Information
-
Patent Grant
-
6276981
-
Patent Number
6,276,981
-
Date Filed
Tuesday, April 4, 200024 years ago
-
Date Issued
Tuesday, August 21, 200123 years ago
-
Inventors
-
Original Assignees
-
Examiners
Agents
- Hayes, Soloway, Hennessey, Grossman & Hage, PC
-
CPC
-
US Classifications
Field of Search
-
International Classifications
-
Abstract
The invention involves the making of a group of apertures spaced in a precise manner on a structure and including, for example, a first aperture made in a first layer and a second aperture made in a second layer which covers the first layer, the first aperture being located within the second aperture. This involves:applying a first layer (41) of photosensitive resin,the etching of this resin layer by photolithography, by means of a single template, to leave a spot of resin (42) per group of apertures on the first layer (41), the exterior limits of the resin spot corresponding to the second aperture, and with the resin spot including an aperture (43) corresponding to the first aperture,vacuum application on the first layer (41) and on the remaining resin of material (44) which will make up the second layer, this application being done so that the part (45) of the first layer located at the bottom of the aperture (43) of the resin spot (42) is not covered by this deposit,the etching of the first layer (41) from the aperture (43) of the spot (42) to obtain the first aperture (46) in the first layer,elimination of the remaining resin and material covering it to obtain the second aperture in the second layer.
Description
FIELD OF THE INVENTION
This invention involves a process for making at least one group of apertures spaced in a precise manner on a structure by photolithography, this group of apertures including a first aperture or apertures made in a first layer of material and a second aperture made in a second layer of material which covers the first layer of material, the first aperture or apertures being located within the second aperture. It involves in particular the making of a auto-aligned focusing grid for a flat micropoint screen.
STATE OF THE ART
Documents FR-A-2 593 953 and FR-A-2 623 013 disclose devices for visualisation by cathodoluminescence excited by field emission. These devices include a micropoint emitting cathode electron source.
By way of illustration,
FIG. 1
is a cross section view of such a micropoint viewing screen. The screen is composed of a cathode
1
, which is a plane structure, oriented with respect to another plane structure which forms the anode
2
. The cathode
1
and the anode
2
are separated by a space in which a vacuum has been created. The cathode
1
includes a glass substrate
11
on which the conductor level
12
has been applied in contact with the electron emitting points
13
. The conductor level
12
is covered with a layer of insulation
14
, made of silica for example, which is itself covered by a conducting layer
15
. Holes
18
of about 1.3 μm in diameter were made through the layers
14
and
15
up to the conducting level
12
to apply the points
13
on this conductor level. The conducting level
15
acts as an extraction grid for the electrons which will be emitted by the points
13
. The anode
2
. includes a transparent substrate
21
covered by a transparent electrode
22
on which luminescent phosphors or luminophores
23
have been deposited.
The operation of this screen will now be described. The anode
2
is brought to a positive voltage of several hundred volts with respect to the points
13
(typically 200 to 500 V). A positive voltage of several dozens of volts (typically 60 to 100 V) with respect to the points
13
is applied to the extraction grid
15
. Electrons are then drawn from the points
13
and are attracted by the anode
2
. The trajectories of the electrons are within a half-angle cone at the peak ⊖, depending on various factors such as the shape of the points
13
. This angle causes a defocusing of the electron beam
31
which increases as the distance between the anode and the cathode is increased. One way to increase the yield of the phosphors, and thus the luminosity of the screens, is to work with higher anode-cathode voltages (between 1,000 and 10,000 V), which implies separating the anode and the cathode further in order to avoid the formation of an electric arc between these two electrodes.
If good resolution on the anode is desired, the electron beam must be refocused. This refocusing is classically obtained with a grid which can either be placed between the anode and the cathode or placed on the cathode.
FIG. 2
illustrates the case where the focusing grid is placed on the cathode.
FIG. 2
repeats the example of
FIG. 1
, but limited to a single micropoint for greater clarity in the drawing. An insulating layer
16
was applied to the extraction grid
15
and bears a metallic layer
17
which acts as a focusing grid. Holes
19
of an appropriate diameter (typically between
8
and 10 ·m) and concentric to holes
18
, were etched in layers
16
and
17
. The insulating layer
16
electrically insulates the extraction grid
15
and the focusing grid
17
. The focusing grid is polarised with respect to the cathode in order to give the electron beam the shape shown in FIG.
2
.
Simulation calculations show that centering of the holes
19
of the focusing grid with respect to the holes
18
of the extraction grid is extremely important. This structure is generally made using the classic photoetching techniques used in microelectronics. For example, with a first level of photoetching, the holes
19
of the focusing grid are defined, then a second level of photoetching is used to make holes
18
in which the points will be placed. To ensure proper functioning, the second level must be positioned in an extremely precise manner with respect to the first level. This can only be done with very high-quality, expensive equipment, a serious drawback if large areas are treated.
