This invention is generally related to liquid crystal cells and, more particularly, to the generation of arbitrarily controlled pretilt angles and azimuthal angles in liquid crystal cells.
There is a constant need for precisely controlled pretilt angles in a liquid crystal cell. Sometimes the pretilt angles needed for certain applications can be quite large and are difficult to reliably obtain using conventional alignment techniques.
U.S. Patent Application Publication No. 2005/0260426 to Kwok teaches a technique for generating a large controllable pretilt angle using inhomogeneous alignment surfaces. Instead of being uniform and composed of a single material, the alignment surface includes nano and micro-scale domains of different alignment materials. In particular, if the alignment materials are such that one kind is capable of generating a vertical alignment and the other kind is capable of generating a homogeneous or horizontal alignment, then the resultant surface generates an intermediate pretilt angle.
Kwok's published application applies random phase segregation upon drying of a binary mixture of different alignment materials. The distribution of domains is random, sometimes not uniform, and is difficult to control. Therefore, it is desired to fabricate an inhomogeneous alignment surface that is highly controllable and to generate a uniform alignment layer for large substrates.
Described herein is a method for fabricating an inhomogeneous alignment layer that is highly controllable in a liquid crystal cell. A very uniform alignment layer is obtained for a large substrate that is useful for many display applications.
According to one embodiment, a liquid crystal alignment layer is provided in a liquid crystal cells having at least one liquid crystal material. The liquid crystal alignment layer includes a substrate and first and second alignment layers. The first alignment layer is continuously disposed on the substrate for inducing a first liquid crystal pretilt angle and a first azimuth angle in the liquid crystal material. The second alignment layer is continuously or discontinuously disposed on a surface of the first alignment layer. The second alignment layer independently induces a second liquid crystal pretilt angle and a second azimuth angle in the liquid crystal material.
According to a further embodiment, the second alignment layer includes a plurality of island structures. Alternatively, the second alignment layer includes one or more network structures. Still alternatively, the second alignment layer includes “hills” and “valleys” structures. A height difference between the “hills” and “valleys” structures ranges from 1 nm to 200 nm.
According to another embodiment, a method is provided for producing a liquid crystal alignment layer in a liquid crystal cells including at least one liquid crystal material. The method includes (1) disposing continuously a first alignment layer on a substrate, (2) treating the first alignment layer for inducing a first pretilt angle and a first azimuthal angle in the liquid crystal material, (3) disposing discontinuously a second alignment layer on a surface of the first alignment layer, and (4) treating the second alignment layer for inducing a second pretilt angle and a second azimuthal angle in the liquid crystal material.
EEL/L ratio for different domain ratio p;
Studies of inhomogeneous surfaces for liquid crystal (LC) alignments have witnessed a rapid growth in recent years. This is because such an alignment arrangement is capable of generating high pretilt angles in a liquid crystal cell. Several experiments have shown that a high pretilt angle can be applied to different applications such as bistable display devices and the No Bias Bend fast switching LC mode. These alignment surfaces generally comprise two kinds of domains favoring different LC orientations. The arrangement of those surfaces can be in alternating stripped or checkerboard patterns.
