Patent Application
20070135321
The present invention relates to methods and compositions for chemically treating a surface of a substrate by using foam technology. The invention more particularly relates to the removal of organic and inorganic compounds such as photoresist and post-etch residue from substrate surfaces.
A substrate is an underlying solid material used in manufacturing products such as integrated electronic circuitry and microelectromechanical systems (MEMS). MEMS result from a technological advancement that unites silicon-based microelectronics with micromachining technology with the goal of producing complete systems on a single chip.
Integrated circuit and MEMS manufacturing comprise stepwise patterning and layering processes. Examples of such processes include the use of plasma to etch circuit-defining pathways, deposition of metals in the pathways to form circuitry, and application of chemicals and abrasives to etch, strip and/or and polish contact surfaces for high precision manufacturing. The processes begin with a suitable substrate, such as a wafer of crystalline silicon, upon which materials having the requisite electrical characteristics are deposited. Water and various chemicals may then be used to treat the surface of a substrate. The treatment can comprise cleaning, etching, or rinsing the substrate after each manufacturing step to quench reactions and ensure precision in the final product.
The process steps in the manufacture of integrated circuits offer many opportunities for contaminants to enter the structure of the product semiconductor substrate. Physical contamination is undesired matter and can comprise organic and inorganic materials such as particles, films from photoresist material, and traces of any other impurities such as metals deposited during implanting or etching. Semiconductor substrate cleaning may thus be the most frequent step in manufacturing integrated circuits and is becoming more critical as the features of semiconductor substrates get smaller. There are various methods of cleaning semiconductor wafers, and the process of choice must not only satisfy technical requirements, but must also satisfy environmental regulations and be cost effective.
The technical goal of cleaning a semiconductor substrate is to eliminate physical contamination between each process step without affecting the integrity and detail of the substrate provided by previous steps. Contamination of the surface of the substrate with undesired matter can affect the manufacturing process and reduce ultimate product performance. Thus, ways of avoiding contamination are paramount in the manufacture of electronic circuitry, as are ways of efficiently removing undesired matter without introducing further contaminants. Some cleaning methods developed to satisfy these goals have been discussed in the literature, for example, Int. Conf. On Solid State Devices and Materials, pp. 484-486 (1991); Kujime, T., et al., Proc. Of The 1996 Semi. Pure Water and Chemicals, pp. 245-256; and, Singer, P. Semi. International, p. 88, (October 1995).
Patterning of integrated circuitry involves depositing material directly on a semiconductor substrate or intervening layers, and each patterning step typically involves the following: applying a photoresist to the surface of the substrate; changing the properties of selected areas of the photoresist by exposing those areas to light, X-rays, or particle beams such as electron or ion beams; removing either exposed or unexposed portions of the photoresist to expose portions of the underlying substrate; chemically treating or depositing material on the exposed portions of the substrate; and removing the residue. Each step in the patterning process can introduce a variety of contaminants, such as various residues, and must usually be followed by a cleaning step before proceeding to the next step in the process.
Etching generally refers to the removal of material from the surface of the semiconductor substrate and includes the pattern defining process. Each layer on the substrate is manufactured individually and then polished to obtain a precise match between layers. Currently, “wet etching” is used to etch semiconductor substrates in a chemical bath, whereas “dry etching” is used to define circuit pathways using a plasma. In dry etching, the plasma is used to form the circuit pathways and is commonly used because of the high precision and selectivity afforded by the process. However, the disadvantage to dry etching is the formation of post-etch residue (PER), which is a difficult to remove by-product of the reaction between the plasma, the substrate surface, and other material present such as the photoresist.
Post-etch residue is found around etched pathways and openings and may be comprised of ashed resist, etching gases, and etched substrate materials. Any post-etch residue must be removed to avoid reduced product performance due to interference from impurities in the intricate pathways or the formation of corrosive chemical species within the residue. One means of removing such contaminants is the use of organic solvents, but such solvents have required operating temperatures of as high as 100° C., often followed by a rinse with volatile and highly flammable solvents. Combining high temperatures with an easily ignitable rinse is clearly less than desirable. Although techniques that do not use isopropyl alcohol have been described, see for example, U.S. Pat. No. 5,571,337, they use vapors of other organic compounds.
Another process that utilizes cleaning chemistries is chemical mechanical polishing (CMP). CMP is a planarization process that combines wet etching with an abrasive slurry to remove excess material between layers in the semiconductor manufacturing process and is as crucial to high product performance as metal deposition or lithography. Planarization improves the contact between the wafer, the dielectric insulators, and the metal substrates, but also increases the room for error in other process steps. Given the onward march towards miniaturization, CMP is becoming a more and more critical step in the manufacturing process, but contaminants introduced during CMP must also be effectively removed.
Since the features of semiconductor wafers are now becoming as small as 0.10 microns, and dimensions of 0.07 microns are projected to occur by the year 2005, thorough removal of contaminants, whether present originally or introduced in preceding process steps, is becoming more critical than ever. Ideally, the sizes of particle contaminants should not exceed one tenth of the minimum feature size. Accordingly, cleaning procedures should thus be effective at removing particles as small as about 0.007 to about 0.010 microns. On these dimensions, the laws of physics produce unexpected results that are a function of the diminishing importance of mass (See e.g., Brown, D., “Surface Tension Rules the Subminiature World of MEMS,” available at http://www.engineer.ucla.edu/stories/mems.htm). In practice, in the submicron world, effects attributable to the inertia of particles are dwarfed by forces such as surface tension and adhesion. The critical forces acting on a submicron particle are those that are manifestations of electrostatic attraction and repulsion over ranges that are typically thought of as short in the macroscopic world but which are comparable to the size of the particles in the submicron regime.
At dimensions of 0.10 microns and less, most semiconductor substrates will need to use conductive materials with low dielectric constants (low-k materials), and such materials are inherently delicate. Low-k materials known in the art include: fluorinated silicate glass (FSG); hydrido organo siloxane polymer (HOSP); low organic siloxane polymer (LOSP); nanoporous silica (“Nanoglass”); hydrogen silsesquioxane (HSQ); methyl silsesquioxane (MSQ); divinysiloxane bis(benzocyclobutene) (BCB); silica low-k (SiLK); poly(arylene ether); (PAE, “Flare”, “Parylene”); and fluorinated polyimide (FPI). As a result, the emphasis in techniques such as CMP has become more “chemical” than “mechanical,” and there has even been a move towards abrasive free methods. It is also becoming more important to have CMP formulations that are not overly aggressive to delicate materials used with these intricate geometries due to the added problems such as erosion and delamination. Accordingly, a need exists for an effective CMP chemistry that will effectively remove small dimension contaminants without deleterious effects on manufacturing materials.
