The present invention relates generally to methods for making a glass material and apparatus, and more particularly, to apparatus and methods of controlling an actual batch fill rate of batch material entering a glass melter.
Methods and apparatus for making glass material typically include introducing batch material into a glass melter for producing a quantity of molten glass. The molten glass can thereafter be formed into glass sheets. Various process techniques may be adjusted to impact the efficiency of the process and/or characteristics of the formed glass sheets.
The following presents a simplified summary of the disclosure in order to provide a basic understanding of some example aspects described in the detailed description.
In one example aspect, a method of making a glass material is provided. The method comprises the step of controlling an actual batch fill rate of batch material entering a glass melter. The step of controlling further comprises the steps of estimating a batch fill rate of batch material entering the glass melter, and controlling the actual batch fill rate based on a comparison between a predetermined batch fill rate and the estimated batch fill rate.
In another example aspect, a method of controlling a level of molten glass within a glass melter is provided. The method comprises the steps of monitoring a level of molten glass within the glass melter, calculating a predetermined batch fill rate for the glass melter based on a difference between a predetermined level of molten glass and the monitored level of molten glass, estimating a batch fill rate of batch material entering the glass melter by determining a characteristic change in a quantity of batch material over time; and controlling an actual batch fill rate of batch material entering the glass melter based on a comparison between the predetermined batch fill rate and the estimated batch fill rate.
In yet another example aspect, a glass melter is provided. The glass melter comprises a level sensor configured to measure a level of molten glass within the glass melter and a level controller operatively connected to the level sensor. The level controller is configured to calculate a predetermined batch fill rate for the glass melter based on a difference between a predetermined level of molten glass and a level of molten glass monitored by the level sensor. The glass melter also comprises a batch material sensor configured to measure a characteristic of a quantity of batch material, and an estimator operatively connected to the batch material sensor. The estimator is configured to receive information from the batch material sensor to estimate a batch fill rate of batch material entering the glass melter. The glass melter further comprises a batch fill rate controller configured to calculate a speed command based on a difference between a predetermined batch fill rate from the level controller and an estimated batch fill rate from the estimator, and a batch delivery device configured to fill the glass melter with batch material at an actual batch material fill rate in response to a speed command from the batch fill rate controller.
These and other aspects are better understood when the following detailed description is read with reference to the accompanying drawings, in which:
Examples will now be described more fully hereinafter with reference to the accompanying drawings in which example embodiments are shown. Whenever possible, the same reference numerals are used throughout the drawings to refer to the same or like parts. However, aspects may be embodied in many different forms and should not be construed as limited to the embodiments set forth herein.
As shown in
The controller 122 can be an electronic controller and can include a processor. The controller 122 can include one or more of a microprocessor, a microcontroller, a digital signal processor (DSP), an application specific integrated circuit (ASIC), a field-programmable gate array (FPGA), discrete logic circuitry, or the like. The controller 122 can further include memory and can store program instructions that cause the controller 122 to provide the functionality ascribed to it herein. The memory can include one or more volatile, non-volatile, magnetic, optical, or electrical media, such as read-only memory (ROM), random access memory (RAM), electrically-erasable programmable ROM (EEPROM), flash memory, or the like. The controller 122 can further include one or more analog-to-digital (A/D) converters for processing various analog inputs to the controller. It will be apparent to those skilled in the art that various modifications and variations can be made without departing from the spirit and scope of the claimed invention.
The apparatus 110 can further include one or more of a first connecting tube 136, a finer 138 (e.g., finer tube), and a second connecting tube 140. The first connecting tube 136 can provide fluid communication between the glass melter 112 and the finer 138. The second connecting tube 140 can provide fluid communication between the finer 138 and other downstream components (not shown).