In Jones T. K. Wan, Ophelia K. C. Tsui, Hoi-Sing Kwok, Ping Sheng, “Liquid Crystal Pretilt Control by Inhomogeneous Surfaces,” Phys. Rev. E 72, 021711-1-021711-4 (2005), a regular patchy pattern is described having a finite anchoring energy. The modeling scheme is shown in
where the total weight
θAV(0) is the average tilt angle at the surface z=0, θ0i is the alignment angle, and Wi is the anchoring energy constant which ranges from 10−4 to 10−3 J/m2. The total energy per unit area of an arbitrary configuration liquid crystal system can be described as:
where λ is the pitch, ƒi(x, y)∈{0,1} is allocation function for domain i. n=(x,y,z) the LC director ei≡K11/Ai, and {tilde over (F)}e≡Fe/K11. When the pitch λ→0 (i.e., λ becomes very small), the system U must have its energy solely comes from the surface energy at z=0, such as U=ΣFSi. It is assumed that there are only two domains with the zero fan angle alignment direction, such as φi=0 and their pretilt angles and anchoring energy are θ1, θ2, W1 and W2 respectively. The pretilt angle is just the pretilt angle that minimizes the surface energy term of equation (2). It is straightforward to show that θAV(0) satisfies equation (3):
where p is the normalized domain ratio. By substituting θ1=85° and θ2=5° into equation (3), the effect of different anchoring energy ratio for domain 1 and 2 is shown in
According to equation (3), we can also investigate the effect of boundary angles θ1,θ2 on the θAV(0) under some very special case. Assuming θ1>θ2 and
and θ2=0+Δ2, (3) gives
Similarly, if we assume θ1=0+Δ1 and
and θ1<θ2, the same results will follow. Therefore, if we have two alignment directions such that the angles difference ≧π/2 and Δ1+Δ2=0, the resultant θAV(0) at any regions can be biased to either θ1 or θ2 as shown in
The concept of θAV(0) is valid only if the domain size is infinitely small, that is, λ→0. Actually the effects of domain size on the average pretilt angles in the bulk system are the most important issue for high pretilt angle study. The detailed simulation model and results are described herein.
The modeling of average pretilt angles has no analytical solutions. Given the mathematical equations describing the free energy density, the objective is to minimize the energy of the device, so that the corresponding director distributions can be obtained.
According to one embodiment, an iterative method is provided, where the liquid crystal molecules relax to the equilibrium states, such as ni,j=0 ∀i,j∈{x,y,z}. The advantage of this method is that splay, bend transitions can be taken care of. No singularity will be found during the iterations. To further describe this method, the Lagrange equation is given as
where L is the Lagrangian function: L=K−U, K is the kinetic energy density, and U is the potential energy density. n=(nx,ny,nz). Since there is no kinetic energy in this configuration, K=0. The potential energy is given in equation (7):
where λ is a Lagrange multiplier to maintain the unit length of the director n, and Kii is Frank constants. When a Rayleigh dissipation function is added in, equation (6) becomes equation (8)
where each of the dots denotes a differentiation of the parameter with respect to time t and γ1 is the rotational viscosity. Combining equations (6), (7), and (8) yields equation (9):
Equation (9) is rewritten as:
According to a further embodiment, if it is assumed that the Frank constants are all equal
F
s=(nx,x+nz,z)2+(nx,z−nz,x)2(nz2+nx2)+(nznz,x+nxnx,y)2 (11)
Hence equation (10) can be rewritten as equations (12) and (13),
From the equations show above, it can be appreciated that the Cartesian coordinate vector form is much simpler than the θ−φ approach and it is much more directly correlated to the system geometry as described below. In addition, as the director approaches homeotropic (i.e., θ=90°), the azimuthal angle becomes undefined. This causes numerical difficulties, where the simulation program tries to decide which azimuthal angle minimizes the free energy Fe. Therefore, the θ−φ approach is only used in selected one-dimensional (1D) simulations.
Equation (10) shows that the most fundamental problem is how to determine the derivative ni,j. There are two common methods use to accomplish this: one is the finite element method (FEM), and the other is finite difference method (FDM). According to one embodiment, a finite element method is provided for determining the derivatives ni,j, where it is assumed that the solution can be approximated by a linear combination of a finite collection of element function, δi, that
According to a further embodiment, the coefficients ai are determined by the specific version of the finite element method used in the computation.
Compared with the finite element method, the finite difference method is generally less complicated, and therefore provides a more desirable approach for determining the derivatives.