In most manufacturing processes, the substrate must not only be cleaned with a cleaning agent after each process step but must also be rinsed to remove residual cleaning agent before the next step. For example, an amine based cleaning agent can leave trace amounts of amine, which may be corrosive to metal substrates such as aluminum. Thus, a post-cleaning treatment is necessary to neutralize residual amines. Traditionally, an unreactive organic solvent may be used to dilute such reactants, and then a solvent of higher vapor pressure, such as isopropanol, is used to rinse away and dry the substrate. However, as previously mentioned, the flammability of such solvents is a disadvantage.
Preferred rinsing agents will selectively neutralize chemicals without reacting with other materials. An example of a commonly used rinsing chemistry is dilute NH4OH with dilute HF for post-CMP cleaning of tungsten wafers. Dilute HF is commonly used to remove the remaining monolayer amounts of organic or inorganic contaminants including metals and anions, but unlike organic chemistries, even dilute HF can damage the semiconductor substrate if not carefully controlled. Formulations that are safe and selective for post-cleaning and post-CMP rinsing are presented in U.S. Pat. Nos. 6,156,661 and 5,981,454 both of which are incorporated herein by reference.
In addition to neutralizing cleaning chemicals, it is also important to prevent redeposition of contaminants after cleaning. Isopropyl alcohol, deionized water, and ultrasonic or megasonic cleaning have traditionally been used in various combinations to remove particles, but other means of removal, both physical and other, have also been used.
One means of removal is megasonics, in which high pressure waves in a liquid solution push and tug at contaminants on a surface, effectively dislodging them. It has been found, however, that megasonics is only effective at removing particles as small 0.3 microns and is not expected to be effective at removing particles that are an order of magnitude smaller. Scrubbing and related techniques have been found to be an improvement upon megasonics.
An example of a physical means of removing particles is buoyancy. Buoyancy is illustrated in Japanese Patent No. 63-239982-A2 and U.S. Pat. No. 4,817,652, where it was shown that gas bubbles could lift dust particles away from the surface of a semiconductor substrate. Gas bubble formation in liquid solution was induced around dust particles, and the buoyancy of the gas bubble released and lifted the particle from a substrate to the surface of the solution. Surface tension forces were described as part of the particle removal mechanism in that the film encasing the bubble would rapidly converge underneath the particle and detach the particle from the surface of the substrate. Thus, a buoyant force is used to overcome an adhesive force. If the surface tension between the liquid and the substrate is higher than that between the liquid and the particle, the liquid will prefer to remain attached to the substrate. Consequently, the liquid will prefer to pass between the particle and the substrate rather than just pass over the particle.
A further example of a physical means of removal is based upon the use of differences in interfacial surface tension. In U.S. Pat No. 4,781,764, an advancing and retracting “interface of a liquid” was taught as a method of detaching particles from the surface of substrates that were too small to be effectively removed using megasonics. The important surface tension relationship is the difference between two values: the interfacial surface tension between the liquid and the substrate and the interfacial surface tension between the liquid and the undesired matter. The movement of the liquid film over a surface creates a force on that surface, and the amount of force created depends on the interfacial surface tension between the liquid and the surface. As such, differences in interfacial surface tensions between the undesired matter and the semiconductor substrate assist in removing particles by “scrubbing” undesired matter from the semiconductor substrate. This physical means of removal was found to be an improvement over the use of megasonics in the removal of smaller particles.
Thus, since some residues are more effectively removed through chemical techniques, while others are more effectively removed by interfacial scrubbing, there is a need for a cleaning technique that is effective at removing a variety of substances at the scales required for the dimensions of the features on current and future semiconductor wafers. Such a technique must also be capable of being used efficiently in an industrial environment and a variety of formulations.
A foam is an agglomeration of gas bubbles separated from one another by a thin liquid film. In U.S. Pat. Nos. 6,090,217 and 6,296,715 B1, both of which are incorporated herein by reference, a foam was taught as useful for drying, cleaning and chemically treating a substrate. Cleaning chemicals such as ammonium hydroxide, hydrofluoric acid, hydrogen peroxide and nitric acid were reported, though all of these have known corrosive effects on delicate substrates and patterns deposited on substrate surfaces. However, foam compositions utilizing non-aqueous solvents in combination with cleaning chemicals were not disclosed. In particular, foam formulations that included corrosion inhibitors or chelating agents were not disclosed. Furthermore, foam techniques for removal of post-etch residue, or for carrying out CMP, were not taught.
A preferred method of foam formation, as described in U.S. Pat. Nos. 6,090,217 and 6,296,715, was the introduction of carbon dioxide gas into a liquid solution, accompanied by appropriate controlled variations of pressure to create a foam. Although carbon dioxide has a surface-tension reducing effect on an aqueous solution, at higher concentrations it produces an acidic solution and may not be compatible with other cleaning reagents. Other methods of facilitating foam production involved the addition to a liquid formulation of surface-tension reducing agents such as surfactants. A foam that could remain stable for approximately one to two minutes could deliver cleaning chemical to the semiconductor substrate using about one tenth of the amount of liquid and chemical normally required to achieve the necessary concentration, thus achieving a cost saving.
It was envisaged that the foam bubbles individually wetted the substrate surface, thereby forming a continuous film of liquid over the substrate surface that replicated the action of an equivalent liquid formulation but at considerably less cost. During foam application, the foam flowed over the substrate, and eventually discharged into an overflow container before decaying and draining. A disadvantage of using foam was that the foam must remain stable and in contact with the substrate long enough to deliver cleaning chemical. It was also envisaged that foam action was attributable, at least in part, to a “scrubbing” effect in which the substrate moves relative to the foam and the mass of foam bubbles dislodges particles from the surface.
Nevertheless, although an advantage of foam compositions and processes is that less liquid and chemical is necessary to achieve the same amount of cleaning as that achieved using liquid phase semiconductor cleaning, etching, and rinsing technology, formulating effective foam chemistries is difficult. Unpredictable criteria such as effective means of foam production and stability militate against universal applicability of foam techniques, however. A further principal disadvantage of current foam technology is that it doesn't provide methods and foam compositions for chemicals that are capable of cleaning post-etch residue.
Accordingly, the present invention teaches foam compositions and methods suitable for cleaning, rinsing, and etching of substrates, according to a variety of chemical formulations. These methods and compositions are selective in the removal of organic and inorganic compounds including post-etch residue. Furthermore, the process can operate with a range of foam stabilities.
According to the present invention, there is provided a process with a variety of foam compositions for treatment of a substrate having a surface to which undesired matter adheres. The foam is generated from a liquid composition that includes at least one surfactant that facilitates foaming, by introducing a gas into the liquid composition. A foam composition for treating the surface of a substrate according to the methods of the present invention comprises: a gas; a surfactant; deionized water; and a component selected from the group consisting of a fluoride, a hydroxylamine, an amine and periodic acid. Secondary components such as additional surfactants, chelating agents, corrosion inhibitors, and acids and bases are optionally added to further control surface tension, scavenge metals, inhibit oxidative side reactions, and control pH, respectively. The foam is caused to contact the surface of the substrate under reaction conditions sufficient for treatment, and the undesired matter is then removed when the foam composition is removed.