SUMMARY OF THE INVENTION
The invention solves the problem of precision alignment of holes located on different levels. This is achieved by a process which requires only a single photolithography step and only one template for two types of patterns: those for the holes on the lower level of lesser diameter and those for the upper level holes of greater diameter. The precision of the relative positioning of the holes is therefore that of the template pattern.
The purpose of the invention is thus the making by photolithography of at least one group of apertures spaced in a precise manner on a structure, this group of apertures including a first aperture or apertures made in a first layer of material and a second aperture made in a second layer of material which covers the first layer of material, the first aperture or apertures being located within the second aperture, characterised in that it includes:
the depositing on the free side of the first layer of material of a photosensitive resin layer of a determined thickness,
the etching of this resin layer by photolithography, by means of a single template, to leave on the aforesaid first layer of the material one spot of resin per group of apertures, the exterior limit of the spot of resin corresponding to the second aperture, the spot of resin including an aperture or apertures corresponding to the first aperture or apertures,
vacuum application, on the first layer and on the remaining resin, of material to form the second layer, this deposit being done so that the part of the first layer located at the bottom of the aperture or apertures of the spot of resin is not covered by this deposit,
the etching of the first layer of material from the aperture or apertures of the spot to obtain the first aperture or apertures in the aforesaid first layer,
elimination of the remaining resin and material from the second layer covering the aforesaid remaining resin to obtain the second aperture in the aforesaid second layer.
The aforesaid group of apertures can include a first aperture which is a circular hole centred in the second aperture which is also a circular hole. It may also include first apertures which are circular holes oriented along the main axis of the second aperture which is a slit.
This process is advantageously applied to manufacturing of a micropoint electron source with an extraction grid and a focusing grid. According to the invention, a manufacturing process for such a source involves:
a step during which are successively applied to one side of an electrically-insulated support: means for cathodic connection, a first layer of electrical insulation of a thickness adapted to the height of the future micropoints, a first conducting layer to form the extraction grid, a second electrically insulating layer of thickness corresponding to the distance which must separate the extraction grid from the focussing grid, and a layer of photosensitive resin of a given thickness,
a step for etching the resin layer by photolithography, by means of a single template, to leave on the aforesaid second insulating layer one spot of resin per aperture of the focussing grid, the exterior limit of the aforesaid spot of resin corresponding to the aforesaid aperture of the focussing grid, the spot of resin including one aperture per aperture of the extraction grid contained in the aforesaid aperture of the focussing grid,
a step for vacuum application on the second insulating layer and on the remaining resin of a material to form the focussing grid, this deposit being made so that the part of the second insulating layer located at the bottom of each aperture of the spot of resin is not covered by this deposit,
a step during which the second insulating layer and the first conducting layer are successively etched from the part of the second insulating layer not covered by the aforesaid deposit to obtain holes in the second insulating layer and the apertures of the extraction grid,
a step for etching of the first insulating layer through the apertures of the extraction grid up to the means of cathodic connection,
a step of lateral etching of the second insulating layer to increase the size of the holes etched previously to a given value, this lateral etching possibly intersecting adjacent holes which are sufficiently close,
a step involving elimination of the remaining resin and the part of the material to make the focussing grid which covers the remaining resin,
a step for making micropoints on the means of cathodic connection through the apertures in the extraction grid.
The means for cathodic connection can be obtained by depositing cathodic conductors on the support, followed by depositing of a resistant layer.
Advantageously, the step for etching the first insulating layer and the step for lateral etching of the second insulating layer are carried out simultaneously and done by isotropic etching.
The remaining resin can be eliminated using the lift-off technique.
BRIEF DESCRIPTION OF DRAWINGS
The invention will be better understood and its. other advantages and characteristics will be clearer with a reading of the following description, which is given as a non-limiting example, accompanied by drawings in appendix among which:
FIG. 1
, already described, illustrates a flat micropoint screen based on the prior art,
FIG. 2
, already described, illustrates a flat micropoint screen with a focussing grid based on the prior art,
FIG. 3
represents, seen from above, a photolithography template used for the carrying out the process according to the present invention,
FIGS. 4
to
6
illustrate the process according to the present invention for which the template of
FIG. 3
is used,
FIGS. 7A
to
7
F illustrate different steps in the manufacturing of a micropoint election source for a flat viewing screen, according to the process of the present invention.
