Number | Name | Date | Kind |
---|---|---|---|
3580065 | Strittmater et al. | May 1971 | |
3788135 | Hammond, Jr. | Jan 1974 | |
4153496 | Swift | May 1979 | |
4246058 | Reed | Jan 1981 | |
4328057 | Gutow | May 1982 | |
4501154 | Mori | Feb 1985 | |
4612805 | Bruce et al. | Sep 1986 | |
4893503 | Kimura et al. | Jan 1990 | |
4899581 | Allen et al. | Feb 1990 | |
4957004 | McKinlay et al. | Sep 1990 | |
4958521 | Morimoto et al. | Sep 1990 | |
5331858 | Theller | Jul 1994 | |
5404751 | Beran et al. | Apr 1995 | |
5696327 | Huang et al. | Dec 1997 | |
5700564 | Freedman | Dec 1997 |
Entry |
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http://www.stablemicrosystems.com/ pp. 1,4-8, 11,27-28 of enclosure, 1996. |
Chuang et al., Adhesive Age, Sep. 1997, pp. 18-23, "Avery Adhesive Test Yields More Performance Data Than Traditional Probe". |