Foam processes can offer a large number of benefits. For example, foams allow the use of less chemical than corresponding liquid compositions. Additionally, according to the methods and compositions of the present inventions, foams that function at temperatures lower than about 100° C. are disclosed. The low volume of solution, the potentially low operating temperatures and the unique physical composition of a foam medium, all tend to slow diffusion and result in a reduction in the amount of impurities capable of redepositing on the substrates through adsorption and readsorption.
A foam composition according to the present invention comprises: a gas; a surfactant; deionized water; and a component selected from the group consisting of a fluoride other than HF, a hydroxylamine, an amine and periodic acid. A foam composition according to the present invention preferably comprises: at least one fluoride compound that is free of both organoammonium and amine carboxylate compounds; at least one solvent; at least one gas; at least one surfactant; and water. A foam composition also preferably comprises: at least one hydroxylamine; at least one alkanolamine; at least one gas; at least one surfactant; and, at least one solvent. A foam composition also comprises: at least one amine; at least one solvent; at least one gas; and at least one surfactant. A foam composition according to the present invention also comprises: periodic acid; at least one gas; at least one surfactant; and deionized water. Any foam composition according to the methods of the present invention is suitable for treating a substrate to which undesired matter adheres for the purpose of removing the undesired matter.
Foams according to the present invention can additionally contain chelating agents and corrosion inhibitors to aid in preventing adsorption and readsorption of metals on the surface of the substrate and reduce undesired oxidation reactions. Further, foam processes are safer than currently practiced liquid-based techniques because foams require the handling of less potentially hazardous chemical. As such, foam processes provide increased safety, decreased material costs, and increased product performance when compared to entirely liquid phase processes. Effective utilization of physical means such as surface tension forces and buoyancy, when combined with the chemical means of effective cleaning formulations, can provide a synergistic cleaning effect that can surpass the effectiveness of prior art cleaning means.
The cleaning power of the foams of the present invention is envisaged to occur by one or more of a number of mechanisms. The cleaning mechanism is thus not limited strictly to chemical action on a substrate surface but also includes the mechanisms of bubble formation, scrubbing, and bubble bursting, alone or in combination with one another. Bubble formation removes undesired matter from the surface of a substrate through movement of the liquid film between the undesired matter and the substrate surface so that the resulting buoyancy lifts away undesired matter. Scrubbing removes undesired matter from the surface of the substrate through the movement of the liquid film in a way that creates surface tension differences that give rise to a force during movement of the liquid film. Moreover, bubble bursting energy significantly complements cleaning power. Foam compositions also enable application of a low and uniform pressure to the wafer surface for precision CMP and serve equally well in post-clean and post-CMP rinsing.
The present invention is particularly selective in removing post-etch residue from the surfaces of semiconductor substrates which comprise vias and low-k dielectrics without affecting structural integrity and detail. The foam compositions can also remove particles smaller than 0.3 microns in size from the surface of the semiconductor substrate, operate at low temperatures, have a low etch rate of silicon dioxide, reduce the quantity of undesired material available for redeposition on the substrate, and inhibit corrosion. Moreover, much less chemical and liquid is required for treatment of the substrate.
FIGS. 4(a), (b), and (c) describe the various degrees of wetting that may be present in the foam cleaning processes described herein.
The present invention includes foams formed from liquid compositions that comprise chemical reagents. The present invention also comprises use of such foams to etch, clean, and rinse substrates. The foam processes and compositions of the present invention are particularly suitable for working with the intricate fine-scale structures developed on semiconductor wafers during semiconductor manufacturing processes. The foam processes and compositions of the present invention combine the properties of foams with chemical activity to achieve a high cleaning efficiency, low material cost, and improved safety over commonly used liquid phase cleaning processes.
According to the methods and compositions of the present invention, a substrate is an underlying solid material used in manufacturing. In a preferred embodiment of the present invention, substrates are the underlying solid materials used in manufacturing products such as integrated electronic circuitry and microelectromechanical systems (MEMS). In a particularly preferred embodiment of the present invention a substrate is a semiconductor wafer, such as a wafer of silicon. As would be understood by one of skill in the art, it is not intended that the methods and compositions of the present invention are limited to particular substrate materials.
The present invention also provides for foam compositions that are non-flammable, have low etch rates of silicon dioxide, and are capable of safely and selectively removing post-etch residue from metals, vias, and low-k dielectrics. The foam compositions of the present invention are also applicable to CMP and lead to improved planarization of integrated circuit layers by providing a chemical delivery medium that requires less pressure to distribute and less chemical to operate. Post-cleaning and post-CMP rinse can likewise benefit from the advantages of the foam technology of the present invention by the synergistic effect of the foam combined with an effective cleaning or rinsing chemistry.
According to the methods and compositions of the present invention, a foam comprises an agglomeration of bubbles separated from each other by thin liquid films, wherein the composition of the liquid can comprise any number of components such as water or deionized water, acid, base, surfactant, and various chemicals capable of chelating metals, inhibiting corrosion, and cleaning undesired matter from the surface of a substrate. Ideally, the foam is formed by imparting mixing energy to the liquid composition, either by agitating the liquid composition in the presence of a preferred gas, introducing a preferred gas into the liquid composition, or by lowering the overall pressure of a gas saturated liquid composition.
Undesired matter that is preferably removed from the substrate surface according to the methods of the present invention includes organic and inorganic materials, such as particles, films from photoresist material, and traces of any other impurities including metals deposited while implanting material on the surface of the substrate or the residue created while etching the surface of the substrate. Undesirable material also includes particulate matter that is left after a planarization process step, wherein it is understood that planarization is removal of a layer, for example an oxide layer after an etching step.
The foam compositions of the present invention comprise at least one chemical agent; at least one solvent; at least one gas; at least one surfactant; and water. The foam compositions also additionally comprise one or more of the following: a chelating agent; a corrosion inhibitor; and one or more acidic or basic compounds for the purpose of maintaining the pH of the composition, when in liquid form, within a specified range. In some embodiments the solvent itself can be water.
The chemical agent of the present invention is preferably selected from the group consisting of: a fluoride, a hydroxylamine, an amine and periodic acid.
Where water is present in the foam compositions of the present invention it is preferably deionized water, and even more preferably high purity deionized water.
The gas that is found within the bubbles of the foam compositions of the present invention is preferably selected from the group consisting of: nitrogen, argon, helium, air, oxygen, carbon dioxide, and ozone. The gas is more preferably nitrogen or argon. In one embodiment the gas is air. In another embodiment, the gas is oxygen. The gas may also be carbon dioxide in a less preferred embodiment.
Surfactants are surface active agents and are integral to the present invention where the chemical agent will not lower the surface tension of the solution sufficiently on its own to facilitate foam formation. Surface activity is defined by the activity of molecules at an interface, where the interfaces of importance in the present invention include the interface between the liquid film surrounding the gas within the foam bubble; the interface between the cleaning composition and the undesired matter; and, the interface between the cleaning composition and the surface of the semiconductor substrate. As is known to one of skill in the art, surfactants typically consist of molecules that contain both polar and non-polar functional groups. The choice of surfactant balances the tendency of molecules to pack together at an interface with the tendency of the molecules to diverge from an interface. Adsorption at an interface between a solid and a liquid lowers the interfacial surface tension, and as the interfacial surface tension decreases, the solid is more readily wet by the liquid.
Foam stability can be increased by surfactants that resist drainage of the liquid film around the foam bubble, a process which results in eventual rupture. A balance of forces is reached where the drainage stops at a certain film thickness. The foam compositions of the present invention preferably comprise at least one surfactant selected from the group consisting of: anionic surfactants, cationic surfactants, nonionic surfactants, amphoteric surfactants, and silicone based surfactants, wherein at least one surfactant is suitable to allow foaming of a liquid formulation. Especially preferred surfactants are poly(vinyl alcohol) and poly(ethyleneimine).
The corrosion inhibitors that are optionally included in the foam compositions of the present invention are preferably inorganic nitrate salts such as ammonium, potassium, sodium and rubidium nitrates, aluminum nitrate and zinc nitrate.
The chelating agents that are optionally included with the foam compositions of the present invention are typically organic molecules and are preferably bidentate, tetradentate, hexadentate or octadentate. Examples of suitable chelating agents are found in commonly assigned U.S. Pat. No. 6,117,783, at col. 8, lines 36 to 49, and in commonly-assigned U.S. Pat. No. 6,156,661, at col. 8, lines 52 to 63, though the entirety of both of these patents are incorporated herein by reference.
Some foam formulations of the present invention require the addition of acids and/or bases to adjust the pH to an acceptable value. The acids suitable for use in the present invention are organic or inorganic. The important factor is the solubility of the acid and base products in any additional agents in the liquid solutions.
The bases suitable for use to adjust the pH of the cleaning solution can be composed of any common base, i.e., sodium, potassium, magnesium hydroxides, or the like. Such bases are problematic, however, because they introduce mobile ions into the foam formulation which can be damaging to today's semiconductor chips. Preferred bases therefore include choline (a quaternary amine) or ammonium hydroxide.
Cleaning the surface of a substrate using the foam process of the present invention does not require the large quantity of chemical that is used by a liquid phase process. The quantity of cleaning chemical that is present in the liquid from which the foam are formed is found to be sufficient to remove undesired matter from substrate surfaces. This is especially true for the surfaces of semiconductor substrates, since integrated circuit manufacture already utilizes very rigorous procedures that ensure the cleanliness of the various steps in the process.
The methods of the present invention are particularly suited to cleaning semiconductor wafer surfaces that have fine-scale features such as vias, circuit pathways, and other circuit components. For the purposes of the present invention, small particles that constitute undesired matter and fine-scale features on substrate surfaces, such as those that have been engineered during integrated circuit manufacture, preferably have at least one dimension that is less than about 1 micron. More preferably at least one dimension of a small particle of undesired matter or of a fine-scale feature is less than about 0.1 micron. Even more preferably, at least one such dimension is less than about 0.07 microns. Most preferably, at least one such dimension is as small as about 0.007 microns. For the purposes of the present invention, a dimension can be a length, height, breadth, radius, thickness or diameter of a particle or fine-scale structure. For example, an approximately spherical particle of undesired matter that may be removed by the methods of the present invention may have a diameter of slightly less than 0.1 microns. As another example, a circuit component on the surface of a semiconductor substrate may have a width of about 0.08 microns. One of skill in the art will appreciate that the aforementioned dimensions are purely exemplary and the methods and compositions of the present invention may be applied to remove undesired matter of a continuous range of sizes from substrate surfaces. For the purposes of the present invention, cleaning can comprise removal of post-etch residue as well as other particulate matter.
The foam compositions and processes of the present invention may also be used for etching. Formulations that may accomplish cleaning of a substrate may also have the effect of etching a substrate. Thus, it is appropriate to consider etching and cleaning as related processes such that apparatus and steps carried out for cleaning a substrate may also be contemplated for etching. In particular, etching itself may be regarded as a form of corrosion.
A first embodiment of the foam-based process of the present invention is shown in
It is envisaged that, while foam 209 is in contact with substrate 100, the bubbles 207 in foam 209 burst and facilitate removal of particles from the surface of the substrate 100. The longevity of foam 209 depends upon the relative rates of formation and bursting of bubbles 207. The bubbles 207 can have a formation rate that surpasses the burst rate, which will result in overflow of spent foam from the top of treatment vessel 102. In this case, additional cleaning solution 210 is preferably added during the treatment period to maintain bubble coverage over the surface of the semiconductor substrate 100. Alternatively, bubbles 207 can have a formation rate equal to the burst rate, which will result in no overflow from the top of treatment vessel 102. In this case, the dirty cleaning solution is eventually forced to overflow from treatment vessel 102 by adding either fresh cleaning solution 210 or a rinsing solution 210, with or without bubbling. The fresh cleaning solution 210 or rinsing solution 210 is allowed to drain through outer vessel drain 112.
According to a second embodiment, foam cleaning is achieved with plug flow. A goal of the plug flow process is to supply substrate 100 with fresh cleaning chemical that is largely unreacted and substantially free of undesired matter that could deposit or redeposit on substrate 100. As illustrated in
Foam stability depends on the tendency of the liquid film to drain and become thinner, and some foams can remain stable almost indefinitely if there is no disruption due to random physical or chemical disturbances. Other factors such as gas diffusion and evaporation also influence foam stability. Bubbles are considered to be unstable in the present invention where bubbles are bursting while foam remains in contact with the substrate. However, as the bubbles increase in stability, the material and energy savings continue to increase proportionate to volume displacement. Preferably, the foam 301 should have sufficient instability to flow through the outer vessel drain 112 at a rate that exceeds bubble formation in order for the flow out of the system to at least equal the flow into the system to facilitate drainage of spent foam 317.
In a third embodiment as shown in
In a fourth embodiment of the present invention as shown in
Any or all of the embodiments described hereinabove may additionally involve moving substrate 100 with respect to the foam in order to amplify the cleaning effect of the foam formulation. Moving a substrate can comprise agitating, rotating, or causing the substrate to change its angle of declination with respect to the vertical, as well as moving the substrate up, down or sideways, within the foam.
