The present invention relates to a method for ascertaining distance on the basis of travel-time of high-frequency measuring signals.
Measuring devices are frequently used in automation and process control technology for ascertaining, during the course of a process, a process variable, such as, for example, flow, e.g. flow rate, fill level, pressure and temperature or some other physical and/or chemical variable. The present assignee produces and sells, among a variety of measuring devices, measuring devices under the marks Micropilot, Prosonic and Levelflex, which work according to the travel-time measuring method and serve for determining and/or monitoring fill level of a medium in a container. In the case of the travel-time measuring method, for example, ultrasonic waves are transmitted via a sound transducer, or microwaves, or radar waves, are transmitted via an antenna, or guided along a waveguide extending into the medium. Echo waves reflected on the surface of the medium are then received back by the measuring device, following a distance-dependent travel-time of the signal. From half the travel-time, the fill level of the medium in a container can then be calculated. The echo curve represents, in such case, the received signal amplitude as a function of time, with each measured value of the echo curve corresponding to the amplitude of an echo curve signal reflected on a surface a certain distance away. The travel-time measuring method is divided into essentially two ascertainment methods: Time-difference measurement, which requires a pulse-modulated wave signal for the traveled path; and, as another widely used ascertainment method, measuring the sweep frequency difference of a transmitted, continuous, high-frequency signal relative to a reflected, received, high-frequency signal (FMCW—Frequency-Modulated Continuous Wave). In the following, there is no limitation to a special ascertainment method. Instead, the underlying travel-time method will be considered as the measuring principle.
The received measuring signals contain, most likely, under real measuring conditions, additionally, disturbance, or noise, signals. These disturbance signals arise from various causes and can be categorized e.g. as
white noise, shot noise
1/f noise, or flicker noise
phase noise
noise from sequential sampling with a sampling circuit
noise from filling and emptying procedures
dispersion of transmitted waves
foam- and accretion-building of the medium
moisture in the atmosphere in the container
turbulent surface on the medium
stray in-coming electromagnetic radiation.
In the present state of the art, there are various attempts to remove the disturbance, or noise, signals, since these unwanted signals can make more difficult, or prevent, evaluation and determining of fill level, in that they can hide the measuring signal.
As one approach for separating disturbance signals from the measuring signal, DE 199 49 992 C2 proposes a method for ascertaining a disturbance measure in the measuring signal. From the disturbance measure and the measuring signal, it is calculated, according to an algorithm, whether a sufficient measuring accuracy of the measuring signal is present. This current disturbance measure is compared with other disturbance measures recorded in other frequency ranges and stored, for example in a memory. Depending on strength of the disturbance measure and ascertained measuring accuracy of the measuring signal, another frequency range can be used, in which the disturbances of the measuring signal are less. In such method, an evaluation of the measuring accuracy of the measuring signal is made and a decision is reached, whether this measuring signal can be used or whether a new measurement in another frequency range is more suitable.
Another approach is to filter-out the disturbance, or noise, signals of the sampled, time-expanded measuring signal, or intermediate-frequency, by filtering with a bandpass of high quality. For this, a narrow-banded bandpass of high quality is used, whose center frequency matches the intermediate-frequency of the sampled measuring signal. This center frequency of the bandpass is, according to the current state of the art, matched to the selected, fixed intermediate-frequency using an adjustable component, e.g. a tuning coil.
Since this center frequency of the bandpass of the filter stage depends on component tolerances of the bandpass and the disturbing influences, such as e.g. temperature movements, this is different from case to case, so that the bandpass must be tuned to the desired metal frequency using a variable component (e.g. tuning coil). This tuning of the bandpass is done in the end phase of the production of the measuring device and is very cost-intensive, due to the additionally used, expensive components, such as e.g. HF-tuning coils, as well as due to the additional working time required for the individual tuning procedures. Furthermore, a changing of the component characteristic and, thus, a drift of the center frequency of the bandpass during operation of the measuring device, e.g. due to temperature influences or aging of the components of the bandpass, can only be counteracted by a manually executed tuning of the bandpass.
An object of the invention, therefore, is to provide an optimized, simple method for improving matching of the filter to the intermediate-frequency of the time-expanded measuring signal, which method reduces the production costs.
This object is achieved according to the invention by a method for ascertaining distance on the basis of travel-time of high-frequency measuring signals, wherein at least one periodic transmission signal having a pulse repetition frequency is transmitted and at least one reflected measuring signal is received, wherein the transmission signal and the reflected measuring signal are transformed by means of a sampling signal produced with a sampling frequency into a time-expanded, intermediate-frequency signal having an intermediate-frequency, wherein the time-expanded, intermediate-frequency signal is filtered by means of at least one filter and a filtered echo curve signal is produced, and wherein the intermediate-frequency is matched to a limit frequency and/or a center frequency of the filter.
