The present invention generally relates to the field of standardization of input CMY and K values in a clustered environment and, more particularly, to standards which help Digital Front Ends (DFE) in a clustered environment relate CMY and K values to device independent L*a*b* values so a common set of CMYK values are presented to the DFE for multiple underlying print engines in the cluster.
Closed loop controls have been disrupting one industry after another as they become replacements for expensive precision parts or wide windows of latitude product/process design. Generally, they have been expanding their scale from individual subsystems to IOTs to complete production-printing systems. The use of closed loop control technology instead of precision parts or robust open loop system modeling and design captures the Moore's law cost curves of the electronics industry for electromechanical products. Applying distributed controls outside the Input Output Terminals (IOT) for predictable color, rendering all suitably equipped color IOTs “identically” and being able to render printed color over display devices accurately opens color cluster printing as an option to large in line color printers (e.g., xerographic and offset) and distributed printing as a viable alternative to the print and distribute business model of high quality graphic arts.
One of the largest barriers to cluster color printing's applicability is the inconsistency in color output. The gray balance technology (U.S. patent application Ser. No. 09/566291, entitled: “On-line calibration system for a dynamically varying color marking device”) may still not be enough to achieve consistency in a distributed and clustered print environment.
The present invention is directed towards the elimination of such barriers by controlling the printers to have substantially identical output color responses for substantially identical input CMYK values.
The present invention implements a CMYK to CMYK pre-transform in front of at least one printer to be clustered where the transform is designed to ensure that the printers addressed through the pre-transform have substantially identical output color for substantially identical input CMYK values. As one form of implementation a method is disclosed to build CMY to CMY 3D-LUTs and 1D-LUT for K using sensors in the field. Making use of a system LUT—CMY to CMY 3D-LUT and a K to K 1D-LUT—improves consistency and provides a coherent control strategy and a means to provide standardized input CMY and K values in a clustered environment so that single or multiple vendor DFEs see substantially identical CMYK values.
The preferred embodiments and other aspects of the invention will become apparent from the following detailed description of the invention when read in conjunction with the, accompanying drawings which are provided for the purpose of describing embodiments of the invention and not for limiting same, in which:
A method is disclosed to build CMY to CMY 3D-LUTs and 1D-LUT for K using sensors in the field. The present invention implements a CMYK to CMYK pre-transform in front of at least one printer to be clustered where the transform is designed to ensure that the printers addressed through the pre-transform have substantially identical output color for substantially identical input CMYK values. Making use of a system LUT—CMY to CMY 3D-LUT and a K to K 1D-LUT—in front of the gray balanced TRCs improves consistency and advantageously provides a coherent control strategy and a means to provide standardized input CMY and K values in a clustered environment so that single or multiple vendor DFEs see substantially identical CMYK values.
A CMYK to CMYK pre-transform is implemented in front of at least one printer to be clustered where the transform is designed to ensure that printers addressed through the pre-transform have substantially identical output color for substantially identical input CMYK values. Making use of a system LUT—CMYK to CMYK 4D-LUT—in front of the gray balanced TRCs improves consistency and advantageously provides a coherent control strategy and a means to provide input CMY and K values in a clustered environment so that single or multiple vendor DFEs see substantially identical CMYK values. As implemented in accordance with the techniques herein, the present invention help the DFEs in the clustered environment relate particular CMY and K values going into the printers to their device independent L*a*b* values. With this invention in place, DFE vendors can more easily construct 3D/4D profiles, such as ICC profiles, so as to perform color management functions more accurately.
With reference now being made to
With reference now being made to
In accordance with the present invention, construction of the system LUT involves the following steps which can be grouped into two groups; (1) one-time processing steps done at the factory, and (2) implementation of field updates.
A full 3D forward map of the gray balanced printer is first measured by printing test patches, which contain CMY patches with no black (i.e., K set to zero). The output CMY, (i.e., output of the sensor LUT; Lab to CMY LUT), from the sensor is obtained for these test patches. For this example 103 patches have been selected. C, M and Y in the test page are varied between 0 to 100% in 10 steps.
Some K patches by setting C=M=Y=0 in the test target (preferably around 256 patches) are printed and their K values (output of sensor LUT when C=M=Y=0) measured.