FIGS. 4(a), (b), and (c) describe various degrees of wetting that may be present in the foam cleaning processes described herein. Undesired matter 420 does not necessarily have to be wet by a bubble 207 of cleaning solution in order to be removed as long as the substrate 100 itself is wet by the cleaning solution. As is understood by one of skill in the art, wetting occurs when the contact angle between the liquid film around bubble 207 and contacting substrate 100 is less than 90 degrees. The smaller the contact angle, the greater the degree of wetting. In
Accordingly, in a fifth embodiment, there is a difference in surface tension between the liquid film around bubble 207 and undesired matter 420, and the liquid film around bubble 207 and semiconductor substrate 100. Thus, the movement of the liquid film around bubble 207, whether the liquid is advancing, retracting or continuously flowing over the substrate, creates the scrubbing action that can remove particles. The advantage of this embodiment is that the cleaning solutions can be selected with the goal of maximizing bubble bursting energy and/or designing surface tension differences.
Other methods and apparatus that may be used to accomplish application of foam to a substrate, according to the general principles of the present invention, can be found in U.S. Pat. No. 6,296,715 B1. For example, cleaning and rinsing can be performed in the same piece of apparatus in close succession.
The concentration of cleaning chemical in the liquid film from which the bubbles are formed may be assumed to be effectively identical to the concentration of the liquid composition used to create the foam. According to the methods of the present invention, foam compositions that are preferably used to clean the surface of substrates have identical compositions to those available in the liquid phase. Such, foam compositions are effective if they provide sufficient driving forces to remove undesired matter.
In another mechanism, it is thought that the action of the bursting foam bubbles provides the additional necessary force to dislodge undesired matter from the surface of the substrate. The following analysis illustrates the salient features of the bursting bubble model. The work expended to produce one bubble can be expressed as:
Work=Aγ=4πr2γ
where A is the total surface area of a bubble and γ is the surface tension of the liquid solution. Assuming that each bubble has a radius of 30 microns, and the surface tension of the foamed solution is 50 dynes/cm, each bubble will discharge 0.0057 ergs upon bursting. A circular wafer, as is typically used in semiconductor manufacture, with a diameter of 30 cm, has a surface area of 707 cm2. Thus, such wafer can accommodate 19.6×106 bubbles at any given time, assuming uniform complete coverage. If 50% of the bubbles burst, summing the work to produce the bubbles and equating that work to the energy released, results in a total energy imparted to the substrate surface of 55,860 ergs. If it is assumed that the foam is entirely replenished in 1 minute, and that the foam resides on the surface of the substrate for 10 minutes, then 558,600 ergs are imparted to the surface during cleaning.
As a useful indicator of the probable potency of bubble bursting, the force exerted on the surface by a bursting bubble may be compared with the forces exerted during megasonics, another technique used in substrate cleaning processes. Dividing the work to form a single bubble by the radius of the bubble provides the force imparted by a bursting bubble:
Force=4πrγ
Thus, a force value of 1.88 dynes is released from a bursting bubble of radius 30 microns formed from a solution whose surface tension is 50 dynes/cm. The acceleration produced by a bursting foam bubble can be estimated by dividing the force produced by the bursting by the mass of the fluid moving from the burst:
Mass=πr2δp; and
Acceleration=4γ/rδp,
wherein δ is the wall thickness of the bubble, and p is the fluid density. Assuming δ=0.001 cm and p=approximately 1.0 g/cm3, provides an estimated acceleration of 0.66×108 cm/s2 for an individual bubble.
In megasonics, the ability of the transducer to remove particles from a substrate is measured in terms of the acceleration induced on the liquid medium by sound waves. A 300 W transducer can produce an acceleration of 2.5×108 cm/sec2, which translates to a dislodging force of 1.25×10−4 dynes on a 1 micron particle. Since the acceleration from bubble bursting is the same order of magnitude as the acceleration produced by megasonics, the dislodging force is similar in magnitude and it can be expected that a bursting bubble, or several acting simultaneously, can dislodge particles of 1 micron in size.
There are likely to be at least five general mechanisms for removing impurities from semiconductor wafer surfaces: physical desorption by solvents, a change in the surface charge with either acids or bases, ion complexion by removing metals with chelating agents, oxidation or decomposition of impurities through redox reactions or degradation by free radical attack and etching to release impurities. In general, chemical compositions for cleaning in foam based methods according to the present invention are preferably prepared in liquid form and foamed in contact with a substrate by any of the methods previously described herein.
Fluoride Based Compositions
The fluoride-based compositions of the present invention can change the surface charge of substrates when combined with acids or bases, or etch an oxide surface to release impurities. The cleaning compositions according to this embodiment of the present invention are found in U.S. Pat. Nos. 6,235,693 B1 and 6,248,704 B1, both of which are incorporated herein by reference.
Various papers report the use of dilute HF solutions to clean residues. The ability of these solutions to clean is well known for front end processing, but due to the aggressive nature, HF shows some disadvantages at the interconnect level. Dilute hydrofluoric acid solutions can under certain conditions remove the sidewall polymers by aggressively attacking the via sidewall of the dielectric and therefore changing the dimensions of the device, as taught by Ireland, P., Thin Solid Films, 304, pp. 1-12 (1997), and possibly the dielectric constant. Such an attack may result in a loss in critical dimensions, which is not desirable (see Lee, C. and Lee, S., Solid State Electronics, 4, pp. 92 1-923 (1997)).
Previous chemistries that contain HF, nitric acid, water and hydroxylamine are aggressive enough to etch silicon, as taught by U.S. Pat. No. 3,592,773 issued to A. Muller. Recent information also indicates that the dilute HF solutions can be ineffective for cleaning the newer CFx etch residues, as taught by K. Ueno et al., “Cleaning of CHF3 Plasma-Etched SiO2/SiN/Cu Via Structures with Dilute Hydrofluoric Acid Solutions,” J. Electrochem. Soc., vol. 144, (7) (1997). In addition, contact holes opened to the TiSi2 layer have also been difficult to clean with HF solutions since there appears to be an attack of the underlying TiSi2 layer.
In a preferred embodiment of the present invention, the fluoride-based compositions suitable for foaming according to the methods of the present invention comprise: from about 0.01 percent by weight to about 10 percent by weight of one or more fluoride compounds; from about 20 percent by weight to about 50 percent by weight water, at least one non-aqueous solvent and is free of both organoammonium and amine carboxylate compounds. The composition preferably has a pH between about 6 and about 10. Additionally, the composition optionally contains corrosion inhibitors, chelating agents, surfactants, acids and bases. The fluoride compound is even more preferably present in an amount from about 0.01 percent by weight to about 5 percent by weight. Preferably the fluoride compound is ammonium fluoride (NH4F), ammonium bifluoride (NH4.HF2), or hydrogen fluoride (HF). Even more preferably, the fluoride compound is ammonium fluoride or ammonium bifluoride. When the fluoride is HF, the composition is preferably buffered to ensure that the pH is between about 6 and about 10. The water used to formulate the fluoride composition is preferably deionized water. Preferably the non-aqueous solvent is from about 20 percent by weight to about 80 percent by weight of a lactam solvent and optionally from 0 to about 50 weight percent of an organic sulfoxide solvent such as an alkyl sulfoxide, preferably dimethyl sulfoxide, or a glycol solvent such as propylene glycol.