According to one embodiment, a finite difference method is provided, where the computational domain is separated into rectangular cubes (i.e., grids), as shown in
The derivatives are then estimated on these grids. To derive a formula that can be used to estimate the derivatives, the Taylor series expansion is used:
Solving for the first derivative ƒ′(x) in equation (14), the forward derivatives are obtained as:
Similarly, the backward derivatives are obtained as:
Rearranging equations (16) and (17) yields the centered difference formula, which becomes more accurate to second-order:
For the second derivative ƒ″ (x), equation (19) is given as:
Now, all the numerical derivatives have been derived for implementing a relaxation governed by equations (10). However, it is impossible to use equations (12) and (13) and to solve new directors nx, nz, and λ. Therefore, the λ term is dropped and the directors are renormalized to the unit length after each iteration. Therefore equation (10) becomes
And the new director after each iteration is
From equation (21), one of the most important parameters determining the speed of the calculation is the numerical time step Δt. When using a relaxation method, there exists a maximum time step, where if the time step is too large, the numerical calculations will give wrong results. In fact, if the numerical time step is above this value, the results will be random numbers. Of course, the value of time step Δt is different from the parameters such as the boundary conditions, the grid size, and the viscosity of liquid crystals. The maximum time step can be approximated by examining a simplified relaxation equation:
The interaction between the director and the surface is characterized by the “anchoring strength.” This is a measure of how rigidly the director at the surface is fixed in its orientation. The higher the anchoring strength, the more likely that the director sticks in place. To describe the interactions between director and surface, the polar anchoring and azimuthal anchoring energies are described herein. The polar anchoring energy is related to how much energy is required to pull the director away from the surface. The azimuthal anchoring energy is a measure of energy required to rotate director right on the alignment surface.
In order to best describe the finite anchoring effects in the Oseen-Frank theory, the Rapini and Papoular (RP) expression is described herein. It is assumed that the anchoring energy density increases in a sine square fashion as the director deviates from the ideal alignment directions:
F
RP
=W sin2(θ−θo), (23)
where W is a scalar value known as the anchoring strength and θ−θo is the angle of departure of the alignment direction. The RP anchoring is a widely used approximation and often used as a reference to which other anchoring representations are compared. A generalization of the RP expression that differentiates between the polar and azimuthal anchoring strengths is:
F
RPgen
=W
p sin2(θ−θo)+Wa cos2(θ−θo)sin2(φ−φo) (24)
where Wp,Wa refer to polar and azimuthal anchoring strengths, and (θ−θo), (φ−φo) refer to tilt and azimuthal angles of the director and alignment direction, respectively.
It has been shown by Zhao et al., “Week Boundary Anchoring, Twisted Nematic Effect, and Homeotropic to Twisted Planar Transition,” Phys. Rev. E 65, 2002, that a representation of the anisotropic surface-energy density can be simplified to:
F
Zhao=1 sin2(θ−θo)cos2(φ−φo)+
2 sin2(θ−θo)sin2(φ−φo). (25)
The anchoring strength coefficients can be compared by equaling order terms of spherical harmonics expansions of (24) and can be found as
According to one embodiment, the surface director must be allowed to move in order to achieve the effect of anchoring energy on the operation of the liquid crystal devices. Therefore, equation (24) must be minimized during the iterations of the simulations.
According to one embodiment, φ1−φ2=0. Such special case assumes that the two alignment domains have the same azimuth alignment angle. According to the embodiment, EEL actually varies according to the domain ratio and the anchoring energy of the alignment domains. The maximum
EEL value can become ≦L. Here more rigorous examination on the anchoring effects and equivalent extrapolation length will be reported.
The effect of anchoring energy on the equivalent extrapolation length is described. It is assumed that the V polyimide induces a pretilt angle of 82 degree, the H polyimide induces a pretilt angle of 0.5 degree, and the domain ratio p is 0.5. The simulation space is xmax=200 nm by zmax=200 nm. The polar anchoring energy for the V polyimide is WpV=0.2×103 J/m2 , and the polar anchoring energy for the H polyimide is WpH=0.2×10−3 J/m2. The corresponding director distributions are presented in
If the anchoring energy of the alignment surface increases, such an effect is suppressed as shown in EEL is modulated by the anchoring energy. Such observations can be made in
EEL≈L. Since the typical anchoring energy for the polyimide is about 2×10−3 J/m2, the
EEL must be smaller than <L.
Other than the anchoring energy, the domain ratio p also plays an important role for the EEL modulation.
EEL is governed by the p ratio and the pretilt angles of the domain area. The anchoring energy does not play any role under such situation. Maximum
EEL study is very important in backflow direction control.
The case of φ1−φ2≠0 is very important in liquid crystal configuration control. By controlling the fan angles of the principle and secondary alignment axes, the resultant pretilt angle and azimuthal angle of the liquid crystal can be altered. It provides a strong tool to liquid crystal mode designer, or optical waveguide designer to control the precise position and magnitude of the resultant pretilt angles inside the liquid crystal bulk.
