Various embodiments relate to a method for manufacturing of electrical contacts on a solar cell, a solar cell, and a method for manufacturing a rear side contact of a solar cell.
A high degree of efficiency, in other words a high current yield, is usually desired in a solar cell. In a conventional solar cell, electrical contacts are provided on the rear side of a solar cell. In a conventional process of manufacturing electrical contacts on a solar cell, a contacting metal layer made of aluminum or silver is deposited on a passivation layer on the rear side of the solar cell. Furthermore, a layer of an as such solderable material (Ag, Ni, NiV, NiCr, and Cr) is sputtered on the contacting metal layer. In the conventional process, there is no break in the vacuum atmosphere between the deposition of the contacting metal layer and the sputtering of the layer of an as such solderable material. In the conventional process, after the deposition of both layers, a laser fired contact (LFC) process is carried out to provide electrical contacts between the contacting metal layer and the base region of the solar cell through the passivation layer.
In various embodiments, a method for manufacturing of electrical contacts on a solar cell is provided. The method may include forming a dielectric layer on a region to be electrically contacted; forming a first metal layer over the dielectric layer; forming electrical contacts between the first metal layer and the region to be electrically contacted through the dielectric layer by laser pulses; annealing the formed electrical contacts; and forming a second metal layer comprising a solderable material at least over a portion of the first metal layer.
In the drawings, like reference characters generally refer to the same parts throughout the different views. The drawings are not necessarily to scale, emphasis instead generally being placed upon illustrating the principles of the invention. In the following description, various embodiments of the invention are described with reference to the following drawings, in which:
The following detailed description refers to the accompanying drawings that show, by way of illustration, specific details and embodiments in which the invention may be practiced.
The word “exemplary” is used herein to mean “serving as an example, instance, or illustration”. Any embodiment or design described herein as “exemplary” is not necessarily to be construed as preferred or advantageous over other embodiments or designs.
Various embodiments provide for a procedure for rear side metallization of a dielectrically passivated local contact solar cell with a deposition of a solderable layer, in other words a layer including or made of a solderable material, after the formation and annealing of the electrical rear side contacts, e.g. after applying laser pulses (e.g. by carrying out a laser fired contact (LFC) process) to form the electrical rear side contacts and after the subsequent anneal process.
In various embodiments, a two-step rear side metallization for LFC solar cells is provided, wherein e.g. a first metal layer (which may also be referred to as the contacting layer) is deposited on a rear side dielectric layer (e.g. in a vacuum process), then the vacuum is broken and the laser pulses are applied to form the electrical rear side contacts through the dielectric layer, followed by an annealing of the structure. The second metal layer is then deposited after the anneal process. The second metal layer may include or consist of solderable material.
In various embodiments, a solar cell may be understood as being a device which directly converts light energy (e.g. at least a portion of the light in the visible wave length region in the range from about 300 nm to about 1150 mn, e.g. sunlight) into electrical energy by means of the so called photovoltaic effect.
In various embodiments, in a process of manufacturing and wiring a solar cell, a wafer (e.g. made of silicon or any other suitable material as listed below), may be separated (e.g. sawn) into individual pieces, e.g. the solar cells. Then, the damages caused by the separation (e.g. sawing) process may be removed and the separated solar cells may be cleaned.
In various embodiments, solar cells (e.g. including the solar cell 100), which may be formed in or on a wafer, e.g. a semiconductor wafer, may be electrically connected to each other to e.g. be encapsulated as a solar module. A solar module may include a glass layer on its front side (i.e. the sunny side, also referred to as the emitter side), which allows light impinging onto the solar module to pass the glass layer, while at the same time it protects the wafer or the solar cells from being damaged, e.g. due to rain, hail, snow, and the like.
In various embodiments, the solar cell 100 may have the following dimensions: a width in the range from about 10 cm to about 50 cm, a length in the range from about 10 cm to about 50 cm, and a thickness in the range from about 50 μm to about 300 μm.
In various embodiments, the solar cell 100 may include at least one photovoltaic layer 106 (e.g. as a part of a layer structure having one or more layers). The at least one photovoltaic layer 106 may include or consist of a semiconductor material (such as e.g. silicon), a compound semiconductor material (such as e.g. a III-V-semiconductor material (such as e.g. GaAs), a II-VI-semiconductor material (such as e.g. CdTe), or a I-III-V-semiconductor material (such as e.g. CuInS2). In various embodiments, the at least one photovoltaic layer 106 may include or consist of an organic material. In various embodiments, the silicon may include or consist of single-crystalline silicon, poly-crystalline silicon, amorphous silicon, and/or micro-crystalline silicon. The at least one photovoltaic layer 106 may include or consist of a junction such as e.g. a pn-junction, a pin-junction, a Schottky-type junction, and the like, as will be described in more detail below. In various embodiments, the at least one photovoltaic layer 106 may have a layer thickness in the range from about 50 μm to about 300 μm, e.g. a layer thickness in the range from about 100 μm to about 200 μm, e.g. a layer thickness in the range from about 150 μm to about 180 μm.
