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4926427 | Remein | May 1990 | |
5193092 | Hartoog et al. | Mar 1993 | |
5260948 | Simpson et al. | Nov 1993 | |
5359547 | Cummins et al. | Oct 1994 | |
5412664 | Bank | May 1995 | |
5560002 | Kardach et al. | Sep 1996 | |
5577199 | Tanabe et al. | Nov 1996 | |
5596765 | Baum et al. | Jan 1997 | |
5802378 | Arndt et al. | Sep 1998 | |
5954830 | Ternullo, Jr. | Sep 1999 |
Entry |
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Miron Abramovici, et al., "Digital Systems Testing and Testable Design", Section 4.2 Fault Detection and Redundancy, published by IEEE Press, pp. 95-106. |