BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is an illustration of the of the eddy current probe performing an eddy current inspection of a component.
FIG. 2 is a schematic of eddy current inspection of the inside of a component using an EC probe.
FIG. 3A is an illustration of the characterization of a touch probe.
FIG. 3B is an illustration of the probe radius and probe alignment.
FIG. 4A is a schematic of the alignment of the touch probe for the coordinate transfer from the touch probe to the eddy current probe.
FIG. 4B is a schematic of the alignment of the eddy current probe for the coordinate transfer from the touch probe to the eddy current probe.
FIG. 5 is a flow chart of the alignment of the touch probe with the component.
FIG. 6 is an illustration of the characterization of the touch probe with the component.
FIG. 7 is an illustration of the auto-alignment of the touch probe and the component.
FIG. 8 is an illustration of eddy current inspection of a component with the eddy current probe.
Wherever possible, the same reference numbers will be used throughout the drawings to refer to the same or like parts.
DETAILED DESCRIPTION OF THE INVENTION
A touch probe is used to align the EC probe for eddy current inspection of manufactured components such as gas turbine engine components. FIG. 1 illustrates the eddy current inspection of an oil drain hole 8 of a component. While FIG. 1 is shown and described as the feature being inspected, any feature or surface requiring inspection may be utilized. The eddy current probe 6 is placed inside the oil drain hole 8 as shown in FIG. 2, or near the component for inspection. An alternating current through the probe coil 14 (not shown) produces eddy currents in the component surface 4. The reaction of the eddy currents in the component surface 4 are monitored by the probe 6 and are sent to a computer to process. Before the inspection can be initiated, however, several steps must be performed by using a touch probe to correctly align the eddy current probe 6 to ensure accurate results. Lift-off, the gap between the EC probe 6 and the component surface 4, must be eliminated during inspection. Even a lift-off as small as 0.001 inch could affect the results of the inspection, therefore, there must be direct contact between the probe 6 and the component surface 4 during the entire inspection process. The alignment of the probe 6 with the component surface eliminates the lift-off effect during inspection, and helps to maintain consistent probe pressure on the component 10 during the inspection process, which produces accurate results.
There are three steps to accomplish the EC probe alignment with the component 10 as described in FIG. 5. In summary, the three steps include a touch probe 12 (not shown) used to reduce any errors once the EC probe 6 (not shown) is used. First, the touch probe 12 is characterized with the calibration plate 26 to find the probe radius 18 and the probe offset 20. The radius 18 and offset 20 of the probe are necessary to compensate for any physical bending or imperfection in the probe during the alignment and inspection. The probe radius 18 and offset 20 values are inserted into coordinates and eventually transferred to the EC probe 6 to compensate for any imperfections during the inspection process. These compensations further eliminate lift-off effect during inspection.
The first step is shown schematically in FIG. 3A, where the touch probe 12 is configured to find the probe radius 18, the probe offset 20 relative to the center of rotation of the component 10 and the angle 22 of the touch point with the component 10. This step requires additional alignment when the component 10 contains features such as dovetails, oil drain holes, or Lock&Load slots, a generic term or abbreviation for locking slot and loading slot. Referring back to FIG. 2, when the component 10 contains features such as dovetails, oil drain holes, or Lock&Load slots, the EC probe 6 must be aligned for those features to ensure accurate inspection of the component 10. The EC probe 6 follows an exact scan path, or the exact feature shape. This exact path or feature shape is obtained from the part drawings. A UniGraphics (UG) model of the component 10 is composed based on the part drawings before the actual inspection begins so the EC probe coil 14 can be placed in the desired position of the component 10 without having to calibrate the coil 14 numerous times before the probe 12 is in the desired location. A UG model is used for ease of data extraction and easier viewing of the part, and further eliminates the time consuming alignment procedures previously used for EC Inspection. Before the EC probe 6 is placed for inspection, the inspection path is obtained from the UG model by overlaying the model on the component 10. The probe 6 is aligned to the UG model of the component 10, which is an overlay of the component 10, thus during inspection, the probe 6 follows the same path that was determined during inspection with the overlay.
