Patent Application
20250078746
The present disclosure relates to the field of displaying technologies, and more particularly, to a method and apparatus for sensing pixel internal data in a display device, the display device and a computer storage medium.
To achieve better display effects or additional application functions, some display apparatuses are equipped with sensors or similar structures inside a pixel unit, and an external circuit reads and processes sensing signals through a sensing signal line disposed between the pixel units to realize the sensing of pixel internal data such as temperature, pressure, light intensity and threshold voltage inside the pixel units.
Embodiments of the present disclosure provide a method and apparatus for sensing pixel internal data in a display device, the display device, and a computer storage medium.
Some embodiments of the present disclosure provide a method for sensing pixel internal data in a display device, the display device including a plurality of pixel units and a plurality of sensing signal lines, the plurality of pixel units being arranged in multiple lines and multiple columns, and each sensing signal line being connected to at least three pixel units in a column of pixel units corresponding to the sensing signal line; the methods includes:
In some embodiments, prior to sensing the pixel internal data for each line of pixel units, the method further includes:
In some embodiments, the determining, based on the number of the suspected abnormal pixel units of each column sequence number in the at least three lines of pixel units, whether the sensing signal line corresponding to the column sequence number is the abnormal sensing signal line includes:
In some embodiments, the determining, based on the number of the suspected abnormal pixel units of each column sequence number in the at least three lines of pixel units, whether the sensing signal line corresponding to the column sequence number is the abnormal sensing signal line further includes:
In some embodiments, the display device further includes an internal memory and an external memory. The method further includes:
In some embodiments, the abnormality determination condition includes at least one of the following conditions:
In some embodiments, each of the sensing signal lines has a one-to-one correspondence with a column of the plurality of pixel units; and the number of the suspected abnormal pixel units of a column sequence number corresponding to the abnormal sensing signal line among at least three lines of pixel units is not less than 2.
In some embodiments, the replacing the pixel internal data of the column of pixel units corresponding to each abnormal sensing signal line with the pixel internal data of at least one column of pixel units adjacent to the abnormal sensing signal line during the at least one full-screen sensing process includes:
In some embodiments, the replacing the pixel internal data of the column of pixel units corresponding to each abnormal sensing signal line with the pixel internal data of at least one column of pixel units adjacent to the abnormal sensing signal line during the at least one full-screen sensing process includes:
In some embodiments, the pixel internal data includes at least one of temperature, pressure, voltage, current, and light intensity.
In some embodiments, the pixel internal data includes data of a threshold voltage of a transistor inside the pixel unit.
In some embodiments, the abnormality determination condition for the suspected abnormal pixel unit includes: a difference between a value of pixel internal data of a current pixel unit and a value of pixel internal data of a pixel unit in a column previous to the current pixel unit is greater than an upper limit value, and a difference between the value of the pixel internal data of the current pixel unit and a value of pixel internal data of a pixel unit in a column next to the current pixel unit is greater than the upper limit value, the upper limit value being equal to one-fourth of a theoretical maximum value of the pixel internal data.
Some embodiments of the present disclosure provide a display device. The display device includes a processor, a memory, a plurality of pixel units and a plurality of sensing signal lines, the plurality of pixel units being arranged in multiple lines and multiple columns, and each of the sensing signal lines being connected to at least three pixel units in a column of pixel units corresponding to the sensing signal line; and the memory is configured to store at least one instruction, at least one program, a code set, or an instruction set therein, and the at least one instruction, the at least one program, the code set or the instruction set, when loaded and executed by the processor, causes the processor to perform any of the above methods for sensing the pixel internal data in the display device.
Some embodiments of the present disclosure provide a non-transitory computer storage medium, the non-transitory computer storage medium being configured to store at least one instruction, at least one program, a code set or an instruction set therein, wherein the at least one instruction, the at least one program, the code set or the instruction set, when loaded and executed by a processor, causes the processor to perform any of the above methods for the sensing pixel internal data in the display device.