The standard deviation of tilt angle and azimuthal angle across the z directions are plotted in
Such simulation results can be explained by equation (2). Since the surface profile p is the same for different fan angles φo, the surface anchoring energy remains constant. But there is the twisted term induced in the Frank energy. Therefore, the equivalent extrapolation length has to increase in order to minimize the total amount of energy. It can be forecasted that liquid crystal with stronger K22 will further increase.
There is some disorder effects on azimuthal angles for the case φo=0. It is supposed that it should be equal to 0 along the z direction. Actually, it is induced by the edging effect of the patterning structures. To illustrate the issue, the liquid crystal molecule alignments on the X-Y plane are shown in
The average pretilt angle simulation results are different from those described by Wan. It was found that if the domain size L is not comparable to the extrapolation length =K/W, the pretilt angle is linearly proportional to the domain ratio p. Furthermore, if the fan angle φo>0, the average pretilt angle is always higher than that in the case of φo=0, if and only if the Frank constant K11<K33. Actually, such property is always true for conventional liquid crystal.
e={circumflex over (K)}/W=15.25×10−12/2×10−3=7.625 nm. Since the values are comparable, therefore, the non-linear effect is found at the head and tail of the curve.
When the azimuthal angles are different (fan angle), other effects can occur. The results are plotted in
Based on the above models and simulation results of the inhomogeneous alignment, various embodiments of the present invention are described below.
There are many different inhomogeneous liquid crystal alignment methods, such as e-beam treatment, micro-rubbing, mixing of polyimide materials, and DUV surface treatment. Polyimide mixing generally comprises two kinds of polyimide materials that respectively lead to different LC orientations. Micro-domain can be achieved by hydrodynamic effects on phase separation of the horizontal and vertical polyimide mixture in three dimensions. In existing systems, the domain patch is about 2 μm. Such size, however, is not in a desirable range for high pretilt angles alignment as described earlier.
In fact, the size of the patchy pattern is governed by the hydrodynamic effect on phase separation. It is difficult to control phase separation in a fluid mixture. The segregation originates from the fact that there exist two relevant transport mechanisms for fluid mixtures, i.e., diffusion and hydrodynamic flows, and they are coupled with each other in a complicated manner. Only the former is responsible for the temporal increase in the order parameter (composition differences between two phases), and the latter only causes geometrical coarsening. Because of the complex nature of their non-local and nonlinear coupling, the hydrodynamic effects on phase separation have not been fully understood even for simple fluid mixtures. For example, there has been no well established theory describing the phase separation kinetics of 3D fluid mixtures. Lacking good methods to control the rate of phase separation, the reproducibility and uniformity of pretilt angle generation are found poor. Due to these problems, such method is not an ideal model to obtain high pretilt angles in liquid crystals and therefore a more desirable method is described herein.
In one embodiment, a two-step process is provided for fabricating the new alignment layer. A uniform alignment layer is first coated on a substrate. Then a second alignment layer is coated on top of the first alignment layer. This second alignment layer is discontinuously distributed. According to a further embodiment, the second alignment layer is in the form of discontinuous island structures. Or, the second alignment layer includes one or more network structures. Alternatively, the second alignment layer includes “hills” and “valleys” structures. The height difference between the “hills” and “valleys” structures can range from 1 nm to 200 nm.
As depicted in
The structured depicted in
The detail experiment steps for obtaining the structure illustrated in
According to a further embodiment, it is possible to manipulate the alignment layers to provide a discontinuous or continuous alignment films by controlling the Bénard-Marangoni convection during soft-baking. In order to obtain this stacked structure, a high viscosity solvent, called S1, is selected for those alignment materials of the first (i.e., lower) alignment layer, so that the Marangoni Number is smaller than 80. Accordingly, a continuous alignment film is obtained after evaporation of the solvent. On the other hand, a low viscosity solvent S2, is selected for the alignment materials at the second (i.e., upper) alignment layer, hence, the Marangoni Number (Ma) will increase and the convection occurs during soft-baking. Since the alignment material has much higher boiling temperature, therefore, once the solvent is evaporated, the alignment materials will record the pattern of the convection. According to still a further embodiment, the alignment material of the lower alignment layer is chosen such that it is not dissolvable in S2. One of proposed combinations are JALS2021 wt 4%: N-Methylpyrrolidone wt 96%/ROP-103 wt<10%: Cyclopentanone wt>90%.