In various embodiments, as will be described in more detail below, the rear side 104 of the solar cell 100 may include a rear side electrode. The rear side electrode may include or consist of electrically conductive material, e.g. one or more metals. In various embodiments, the rear side electrode may be transparent. Furthermore, in various embodiments, the rear side electrode may be patterned.
As will also be described in the following, in various embodiments, an electric contacting structure, e.g. implemented in the form of a plurality of metallization lines, in other words, metallization conductors (e.g. in the form of contact fingers), may be provided on or above the front surface 102 of the at least one photovoltaic layer 106. The metallization lines may run substantially parallel to one another and/or at a distance from each other. However, it is to be noted that the metallization lines may alternatively run at an angle to each other, but without crossing each other. In various embodiments, the metallization lines may be provided in a comb structure having a plurality of metal fingers, which run substantially parallel to each other. In various embodiments, the metallization lines may be provided in a strip shape electrically conductive surface regions. In various embodiments, the electric contacting structure may e.g. be implemented in the form of a plurality of electrically conductive point contacts.
In various embodiments, the layer structure including the at least one photovoltaic layer 106 which may be p-doped (e.g. using boron as doping species).
In various embodiments, it is achieved to provide of a solderable layer at the rear of an LFC solar cell.
The inventors have realized that the conventional processing sequence as described above, namely to sputter or by means of E-beam evaporation or thermal evaporation an aluminum and nickel vanadium layer structure followed by the lasering and the anneal process may result in at least one of the following problems:
As shown in
As shown in
As shown in
Then, the above described electric contacting structure 118, e.g. implemented in the form of a plurality of metallization lines 118, in other words, metallization conductors (e.g. in the form of contact fingers), may be provided on or above the front surface 102 of the at least one photovoltaic layer 106, more accurately, on or above the dielectric layer 116. Then, using a (e.g. fast) firing process, the metallization lines 118 are fired through the dielectric layer 116 to thereby form electrical contacts with the emitter region 114.
Then, in various embodiments, a first metal layer 120, e.g. including or consisting of a metal such as e.g. aluminum; silver; and/or gold, may be deposited on the rear side 104 of the solar cell, more accurately on the exposed surface of the rear side thin oxide layer (e.g. silicon oxide layer) 110, in a vacuum atmosphere (e.g. by plasma treatment in a vacuum atmosphere), e.g. by means of thermal deposition or sputtering. In various embodiments, the first metal layer 120 may be deposited having a layer thickness in the range from about 200 nm to about 4 μm, e.g. having a layer thickness in the range from about 300 nm to about 3 μm, e.g. having a layer thickness in the range from about 500 nm to about 2 μm.
In various embodiments, the first metal layer 120 may be an aluminum layer 120, which may be deposited at a pressure in the range from about 3*10−3 mbar to about 5*10−7 mbar, e.g. at a pressure in the range from about 5*10−3 mbar to about 5*10−6 mbar, e.g. at a pressure in the range from about 1*10−4 mbar to about 1*10−5 mbar. The duration of the deposition process may depend on the desired layer thickness of the first metal layer 120 to be deposited. In various embodiments, using the above pressure regime, e.g. when simultaneously processing about 40 solar cells 100 on a common carrier in the process chamber, 2 μm of the first metal layer 120 may be deposited in approximately 50 seconds. Thus, in various embodiments, using the above pressure conditions for the deposition, the deposition process may be carried out for a time duration in the range from about 30 seconds to about 90 seconds or longer, e.g. for a time duration in the range from about 40 seconds to about 60 seconds or longer.
