Number | Date | Country | Kind |
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6-257808 | Oct 1994 | JPX |
Number | Name | Date | Kind |
---|---|---|---|
5122985 | Santin | Jun 1992 | |
5313432 | Lin et al. | May 1994 | |
5371706 | Frentz et al. | Dec 1994 |
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P. Cappelletti et al., "CAST: An Electrical Stress Test to Monitor Single Bit Failures in Flash-EEPROM Structures", The 13th Annual IEEE Nonvolatile Simiconductor Memory Workshop, (1994) pp. 1-3. |