According to this preferred embodiment, suitable lactam solvents include lactams having from 4 to 7 membered rings, including 1 to 5 carbon atom alkyl and alkoxy substituted lactams and 5 to 7 member ring alkane substituted lactams. Suitable specific examples of lactam solvents include piperidones, such as 1 to 5 carbon atom alkyl, dialkyl and alkoxy, dialkoxy piperidones, including N-methyl piperidone, dimethyl piperidone, N-methoxy piperidone, dimethoxy piperidone, N-ethyl piperidone, diethylpiperidone, diethoxy piperidone, and the like; cyclohexyl analogues of these piperidones, such as N-methyl pyrrolidone, N-2(hydroxyethyl-2-pyrrolidone, N-2(cyclohexyl)-2-pyrrolidone, and the like. The preferred lactam solvents are N-methyl piperidone, dimethyl piperidone and N-methyl pyrrolidone. Dimethyl piperidone is commercially available as a mixture of predominantly 1,3 dimethyl piperidone and a minor amount of 1,5 dimethyl piperidone. The lactam solvents can be used either singly or as mixtures.
In an alternative preferred embodiment, the fluoride-based compositions suitable for foaming according to the methods of the present invention comprise: from about 0.01 percent by weight to about 5 percent by weight of one or more fluoride compounds; from about 20 percent by weight to about 50 percent by weight water, at least one non-aqueous solvent and is free of both organoammonium and amine carboxylate compounds. The composition has a pH between about 7 and about 10. Additionally, the composition optionally contains corrosion inhibitors, chelating agents, surfactants, acids and bases. The fluoride compound is even more preferably present in an amount from about 0.05 percent by weight to about 5 percent by weight. Preferably the non-aqueous solvent is from about 20 percent by weight to about 80 percent by weight of an organic amide solvent and from 0 to about 50 weight percent of an organic sulfoxide solvent. Preferably the fluoride compound is ammonium fluoride, ammonium bifluoride, or hydrogen fluoride (HF). Even more preferably, the fluoride compound is ammonium fluoride or ammonium bifluoride. When the fluoride is HF, the composition is preferably buffered to ensure that the pH is between about 7 and about 10. The water used to formulate the fluoride composition is preferably deionized water.
According to this alternative preferred embodiment, suitable organic amide solvents are N,N-dimethylacetamide and N,N-dimethylformamide. The preferred organic amide solvent is N,N-dimethylacetamide. The organic amide solvents can be used either singly or as mixtures. The composition optionally contains alkyl sulfoxides such as dimethyl sulfoxide.
The chelating agents that are optionally included in the fluoride containing foam compositions of the present invention are preferably selected from: catechol, ethylene-diaminetetraacetic acid, citric acid, pentandione and pentandione dioxime. Suitable chelating agents are also described in commonly assigned U.S. Pat. No. 5,672,577, issued Sep. 30, 1997 to Lee, which is incorporated herein by reference.
The acids for use in the fluoride-containing foam compositions preferably include nitric, sulfuric, phosphoric, hydrochloric acids (though hydrochloric acid can be corrosive to metals) and the organic acids, formic, acetic, propionic, n-butyric, isobutyric, benzoic, ascorbic, gluconic, malic, malonic, oxalic, succinic, tartaric, citric, gallic. The last five organic acids are also examples of chelating agents. Concentrations of the acids can vary from about 1 to about 25 wt percent. The important factor is the solubility of the acid and base products in any additional agents in the liquid solutions.
The fluoride-containing compositions of the present invention are free of both organoammonium and amine carboxylate compounds which are phase-transfer catalysts that can accelerate undesirable side reactions such as corrosion and introduce additional cationic and anionic contamination. Nevertheless, it has been found that processing times, can be improved by adding a small amount of an amine, preferably an alkanolamine such as monoethanolamine (MEA), to the chosen formulation. In a preferred embodiment the amine is not a quaternary amine. In an especially preferred embodiment, 0.1 weight percent of MEA is added to a fluoride containing formulation.
In addition, the fluoride cleaning compositions of the present invention are preferably effective at temperatures lower than 100° C. and even more preferably are effective at room temperature. However, some adjustment in reaction temperature may be necessary to allow sufficient foaming, and the reaction temperature of choice will likely rely on the surfactant or surfactants chosen. Moreover, the compositions effective at lower temperatures help to inhibit redeposition of metals, are non-flammable, have low etch rates of silicon dioxide, and are capable of removing post-etch residues from metals, vias, and low-k dielectrics.
The fluoride-based compositions of the present invention avoid the widespread disadvantages of many fluoride-containing compositions that are toxic, and for which conditions must be carefully controlled, and for which evaporation rates are very high, thus requiring further containment procedures.
Hydroxylamine Based Compositions
According to one embodiment of the present invention, alkaline organic solvents for post-etch residue removal can be comprised of amines, alkanolamines, and neutral organic solvents, either alone or in combination. Such formulations are effective at residue removal without causing undesirable damage of the substrate. Where such formulations also require high temperatures, generally over 100 ° C., they are less preferred, however.
A preferred embodiment of the present invention utilizes a recently-developed class of post-etch residue cleaning chemistries described in U.S. Pat. No. 6,000,411, which is incorporated herein by reference. These foam formulations include hydroxylamine (HDA), an alkanolamine, a surfactant, at least one solvent such as water or a polar solvent, a gas and, optionally, a corrosion inhibitor and/or a chelating agent. The alkanolamine is preferably chosen so as to be miscible with HDA. Such formulations preferably operate at temperatures in the range 70-80° C. and even more preferably operate at lower temperatures. Some adjustment in operating temperature may be desirable to allow sufficient foaming, and the temperature of choice will likely depend on the surfactant or surfactants chosen. Where water is used it is preferably deionized water. Polar solvents can be added to help remove stubborn photoresist material and other impurities without damaging the semiconductor substrate.
Organic derivatives of hydroxylamine, such as R1R2-hydroxylamine, can also be included, wherein at least one of R1 or R2 must be an alkyl group containing 5 or fewer carbons.
The alkanolamine is preferably selected from the group consisting of monoalkanolamines, dialkanolamines, and trialkanolamines and is present in a concentration that ranges from about 10 to about 80 percent by weight of the formulation.
The chelating agent concentration preferably ranges from about 2.5 to about 30 percent by weight and is selected from the group consisting of:
The foam formulation may also additionally comprise an acid that is preferably present in less than about 10% by weight.
Where the at least one solvent of the foam composition includes an organic polar solvent, it preferably a glycol, a glycol alkyl ether, an alkyl N-substituted pyrrolidone, ethylene diamine or ethylene triamine.