Then, in various embodiments, the vacuum atmosphere may be broken, i.e. the solar cell 100 as shown in
Then, laser light, e.g. laser pulses which may have e.g. a pulse duration in the range of nanoseconds to milliseconds, may be applied to the rear side 102 of the solar cell, i.e. for example to the exposed surface of the first metal layer 120 in order to form, e.g. fire, electrical contacts 122 from the first metal layer 118 through the rear side thin oxide layer (e.g. silicon oxide layer) 110 to the rear side of the base region 112 of the solar cell 100. In various embodiments, this process may be implemented as a so called laser fired contact (LFC) process. In various embodiments, this process may be carried out in non-vacuum atmosphere, e.g. at a room atmosphere and at room temperature. In various embodiments, the electrical contacts 122, e.g. the laser fired contacts 122, may be formed only at pre-defined positions, e.g. at those positions, at which no solder pads are to be formed at a later processing stage. This may be achieved by not exposing those positions, at which e.g. solder pads are to be formed, to the irradiated light, e.g. laser light. By way of example, the electrical contacts 122, e.g. the laser fired contacts 122, may be formed only outside the busbar region to be formed.
In various embodiments, the structure with the formed electrical rear side contacts (and thus the formed electrical rear side contacts 122) is annealed. In various embodiments, the anneal process may be carried out e.g. in a forming gas atmosphere or a normal room atmosphere. In various embodiments, the anneal process may be carried out e.g. at a temperature in the range from about 300° C. to about 500° C., e.g. at a temperature in the range from about 350° C. to about 450° C., e.g. at a temperature in the range from about 375° C. to about 425° C. In various embodiments, the anneal process may be carried out for a time duration in the range from about 5 seconds to about 30 minutes, e.g. for a time duration in the range from about 30 seconds to about 20 minutes, e.g. for a time duration in the range from about 1 minute to about 10 minutes.
In various embodiments, due to the optional break of the vacuum atmosphere, as shown in
Then, as will be described in more detail below, the process for depositing a second metal layer including or consisting of solderable material, will be carried out.
In those embodiments, in which the first metal oxide layer 124 is formed, a sputter-cleaning from the rear side 104 may be carried out, thereby removing the first metal oxide layer 124 (in general, the first metal oxide layer 124 may be removed in various embodiments by means of a plasma treatment in a vacuum atmosphere).
Then, as shown in
Then, as shown in
In various embodiments, the second metal layer 130 may be deposited having a layer thickness in the range from about 40 nm to about 5 μm, e.g. having a layer thickness in the range from about 100 nm to about 1 μm, e.g. having a layer thickness in the range from about 300 nm to about 500 nm.
In an alternative embodiment, the removal of the first metal oxide layer 124 may be carried out in a common process (i.e. simultaneously) with the deposition of the second metal layer 130. In this case, the above described deposition of the thin layer 128 of the same material (i.e. the first metal) as the material of the first metal layer 120, may be omitted. In various embodiment a sputtering of the second metal layer 130 may be provided to, on the one hand, remove the first metal oxide layer 124 and, on the other hand, to simultaneously deposit the second metal layer 130, which may include or consist of the materials as described above.
In various embodiments, e.g. in the case that the first metal oxide layer 124 has been removed by wet etching, the second metal layer 130 (e.g. including or consisting of nickel vanadium) may also be evaporated (e.g. by means of vapor deposition such as e.g. chemical vapor deposition).
Furthermore, in various embodiments, the second metal layer 130 may include a layer stack of a plurality of layers, e.g. including a titanium layer on the first metal layer 120 or the thin layer 128, and a silver layer on the titanium layer, in which case the titanium layer may act as a diffusion barrier layer with respect to the silver.
In various embodiments, it may be provided that the second metal layer 130 is formed only at pre-defined positions, e.g. at those positions, at which the solder pads are to be formed at a later processing stage. This may be achieved by masking those regions, in which no solder pads are to be formed. In various embodiments, those regions, in which the electrical contacts have been formed, may be masked so that no solderable material is deposited (e.g. sputtered) in those regions. In various embodiments, various masks may be used, e.g. a strip mask or a shadow mask. Illustratively, in various embodiments, the lasered areas may be masked during the deposition of the second metal layer 130.
Then, as shown in
In various experiments it has been found out that the above described sequence was proven e.g. for the non contacted areas of the solar cell by good solderability of the second metal layer (e.g. nickel vanadium layer) and an excellent solder-ribbon adhesion.
Various embodiments may provide at least one of the following advantages:
a) Presputtering for removal of the aluminum oxide layer formed in various embodiments;
b) Depositing a thin aluminum layer followed by depositing a solderable layer.
Various embodiments provide a process sequence for the LFC rear side of a solar cell that allows to maintain high efficiency local laser rear side contacts while achieving solderability of the solar cell.
While the invention has been particularly shown and described with reference to specific embodiments, it should be understood by those skilled in the art that various changes in form and detail may be made therein without departing from the spirit and scope of the invention as defined by the appended claims. The scope of the invention is thus indicated by the appended claims and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced.