Claims
- 1. A method of conducting passive non-intrusive testing of a set of corresponding digital output circuits in a field computer unit having at least three redundant computers, where each of said digital output circuits having a plurality of output channels, comprising the steps of:
- providing a predetermined period of time in which to conduct a passive test of a plurality of said output channels; and
- conducting passive testing of a plurality of said output channels during said predetermined period of time,
- said passive testing for each of said plurality of output channels including the steps of comparing the magnitude of a first signal with a first predetermined high test level when said channel is On, and comparing the magnitude of a second signal with a predetermined low track signal when said channel is Off,
- said first and second signals being different signals associated with said digital output circuit and each of said comparing steps providing a determination of a different error condition.
- 2. The method according to claim 1, including the step of comparing the magnitude of said first signal with a second predetermined high test level when the output channel being passively tested is On.
- 3. The method according to claim 2, including the step of comparing the magnitude of said second signal with a predetermined minimum track level when the output channel being passively tested is On and the magnitude of said second signal is below said predetermined low track signal.
- 4. The method according to claim 3, wherein said first and second signals provide an indication of the voltage level on opposite sides of a diode through which a high output signal from said digital output circuit is transmitted.
- 5. The method according to claim 4, including the step of comparing said first and second signals to determine the presence of a voltage drop across said diode when the output channel being tested is On.
- 6. The method according to claim 1, wherein said output channels are sequentially tested during said predetermined time period.
- 7. The method according to claim 6, wherein the output channels for each of said corresponding digital output circuits are tested during different predetermined time periods.
- 8. The method according to claim 1, including the step of temporarily stopping the passive testing for an output channel when it is determined that the output channel being tested has changed digital states.
- 9. A method of non-intrusively testing a digital output circuit in a field computer unit having at least three redundant digital output circuits which are each controlled by a correspondingly redundant computer, where each of said digital output circuits has a plurality of output channels and each of said output channels has a power switch controlled by one of said redundant computers and a set of abort switches which are each controlled by a neighboring redundant computer, comprising the steps of:
- (a) selecting a first output channel to be actively tested on one of said digital output circuits;
- (b) determining whether the selected output channel is in an On condition where said power switch is closed and at least one of said abort switches is closed, or an Off condition where at least said power switch is open;
- (c) conducting a series of active-Off tests if the selected output channel is in an Off condition;
- (d) conducting a series of active-On tests if the selected output channel is in an On condition;
- (e) selecting the next output channel to be actively tested on one of said digital output circuits, and repeating steps (b) through (d) for the next output channel to be actively tested; and
- (f) periodically repeating steps (b) through (e) until all of said output channels for all of said digital output circuits are actively tested.
- 10. The method according to claim 9, wherein said series of active-Off tests includes the steps of individually closing and then opening each of said abort switches for the selected output channel of the digital output circuit being actively tested in sequence, and determining if a test signal level changes by a predetermined magnitude in response to the closing of each of said abort switches.
- 11. The method according to claim 10, said abort switches are closed in response to a command transmitted by the redundant computer conducting the active-Off testing to each of its neighboring redundant computers, and said abort switches are subsequently opened by each of said neighboring redundant computers after a predetermined period of time.
- 12. The method according to claim 10, wherein said series of active-Off tests includes the step of closing and then opening said power switch while all of said abort switches are open.
- 13. The method according to claim 9, wherein said series of active-On tests includes the steps of:
- (a) opening said power switch while all of said abort switches are closed, determining whether said test signal level changes by a first predetermined magnitude, and closing said power switch;
- (b) opening and then closing each of said abort switches in turn, and determining whether said test signal level has changed;
- (c) opening all of said abort switches, determining whether said test signal level has changed by a second predetermined magnitude; and
- (d) opening said power switch and all of said abort switches, determining whether said test signal level has changed by a third predetermined magnitude, closing said power switch, and closing all of said abort switches.
- 14. The method according to claim 13, said abort switches are closed in response to a command transmitted by the redundant computer conducting the active-On testing to each of its neighboring redundant computers, and said abort switches are subsequently opened by each of said neighboring redundant computers after a predetermined period of time.
- 15. The method according to claim 14, wherein each of said neighboring computers determines whether the commands received from the redundant computer conducting said active-On testing can be executed, and each of said neighboring computers echoes back to the redundant computer conducting said active-On testing each command received that can be executed.
- 16. A method of non-intrusively testing a digital output circuit in a field computer unit having at least three redundant digital output circuits which are each controlled by a correspondingly redundant computer, where each of said digital output circuits has a plurality of output channels and each of said output channels has a power switch controlled by one of said redundant computers and a set of abort switches which are each controlled by a neighboring redundant computer, comprising the steps of:
- providing a predetermined period of time in which to conduct a passive test of a plurality of said output channels;
- conducting passive testing of a plurality of said output channels during said predetermined period of time regardless of whether said output channels are On or Off,
- selecting at least one of said output channels for one of said digital output circuits for active testing after said predetermined period of time has expired; and
- conducting a series of active tests, said active tests including a plurality of active-Off tests if the selected output channel is in an Off condition and a plurality of active-On tests if the selected output channel is in an On condition.