An advantageous form of embodiment of the solution of the invention is that wherein the intermediate-frequency is matched by so varying the pulse repetition frequency and/or the sampling frequency, that the frequency difference between the pulse repetition frequency and the sampling frequency is changed.
In an especially preferred form of embodiment of the solution of the invention, it is provided that the intermediate-frequency is matched by varying the pulse repetition frequency and/or the sampling frequency according to an iterative method.
An efficient embodiment of the solution of the invention is that wherein the matching of the intermediate-frequency is checked by evaluating signal strength of the echo curve signal.
An advantageous form of embodiment of the structure of the method of the invention is that wherein the control process for matching the intermediate-frequency is initiated periodically or under event-control.
According to an advantageous form of embodiment of the method of the invention, it is provided that signal strength of the echo curve signal is determined by an algorithm from the echo curve signal, by ascertaining of amplitude of the fill level echo and/or by ascertaining of an integral over all data points of the echo curve signal.
According to an advantageous form of embodiment of the method of the invention, it is provided that a transformation factor corresponding to the time expansion ratio is ascertained from the ratio of the pulse repetition frequency to a frequency difference.
In an advantageous form of embodiment of the method of the invention, it is provided that the transformation factor is transmitted for further evaluation and processing of the filtered, time-expanded echo signal.
A further advantageous form of embodiment of the method of the invention is that wherein mirror frequencies of the intermediate-frequency are masked out of the time-expanded, intermediate-frequency signal by a lowpass filter and/or the sampling sum signal.
A very advantageous variant of the method of the invention is that wherein disturbance signals, especially noise, are masked out of the time-expanded, intermediate-frequency signal by a bandpass filter.
Further advantages of the invention are that measuring accuracy is increased, in that always the maximum possible echo curve signal is ascertained and evaluated and that an autonomous tuning of the measuring device or measuring electronics is possible for changing measuring, or measuring device, conditions, without requiring maintenance personnel. By the method of the invention, a self-sufficient tuning control of the measuring electronics is provided for working against changes resulting from aging, temperature drift of components and/or changed measuring conditions, e.g. measuring range changes.
The invention will now be explained in greater detail on the basis of the appended drawings. For simplification, identical parts in the drawings are provided with equal reference characters. The figures show as follows:
The method of the invention is not limited to travel-time measuring methods with pulsed measuring signals S. Rather, this method can also be used generally for adapting the frequency of the output signal of a mixer 13, 24, or sampling circuit 23, to the limit frequency fl or the center frequency fcen of the back- or front-connected filter/amplifier unit 9. Included under the generic term, “measuring signals S”, are the transmission signals STX and the reflected signals SRX, which are, in particular, composed partially of the pulse repetition signals SPRF, the sampling signals Ssampl, and the carrier signals, or high-frequency signals, SHF, as well as also the sampling signal Ssampl, difference signal Sdiff combined for further signal processing.
Measuring device 16 serves for determining a certain fill level e of the fill substance 3 in the open or closed, spatial system 4, especially in the container, based on the pulse radar method, and, by means of an appropriate digital processing unit, especially a microcontroller, 5, for delivering a measured value M especially a digital measured value M, currently representing this fill level e.
For this purpose, measuring device 16 has a transducer element 20, basically connected with the measuring electronics 1. By means of the transducer element 20, the pulsed electromagnetic transmission signal STX carried by the high frequency signal SHF, the carrier signal, and being of lower frequency in comparison thereto, is coupled into a measuring volume containing the fill substance 3, especially in the direction of the fill substance 3. The average high-frequency fHF of the high-frequency signal SHF or the pulsed transmission signal STX, lies, here, as is usual in the case of such measuring devices 16 working with microwaves, in a frequency range of several GHz, especially in the frequency range of 0.5 GHz to 30 GHz.
Transducer element 20 can, as shown, for example, in
Due to impedance jumps within the measuring volume of the open or closed, spatial system 4, or container, especially on the surface 3a of the fill substance 3, the transmission signal STX is at least partially reflected and, thus, transformed into corresponding reflected measuring signals SRX, which travel back toward the transducer element 20 and are received thereby.
