recessed downwardly along a direction from the upper surface to the lower surface of the undoped GaN layer 120. Each cavity 130 is defined by a bottom surface 131 and side surfaces 132 extending upwardly and slantways from opposite sides of the bottom surface 131. A size of an opening of the cavity 130 is gradually decreased along the direction from the upper surface of the undoped GaN layer 120 to the lower surface of the undoped GaN layer 120. A depth D of each cavity 130 is less than a thickness of the undoped GaN layer 120.
Preferably, a depth D of each cavity 130 ranges from 50 nm to 300 nm, and a width W of the opening of each cavity 120 at a top thereof is 3 um.
Referring to
Referring to
According to the method for manufacturing the light emitting diode 100 of the embodiment of the present disclosure, light emitting away from the substrate 110 directly travels through the P-type GaN layer 170 to emit out of the light emitting diode 100. Light emitting towards the substrate 110 is reflected by the Distributed Bragg Reflector layer 140 to sequentially emit through the N-type GaN layer 150, the active layer 160 and the P-type GaN layer 170 to emit out of the light emitting diode 100. In addition, because the Distributed Bragg Reflector layer 140 is wave-shaped which is a three-dimensional structure, not only the light vertical to the substrate 110 emitted from the active layer 160 is effectively reflected by the Distributed Bragg Reflector layer 140, but also the light not vertical to the substrate 110 emitted from the active layer 160 is effectively reflected by a portion of the Distributed Bragg Reflector layer 140 located in the cavity 130 defined in the undoped GaN layer 120.
Furthermore, because the Distributed Bragg Reflector layer 140 is formed between the undoped GaN layer 120 and the N-type GaN layer 150, growth defects of the undoped GaN layer 120 is stopped by the Distributed Bragg Reflector layer 140 to enable the N-type GaN layer 150 to have an epitaxial growth with a better quality; accordingly, the active layer 160 and the P-type GaN layer 170 can also have a better quality. The formation of the cavities 130 in the un-doped GaN layer 120 can effectively release internal stress formed due to the formation of the un-doped GaN layer 120, whereby the possibility of formation of cracks in the Distributed Bragg Reflector layer 140 due to the internal stress can be lowered. Finally, since the Al1-xGaxN, (1>x≧0) layer 141 and GaN layer 142 for constituting the Distributed Bragg Reflector layer 140 have different lattice constants, the lattice defect density of the Distributed Bragg
Reflector layer 140 can be lowered due to lattice dislocation, whereby a yielding rate of the light emitting diode 100 can be increased.
It is to be understood that the above-described embodiments are intended to illustrate rather than limit the disclosure. Variations may be made to the embodiments without departing from the spirit of the disclosure as claimed. The above-described embodiments illustrate the scope of the disclosure but do not restrict the scope of the disclosure.
Number | Date | Country | Kind |
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2013101581623 | May 2013 | CN | national |