To describe the technical solutions of the embodiments of the present disclosure more clearly, the following briefly introduces the accompanying drawings required for describing the embodiments. Apparently, the accompanying drawings in the following description show only some embodiments of the present disclosure, and a person of ordinary skill in the art may still derive other drawings from these accompanying drawings without creative efforts.
Through the above drawings, the specific embodiments of the present disclosure have been shown, which will be described in more detail later. These drawings and text descriptions are not intended to limit the scope of the concept of the present disclosure in any way, but to explain the concept of the present disclosure for those skilled in the art by referring to the specific embodiments.
To make the objectives, technical solutions, and advantages of the present disclosure clearer, the following further describes implementations of the present disclosure in detail with reference to the accompanying drawings.
In some practices, since a plurality of pixel units arranged in the array output the sensing signals through the same sensing signal line, the internal fault of a single pixel unit may not only lead to the abnormality of sensing signals outputted by itself, but also make the pixel units connected to the same sensing signal line unable to output the sensing signals normally, resulting in a serious fault generally known as “undesirable longitudinal line” or “undesirable point and strip line”.
Taking the display device shown in
In view of the above problems, some embodiments of the present disclosure provide a method for sensing pixel internal data in the display device, which can facilitate mitigating or eliminating the undesirable phenomenon caused by the output of abnormal pixel internal data from the entire column when the fault occurs.
In step 101, pixel internal data is sensed for each of at least three lines of pixel units to determine column sequence numbers of suspected abnormal pixel units in the line of pixel units.
The at least three lines of pixel units are preset in multiple lines of pixel units or randomly selected before or during the step 101, the number of which is set in advance according to the required fault column detection accuracy and processing time. The specific number is, for example, 3 lines, 4 lines, 5 lines, 6 lines, 7 lines, 8 lines, 9 lines, 10 lines or more. The suspected abnormal pixel units are pixel units in which the pixel internal data as sensed meets an abnormality determination condition. The abnormality determination condition is one or more conditions for determining whether the pixel internal data as sensed is within a normal range, and is set according to empirical or experimental data.
In step 102, whether a sensing signal line corresponding to the column sequence number is an abnormal sensing signal line is determined based on a number of the suspected abnormal pixel units of each of the column sequence numbers in the at least three lines of pixel units. The number of suspected abnormal pixel units of the column sequence number corresponding to the abnormal sensing signal line is preset, such as 2, 3, 4, 5, or more. In some embodiments, the at least three pixel units are adjacent to each other.
In step 103, in the case that there is at least one of the abnormal sensing signal lines, the pixel internal data of a column of pixel units corresponding to each of the abnormal sensing signal lines is replaced with the pixel internal data of at least one adjacent column of pixel units during at least one full-screen sensing process.
In one example, for the fault case in which the sensing signal line S1 in
It can be seen from the embodiments of the present disclosure that, by sensing the pixel internal data for a few lines of pixel units, the suspected abnormal pixel unit in which the pixel internal data meets the abnormality determination condition is determined. Based on the number of suspected abnormal pixel units in the same column, whether a fault has occurred to cause the entire column of pixel units to output abnormal pixel internal data is determined. In the case that the fault has occurred, the sensing signal line of the fault column is determined as the abnormal sensing signal line, and the pixel internal data of the pixel unit in the fault column is replaced by the pixel internal data of the adjacent column of pixel units each time all pixel units are sensed. That is, the fault column is detected and shielded in the display device, which can facilitate mitigating or eliminating the undesirable phenomenon caused by the abnormal pixel internal data outputted from the entire column when the fault occurs, and also facilitate improving the performance and reliability of the display device.
In some examples, in order not to solidify the data of the abnormal sensing signal line (for example, the pixel internal data of the pixel units in the left column or the right column is used for replacement in each full-screen sensing process, which is easy to lead to the data solidification of the abnormal sensing signal line), during the odd-numbered full-screen sensing, the pixel internal data corresponding to the abnormal sensing signal line is replaced with normal data of a column of pixel units on the left side of the abnormal sensing signal line; and during the even-numbered full-screen sensing, the pixel internal data corresponding to the abnormal sensing signal line is replaced with normal data of a column of pixel units on the right side of the abnormal sensing signal line. Alternatively, during the odd-numbered full-screen sensing, the pixel internal data corresponding to the abnormal sensing signal line is replaced with normal data of a column of pixel units on the right side of the abnormal sensing signal line; and during the even-numbered full-screen sensing, the pixel internal data corresponding to the abnormal sensing signal line is replaced with normal data of a column of pixel units on the left side of the abnormal sensing signal line.