- 17. The method according to claim 16, wherein said passive testing for each of said plurality of output channels including the steps of comparing the magnitude of a first signal with a first predetermined high test level when said channel is On, and comparing the magnitude of a second signal with a predetermined low track signal when said channel is Off,
- said first and second signals being different signals associated with said digital output circuit and each of said comparing steps providing a determination of a different error condition.
- 18. The method according to claim 16, wherein said plurality of active-Off tests includes the steps of individually closing and then opening each of said abort switches for the selected output channel of the digital output circuit being actively tested in sequence, and determining if a test signal level changes by a predetermined magnitude in response to the closing of each of said abort switches.
- 19. The method according to claim 16, wherein said plurality of active-On tests includes the steps of:
- (a) opening said power switch while all of said abort switches are closed, determining whether said test signal level changes by a first predetermined magnitude, and closing said power switch;
- (b) opening and then closing each of said abort switches in turn, and determining whether said test signal level has changed;
- (c) opening all of said abort switches, determining whether said test signal level has changed by a second predetermined magnitude; and
- (d) opening said power switch and all of said abort switches, determining whether said test signal level has changed by a third predetermined magnitude, closing said power switch, and closing all of said abort switches.
- 20. A method of non-intrusively testing an analog output circuit in a field computer unit having at least three redundant analog output circuits which are each controlled by a correspondingly redundant computer, where each of said analog output circuits has a plurality of output channels and each of said output channels has an analog signal driver which is responsive to one of said redundant computers and a set of abort switches which are each controlled by a neighboring redundant computer, comprising the steps of:
- (a) selecting one of said analog output circuits to undergo said non-intrusive testing;
- (b) causing an analog signal driver for at least one of said output channels of said selected analog output circuit to reduce its analog signal level to a predetermined level over a period of time which will permit at least one of said neighboring redundant computers to increase its analog signal level output in order to maintain the analog signal level provided to a field device for this output channel before said non-intrusive testing was begun;
- (c) determining if the analog signal level provided to said field device was reduce by a predetermined amount during the time that that analog signal level from said analog signal driver was being reduced; and
- (d) restoring the analog signal level output of said analog signal driver to the analog signal level provided before it was reduced.
- 21. The method according to claim 20, wherein the analog signal level output from a plurality analog signal drivers for said selected analog output circuit are concomitantly reduced, so that a plurality of said output channels are tested during the same period of time.
- 22. The method according to claim 21, wherein the analog signal level output from all of said analog signal drivers for said selected analog output circuit are concomitantly reduced, so that all of said output channels are tested during the same period of time.
- 23. The method according to claim 20, wherein said predetermined level is a level where the analog signal driver no longer provides a substantial contribution to the analog signal level transmitted to said field device.
- 24. The method according to claim 23, wherein said predetermined level is a substantially zero level contribution.
- 25. The method according to claim 20, wherein the analog signal level output of said analog signal driver is restored to the analog signal level provided before it was reduced in the event that it was determined that the analog signal level provided to said field device was reduced by said predetermined amount during the time that that analog signal level from said analog signal driver was being reduced.
- 26. A method of non-intrusively testing an analog output circuit in a field computer unit having at least three redundant analog output circuits which are each controlled by a correspondingly redundant computer, where each of said analog output circuits has a plurality of output channels and each of said output channels has an analog signal driver which is responsive to one of said redundant computers and a set of abort switches which are each controlled by a neighboring redundant computer, comprising the steps of:
- (a) selecting one of said analog output circuits to undergo said non-intrusive testing;
- (b) determining if the analog signal level provided by an analog signal driver for at least one of said output channels of said selected analog output circuit is below a predetermined threshold level;
- (b) causing said analog signal driver to increase its analog signal level to a predetermined test level which will not change the analog signal level provided to a field device for this output channel;
- (c) determining if the analog signal level output from said analog signal driver was able to achieve said predetermine test level.
- 27. The method according to claim 26, wherein said predetermined test level is a voltage level which is below the forward cut-in potential of a blocking diode in the output channel of said selected analog output circuit.
Parent Case Info
This is a division of U.S. patent application Ser. No. 07/864,931, filed Mar. 31, 1992, now U.S. Pat. No. 5,428,769.
US Referenced Citations (92)
Foreign Referenced Citations (9)
Number |
Date |
Country |
186613 |
Jul 1986 |
EPX |
186832 |
Jul 1986 |
EPX |
200704 |
Nov 1986 |
EPX |
229559 |
Jul 1987 |
EPX |
239662 |
Oct 1987 |
EPX |
307191 |
Jul 1988 |
EPX |
275362 |
Jul 1988 |
EPX |
299323 |
Jan 1989 |
EPX |
307191 |
Mar 1989 |
EPX |
Divisions (1)
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Number |
Date |
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Parent |
864931 |
Mar 1992 |
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