Time-to-digital converters (TDCs) are used to measure time intervals and convert them into digital output signals. A single-photon avalanche diode (SPAD, also known as Geiger-mode avalanche photodiode) is a photodetector in which a photon-generated carrier triggers an avalanche current.
CA 2 562 200 A1 discloses a time-to-digital converter comprising digital delay circuits. A clock compensation scheme is used to modify and adjust the operation of the TDC. A digital processing algorithm produces one conversion every clock cycle. The time-to-digital converter is intended for high speed circuit applications such as time-based analog-to-digital converters for conversion of radio frequency signals in wireless communication systems and high speed signal measurement applications.
WO 2016/035469 A1 discloses a time measurement device calculating the time between first and second trigger signals. It is provided with start and stop gates for generating a start signal and a stop signal, a TDC circuit for generating a digital code corresponding to the time between the input of the start signal and the input of the stop signal, a delay circuit for delaying the input of the start signal and/or the stop signal to the TDC circuit by a prescribed delay time, and a control unit for calculating a measurement time on the basis of a plurality of digital codes generated by the TDC circuit.
TDCs are typically reset according to fixed measurement periods of constant duration. Thus a TDC either measures the time interval from the beginning of one of the fixed periods, which is used as a start-signal, to the input of a stop signal caused by a triggering event, or the time interval from the input of a start signal caused by a triggering event to the subsequent end of the fixed period. Either way, there can only be one start and one stop signal within each of the measurement periods. Once an event is latched, no further events can be recorded by the TDC until it is reset at the beginning of the next period. Therefore the TDC latches the first event within each period, and subsequent events occurring in the same period are ignored. When the frequency of events is high and there is a large probability that more than one event occurs within a measurement period, the number of recorded events decreases in relation to the time elapsed since the beginning of the period in which the event occurs.
Therefore, the record of events in the time-domain shows a distinct bias, even if the events are uncorrelated like ambient noise evenly spread in time. A histogram of the number of events as a function of the time elapsed since the latest reset of the TDC will have a generally sloping shape. If only one single-photon avalanche diode (SPAD) generating the triggering events is connected to a single TDC, the relatively long deadtime of the SPAD may essentially increase the possibility that an event is missed. If a plurality of SPADs are connected to a TDC in order to extend the sensing area when the frequency of events is low, an increase of that frequency will drastically increase the probability that one of the SPADs triggers the TDC and many subsequent events generated by the other SPADs will be missed.
The problem of removing the time-domain bias is solved by resetting the input stage of the TDC in an asynchronous manner by means of a delay line, so that the probability of an event being latched by the TDC is uniformly distributed over the measurement periods and the bias vanishes. The occurrence of the first event within a measurement period is used as a start signal to gate or block the input stage of the TDC for a time interval of independent duration, which does not depend on the time of registration of the event but is selected in advance for the entire measurement. The duration of this time interval may ideally be the same for each registration of an event. In practice variations of the duration will not be prevented, and it is therefore appropriate to specify durations of time intervals of independent durations only for a selected range or approximate target value. Such a specification allows for some jitter or statistical distribution, which is characteristic of time intervals generated by electronic circuits.
The lengths of the time intervals of independent durations may be equal or at least approximately equal to the length of each measurement period, or they may be slightly greater, so that the input will be blocked in each case at least until the end of the period is reached, even if the triggering event is registered immediately after the beginning of the period. It may be favorable to avoid blocking the input during a larger time interval, which would unduly restrict the overall availability of the TDC. If the frequency of events is very high, it is probable that the next event to be registered occurs immediately after the time interval of independent duration elapses. In this case, a uniform distribution of the recorded times may be obtained if the length of any of the time intervals of independent durations and the length of each measurement period are not in a ratio of integers and/or the durations vary randomly, which is practically always the case.
The method of operating a time-to-digital converter comprises providing a time-to-digital converter with a measurement period for registration of events, selecting time intervals of independent durations, each of the durations being independent of the registration of events, and, at each registration of an event, blocking the time-to-digital converter from registration for one of the time intervals of independent durations. In particular, each of the durations of the time intervals of independent durations may be within a selected range or at least approximately equal to a selected target value.
In a variant of the method, the durations of the time intervals of independent durations are longer than the duration of one of the measurement periods and/or shorter than twice the duration of one of the measurement periods. In a further variant, the durations of the time intervals of independent durations may be greater than half a selected target value and smaller than one and a half of that target value. The target value may especially be larger than the duration of one of the measurement periods.
In a further variant of the method, the time-to-digital converter is blocked by gating an input stage.
A further variant of the method comprises recording lengths of sample time intervals, each of the sample time intervals lasting from the beginning of one of the measurement periods to the registration of an event within this measurement period.
The time-to-digital converter circuit comprises a time-to-digital converter, an input stage and a gate between the input stage and the time-to-digital converter. A gating logic and delay line component may be provided, which controls the gate and is controlled by the time-to-digital converter.
A logical OR member may be provided between the input stage and the gate to allow input from a plurality of sources of events.
The method of operating a time-to-digital converter and the time-to-digital converter circuit will be described in more detail with reference to the accompanying figures.
Sample time intervals 11, 13, 14, 16 indicated in
In the example shown in
The lengths of the sample time intervals 11, 13, 14, 16 are uniformly distributed between zero and the whole measurement period 3. Missed events 2 occur during each time interval of independent duration 4, when the TDC is blocked. The sample time intervals 11, 13, 14, 16 do not show a bias, since the probability for events 1 to be registered does not vary between two subsequent time limits defining the beginning and end of a measurement period 3.
The relative number of missed events 2 is further increased if a longer time interval of independent duration 4 is selected, and hence it may be favorable to select a short time interval. If the time interval of independent duration 4 is not shorter than one measurement period 3, the blocking of the TDC caused by an event registered at the very beginning of a measurement period 3 lasts at least until the end of that measurement period 3, in order to ensure that at most one event is registered within each measurement period 3.
The described method allows to enhance TDC measurements for applications under extreme conditions, including exposure to sunlight of typically 110000 1×, for instance.
Number | Date | Country | Kind |
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16166908 | Apr 2016 | EP | regional |
Filing Document | Filing Date | Country | Kind |
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PCT/EP2017/059643 | 4/24/2017 | WO | 00 |
Publishing Document | Publishing Date | Country | Kind |
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WO2017/186632 | 11/2/2017 | WO | A |
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Entry |
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European Patent Office, International Search Report for PCT/EP2017/059643, dated Jul. 10, 2017. |
Number | Date | Country | |
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20190155223 A1 | May 2019 | US |