In some examples, in order not to solidify the data of the abnormal sensing signal line (for example, the pixel internal data of the pixel units in the left column or the right column is used for replacement in each full-screen sensing process, which is easy to lead to the data solidification of the abnormal sensing signal line), during the odd-numbered full-screen sensing, the pixel internal data corresponding to the abnormal sensing signal line is replaced with normal data of a column of pixel units on the left side or right side of the abnormal sensing signal line; and during the even-numbered full-screen sensing, the pixel internal data corresponding to the abnormal sensing signal line is replaced with the average value of the pixel internal data of a column of pixel units on the left side and the pixel internal data of a column of pixel units on the right side of the abnormal sensing signal line as normal data. Alternatively, during the odd-numbered full-screen sensing, the pixel internal data corresponding to the abnormal sensing signal line is replaced with the average value of the pixel internal data of a column of pixel units on the left side of the abnormal sensing signal line and the pixel internal data of a column of pixel units on the right side of the abnormal sensing signal line as normal data; and during the even-numbered full-screen sensing, the pixel internal data corresponding to the abnormal sensing signal line is replaced with normal data of a column of pixel units on the left side or right side of the abnormal sensing signal line.
In some examples, if the number of detection lines for sensing the pixel internal data of the pixel units is N lines, and N is greater than or equal to 3 (for example, the number of detection lines is 10 lines, N=10), three line sequence numbers in the same column are selected for making determination, and whether a fault has occurred to cause the entire column of pixel units to output abnormal pixel internal data is further determined in consideration of detecting whether the sensing signal lines of the three line sequence numbers in the same column are abnormal. For example, the pixel unit lines corresponding to the three line sequence numbers in the same column are the first, last, and intermediate lines of a selected N-line square matrix. Assuming N=7, lines 1, 4, and 7 in the first column are selected. Assuming N=8, lines 1, 4, or 5, and 8 in the first column are selected. It should be noted that with respect to the display device to which the method in the embodiments of the present disclosure applies, the pixel unit in some examples is a unit including a monochrome sub-pixel, and in other examples is a pixel unit including a plurality of sub-pixels of different colors. Moreover, in consideration of the specific application requirements, the display device may not need to sense the pixel internal data for each of the pixel units in multiple lines and multiple columns (for example, pixel internal data such as temperature and light intensity is sensed by a pixel unit representing a small display area centered on this pixel unit, and only this pixel unit in the display area is connected with a sensing signal line). At this time, the method in the embodiments of the present disclosure is used only by meeting the following condition: each sensing signal line is connected to at least three pixel units in the corresponding column of pixel units (i.e., the number of pixel units connected to the sensing signal line needs to be not less than the number of lines of pixel units detected in step 101 and step 102 above). In some examples, each sensing signal line has a one-to-one correspondence relationship with a column of the plurality of pixel units, that is, each sensing signal line only corresponds to a column of pixel units and is not connected across columns.
It should also be noted that the method in the embodiments of the present disclosure is used to detect a fault case in which a whole column of pixel units fails to normally provide pixel internal data (i.e., the sensing signal line corresponding to the foregoing column sequence number is the abnormal sensing signal line, and it should be understood that there are many possible factors that cause this phenomenon, and not necessarily a short-circuit or open-circuit abnormality of the sensing signal line itself), and to mitigate or eliminate the undesirable phenomena caused by the fault, wherein the above steps 101 and 102 achieve once detection of abnormal sensing signal lines, and the above step 103 shields the abnormal sensing signal lines according to the detection results when the fault occurs. It should be understood that the detection operation for the abnormal sensing signal line is repeated many times with the change of the working state of the display device to continuously update the detection results, so as to determine the abnormal sensing signal line to be shielded during each full-screen sensing process. It should also be understood that the abnormality determination condition and a determination standard of the abnormal sensing signal line used in the detection of the abnormal sensing signal line implemented in steps 101 and 102 above are set by a technician according to the types and characteristics of actual pixel internal data and the experimental measurement in combination with actual application requirements, thereby implementing a detection process that meets the requirements.
