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199 01 206 | Jan 1999 | DE |
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196 12 407 A1 | Nov 1996 | DE |
198 38 861 A1 | Mar 2000 | DE |
Entry |
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John R. Day; “A Fault-Driven Comprehensive Redundancy Algorithm”, International Test Conference 1984, XP-000744056, pp. 35-44. |
Fabrizio Lombardi et al.: “Approaches For The Repair of VLSI/WSI RRAMs By Row/Column Deletion”, XP-000619023. |