Example methods of making glass with the apparatus 110 will now be described. Referring to
As shown in
If the actual batch fill rate 244 entering the glass melter 112 is kept close to a molten glass pull rate coming out of the finer 138, then the level of the molten glass 124 will be held relatively constant. The level of the molten glass 124 response (Level) can be modeled as proportional to the integral of the difference between the actual batch fill rate 244 and molten glass pull rate as shown in the following format:
Level=km∫(fill rate(t)−pull rate(t))dt (1)
where km is a constant of proportionality (or the process gain) which is inversely proportional to the surface area of the melting tanks (e.g. the glass melter 112 and the finer 138). This relationship is clear since an actual batch fill rate 244 that is higher or lower than the corresponding molten glass pull rate will correspondingly accumulate or reduce the mass of the molten glass in the glass melter 112 and the finer 138. Therefore, the level of molten glass 124 can be adjusted up or down by moving the actual batch fill rate 244 up or down over an appropriate period of time and then returning the actual batch fill rate 244 to match the molten glass pull rate.
It is noted that there may be other disturbances not compensated for by batch fill rate control that can impact the level of molten glass 124, such as pressure and temperature variation in the glass melter 112. It may therefore be advantageous to adjust the predetermined batch fill rate 246 to achieve a stable level of molten glass 124. Referring to
In following example embodiments, the PI control for the batch fill rate controller 134 and the level controller 128 is designed by selecting the PI gains (i.e. proportional gain and integral gain) based on a variation of an internal model approach, which is useful for guaranteeing the closed-loop stability. The variation can include information about the fill rate variation to try and balance the tradeoff between closed-loop stability and disturbance rejection.
In an example embodiment, the PI gains for the batch fill rate controller 134 (i.e. inner control loop) are determined by considering the fill rate variation (i.e. disturbance d). The controller design can be based on a model of the process, in particular, using a process gain (kg) from the speed command 250 to the actual batch fill rate 244, time constant (τ) of the actual batch fill rate response, and delay time (θ) between the speed command 250 and the actual batch fill rate 244. These values can be determined from the process based on historical data, or for example from a step test. The controller design also uses the frequency response characteristic of the disturbances. The highest frequency (ω) of interest of the disturbance d is selected by examining the frequency response of these disturbances obtained from process data. The desired amount of disturbance attenuation (ad) is selected as well. This value is selected in the range of 0<ad<1, where 0 corresponds to zero percent attenuation while 1 corresponds to 100 percent. The proportional gain kp and integral gain ki are calculated using the following formula:
where Tc is the desired closed-loop time constant.
The desired closed-loop time constant Tc is determined by selecting a value (factor) that indicates the aggressiveness of the control action. The value factor can be chosen from the range of 1≦factor≦100, where a value of 1 is considered aggressive tuning and 100 is considered conservative tuning. Aggressive tuning generally provides a better disturbance rejection, but at the expense of reduced closed-loop stability margins and potential for amplification of actual batch fill rate calculation error. Conservative tuning will have the opposite effect; thus there is a tradeoff in the tuning selection. In one example, the factor has a value of 10. Once the factor value is selected, the desired closed-loop time constant is Tc chosen by using the following logical statement:
where rd=1−ad. In one example, to balance disturbance rejection with closed-loop stability, the disturbance attenuation ad is 0.9 and rd is 0.1.
In another example embodiment, the PI gains for the level controller 128 (i.e. outer control loop) are determined based on the inner control loop bandwidth and the model of the level response given in equation (1), specifically, the constant of proportionality (or the process gain) km. The inner control loop bandwidth is the bandwidth of the transfer function (Bi) from the predetermined batch fill rate 246 to the estimated batch fill rate 242. This is defined as the frequency (rad/s) where the transfer function Bi is −3 dB below the d.c. value. The proportional gain (kpo) of the level controller 128 is chosen to initially set the outer control loop bandwidth to be 5 to 10 times smaller than the inner control loop bandwidth. It is calculated using the following formula:
where χ is a constant. When χ=10, it emphasizes stability over aggressive performance, while a choice of χ=5 would give more aggressive outer loop control.