DETAILED DESCRIPTION OF AN EMBODIMENT OF THE INVENTION
FIG. 3
represents, seen from above, a template
3
which can be used for carrying out the process according to the present invention. It includes four identical patterns formed by an interior circle
4
and an exterior circle
5
, the circles
4
and
5
being concentric. The space
6
between the circles
4
and
5
is dark whereas the rest of the template is light.
If a layer of positive resin is insolated, through the template
3
, after development there will only be resin at the places corresponding to the dark parts of the template, i.e. at the places corresponding to the spaces
6
. This is shown by
FIG. 4
which is a perspective and cross-section view of a substrate
40
, covered by a layer
41
of a first material, this layer
41
, supporting spots
42
of resin whose shape corresponds to that of a space
6
on the template. The spots
42
have a thickness corresponding to a layer of resin deposited on the layer
41
. If the diameter of the holes
43
which are central to the spots is d, the distance D separating two successive spots of resin will be chosen greater than 2d.
FIG. 5
is a cross-section view of the structure illustrated by FIG.
4
and on which a layer
44
of material has been deposited by vacuum evaporation, with an incidence greater than an angle · such that tg ·=d/e and by turning the structure around an axis perpendicular to its area. The bottoms
45
of the holes
43
are not covered by the layer
44
. If the layer
41
covered by the resin spots
42
and the layer
44
are etched, only the bottoms
45
of the holes which are not protected will be etched in the prolongation of the holes
43
. The apertures
46
are obtained as indicated by the unbroken lines.
FIG. 6
, which is a perspective and cross-section view, also shows the structure obtained after having eliminated the resin spots. Holes
46
in a layer
41
are thereby obtained which are perfectly centred with the holes
47
of greater diameter made in a layer
44
deposited on the layer
41
.
The process for making a micropoint electron source for a flat viewing screen by the present invention will now be described. This micropoint electron source is designed to have a focussing grid of which the apertures are slits, each slit covering several apertures of the extraction grid. The process will be described in reference to
FIGS. 7A
to
7
F which are cross-section views,
FIG. 7F
also being a perspective view.
On a support
50
composed of a glass chip, a metallic layer is deposited (see
FIG. 7A
) which is etched to make cathodic conductors
51
which are parallel to each other. These cathodic conductors
51
can be used as columns for matrix display for example. A resistant layer
52
is then deposited in a uniform manner. On this resistant layer
52
are successively deposited a first insulating layer
53
, a conducting layer
54
to form the extraction grid for the micropoint electron source, and a second insulating layer
55
. The thickness of the insulating layers
53
and
55
are chosen as a function of the chosen height of the micropoints and the distance which must separate the extraction grid from the focussing grid. A layer of photosensitive resin is then deposited in a uniform manner on the second insulating layer
55
.
The photosensitive resin layer is insolated through a template of which the pattern includes in dark, if the photosensitive resin is a positive resin, the space separating the contour of each aperture of the focussing grid (in the form of a slit in the present case) from the contour of the apertures of the extraction grid corresponding to this grid aperture. With development, only the spots of resin
56
will remain on the insulating layer
55
, each spot
56
being pierced by apertures
57
in the number corresponding to the number of micropoints seen by an aperture of the focussing grid.
The conducting material from which the focussing grid will be formed is then applied by vacuum evaporation (see FIG.
7
B). This evaporation is done with an angle of incidence such that conducting material is only deposited at the bottom of the apertures
57
. A conducting layer
58
is thus obtained on the second insulating layer
55
and a conducting layer
59
on the resin spots
56
with the exception of the bottoms of the apertures
57
. The conducting layer
58
forms the focussing grid. Next comes the anisotrope etching of the second insulating layer
55
from the bottom of the apertures
57
to obtain holes
60
in this layer, in prolongation of the apertures
57
, until they reach the conducting layer
54
(see FIG.
7
C). The conducting layer
54
is then etched to obtain apertures
61
(apertures of the extraction grid), as a prolongation of the apertures
57
and the holes
60
, until they reach the first insulating layer
53
.
The first insulating layer
53
is then etched from the apertures
57
, holes
60
and apertures
61
. One cavity
62
per aperture
61
of the extraction grid is obtained on anisotropic etching. This cavity
62
has as its base the resistant layer
52
which is not attacked (see FIG.
7
D). By the same etching, the second insulating layer
55
can also be laterally attacked from the walls of the holes
60
(see
FIG. 7C
) to obtain enlarged holes
63
. This is possible if the two insulating layers are made of the same material. The etching is done until intersecting holes
63
are obtained.
FIG. 7E
shows the structure obtained after dissolution of the spots of resin and the conducting layer which covered them. The focussing grid
58
with apertures or slits
64
remains on the surface of the second insulating layer
55
.