Described below is one example for obtaining the alignment structure described above. Specifically, the first alignment layer solution is applied onto the ITO substrate as shown by the atomic force microscopic picture in
Subsequently, the coated substrate will undergo mechanical rubbing. Accordingly, a periodic pattern is introduced along the rubbing directions as shown
The substrate is now ready for the final steps. The second alignment material solution is applied on the first alignment layer. For the experimental purpose, different concentrations (i.e., 2%, 4%, 6%, 8%, and 10%) of the ROP-103 are respectively applied to five experimental structures. The resulting structures are shown in the atomic force microscopic images of
As further shown in
As shown by the experiments of the sample testing cells, empirically, a higher concentration of the solutions implied a higher ratio p of the horizontal alignment materials in the domains, and thereby a lower pretilt angle can be obtained. Such implication is depicted in
In the experiments described above, the polar anchoring energy of pure ROP-103 is 1×10−3 J/m2. The polar anchoring energy is measured by using a high voltage method. According to the atomic force microscopic images in
Different sample domain sizes are applied on the atomic force microscopic images, and the minimum domain size is determined such that the domain ratio becomes a constant value. The experimental results are shown in
After the experimental domain ratio p and the domain size L are obtained, the models discussed earlier are compared with the experimental results. As shown in e=K/W for the V and H domains are not comparable to the domain size L. The pretilt angle varies substantially linearly with the domain ratio p. These results agree with the earlier discussions.
In addition, as shown in
The preferred embodiments of the present subject matter and a few examples of its versatility are shown and described in the present disclosure. It is to be understood that the present subject matter is capable of use in various other combinations and environments and is susceptible of changes and/or modifications within the scope of the inventive concept as expressed herein. For example, the first layer can also be disposed onto the substrate by an ink jet printing method. Similarly, the second layer can also be disposed onto the first layer by the ink jet printing method. In particular, ink-jet printing technique can modify a thickness of a layer in various parts of the cell by controlling the size or the distribution of the droplets.
All references, including publications, patent applications, and patents, cited herein are hereby incorporated by reference to the same extent as if each reference were individually and specifically indicated to be incorporated by reference and were set forth in its entirety herein.
The use of the terms “a” and “an” and “the” and similar referents in the context of describing the invention (especially in the context of the following claims) are to be construed to cover both the singular and the plural, unless otherwise indicated herein or clearly contradicted by context. The terms “comprising,” “having,” “including,” and “containing” are to be construed as open-ended terms (i.e., meaning “including, but not limited to,”) unless otherwise noted. Recitation of ranges of values herein are merely intended to serve as a shorthand method of referring individually to each separate value falling within the range, unless otherwise indicated herein, and each separate value is incorporated into the specification as if it were individually recited herein. All methods described herein can be performed in any suitable order unless otherwise indicated herein or otherwise clearly contradicted by context. The use of any and all examples, or exemplary language (e.g., “such as”) provided herein, is intended merely to better illuminate the invention and does not pose a limitation on the scope of the invention unless otherwise claimed. No language in the specification should be construed as indicating any non-claimed element as essential to the practice of the invention.
Preferred embodiments of this invention are described herein, including the best mode known to the inventors for carrying out the invention. Variations of those preferred embodiments may become apparent to those of ordinary skill in the art upon reading the foregoing description. The inventors expect skilled artisans to employ such variations as appropriate, and the inventors intend for the invention to be practiced otherwise than as specifically described herein. Accordingly, this invention includes all modifications and equivalents of the subject matter recited in the claims appended hereto as permitted by applicable law. Moreover, any combination of the above-described elements in all possible variations thereof is encompassed by the invention unless otherwise indicated herein or otherwise clearly contradicted by context.
This patent application claims the benefit of U.S. Provisional Patent Application No. 61/071,567, filed May 6, 2008, which is herein incorporated by reference in its entirety.
Number | Date | Country | |
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61071567 | May 2008 | US |