Claims
- 1. An implant having a contaminant-free surface produced by the process of blasting the surface with particles of titanium oxide, wherein the surface is free from any contaminants after it has been blasted.
- 2. An implant comprising titanium or an alloy thereof and having a contaminant-free surface, said implant produced by the process of blasting the surface with particles of titanium oxide, wherein the surface is free from any contaminants after it has been blasted.
- 3. The implant of claim 2, wherein the particles are titanium dioxide.
- 4. The implant of claims 2 or 3, wherein the particles have a size in the range of 1 to 2000 .mu.m.
- 5. The implant of claim 4, wherein the particles have a size in the range of 1 to 300 .mu.m.
- 6. The implant of claim 5, wherein the particles have a size in the range of 1 to 50 .mu.m.
Priority Claims (1)
Number |
Date |
Country |
Kind |
9003206 |
Oct 1990 |
SEX |
|
Parent Case Info
This application is a division of application Ser. No. 08/039,153, filed as PCT/SE91/00672 Oct. 4, 1991, now U.S. Pat. No. 5,484,286.
US Referenced Citations (7)
Number |
Name |
Date |
Kind |
4145764 |
Suzuki et al. |
Mar 1979 |
|
4145768 |
Suzuki et al. |
Mar 1979 |
|
4330891 |
Branemark et al. |
May 1982 |
|
5034186 |
Shimamune et al. |
Jul 1991 |
|
5049074 |
Otani et al. |
Sep 1991 |
|
5074881 |
Thull et al. |
Dec 1991 |
|
5457672 |
Steinemann et al. |
Oct 1995 |
|
Foreign Referenced Citations (1)
Number |
Date |
Country |
0388576 |
Sep 1990 |
EPX |
Divisions (1)
|
Number |
Date |
Country |
Parent |
39153 |
Apr 1993 |
|