Using interpolation routines commonly found in the arts, (trilinear/tetrahedral) up-sample this measured forward map. Up-sampling may not be required depending on how well the printer is linearized with internal process controls and the gray balance system.
A dynamic optimization technique known in the arts is applied to determine critical nodes. These optimal critical nodes will minimize the measurements required for real-time updates (updates in the field). Alternatively sequential linear interpolation techniques described in Sequential Linear Interpolation of Multi-Dimensional Functions, Allebach et al., IEEE Trans on Image Processing, Vol. 6. No. 9, September 1997), incorporated herein by reference be made thereto, can also be applied to determine critical nodes. In that example, 100 critical nodes were identified. The CMY values of these critical nodes become the input patch values for the test target to be used for field updates.
A dynamic optimization technique known in the arts is then applied to generate optimal nodes for creating 1D system LUT for K separation. This is the inverse map of the forward LUT using either an Iteratively Clustered Interpolation Technique, as described in U.S. patent application Ser. No. 09/487,587, entitled: Iteratively clustered interpolation for geometrical interpolation of an irregularly spaced multidimensional color space”, by Yao WANG et al., or a Moving Matrix Algorithm, as described in: Refinement of printer transformations using weighted regression, R. Balasubramanian, Proc. SPIE, Vol 2658, pp. 334-340, (1996) both of which are incorporated herein by reference.
One way of updating the system LUT in the field is by printing and measuring test patches created at all nodes of the system LUT (e.g., uniformly sampled CMY & K values with 103 nodes). In other words, the number of patches required are chosen equal to as many nodes as there are in the system LUT. Depending upon the particular system, these nodes could be many and may become tedious and time consuming to measure and control. Hence, a sub sampled node set is preferred.
A test target with CMYK values of the critical nodes (output CMYK in the critical node LUT) is created using compression algorithms known in the arts.
The sub-sampled CMYK test target (for critical patches) are printed and measured with the sensor and its LUT output (CMY values for CMY patches and K values for K patches).
The up-sampled version of the inverse map is built using trilinear/tetrahedral interpolation and the measured CMYK values for the sub-sampled CMYK test target. In the present instance, the up-sampled inverse map will have an approximate size of 103. This will contain the desired system LUT (CMY to CMY 3D LUT and K to K 1D LUT). This can be referred to as post-processing. This post-processing is performed every time updates are required. One skilled in this art would appreciate the fact that if all nodes are measured and controlled then up-sampling is not required.
Since the system LUT may contain a finite number of nodes, for colors outside these nodes, transformation is preferably achieved by using an interpolator.
The sensor LUT is required to extract CMY and K values from the measured spectra/L*a*b* values of the color patches. It is built preferably using high resolution such as 253 CMY patches and about 1000 K-patches to minimize interpolation errors. CMYK test patch target are first printed and their L*a*b* values on a chosen reference printer are measured. Trilinear or tetrahedral interpolation is used to construct a uniformly sampled input for sensor LUT. Uniform sampling is not required to make this work. The same sensor LUT can be used in all other printers in the cluster. This LUT is treated static in all the print engines as compared to system LUT and hence no further updates are required in the field. Whereas, to keep the colors consistent across host of printers and have the DFEs see substantially identical CMYK values for the clustered printers, the system LUT needs to be constantly updated using control steps shown above.
With reference now being made to
With reference now being made to
By introducing the controls described above other core capabilities of the cluster printing (job splitting, load balancing, auto routing, job integrity etc.,) are not compromised. Dotted line between the controls loops in
Variations among the printers are compensated as control loop updates the system LUT. For instance a common variation seen among printers of the same family is variation in contrast due to different dynamic range of the printers (different Dmax/L*min). The sensors can measure the differences in dynamic range and the CMYK can be normalized to achieve a common dynamic range. Other differences in gamut may also be compensated for and incorporated in the CMYK to CMYK transform.
For an 8 bit system, a CMY to CMY 3D LUT would preferably use a 24-bit system whereas for a CMYK to CMYK 4D LUT would preferably use a 32-bit system. Generally, 17 Cube for 3D/4D LUTs are preferred. When reduced nodes are used in a look up table, a hardware or software interpolator based on trilinear/tetrahedral interpolation methods is preferable.
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