As part of the touch probe configuration, the touch probe 12 is configured to interrupt the computer process when the stylus 24 contacts the calibration plate 26. Contact occurs during the first step, when the probe 12 is obtaining axis positions. As shown in FIG. 3A, the axis is found by rotating the touch probe 12 to zero degrees 16 and moving the touch probe 12 towards the calibration (CAL) plate 26. The next axis position is found at ninety degrees 17, then at one hundred and eighty degrees 19, and lastly at two hundred and seventy degrees 21. The existing flat surface of the CAL plate 26 is used for measuring the radius and angle of the TP stylus 24. The information of the TP radius and angle is needed to rotate the same TP stylus 24 to each alignment touch point of the component. When the probe 12 touches the calibration plate 26, the displacement axis position 20 is recorded. As shown in FIG. 3B, the probe radius 18 (TP_Radius) and the probe's angle of alignment 22 (TP_TiltAngle) is computed by using the following equations:
TP_Radius=((Posit—0-Posit—180)*(Posit—0-Posit—180)+(Posit—90-Posit—270)*(Posit—90-Posit—270))/2+TP—dia/2 Equation 1
TP_TiltAngle=RadToDeg*ATAN(Posit—90-Posit—270)/(Posit—0-Posit—180)) Equation 2
The characterization of the touch probe 12 is shown in FIG. 6, where the probe 12 is calibrating the radius 18 and the angle 22 for accurate EC inspection of the component 10.
As shown in FIG. 7, the second step of the alignment is to align the component 10 with the touch probe 12 in order to locate and place the UG model's virtual zero point with the component's virtual zero point automatically. As shown in FIG. 4A, to find the virtual zero point 31 of the touch probe 12 (not shown), the touch probe 12 touches the component 10 sequentially beginning at the top-center 28, then moving to the top-left 30 of the component 10, then to the top-right 32, moving to the bottom 34, bottom-left 36, and lastly, the bottom-right 38 of the component 10. By having contact with the left and right, or top and bottom of the component 10, a true center of the component 10 is calibrated depending upon where the center of rotation 33 is located at each touch point 28, 30, 32, 34, 36, 38. FIG. 4B illustrates how the EC probe 6 then follows the same path the touch probe completed in FIG. 4A, touching the top-center 28, then moving to the top-left 30 of the component 10, then to the top-right 32, moving to the bottom 34, bottom-left 36, and lastly, the bottom-right 38 of the component 10. The virtual zero point 33 of the touch probe is transferred to the EC probe 6 and becomes the virtual zero point 35 of the EC probe 6. One embodiment of the invention requires approximately three minutes to align the touch probe 12 to the component 10, and may be repeated more than 3 times if a higher accuracy is required or desired. The alignment process is shown in FIG. 7, where the probe is aligned for the component's virtual zero point with the UG model's virtual zero point.
The third step in the alignment process of the probe 12 and the component 10 before actual inspection of the component 10 is to transfer the virtual zero 31 aligned with the touch probe 12 to virtual zero 35 of EC probe 6 as shown in FIGS. 4 and 4A. The EC probe's virtual zero point 35 is adjusted by the offset values calculated from the following equations:
REL
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X_ZERO=−1*(TP_Radius)*Cos U Equation 3
REL
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Y_ZERO=(ProbeOffset/2) Equation 4
REL
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Z_ZERO=(TP_Radius)*Sin U, Where U is angle for vertical rotation axis, to EC Probe virtual zero Equation 5
After the coordinates are transferred from the touch probe 12 to the EC probe 6, the EC probe 6 is placed at the UG model virtual zero point (not shown). The EC probe 6 follows scan points derived from UG model, as shown in FIG. 8.
FIG. 5 shows the process of the three steps to initialize the EC inspection process by aligning the touch probe 12 with the component 10. First, in Step 42, an EC scanplan is started for inspection. A scan plan, for example, is when the touch probe 12 is placed inside the oil hole of a gas turbine engine, searching for stresses or areas of weakness that could cause errors or component failures. The touch probe 12 is characterized in Step 44 as described in greater detail above. Step 46 locates the virtual zero 33 position of the touch probe 12 with the component 10, also as described above in greater detail. Step 48 involves configuring the six-point alignment with the component. The alignment is checked for completeness in Step 50. If the alignment is complete, then the coordinates are transferred in Step 54 to the eddy current probe 6 from the touch probe 12. Then in Step 56 the inspection is ready and can be initiated, as illustrated in FIG. 8. If the alignment is not complete in Step 50, then the virtual zero 33 position is adjusted in Step 52. Then step 46 is repeated to find the actual virtual zero 33 position, and Step 48 is also repeated to check the alignment once again.
While the invention has been described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes may be made and equivalents may be substituted for elements thereof without departing from the scope of the invention. In addition, many modifications may be made to adapt a particular situation or material to the teachings of the invention without departing from the essential scope thereof. Therefore, it is intended that the invention not be limited to the particular embodiment disclosed as the best mode contemplated for carrying out this invention, but that the invention will include all embodiments falling within the scope of the appended claims.
Patent Application
20070244659