A transmitting/receiving unit 2 coupled to the transducer element 20 serves for producing and processing line-guided and mutually coherent wave packets of predeterminable pulse shape and pulse width, so-called bursts, as well as for generating, by means of the bursts an analog, time-expanded, intermediate-frequency signal SIF influenced by the fill level e. The pulse shape of an individual burst is usually a needle-shaped or sinusoidal, half-wave-shaped pulse of predeterminable pulse width; it is possible, however, also to use other suitable pulse shapes for the bursts.
Measuring electronics 1 is composed, mainly, of at least one transmitting/receiving unit 2, digital processing unit 5, and a filter/amplifier unit 9. The transmitting/receiving unit 2 can, in turn, be considered in terms of an HF-circuit portion 28, in which mainly HF-signals are produced and processed, and an LF-circuit portion 29, in which mainly LF-signals are produced and processed. The individual circuit elements in the HF-circuit portion 28 are built, on the basis of experience, in analog circuit technology, i.e. analog measuring signals S are produced and processed. In contrast, the individual circuit elements in the LF-circuit portion 29 are built either on the basis of digital circuit technology and/or on the basis of analog circuit technology. Considering the rapid progress of digital signal processing, it is also thinkable to embody the HF portion using digital circuit elements. Additionally, the most varied of individual circuit elements are thinkable in digital and analog circuit technology, but all these options should not be detailed explicitly here. Thus, the following description of a form of embodiment is to be considered only as an example of many possible forms of embodiment.
The transmitting/receiving unit 2 includes, according to
The transmission signal STX lying on the signal output of the transmission pulse generator 18 is coupled by means of a transmitting/receiving duplexer 8, especially by means of a directional coupler or hybrid coupler, of the transmitting/receiving unit 2 into the transducer element 20 connected to a first signal output of the transmitting/receiving duplexer 8. Practically at the same time, the transmission signal STX lies additionally on the second signal output of the transmitting/receiving duplexer 8. The transmission pulse generator 18 and the sampling pulse generator 19 are embodied as usual analog HF-oscillators, e.g. quartz oscillators, back-coupled oscillators or surface acoustic wave filters (SAW).
The reflected measuring signals SRX produced in the above-described manner in the measuring volume of the open or closed, spatial system 4 are, as already explained, received back by the measuring device 16 by means of the transducer element 20 and out-coupled at the second signal output of the transmitting/receiving duplexer 8. As a result, tappable at the second signal output of the transmitting/receiving duplexer 8 is a sum signal STX+SRX formed by means of the transmission signal STX and the reflected measuring signal SRX.
Due to the fact that the high-frequency fHF and/or the pulse repetition frequency fPRF of the transmission signal STX, as usual in the case of such measuring devices 16, are/is set so high that a direct evaluation of the sum signal STX+SRX lying on the second signal output of the transmitting/receiving duplexer 8, especially a direct measuring of the travel-time t, would no longer be practically possible, or possible only with great technical effort, e.g. use of high-frequency electronics components, the transmitting/receiving unit 8 further includes a sampling circuit 23, which serves for expanding the high-frequency-carried, sum signal STX+SRX, and, indeed, such that the high-frequency SHF and the pulse repetition frequency fPRF are shifted into a low frequency region of some kilohertz.
For the time expansion of the sum signal STX+SRX, such is fed to a first signal input of the sampling circuit 23 connected with the second signal output of the transmitting/receiving duplexer 8. Simultaneously with the sum signal STX+SRX, a burst sequence serving as a sampling signal Ssampl is supplied to a second signal input of the sampling circuit 23. A sampling frequency fsampl, respectively clock rate, with which the sampling signal Ssampl is clocked, is, in such case, set somewhat smaller than the pulse repetition frequency fPRF of the transmission signal STX.
By means of the sampling circuit 23, the sum signal STX+SRX is mapped onto an intermediate-frequency signal SIF, which is time-expanded by a transformation factor KT relative to the sum signal STX+SRX and is, accordingly, low frequency. The transformation factor KT, respectively the time-expansion factor, corresponds, as can be seen in Eq. 1, in such case, to a quotient of the pulse repetition frequency fPRF of the transmission signal STX divided by a difference of the pulse repetition frequency fPRF of the transmission signal STX and the sampling frequency fsampl of the sampling signal Ssampl.
An intermediate-frequency fIF of the so-produced intermediate-frequency signal SIF lies, in the case of such types of measuring devices 16 for ascertaining fill level e, usually in a frequency range of 50 to 200 kHz; in case required, the frequency range can, however, also be chosen higher or lower. A priori, in an old method used in measuring devices 16 of the present assignee, the intermediate-frequency fIF was set fixedly at about 160 kHz, and the filter/amplifier unit 9 was tuned to that via frequency variable components, e.g. rotary coils. The dependence of the intermediate-frequency fIF on the ratio of sampling frequency fsampl and pulse repetition frequency fPRF can be derived from Equation 1, as shown in Equation 2.