Amine Based Formulations (“Copper Compatible Chemistries”)
Because of the frequency with which copper finds use in features on the surfaces of substrates, it is preferable for cleaning chemicals to have minimal adverse impact on copper and copper-containing materials. Cleaning chemicals for which this is the case are often referred to as “copper-compatible.” A preferred embodiment of the present invention utilizes a recently-developed class of post-etch residue cleaning chemistries described in PCT publication No. WO 00/02238, which is incorporated herein by reference.
Accordingly, formulations for post-etch residue removal preferably comprise an amine, a solvent that may be water or optionally an organic solvent, a gas, a surfactant, and optionally a corrosion inhibitor. The amine is preferably present in about 1 to about 60 weight %. The organic solvent is preferably polar and is present in about 5 to about 80 weight %, preferably from about 20 to about 80% by weight. Water may be present in about 10 to about 80% by weight. The corrosion inhibitor is typically present in about 0.5 to about 5 weight % and preferably from about 1 to about 5 weight %.
The amine is preferably selected from alkaline organic solvents and even more preferably from quaternary ammonium hydroxides such as tetramethylammonium hydroxide (TMAH) and tetrabutylammonium hydroxide (TBAH), quaternary alkanol ammonium hydroxides such as choline (HO(CH2)2N+(Me)3 in solution), choline derivatives such as simple choline salts, and cyclic amine compounds such as morpholine. In an especially preferred embodiment, the amine is choline. It has been found that choline can also be used in combination with hydroxylamine or a hydroxylamine salt, which is preferably present from about 1 to about 12% by weight. In another preferred embodiment, choline is supplemented with a stabilizer selected from the group consisting of: a hydroxylamine salt, hydrazine, a hydrazine salt, and an organic derivative of hydroxylamine with the formula R1R2N—OH, wherein at least one of R1 or R2 is an alkyl group containing 5 or fewer carbons or Hydrogen.
Polar organic solvents such as N-methyl pyrrolidone (5 member ring), N-methyl piperidone (6 member ring), γ-butylolactone, and propylene glycol are well known to those of skill in the art and can be added alone or in combination with one another to help remove stubborn photoresist material and other impurities without damaging the semiconductor substrate. In particular, these chemicals work well for cleaning copper substrates. However, some reduction in reaction temperature from customary operating temperatures, as described in PCT pub. WO 00/02238, may be desirable to allow sufficient foaming, and the reaction temperature of choice will depend upon the surfactant or surfactants chosen.
Corrosion inhibitors suitable for use in the amine based formulations of the present invention are found at page 8 of PCT publication WO 00/02238 and fall into two broad categories: substituted 5-membered ring heterocycles and hydroxy-substituted benzenes, including hydroxy substituted benzoic acid. Particularly preferred corrosion inhibitors include: catechol, t-butyl catechol, pyrogallol, gallic acid (3,4,5 tri-hydroxy benzoic acid), and benzotriazole.
Other formulations of copper compatible chemistries are shown hereinbelow, in which percentage compositions vary slightly from those described hereinabove. As would be understood by one of skill in the art, a variety of compositions may achieve the desired results.
Precision layering of the integrated circuit structure requires that excess materials from the previous manufacturing step be removed from the clean substrate. The CMP process removes the excess material through a wet chemical etch of the surface material followed by a mechanical abrasion of the etched surface. As such, CMP is like a controlled corrosion, and chemical selectivity is essential to maintaining desired intricate features on the substrate. An example is the copper damascene process, where trenches are etched into interdielectric layers, the walls of the trenches are coated with barrier materials, and then copper is deposited into the trench to serve as the conductive material. Excess copper above the trench is then removed by CMP. The challenge in CMP is always to remove the excess material evenly without “dishing,” which is the creation of a non-planar surface resulting in poor contact between intervening layers on the substrate. Interlayer dielectrics can be polished in this manner also. A patent that explains CMP is U.S. Pat. No. 6,117,783, which is incorporated herein by reference. The CMP process is performed at ambient pressure, and the pressure applied to the surface of the substrate is slightly above ambient pressure.
It is envisaged that standard CMP apparatus and methodology known to those of skill in the art can be utilized through application of foam-based formulations, resulting in improvements as described herein. However, some adjustment in reaction temperature from temperatures typically practiced in CMP may be necessary to ensure the foam to persist for long enough to be effective. As would be within the discretion of one of ordinary skill in the art, the reaction temperature of choice can be tailored by appropriate choice of surfactant or surfactants. It is not expected that the apparatus shown in
Preferred formulations for use in foam compositions involving periodic acid chemistries are included in U.S. Pat. No. 6,117,783, incorporated herein by reference. In the present invention, periodic acid (H5O6), an oxidant, is preferably used from 0.1-2.0% in solution with deionized water to serve as an etching agent for CMP. Caustics such as potassium hydroxide, sodium hydroxide, or metal free caustics such as ammonium hydroxide, TMAH, trimethyl(2-hydroxyethyl)ammonium hydroxide (choline), and choline derivatives are added to adjust the pH. A solution comprising periodic acid and, optionally, a caustic, is prepared and caused to foam. Generation of foam from rinsing solutions may utilize the methods of foam generation described hereinabove. The foam is contacted with a substrate during CMP. Where appropriate, a surfactant is added to the formulation in order assist foaming.
Whether cleaning or etching the substrate, the residual chemical and undesired matter is preferably removed in either a post-cleaning or a post-CMP rinse to effectively neutralize residual chemicals and wash away undesired material that may otherwise redeposit. For example, amine-based formulations are capable of removing post-etch residue but are also used in CMP and post-CMP cleaning. However, residual amines are corrosive and can damage the fine structure of the substrate and affect performance. Thus, neutralization of the residual chemical is often necessary to quench further reactions such as corrosion.
Accordingly, the methods of the present invention accommodate the use of foam formulations in rinsing that occurs after either cleaning or etching processes. Generation of foam from rinsing solutions may utilize the methods of foam generation described hereinabove. Preferably foam is introduced and applied to a substrate in a tank.
In a typical rinse, a benign organic chemical such as isopropyl alcohol or N-methylpyrrolidone (NMP) dilutes chemicals from previous process steps, either in liquid or foam form. The substrate is further rinsed with isopropyl alcohol or deionized water, also either in liquid or foam form, and the substrate is then dried with isopropanol vapor. In an alternative embodiment, nitrogen gas can be used to dry the substrate after the rinse. One particular foam formulation useful for removing residual amines is comprised of a monofunctional, difunctional or trifunctional organic acid with a buffering amount of a quaternary amine, ammonium hydroxide, hydroxylamine, hydroxylamine salt, and hydrazine or a hydrazine salt base. Since NMP is not normally used with this formulation, deionized water is typically used for rinsing and a drying step follows.