In one example, the internal pixel data is data of a threshold voltage of a transistor inside the pixel unit. The abnormality determination condition for the suspected abnormal pixel unit is set as “a difference between the value of the pixel internal data of the current pixel unit and the value of the pixel internal data of the pixel unit in the previous column and the difference between the value of the pixel internal data of the current pixel unit and the value of the pixel internal data of the pixel unit in the next column both are greater than an upper limit value, the upper limit value being equal to one-fourth of a theoretical maximum value of the pixel internal data” (for example, if the threshold voltage of a type of transistor, i.e., the theoretical maximum value of the pixel internal data is 1500 mV, the upper limit value is equal to 1500/4=375 mV). In addition, pixel internal data of four lines of pixel units with line sequence numbers equal to ⅛, ⅜, ⅝, and ⅞ of the total number of lines respectively (for example, for a display device with a resolution of 2560*1600, the total number of lines is 2560, and the above four lines of pixel units are pixel units in lines 320, 960, 1600 and 2240) is sensed. The sensing signal lines with three or more suspected abnormal pixel units of the corresponding column sequence number in the four lines are determined as the above abnormal sensing signal lines. After experimental measurements, the above configuration has a shorter detection time under the premise of meeting the application requirements in terms of detection accuracy. In addition, compared with the determination method, e.g., “the sensing signal line in which all pixel units are suspected abnormal pixel units of the corresponding column sequence numbers in the four lines is determined as the above abnormal sensing signal line”, the above determination method can reduce the adverse impact of other faults or one-line pixel unit determination errors on the determination process, thereby facilitating improving the accuracy of detection.
Taking the above abnormality determination condition as an example, in other examples, the abnormality determination conditions further includes any of one or more conditions: a value of the pixel internal data of the pixel unit is greater than a set upper limit value (e.g., the above theoretical maximum of 1500 mV); the value of the pixel internal data of the pixel unit is less than a set lower limit value (the lower limit value is, for example, 1 mV, that is, the pixel internal data equal to zero is regarded as a suspected abnormality); the value of the pixel internal data of the pixel unit exceeds a set value range (the value range is, for example, 1-1500 mV); a difference between the value of the pixel internal data of the pixel unit and the value of the pixel internal data of the column of pixel units previous to the current column is greater than a set value (the set value is, for example, 375 mV above); a difference between the value of the pixel internal data of the pixel unit and the value of the pixel internal data of the column of pixel units next to the current column is greater than a set value (the set value is, for example, 375 mV above); and a difference between the value of the pixel internal data of the pixel unit and the value of history pixel internal data of this pixel unit is greater than a set value (the set value is, for example, 375 mV above). It should be understood that more complex abnormality determination conditions can more accurately determine the suspected abnormal pixel units, while simpler abnormality determination conditions can shorten the processing time of detection.
Referring to
In step 401, the detection result of the abnormal sensing signal line stored in the external memory is read into the internal memory of the display device each time the display device is switched on.
Taking the structure shown in
In step 402, after each detection operation to detect whether an abnormal sensing signal line is present in a plurality of sensing signal lines has been completed, the detection result is updated and stored in the internal memory and the external memory.
Based on an instruction, a program, or a code set stored in the external memory 13, the processor 11 of the display device can start to perform the detection operation to detect whether an abnormal sensing signal line is present in the sensing signal lines as triggered by a user instruction, a timer or other trigger conditions; and after the detection operation has been completed, the detection result is updated and stored in the internal memory 12 and the external memory 13. The specific execution method of the detection operation may refer to the examples described previously or later, and is not repeated here.
In step 403, in at least one full-screen sensing process, data in the internal memory is read to determine whether the abnormal sensing signal line is present; and in the presence of at least one abnormal sensing signal line, pixel internal data of a column of pixel units corresponding to each abnormal sensing signal line is replaced with pixel internal data of at least one column of pixel units adjacent to the abnormal sensing signal line.