In the example of an embodiment of the mixing electronics 1 in
In this example of an embodiment in
In the example of the embodiment of the measuring electronics 1 in
Sampling switch 25, due to the frequency offset between the pulse repetition frequency fPRF and the sampling frequency fsampl, samples the transmission signal STX in each period at a different phase position, whereby a time-expanded, intermediate-frequency signal SIF results having the above-described transformation factor KT. In the case of sampling switch 25, a fast, bounce-free, electrical switching element, especially an HF-diode or an HF-transistor, is used. Compared with the sampling mixer 24, a stronger disturbance signal Sdist, respectively noise, is to be expected from the switching process.
Of course, if required, the intermediate-frequency signal SIF, which is time-expanded relative to the sum signal STX+SRX by a transformation factor KT, is also pre-amplified in suitable manner by a signal amplifier 11 and can, thus, be matched as regards its signal curve and signal strength P to subsequent control (open- or closed-loop) units 7 and/or evaluating units 6.
For operating the transmitting/receiving unit 2 and for producing the measured value of the fill level M from the intermediate-frequency signal SIF, the measuring device 16 further includes an evaluating unit 6, which likewise can be accommodated in the digital processing unit 5 of the measuring electronics 1, as shown in
The above-described frequency difference fdiff, which results from the difference of the pulse repetition frequency fPRF and the sampling frequency fsampl, is ascertained in
An example of such a digital, phase-coupled control circuit is a phase locked loop, or PLL, whose e.g. free-running, voltage-controlled oscillator (VCO) is divided down by a most-often adjustable divider to a fixed, first, comparison frequency. The phase difference between the first comparison frequency derived from the VCO and a second, most-often quartz-controlled, highly constant comparison frequency, which e.g. also can be transmitted via the control line, or bus, 27, and produced and impressed by the digital processing unit 5, is ascertained in a phase comparator and fed back to the free-running voltage-controlled oscillator as control voltage. In this way, the frequency of the free-running voltage-controlled oscillator is controlled accurately to the whole-numbered multiple of the second, highly constant, comparison frequency set in the divider. These PLL components have only the disadvantage that their current consumption is very high, so that they cannot be used for a low energy, two-conductor device.
The D/A converter, respectively A/D converter, 15 in
As evident in
Before the analog-digital conversion, for this purpose, the measuring signals S, e.g. filtered, intermediate-frequency signal SfilterIF, difference signal Sdiff, having the corresponding frequency values, e.g. intermediate-frequency fIF, frequency difference fdiff, are fed to the control unit 7, as shown schematically in
For the case in which the utilized A/D converter 15 is provided for converting exclusively positive signal input values, a reference voltage of the A/D converter 15 is to be correspondingly so set, for example, that an expected, minimum signal input value of the A/D converter 15, e.g. the filtered intermediate-frequency signal SfilterIF, sets at least one bit, especially the highest significant bit (MSB).
The transmission clock oscillators 21 and/or for the sampling clock oscillators 22 can, as shown explicitly in
The individual regions of the measuring electronics 1, such as transmitting-receiving unit with e.g. HF-circuit portion 28 and LF-circuit portion 29, digital processing unit 5, and their individual branches and components from
The mirror frequency fmir is that frequency, which, mixed with the sampling frequency fsampl, produces the same intermediate-frequency fIF on the output of the mixer 13, 24, as is produced with the pulse repetition frequency fPRF. The narrow-band bandpass 10 with bandwidth of, for example, B=5 . . . 20 kHz is used for filtering the lower frequency portions of the noise signal, or disturbance signal, Sdist out of the remaining measuring signal S. Bandpass 10 must, therefore, be embodied with components of an appropriate quality. The intermediate-frequency signal SIF is, according to the invention, so matched to this bandpass 10, that the intermediate-frequency fIF and the center frequency fcen of the bandpass 10 are the same. The disturbance signals Sdist are influenced and produced, for example, also by the noise behavior of the sampling mixer 24 or also, especially, by the high noise signal of the sampling switch 25. Yet other signal portions and harmonic frequencies of the above-described signal portions can be contained in this spectrum, but these need not be discussed further in this context.
Number | Date | Country | Kind |
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10 2005 021 358.8 | May 2005 | DE | national |
Filing Document | Filing Date | Country | Kind | 371c Date |
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PCT/EP2006/061735 | 4/21/2006 | WO | 00 | 1/14/2009 |