The integral gain (kio) of the level controller 128 is designed to avoid closed-loop oscillation, and is calculated using the following formula:
The integral gain kio of the level controller 128 will in general increase the outer-loop bandwidth. The outer-loop bandwidth can be calculated numerically and if the resulting value is determined to be too large relative to the inner-loop bandwidth, the parameter χ can be increased and the gains kpo and kio can be recalculated. In one example, an outer-loop bandwidth is close to the value chosen above when
In addition, online process tuning can be conducted by adjusting the design parameters rd, χ, or factor as appropriate. If the above-mentioned values of the parameters rd and χ are used, then the PI gains for the batch fill rate controller 134 and level controller 128 can be selected and tuned by simply choosing the valuefactor.
To implement the close-loop control of the batch fill rate, real-time batch fill rate information is needed for feedback. The actual batch fill rate 244 can be measured by any sensor that directly measures the rate of the batch material 114 entering the glass melter 112. Alternatively, the actual batch fill rate 244 entering the glass melter 112 should correspond to the loss-in-bin weight over time; thus, the batch fill rate can be estimated by characteristics change in a quantity of batch material 114 over time. The characteristics change can include change of the weight, mass, volume, level, density in a quantity of batch material 114, or the like.
In an example embodiment, the estimated batch fill rate 242 is determined by an algorithm as shown in
It is possible that the bin weight can shift during the estimation from an abrupt disturbance. For example, additional batch material 114 maybe added at the same time that the bin weight change is calculated. In that case, the weight change may be positive or in general may not correspond to the rate of removal. Under this condition, the resulting batch fill rate estimation would be inaccurate and would likely be counter productive for feedback control. Therefore, alternatively, it may be advantageous to compensate at step 366 for the additional batch material when determining the weight change over the period of time. Compensating the bin weight shift from an abrupt disturbance can be achieved using various methods. For example, the adding of additional batch material 114 during the time of estimating the batch fill rate can be compensated by subtracting a weight of the additional batch material.
In another example, the batch fill rate can be compensated by substantially masking the additional batch material with historical weight change data. For instance,
Referring to
The method starts with the bin weight data sampled every T seconds. This data may be filtered before or after sampling. The bin weight data at the sample instants kT, where k=0,1,2, . . . , is represented as BW(k). The weight change ΔBW(k) at the sample instants is given by the following formula at step 502:
A running average of weight change ΔBWavg(k), delayed by koffset+kavg
where ΔBWfitmod(k) is the filtered modified weight change that is calculated by equation (14) at step 514. Equation (10) can be initialized by using historical data or using zeros for the filtered modified weight change ΔBWfitmod(k). The koffset value is set to allow enough samples to detect the bin weight shift. As shown in
The step 506 detects any abrupt bin weight shift, such as adding additional batch material 114, at each sample point by comparing the weight change deviation, which is given by the following formula:
∥ΔBW(k)|−|ΔBWavg(k)∥≧ΔBWthreshold (11)
where ΔBWthreshold is a constant threshold value. The threshold value can be determined by examining process data to quantify the weight change deviation during abrupt bin weight shift. In one example, the threshold value is 0.2.
If conditional relationship of equation (11) is FALSE, then the unfiltered modified weight change ΔBWmod(k) is set equal to the weight change delayed by koffset, as calculated using the following formula at step 508:
If this conditional relationship of equation (11) becomes TRUE, then the method goes to step 510 of a transition from FALSE to TRUE for a period of time set by a timer. The period of transition is referred to as the alarm period set by the timer, and can be, for example, 5 minutes long.
During alarm period set by the timer at step 510, the unfiltered modified weight change ΔBWmod(k) is calculated using the following formula at step 512:
ΔBWmod(k)=ΔBWavg(k−koffset) (13)
where the average of weight change ΔBWavg(k) is delay by samples koffset.