Based on the instruction, program or code set stored in the external memory 13, the processor 11 of the display device can periodically perform an operation corresponding to the above full-screen sensing process in a plurality of consecutive display cycles (e.g., threshold voltage data of the pixel internal data is subjected to once full-screen sensing within a fixed period of time in each display frame), to acquire the pixel internal data of each pixel unit connected to the sensing signal line, thereby achieving the functions such as temperature compensation, ambient light compensation, pressure sensing, and threshold voltage compensation. In this process, based on the instruction, program, or code set stored in the external memory 13, the processor 11, in response to determining the presence of at least one abnormal sensing signal line based on the detection results stored in the internal memory 12, performs a shielding operation for the abnormal sensing signal line. In one example, the processor 11 directly replaces pixel internal data of pixel units of a fault column with pixel internal data of a column of pixel units on the left side (i.e., when a column sequence number Lx of the fault column is greater than 1, pixel internal data of a pixel unit with a column sequence number Lx−1 is used for replacement, while when the fault column sequence number Lx is 1, pixel internal data of a pixel unit with a column sequence number of 2 is used for replacement). In yet another example, the processor 11 replaces pixel internal data of pixel units of a fault column with an average value of pixel internal data of pixel units of the left column and of pixel internal data of pixel units of the right column (i.e., except for the first column and the last column, pixel internal data of pixel units with a column sequence number Lx is replaced with an average value of pixel internal data of a pixel unit with a column sequence number of Lx−1 and of pixel internal data of a pixel unit with a column sequence number of Lx+1). It should be understood that the above examples are a possible implementation of step 103 described above. It can be seen that the mode of directly replacing with another column is faster in processing speed, while the mode of averaging can get more reliable replacement results.
Further, unlike the example of
In step 501, p line sequence numbers are randomly selected.
In one example, for an 8K display device (with a resolution of 4320*7680), step 501 includes: randomly selecting p line sequence numbers from a range of 1 to 7680 (p is a preset parameter and is an integer not less than 3) for detecting whether a sensing signal line corresponding to each column sequence number is an abnormal sensing signal line. Compared with such fixed and equidistant selection method in which line sequence numbers equal to ⅛, ⅜, ⅝, and ⅞ of the total number of lines are, for example, selected, the random selection can avoid the adverse effects of accidental factors on the accuracy of the detection results, and also avoid a situation that the fault of the second gate line in the fixed selected pixel line causes the detection operation to not be carried out normally.
In step 502, pixel internal data of a line of pixel units corresponding to the next line sequence number is sensed.
As shown in
In step 503, within a range of the column sequence numbers whose detection results are not determined, column sequence numbers of suspected abnormal pixel units among the pixel units of the current line is determined.
In one example, the processor 11 creates a data table or array in the internal memory 12, for recording whether the detection result of each column sequence number has been determined. In the initial state, the detection result of each column sequence number is not determined, so the processor 11 performs a process of determining whether the pixel internal data acquired in step the 502 meets the above abnormality determination condition in step 503, to determine the column sequence numbers of the suspected abnormal pixel units among the pixel units of the current line. In the case that the detection results of some column sequence numbers have been determined, the processor 11 skips the judgment of whether the pixel internal data corresponding to these column sequence numbers meet the above abnormality determination condition, thereby saving the processing time and computing resources.
In step 504, if a column sequence number appears in a set of column sequence numbers of suspected abnormal pixel units in the current line consecutively for m times, the detection result of this column sequence number is determined to be abnormal.
m is a preset parameter and is an integer not less than 2. In order to avoid excessive occupancy of system resources caused by too slow detection operation processing speed when the number of selected p lines is too large, the method shown in
In step 505, if a column sequence number does not appear in a set of column sequence numbers of suspected abnormal pixel units in the current line consecutively for n times, the detection result of this column sequence number is determined to be normal.
n is a preset parameter and is an integer not less than 3. In one example, when a column sequence number does not appear in the cycle of steps 502 to 508 consecutively for n times in the column sequence numbers of the suspected abnormal pixel units determined in the step 503, the processor 11 records in the data table or array in the internal memory 12 in the current step 505 that the detection result corresponding to this column sequence number has been determined to be “normal”. That is, it is unnecessary to wait for the detection result of this column sequence number in each next line of pixel units, but the sensing signal line corresponding to this column sequence number is determined in advance to be not an abnormal sensing signal line, without performing the separate operation to determine whether the sensing signal line corresponding to this column sequence number is the abnormal sensing signal line.
