Claims
- 1. A method of manufacturing a semiconductor device, the method comprising the steps of:depositing thin film semiconductor layers on a provisional substrate; exfoliating the thin film semiconductor layers from the provisional substrate; transcribing the exfoliated thin film semiconductor layers onto a first substrate made of a material including cellulose; and after the thin film semiconductor layers are exfoliated from the provisional substrate, positioning a second substrate made of a material including cellulose on a side of the thin film semiconductor layers opposite to the first substrate.
- 2. A method of manufacturing a thin film semiconductor device according to claim 1 wherein the thin film semiconductor layers are transcribed onto the first substrate on a part of a surface of the first substrate on which a waterproof film is deposited.
- 3. A method of manufacturing a thin film semiconductor device according to claim 1 wherein the thin film semiconductor layers are deposited on the provisional substrate with a porous layer in between.
- 4. A method of manufacturing a thin film semiconductor according to claim 3 wherein the porous layer is formed by anodizing.
- 5. A method of manufacturing a thin film semiconductor device according to claim 3 wherein after the first substrate is adhered on the thin film semiconductor layers, the thin film semiconductor layers are exfoliated from the provisional substrate by at least one of means of exposing the thin film semiconductor layers deposited on the first substrate to supersonic, applying force to pull the thin film semiconductor layers and the first substrate apart, and centrifugal separation.
- 6. A method of manufacturing a thin film semiconductor device according to claim 3 wherein after the thin film semiconductor layers are exfoliated from the provisional substrate made of single crystalline or polycrystalline semiconductor material, the provisional substrate is reused in a process of manufacturing further thin film semiconductor layers by removing a remainder of the porous layer.
- 7. A method of manufacturing a semiconductor device according to claim 1 wherein after the thin film semiconductor layers are deposited on more than one regions, the regions are separated each other and then the thin film semiconductor layers of each region are transcribed onto the first substrate.
- 8. A method of manufacturing a thin film semiconductor device according to claim 1 wherein a reflecting film is deposited on at least a part of a surface of the second substrate.
- 9. A method of manufacturing a semiconductor device according to claim 1 wherein at least a part of a surface of the second substrate is covered with a waterproof film.
- 10. The method of manufacturing a thin film semiconductor device according to claim 1, wherein after the thin film semiconductor layers are transcribed onto the first substrate, the thin film semiconductor layers are exfoliated from the provisional substrate by at least one of soaking the provisional substrate in one of water or solution and exposing the thin film semiconductor layers deposited on the first substrate to supersonic energy, applying force to pull the thin film semiconductor layers and the first substrate apart from the provisional substrate, and centrifugal separation.
- 11. A method of manufacturing a semiconductor device, the method comprising the steps of:depositing thin film semiconductor layers on a provisional substrate; exfoliating the thin film semiconductor layers from the provisional substrate; transcribing the exfoliated thin film semiconductor layers onto a first substrate made of a material including cellulose; and after the thin film semiconductor layers are exfoliated from the provisional substrate, positioning a second substrate made of a material including cellulose on a side of the thin film semiconductor layers opposite to the first substrate, wherein at least a part of the first substrate includes oil.
- 12. A method of manufacturing a thin film semiconductor device according to claim 11, wherein the thin film semiconductor layers are transcribed onto the first substrate on a part of the surface of which a waterproof film is deposited.
- 13. A method of manufacturing a thin film semiconductor device according to claim 11, wherein the thin film semiconductor layers are deposited on the provisional substrate with a porous layer in between.
- 14. A method of manufacturing a thin film semiconductor device according to claim 13, wherein the porous layer is formed by anodizing.
- 15. The method of manufacturing a thin film semiconductor device according to claim 13, wherein after the thin film semiconductor layers are transcribed onto the first substrate, the thin film semiconductor layers are exfoliated from the provisional substrate by at least one of soaking the provisional substrate in one of water or solution and exposing the thin film semiconductor layers deposited on the first substrate to supersonic energy, applying force to pull the thin film semiconductor layers and the first substrate apart from the provisional substrate, and centrifugal separation.
- 16. A method of manufacturing a thin film semiconductor device according to claim 13, wherein after the thin film semiconductor layers are exfoliated from the provisional substrate, which is made of a single crystalline or polycrystalline semiconductor material, the provisional substrate is reused in a process of manufacturing following thin film semiconductor layers by removing a remains of the porous layer.
- 17. A method of manufacturing a semiconductor device according to claim 11, wherein after the thin film semiconductor layers are deposited on more than one region of the provisional substrate, the regions are separated from each other and then the thin film semiconductor layers of each region are transcribed onto the first substrate.
- 18. A method of manufacturing a thin film semiconductor device according to claim 11, wherein a reflecting film is deposited on at least a part of a surface of the second substrate.
- 19. A method of manufacturing a thin film semiconductor device according to claim 11, wherein at least a part of a surface of the second substrate is covered with a waterproof film.
Priority Claims (1)
Number |
Date |
Country |
Kind |
10-300113 |
Oct 1998 |
JP |
|
RELATED APPLICATION DATA
This application is a divisional of application Ser. No. 09/419,936, filed Oct. 18, 1999, now U.S. Pat. No. 6,222,118. The present and foregoing applications claim priority to Japanese Application No. P10-300113, filed Oct. 21, 1998. All of the foregoing applications are incorporated herein by reference to the extent permitted by law.
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