| Dual Beam, Second Derivative Tunable Diode Laser Infrared Spectroscopy Applied to Trace Gas Measurement; David R. Tallant, Rudolph G. Jungst, Sandia National Laboratories. |
| Standard Addition Technique for Quantitative Trace Gas Analysis Using Derivative Infrared Diode Laser Spectroscopy; John A. Mucha, Applied Spectroscopy, vol. 36, No. 4, 1982. |
| Calibration of Diode-Laser Second-Derivative Modulation Spectrometry with a Reference Cell; Claus Weitkamp, Applied Optics, vol. 23, No. 1, 1 Jan., 1984. |
| High Sensitivity Pollution Detection Employing Tunable Diode Lasers; J. Reid, J. Shewchun, B. K. Garside, and E. A. Ballik; Applied Optics, vol. 17, No. 2, 15 Jan., 1978. |
| Tunable Diode Laser Spectroscopy; an invited review; R. S. Eng, J. F. Butler, K. J. Linden, Optical Engineering, vol. 16, No. 6, Nov./Dec. 1980. |
| SP5100 Isotope Ratio Measurement System; D. L. Wall, R. S. Eng & A. W. Mantz; Spectra-Physics, Laser Analytics Division. |
| Second Derivative Tunable Diode Laser Spectrometry for Line Profile Determination. II. Experimental Results; David L. Grieble, Mark L. Olson, Jeffrey N. P. Sun & Peter R. Griffiths, Applied Spectroscopy, vol. 34, No. 1, 1980. |