In 506, if a column sequence number appears in a set of column sequence numbers of suspected abnormal pixel units in the current line accumulatively for x times, the detection result of this column sequence number is determined to be abnormal.
x is a preset parameter and is an integer not less than 2. In one example, when a column sequence number appears in the cycle of steps 502 to 508 accumulatively for x times in the column sequence numbers of the suspected abnormal pixel units determined in the step 503, the processor 11 records in the data table or array in the internal memory 12 in the current step 506 that the detection result corresponding to this column sequence number has been determined to be “abnormal”. That is, it is unnecessary to wait for the detection result of this column sequence number of each next line of pixel units, but the sensing signal line corresponding to this column sequence number is determined in advance as the abnormal sensing signal line, without performing the separate operation to determine whether the sensing signal line corresponding to the column sequence number is the abnormal sensing signal line.
In 507, if a column sequence number does not appear in a set of column sequence numbers of suspected abnormal pixel units in the current line accumulatively for y times, the detection result of this column sequence number is determined to be normal.
The y is equal to p minus the x plus 1. In one example, when a column sequence number does not appear in the cycle of steps 502 to 508 accumulatively for y times in the column sequence numbers of the suspected abnormal pixel units determined in the step 503, the processor 11 records in the data table or array in the internal memory 12 in the current step 506 that the detection result corresponding to this column sequence number has been determined to be “normal”. That is, it is unnecessary to wait for the detection result of this column sequence number in each next line of pixel units, but the sensing signal line corresponding to this column sequence number is determined in advance not to be the abnormal sensing signal line, without performing the separate operation to determine whether the sensing signal line corresponding to the column sequence number is the abnormal sensing signal line.
In 508, if the detection results of all column sequence numbers have been determined, this detection operation is ended; otherwise, the process returns to the step 502 for proceeding.
In one example, the processor 11 checks in the step 508 whether there is a column sequence number whose detection result has not been determined according to the data table or array in the internal memory 12; if the column sequence number is present, the process returns to the step 502 to continue the operation corresponding to the next line sequence number; and if the column sequence number is absent, it means that the detection results of all column sequence numbers have been determined, without performing operations corresponding to other line sequence numbers, so this detection operation is ended. In addition, the detection results of this detection operation are generated based on the data table or array in the internal memory 12 to be updated and stored in the external memory 13 and the internal memory 12.
It can be seen that, by setting the determination conditions in the steps 504 to 507 above, the detection operation facilitates reducing the number of line sequence numbers that need to be traversed when the number p of lines is large, thereby reducing the time required for the detection operation and the resources to be occupied, and improving the processing efficiency. In other examples, one or more of the above steps 504 to 507 may be removed as needed, and a similar step corresponding to a determination condition may also be added as needed. In addition, considering the validity of determination, in other examples, the step 504 is performed only when the number of cycles is not less than m−1, the step 505 is performed only when the number of cycles is not less than n−1, the step 506 is performed only when the number of cycles is not less than x−1, and the step 507 is performed only when the number of cycles is not less than y−1. In this way, the number of invalid determinations can be reduced to facilitate improving the processing efficiency.
The following are apparatus embodiments of the present disclosure, which are configured to implement the method embodiments of the present disclosure. For details that are not disclosed in the apparatus embodiments of the present disclosure, please refer to the method embodiments of the present disclosure.
