Claims
- 1. A method of manufacturing a stamper, comprising the steps of:
- coating a surface of a substrate with a photosensitive material;
- directing light on the resulting coated surface to expose the photosensitive material;
- developing the photosensitive material to make a photoresist masked pattern on the substrate;
- etching the substrate at the unmasked portion;
- removing the photoresist to make a master;
- forming a first nickel layer on a surface of the substrate;
- forming an intermediate layer of tantalum or chrome over the nickel layer;
- forming a second nickel layer on the intermediate layer to form a conductive film having a three-stratum structure;
- forming an electroformed layer on the conductive film by an electroforming process; and
- separating the conductive film with the electroformed layer from the substrate.
- 2. A method according to claim 1, wherein said first and second nickel layers are identical in thickness,
- 3. A method according to claim 1 wherein said substrate is selected from the group consisting of glass and quartz.
- 4. A method according to claim 1 wherein the substrate being coated has a surface roughness of Rmax 5 to 20 .ANG..
- 5. A method of manufacturing a stamper, comprising the steps of:
- coating a surface of a substrate with a photosensitive material;
- directing light on the resulting coated surface to expose the photosensitive material;
- developing the photosensitive material to make a photoresist masked pattern on the substrate;
- etching the substrate at the unmasked portion;
- removing the photoresist to make a master;
- forming an intermediate layer of tantalum or chrome over the substrate;
- forming a nickel layer on the intermediate layer to form a conductive film having a two-stratum structure;
- subjecting the whole structure to a process to make nickel passive;
- forming an electroformed layer on the conductive film by an electroforming process; and
- separating the electroformed layer from the substrate.
- 6. A method according to claim 5 wherein said layer subjected to said process to make nickel passive has a thickness of from 200 to 500 .ANG..
- 7. A method according to claim 6 wherein the substrate being coated has a surface roughness of Rmax 5 to 20 .ANG..
- 8. A method according to claim 1, 2 or 5 comprising forming at least one nickel layer to a thickness of from 200 to 500 .ANG..
- 9. A method according to claim 8 wherein the substrate being coated has a surface roughness of Rmax 5 to 20 .ANG..
- 10. A method according to claim 1, 2 or 5 comprising forming said intermediate layer to a thickness of from 100 to 500 .ANG..
- 11. A method according to claim 10 wherein the substrate being coated has a surface roughness of Rmax 5 to 20 .ANG..
- 12. A method according to claims 1, 2, 3 or 5, wherein the roughness of the surface of said substrate is Rmax 5 to 20 .ANG..
- 13. A method according to claims 1, 2, 3 or 5 comprising forming at least one nickel layer to a thickness of from 200 to 500 .ANG..
- 14. A method according to claims 1, 2, 3 or 5 comprising forming said intermediate layer to a thickness of from 100 to 500 .ANG. and forming at least one said nickel layer to a thickness of from 200 to 500 .ANG..
- 15. A method according to claims 1, 2, 3 or 5 comprising forming at least one said nickel layer to a thickness of from 200 to 500 .ANG. and wherein the substrate being coated has a surface roughness of Rmax 5 to 20 .ANG..
- 16. A method of manufacturing a stamper, comprising:
- coating a surface of a substrate with a photosensitive material;
- directing light on the resulting coated surface to expose the photosensitive material;
- developing the photosensitive material to make a photoresist masked pattern on the substrate;
- etching the substrate at the unmasked portion;
- removing the photoresist to make a master;
- forming a nickel-tantalum alloy conductive layer on a surface of the substrate;
- forming an electroformed layer on the conductive film by an electroforming process; and
- separating the conductive layer film from the substrate.
- 17. A method according to claim 16 wherein said nickel-tantalum alloy conductive layer film contains from 3 to 10 weight percent tantalum and said electroformed layer comprises nickel.
- 18. A method according to claim 16 wherein said substrate is selected from the group consisting of glass and quartz.
- 19. A method according to claim 16 wherein the roughness of said substrate is Rmax 5 to 20 .ANG..
Priority Claims (2)
Number |
Date |
Country |
Kind |
2-331062 |
Nov 1990 |
JPX |
|
2-416754 |
Dec 1990 |
JPX |
|
Parent Case Info
This is a continuation of copending application Ser. No. 07/798,595 filed on Nov. 26, 1991, now abandoned.
US Referenced Citations (1)
Number |
Name |
Date |
Kind |
4500392 |
Slaten |
Feb 1985 |
|
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Country |
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EPX |
3825590 |
Feb 1990 |
DEX |
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May 1985 |
JPX |
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2-8392 |
Jan 1990 |
JPX |
277594 |
Mar 1990 |
JPX |
63229450 |
Mar 1990 |
JPX |
Non-Patent Literature Citations (1)
Entry |
Weast CRC Handbook of Chemistry and Physics CRC Press Inc, 1982, pp. P-191, E-81. |
Continuations (1)
|
Number |
Date |
Country |
Parent |
798595 |
Nov 1991 |
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