1. Technical Field
The disclosure relates to a substrate structure and a method of fabricating the same.
2. Related Art
A roll-to-roll continuous process is superior in low cost of fab construction and large-area productions, is suitable for application in a thin film transistor (TFT) array process, and has competitive edge over a sheet-to-sheet process of silicon semiconductor used nowadays.
A substrate employed in a general roll-to-roll continuous process is a flexible plastic substrate, such as polyethylene terephthalate (PET) or polyethylene naphthalate (PEN), polyimide (PI), and the forms of the product are mainly single-layer patterning of an indium tin oxide (ITO) thin film or single-layer patterning of a multi-layer thin film. To fabricate and develop electronic components, a photolithography process of more than two layers may be employed. However, the flexible plastic substrate may be deformed due to membrane stress in the process and reel tension of the equipment, thereby causing an error in alignment precision of photolithography of layers above the second one, so that it may be difficult to fabricate the electronic components.
A method of fabricating a flexible substrate structure is provided, which may capable of reducing the alignment errors among layers formed in photolithography and accomplishing a patterning process of more than two layers (including two layers).
A method of fabricating a flexible substrate structure is provided. A flexible metal carrier including at least one first region and at least one second region is provided. A surface-modified layer is formed on the first region of the flexible metal carrier. A flexible plastic substrate is formed over the first region and at least one portion of the second region of the flexible metal carrier. The flexible plastic substrate over the first region contacts with the surface-modified layer. The flexible plastic substrate over the second region contacts with the flexible metal carrier.
The accompanying drawings are included to provide further understanding, and are incorporated in and constitute a part of this specification. The drawings illustrate exemplary embodiments and, together with the description, serve to explain the principles of the disclosure.
In on embodiment, a method of fabricating a flexible substrate structure is provided, a simple and rapid method may be used for fabrication, and in the removal of the flexible plastic substrate.
Several exemplary embodiments accompanied with drawings are described in detail below to further describe the disclosure in details.
Referring to
The flexible metal carrier 10 includes a first region 10A and a second region 10B. The second region 10B may be located around the first region 10A, and the region over the first region 10A may be, for example, used for forming flexible electronic components, and the region over the second region 10B may be, for example, a peripheral region of the flexible electronic components. Referring to
The surface-modified layer 12 is located on and may contact with the first region 10A of the flexible metal carrier 10. A process of forming the surface-modified layer 12 may be regarded as a process of planarizing the first region 10A of the flexible metal carrier 10. A roughness of the formed surface-modified layer 12 may be smaller than the roughness of the flexible metal carrier 10. In an embodiment, the roughness of the surface-modified layer 12 is smaller than 10 nm, for example, about 1 nm to 10 nm. The adhesion of the surface-modified layer 12 to the flexible metal carrier 10 may be greater than an adhesion of the flexible plastic substrate 14 to the surface-modified layer 12. The adhesion of the surface-modified layer 12 to the flexible metal carrier 10 may be, for example, 1 B to 5 B, in which B is an adhesion unit referring to ASTM (American Standard Test Method) D339. A material of the surface-modified layer 12 includes silicone epoxy, polyimide (pyromellitic dianhydride-diaminodiphenyl ether) (PI(PMDA-ODA)) or Teflon. A thickness of the surface-modified layer 12 is, for example, about 1 to 10 μm. The surface-modified layer 12 may be formed by various known coating methods, for example, dip coating, spin coating, roll coating or spray coating. The surface-modified layer 12 may be formed on the first region 10A shown in
The flexible plastic substrate 14 is located over the first region 10A and the second region 10B. The flexible plastic substrate 14 over the first region 10A contacts with the surface-modified layer 12, and the flexible plastic substrate 14 over the second region 10B contacts with the flexible metal carrier 10. The adhesion of the flexible plastic substrate 14 to the surface-modified layer 12 is smaller than the adhesion of the surface-modified layer 12 to the flexible metal carrier 10, and the adhesion of the flexible plastic substrate 14 to the flexible metal carrier 10 is greater than the adhesion of the flexible plastic substrate 14 to the surface-modified layer 12. In an embodiment, the adhesion of the flexible plastic substrate 14 to the surface-modified layer 12 is smaller than the adhesion of the surface-modified layer 12 to the flexible metal carrier 10 by 1 B to 5 B, and the adhesion of the flexible plastic substrate 14 to the flexible metal carrier 10 is greater than the adhesion of the flexible plastic substrate 14 to the surface-modified layer 12 by 1 B to 5 B. In an embodiment, the adhesion of the flexible plastic substrate 14 to the flexible metal carrier 10 is 1 B to 5 B, and the adhesion of the flexible plastic substrate 14 to the surface-modified layer 12 is 0 B. Herein, the adhesion is measured by a cross-cut adhesion test method. A material of the flexible plastic substrate 14 may be, for example, polyimide (PI), polycarboxylate (PC), polyether sulfone (PES), PET, PEN, polyamide (PA), pernigraniline (PNB), polyetheretherketone (PEEK) or polyetherimide (PEI) or a combination thereof. A thickness of the flexible plastic substrate 14 is, for example, about 10 μm to 200 μm. The flexible plastic substrate 14 may be formed by various known coating methods, for example, dip coating, spin coating, roll coating or spray coating. Since the material of the carrier 10 is metal, during the coating of the flexible plastic substrate 14, the flexible plastic substrate 14 may not be seriously deformed due to the reel tension of the equipment and the resulting membrane stress, and thus the flexible plastic substrate 14 may be formed by a roll-to-roll method. However, the method of forming the flexible plastic substrate 14 is not limited to the roll-to-roll method, and may also be a sheet-to-sheet method or any other suitable method. The flexible plastic substrate 14 may be formed over the first region 10A and the second region 10B shown in
In one embodiment,
Referring to
Referring to
Then, referring to
In one embodiment, the flexible substrate structure includes a flexible metal carrier. The rigidity of metal in the flexible metal carrier may overcome the reel tension of the equipment and may reduce the deformation of subsequently formed layer or substrate. As a result, even if the subsequent layer is formed by a roll-to-roll process method, the photolithography thereof still has sufficient alignment precision, so that the lithographic alignment error may be reduced, and the alignment offset may be smaller than 10 μm. Therefore, a patterning process of more than two layers is accomplished, and the yield of the process is increased.
In addition, the flexible substrate structure includes a surface-modified layer. The adhesion of the surface-modified layer to the flexible plastic substrate thereon is smaller than the adhesion of the surface-modified layer to the flexible metal carrier there-below, that is, an excellent separation interface exists between the surface-modified layer and the flexible plastic substrate. Therefore, when the flexible plastic substrate over the first region is cut longitudinally to the surface-modified layer, the flexible plastic substrate over the first region may be automatically separated from the surface-modified layer thereon and be removed.
It will be apparent to those skilled in the art that various modifications and variations can be made to the structure of the disclosed embodiments without departing from the scope or spirit of the disclosure. In view of the foregoing, it is intended that the disclosure cover modifications and variations of this disclosure provided they fall within the scope of the following claims and their equivalents.
Number | Date | Country | Kind |
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100131528 | Sep 2011 | TW | national |
This application is a divisional of and claims the priority benefit of U.S. application Ser. No. 13/306,949 filed on Nov. 29, 2011, now pending. The prior application Ser. No. 13/306,949 claims the priority benefit of Taiwan application serial no. 100131528, filed on Sep. 01, 2011. The entirety of each of the above-mentioned patent applications is hereby incorporated by reference herein and made a part of this specification.
Number | Date | Country | |
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Parent | 13306949 | Nov 2011 | US |
Child | 13600220 | US |