It can be seen from the embodiments of the present disclosure that, by sensing the pixel internal data for a few lines of pixel units, the suspected abnormal pixel unit in which the pixel internal data meets the abnormality determination condition is determined. Based on the number of suspected abnormal pixel units in the same column, whether a fault has occurred to cause the entire column of pixel units to output abnormal pixel internal data is determined. In the case that the fault has occurred, the sensing signal line of the fault column is determined as the abnormal sensing signal line, and the pixel internal data of the pixel unit in the fault column is replaced by the pixel internal data of the adjacent column of pixel units each time all pixel units are sensed. That is, the fault column is detected and shielded in the display device, which can facilitate mitigating or eliminating the undesirable phenomenon caused by the abnormal pixel internal data outputted from the entire column when the fault occurs, and also facilitate improving the performance and reliability of the display device.
In some embodiments, the replacing module 73 is, when there is at least one abnormal sensing signal line, during an odd-numbered full-screen sensing, replace the pixel internal data of the column of pixel units corresponding to each abnormal sensing signal line with pixel internal data of a column of pixel units on a left side of the abnormal sensing signal line; and during an even-numbered full-screen sensing, replace the pixel internal data of the column of pixel units corresponding to each abnormal sensing signal line with pixel internal data of a column of pixel units on a right side of the abnormal sensing signal line; or
In some embodiments, the replacing module is, when there is at least one abnormal sensing signal line, further configured to:
In some embodiments, the apparatus further includes a selecting module (not shown in
In some embodiments, the second detecting module 72 is further configured to:
In some embodiments, the second detecting module 72 is further configured to:
In some embodiments, the apparatus further includes an initializing module (not shown in
In some embodiments, the abnormality determination condition includes at least one of the following conditions:
In some embodiments, the number of the suspected abnormal pixel units of a column sequence number corresponding to the abnormal sensing signal line among at least three lines of pixel units is not less than 2.
In some embodiments, the first detecting module 71 is disposed in the sensing circuit 16, or integrated in the source driver 15; and the replacing module 73 is integrated in the processor 11. The initializing module and the selecting module (not shown) are arranged in the sensing circuit 16, or integrated in the source driver 15 or processor 11.
Some embodiments of the present disclosure further provide a non-transitory computer storage medium, the non-transitory computer storage medium being configured to store at least one instruction, at least one program, a code set or an instruction set therein, wherein the at least one instruction, the at least one program, the code set or the instruction set, when loaded and executed by a processor, causes the processor to perform any of the above methods for sensing the pixel internal data in the display device. The external memory 13 is used as an example of a non-transitory computer storage medium in the embodiments of the present disclosure.
In the present disclosure, the terms “first” and “second” are used for descriptive purposes only and are not to be construed as indicating or implying relative importance. The term “a plurality of” refers to two or more, unless specifically defined otherwise.
In several embodiments provided in the present disclosure, it should be understood that the disclosed apparatus and method may be implemented by other ways. For example, the apparatus embodiments described above are merely schematic. For example, the partitioning of the units can be a logical functional partitioning. There may be other partitioning modes during actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, mutual coupling or direct coupling or communication connection that is shown or discussed can be indirect coupling or communication connection through some interfaces, apparatuses or units, and can be in electrical, mechanical or other forms.
The units described as separate components may or may not be physically separated, and the components for unit description may or may not be physical units, that is, may be located in one place or distributed on a plurality of network units. Part or all of the units can be selected according to actual needs to achieve the objects of the solutions of the embodiments.
It may be understood by a person of ordinary skill in the art that all or part of steps in the above embodiments may be completed by hardware, or a program instructing relevant hardware. The program may be stored in a computer-readable storage medium which includes a read-only memory, a magnetic disk, an optical disc or the like.
The foregoing descriptions are merely optional embodiments of the present disclosure, and are not intended to limit the present disclosure. Within the spirit and principles of the present disclosure, any modifications, equivalent substitutions, improvements, etc., are within the protection scope of the present disclosure.
The present disclosure is a U.S. national stage of international application No. PCT/CN2023/071019, filed on Jan. 6, 2023, the disclosure of which is herein incorporated by reference in its entirety.
| Filing Document | Filing Date | Country | Kind |
|---|---|---|---|
| PCT/CN2023/071019 | 1/6/2023 | WO |
