Number | Date | Country | Kind |
---|---|---|---|
98 14404 | Nov 1998 | FR |
Filing Document | Filing Date | Country | Kind |
---|---|---|---|
PCT/FR99/02804 | WO | 00 |
Publishing Document | Publishing Date | Country | Kind |
---|---|---|---|
WO00/30086 | 5/25/2000 | WO | A |
Number | Name | Date | Kind |
---|---|---|---|
5623472 | Bakx et al. | Apr 1997 | A |
5635267 | Yamada et al. | Jun 1997 | A |
5870338 | Casper | Feb 1999 | A |
5985404 | Yano et al. | Nov 1999 | A |
6078471 | Fiske | Jun 2000 | A |
Entry |
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206.4 “Electric field Gradient Detection—Theory”, Support Note No. 206, (p. 16). |
206.4.4, “Surface Potential Detection—Theory”, Support Note, No. 206, (p. 31). |
Fujiwara, et al., “High Density Storage Memory with Scanning Probe Microscopy”, Part 1, No. 5A, May 1996, (pp. 2764-2766). |
Ohgami, et al., “Determination of Sign of Surface Charges of Ferroelectric TGS Using Electrostatic Force Microscope Combined with the Voltage Modulation Technique”, Part 1, No. 5A, May 1996, (pp. 2734-2735). |