Claims
- 1. A method of examining posture of an electronic part, the electronic part comprising a polyhedral body having opposing end surfaces, electrodes being disposed on said opposing end surfaces for outputting voltages of different polarities, said electronic part further comprising: a conductive film formed on one surface of said body orthogonal to said end surfaces having said electrodes at a predetermined position closer to one of said end surfaces than to the other, said conductive film having an area large enough to be simultaneously contacted by a pair of probe terminals for applying a voltage, the electronic part being required to be placed in a predetermined posture in terms of up and down, left and right and front and back directions, said method comprising:bringing a pair of probe terminals into contact with a portion of an upwardly directed surface of said electronic part disposed in an examination position in an arbitrary posture, said portion being closer to one of the end surfaces having electrodes than to the other; applying a voltage between said probe terminals; and determining, based on the presence or absence of electrical current between said probe terminals, whether or not the electronic part has been placed in a correct posture.
Priority Claims (3)
Number |
Date |
Country |
Kind |
7-181675 |
Jul 1995 |
JP |
|
7-191588 |
Jul 1995 |
JP |
|
7-220334 |
Aug 1995 |
JP |
|
Parent Case Info
This is a division of application Ser. No. 09/170,845, filed Oct. 13, 1998 and now U.S. Pat. No. 6,353, 325 which is a division of application Ser. No. 08/683,231, filed Jul. 18, 1996, and now U.S. Pat. No. 6,043,588.
US Referenced Citations (9)
Foreign Referenced Citations (4)
Number |
Date |
Country |
57-71142 |
May 1982 |
JP |
60-35528 |
Feb 1985 |
JP |
1-288771 |
Nov 1989 |
JP |
5-343484 |
Dec 1993 |
JP |
Non-Patent Literature Citations (2)
Entry |
TDB-ACC-No: NN75043205 “Module Orientation Tester” IBM Technical Disclosure Bulletin, vol. 17, No. 11, pp. 3205-3206, Apr. 1975.* |
TDB-ACC-No: NN82014067 “Alignment Detector on Silicon Optical Bench” IBM Technical Disclosure Bulletin vol. 24, No. 8, pp. 4067-4068, Jan. 1982. |