The micropoints are then applied through the apertures of the extraction grill in the usual manner.
FIG. 7F
shows several micropoints
65
, each centred in its corresponding aperture
61
of the extraction grid, the axes of the apertures
61
for a given slit
64
being strictly aligned with the main axis of the slit.
Claims
- 1. Process for making by photolithoghraphy at least one group of apertures spaced in a precise manner on a structure, this group of apertures including a first aperture or apertures made in a first layer of material and a second aperture made in a second layer of material which covers the first layer of material, the first aperture or apertures being located within the second aperture, involving:applying on a free side of the first layer of material a layer of photosensitive resin of a determined thickness, the etching of this resin layer by photolithography, by means of a single template, to leave on the aforesaid first layer of material a spot of resin per group of apertures, the exterior limit of the spot of resin corresponding to the second aperture, the spot of resin including an aperture or apertures corresponding to the first aperture or apertures, vacuum application, on the first layer and on the remaining resin, of material to form the second layer, this deposit being done so that the part of the first layer located at the bottom of the aperture or apertures of the spot of resin is not covered by this deposit, the etching of the first layer of material from the aperture or apertures of the spot to obtain the first aperture or apertures in the aforesaid first layer, elimination of the remaining resin and material from the second layer covering the aforesaid remaining resin to obtain the second aperture in the aforesaid second layer.
- 2. Process according to claim 1, wherein the aforesaid group of apertures includes a first aperture which is a circular hole centered in the second aperture which is also a circular hole.
- 3. Process according to claim 1, wherein the aforesaid group of apertures includes first apertures which are circular holes oriented on the main axis of the second aperture which is a slit.
- 4. Process for manufacturing a micropoint electron source with an extraction grid and focussing grid, including:a step during which are successively applied to one side of an electrically-insulated support: means for cathodic connection, a first layer of electrical insulation of a thickness adapted to the height of the future micropoints, a first conducting layer to form the extraction grid, a second electrically insulating layer of thickness corresponding to the distance which must separate the extraction grid from the focussing grid, and a layer of photosensitive resin of a given thickness, a step for etching the resin layer by photolithography, by means of a single template, to leave on the aforesaid second insulating layer one spot of resin per aperture of the focussing grid, the exterior limit of the aforesaid spot of resin corresponding to the aforesaid aperture of the focussing grid, the spot of resin including one aperture per aperture of the extraction grid contained in the aforesaid aperture of the focussing grid, a step for vacuum application on the second insulating layer and on the remaining resin of a material to form the focussing grid, this deposit being made so that the part of the second insulating layer located at the bottom of each aperture of the spot of resin is not covered by this deposit, a step during which the second insulating layer and the first conducting layer are successively etched from the part of the second insulating layer not covered by the aforesaid deposit to obtain holes in the second insulating layer and the apertures of the extraction grid, a step for etching of the first insulating layer through the apertures of the extraction grid up to the means of cathodic connection, a step of lateral etching of the second insulating layer to increase the size of the holes etched previously to a given value, this lateral etching possibly intersecting adjacent holes which are sufficiently close, a step involving elimination of the remaining resin and the part of the material to make the focussing grid which covers the remaining resin, a step for making micropoints on the means of cathodic connection through the apertures in the extraction grid.
- 5. Process according to claim 4, wherein the means of cathodic connection are obtained by depositing cathodic conductors on the support, followed by depositing of a resistant layer.
- 6. Process according to claim 4, wherein the step for etching of the first insulating layer and the step for lateral etching of the second insulating layer are done simultaneously and by isotropic etching.
- 7. Process according to claim 4, wherein the elimination of the remaining resin is done by the lift-off technique.
Priority Claims (1)
Number |
Date |
Country |
Kind |
98 06608 |
May 1998 |
FR |
|
PCT Information
Filing Document |
Filing Date |
Country |
Kind |
102e Date |
371c Date |
PCT/FR99/01219 |
|
WO |
00 |
4/4/2000 |
4/4/2000 |
Publishing Document |
Publishing Date |
Country |
Kind |
WO99/62094 |
12/2/1999 |
WO |
A |
US Referenced Citations (4)
Number |
Name |
Date |
Kind |
4857161 |
Borel et al. |
Aug 1989 |
|
4940916 |
Borel et al. |
Jul 1990 |
|
5981304 |
Perrin et al. |
Nov 1999 |
|
6045426 |
Wang et al. |
Apr 2000 |
|
Foreign Referenced Citations (4)
Number |
Date |
Country |
0834897 |
Apr 1998 |
EP |
7029484 |
Jan 1995 |
JP |
7085779 |
Mar 1995 |
JP |
9747021 |
Dec 1997 |
WO |