Claims
- 1. The method of electrodepositing a metal onto a substrate by electrolyzing a bath containing dissolved species of the metal to be deposited on said substrate, using in said method an electrocatalytically coated anode having as its operative surface an electrochemically active surface coating applied over a metal base that has an average roughened surface of at least about 250 microinches and an average surface peaks per inch of at least about 40, both as measured by profilometer with said peaks per inch being basis a low profilometer threshold limit of 300 microinches and an upper profilometer threshold limit of 400 microinches.
- 2. The method of claim 1 for the electrogalvanizing of a metal substrate from a zinc-containing bath.
- 3. The method of claim 1 for the electrotinning of a metal substrate from a tin-containing bath.
- 4. The method of claim 1 for the copper foil plating of a metal substrate from a copper-containing bath.
- 5. The method of claim 1, for preparing a surface to be used as an anode in aluminum anodizing.
- 6. The method of claim 1, wherein said roughened surface has a profilometer-measured average roughness of at least about 250 microinches with no low spots of less than about 200 microinches.
- 7. The method of claim 1, wherein said roughened surface has a profilometer-measured average surface peaks per inch of at least about 60, basis an upper threshold limit of 400 microinches and a lower threshold limit of 300 microinches.
- 8. The method of claim 1, wherein said roughened surface has a profilometer-measured average distance between the maximum peak and the maximum valley of at least about 1,000 microinches.
- 9. The method of claim 1, wherein said roughened surface has profilometer-measured average distance between the maximum peak and the maximum valley of from about 1,500 microinches to about 3,500 microinches.
- 10. The method of claim 1, wherein said roughened surface has a profilometer-measured maximum peak height of at least about 1,000 microinches.
- 11. The method of claim 1, wherein said roughened surface has a profilometer-measured maximum peak height of from at least about 1,500 microinches up to about 3,500 microinches.
CROSS-REFERENCE TO RELATED APPLICATION
This application is a continuation-in-part of application Ser. No. 374,429 filed Jun. 30, 1989, now abandoned.
US Referenced Citations (2)
Number |
Name |
Date |
Kind |
3948736 |
Russell |
Apr 1976 |
|
4572770 |
Beaver et al. |
Feb 1986 |
|
Non-Patent Literature Citations (1)
Entry |
Hayfield, Titanium as a Substrate for Electrodes; Birmingham, Eng. pp. 1-11, FIGS. 1-13. |
Continuation in Parts (1)
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Number |
Date |
Country |
Parent |
374429 |
Jun 1989 |
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