Preferred formulations for use in foam-based compositions for post-CMP processes, according to the methods of the present invention are found in U.S. Pat. No. 5,981,454, to Small, incorporated herein by reference. In particular, foam-based compositions for post-CMP CMP processes comprise: at least one amine; at least one acid selected from the group consisting of citric acid, formic acid, acetic acid, propionic acid, n-butyric acid, iso-butyric acid, benzoic acid, ascorbic acid, gluconic acid, malic acid, malonic acid, oxalic acid, succinic acid, tartaric acid, and gallic acid; at least one gas selected from the group consisting of nitrogen, argon, helium, air, oxygen, carbon dioxide, and ozone; at least one surfactant suitable to allow foaming selected from the group consisting of anionic surfactants, cationic surfactants, nonionic surfactants, amphoteric surfactants, and silicone based surfactants; at least one chelating agent selected from the group consisting of ethylenediaminetetraacetic acid, citric acid, oximes, lactic acid, 8-hydroxy quinoline, salicylic acid, and salicyclaldoxime; at least one corrosion inhibitor selected from the group consisting of catechol, t-butyl catechol, pyrogallol, gallic acid, benzotriazole; and, deionized water.
An especially preferred foam composition for post-CMP is such that the amine is selected from the group consisting of hydroxylamine, hydroxylamine salts, hydrazine, hydrazine salts, quaternary amines, and ammonium hydroxide. In particular, the concentration of amines is preferably sufficient to buffer the composition to a pH of 4 to 6.
In another preferred foam composition for post-CMP the concentration of acid ranges from about 2.0 to about 11 percent by weight. The preferred concentration of chelating agents is less than or equal to about 1.0 percent by weight and the concentration of surfactants preferably ranges from about 0.05 to about 3.0 percent by weight.
Liquid phase cleaning of a substrate was compared to foam phase cleaning. The cleaning chemical concentration was the same in both the liquid and foam experiments. Two different proprietary wafers were used in these cleaning experiments. Each wafer surface was contaminated with post-etch residue from the previous removal process. The wafers were designated T and S. Two surfactants were used to make the compositions foamable: a sodium salt of dodecylbenzene sulfonic acid (anionic surfactant, obtained from Aldrich Chemical Co, Milwaukee, Wis.) and NCW601A (nonionic surfactant, obtained from Waco Chemical, Richmond, Va.).
The liquid phase cleaning experiments involved suspending a wafer fragment in a 100 cm3 beaker and stirring the cleaning composition magnetically at room temperature and pressure for a designated time. The foam phase cleaning experiments involved suspending a wafer fragment in a tall cylindrical vessel equipped with a gas dispersion tube for supplying nitrogen gas. Proper adjustment of the gas flow generated a foam head above the liquid phase. The wafer was suspended in the foam head for the designated time.
Table 1 provides a summary of the cleaning compositions and the experimental conditions, wherein designations such as 10/1/10 refer to three times (in minutes): treatment time/rinse time/treatment time. The final rinse was at least two minutes and was followed by drying with nitrogen gas. All experiments were at room temperature.
In order to support a theory that bubble bursting alone provides cleaning power, wafer specimen S had much post-etch residue and was subjected to treatment with a solution of deionized water containing 0.6 weight percent of the anionic surfactant, and 0.18 weight percent of the nonionic surfactant. The treatment cycle comprised 10 minutes of contact with the deionized water and nitrogen bubbles. The wafer was then rinsed for 1 minute, allowed to contact with the deionized water and nitrogen bubbles for another 10 minutes, and then rinsed again for 2 minutes. The wafer was then dried with nitrogen gas. The bursting of the bubbles removed post-etch residue from the wafer surface whereas the same solution of deionized water without nitrogen bubbles showed essentially no cleaning.
In order to support a theory that the chemical in the liquid film surrounding the bubbles would clean at least as well as the same chemical concentration in an all liquid phase solution, wafer samples S and T were cleaned in both liquid and foam phases.
Table 2 provides a rating system for the cleaning and corrosion results, where a score of 0 is the poorest cleaning and the poorest corrosion inhibition, and a score of 10 is the highest level of cleaning and the highest level of corrosion inhibition.
Formulations A, B, and C are designations for EKC formulations EKC 640, EKC 640D, and EKC 6800 respectively. All EKC chemicals are available from EKC Technologies, 2520 Barrington Ct., Hayward, CA 94545. These formulations are representative of the examples in U.S. Pat. Nos. 6,248,704 B1 and 6,235,693 B1. DI is deionized water.
Table 3 provides examples chemical formulations capable of foaming with surfactants with each component expressed in weight percent prior to addition of surfactant.
Formulations D, E, F and G additionally contain an amount of a surfactant sufficient to ensure foaming at desired operating temperatures.
Some copper compatible cleaning formulations that are capable of foaming, along with variations in those formulations are provided in the Tables 4 and 5.
It is noted that formulations H and J in Table 4 do not have deionized water in them. All of formulations H through J additionally contain an amount of a surfactant sufficient to ensure foaming.
In Tables 5A-D, alternative compositions for formulations H, I, J and K, respectively, are indicated. In the right hand column of each row, headed “others”, alternative materials are listed that could replace the component of the formulation indicated by the row in question.
The following example is from U.S. Pat. No. 6,117,783 and shows the effect of pH when using periodic acid. Removal rates of tungsten generally increase with pH for periodic acid in water on 3″ wafers coated with sputtered tungsten using 1% or 2.5% alumina and 0-3 parts ammonium hydroxide to adjust pH. Periodic acid was added to an alumina slurry at a rate of 50-100 mL/min, and the wafers were polished using a Logitech PM5 polisher (33 rpm, 12″ IC1000 pad, 2 psig):
Table 6 shows that periodic acid is an effective etchant, and that the etch rate can be controlled by adjusting the pH of the periodic acid and alumina slurry using inorganic bases such as KOH and NaOH, or metal-free organic bases such as TMAH, choline, and choline derivatives. For use in foam compositions, a surfactant is added to the periodic acid formulation.
The preferred compositions are found in U.S. Pat. No. 5,981,454 which is hereby incorporated by reference. The economy and cleaning power of these formulations is also improved through addition of the proper surfactant to enable foaming. Exemplary formulations for use in foam compositions are shown in Table 7, where it is assumed that additional amounts of surfactant are added to ensure efficient production of foam.
In Table 7, the reaction temperature is from about room temperature to about 30° C., and reaction time is from about 1-15 minutes. The percentage composition of HDA is an amount sufficient to buffer the solution to pH 4-6.
All publications and patent applications mentioned in this specification are herein incorporated by reference to the same extent as if each individual publication or patent application was specifically and individually indicated to be incorporated by reference.
One skilled in the art will recognize from the foregoing examples that modifications and variations can, and are expected to be made, to the foregoing foam compositions in accordance with varying conditions inherent in the production process, without departing from the spirit or scope of the appended claims. The embodiments above are given by way of example and do not limit the present invention, which is defined by the following claims.
| Number | Date | Country | |
|---|---|---|---|
| Parent | 10060109 | Jan 2002 | US |
| Child | 11450291 | Jun 2006 | US |