A low pass filter is used at the step 514 to filter the unfiltered modified weight change ΔBWmod(k) using the following discrete-time filter:
The parameter ε sets the filter bandwidth and α1 and α2 set the shape of the frequency response. In one example, the values ε is 200, α1 is 2, and α2 is 1. The filter can be initialized at time k=0 using the following formula:
ΔBWfiltmod(−1)=ΔBWmod(−2)
ΔBWfiltmod(−2)=ΔBWmod(−2) (15)
The modified weight change ΔBWmod(k) filtered at step 514 at sample instant k can be sent to step 504 to calculate the average of weight change ΔBWavg(k+1) using equation (10) at the next sample instant k+1.
Eventually, the estimated batch fill rate 242 at sample instant k (FR(k)) in units of lbs/hour is calculated using the following formula at step 516:
FR(k)=−3600ΔBWfiltmod(k) (16)
Example methods may provide an actual batch fill rate 244 with a desirably low standard deviation. In one example, the standard deviation can be measured as a relative change of the actual batch fill rate with respect to the weight of the batch within the holding bin 116 over time. For example, a relative standard deviation of the actual batch fill rate 244 can be less than 2.32% of the weight of the batch material within the holding bin 116. In another example, the relative standard deviation of the actual batch fill rate 244 can be less than about 1.94% of the weight of the batch material within the holding bin. In still another example, the relative standard deviation of the actual batch fill rate 244 can be less than about 1.67% of the weight of the batch material within the holding bin, for example about 1.61% of the weight of the batch material within the holding bin. Example methods herein can be used with a wide range of processes with various amounts of batch material within the holding bin 116. For instance, if the holding bin includes 1800 pounds of batch material, a standard deviation of the actual batch fill rate 244 can be less than 41.8 lbs/hr. In another example, the standard deviation of the batch fill rate 244 is less than about 35 lbs/hr. In still another example, the standard deviation of the actual batch fill rate 244 is less than about 30 lbs/hr, for example, 28.9 lbs/hr.
In addition or alternatively, example methods may provide a level of molten glass 124 with a desirably low standard deviation. In one example, the standard deviation can be measured as a relative change in the level of molten glass with respect to an average level of molten glass. For example, a relative standard deviation for the level of molten glass 124 can be less than 0.16% of the average level of molten glass. In another example, the relative standard deviation of the actual batch fill rate 244 is less than about 0.12% of the average level of molten glass. In still another example, the relative standard deviation of the actual batch fill rate 244 is less than about 0.058% of the average level of molten glass, for example about 0.036% of the average level of molten glass. Example methods herein can be used with a wide range of processes with various average levels of molten glass. For instance, if the average level of molten glass is 33.5 inches with in the glass melter 112, the standard deviation of the level of molten glass 124 can be less than 0.54 inches. In another example, the standard deviation of the actual batch fill rate 244 can be less than about 0.04 inches. In still another example, the standard deviation of the actual batch fill rate 244 can be less than about 0.02 inches, for example, 0.012 inches.
In another example embodiment, there may be multiple batch deliver devices and holding bins and therefore multiple estimated and actual batch fill rates, and thus the fill rate control may be setup in different configurations. For instance, multiple batch fill rate controller can be designed, one for each batch deliver device, and the predetermined batch fill rate is divided up among each batch fill rate controller. The design of each batch fill rate controller should be based upon the response of the corresponding estimated batch fill rate to the corresponding batch deliver device's speed command. Alternatively, one batch fill rate controller can be designed for every batch deliver device using the total predetermined batch fill rate and total actual fill rate, and the resulting speed command may be distributed appropriately among each batch fill rate controller. In this case, the controller design should be based on the response of the total actual fill rate to the speed command.
The present invention can work for any process where a tight fluid level and raw batch fill rate control is required, and where no direct batch fill rate measurement is feasible. Providing tight fluid level and raw batch fill rate can enhance the quality of the glass sheets formed by the apparatus. Moreover, reducing glass level and fill rate variability may also reduce adverse interaction with thermal, electrical, and compositional aspects of the glass melting process. Thus, tighter fill rate and level control can improve melting stability, improve uniformity of molten glass, and reduce applied power variation. In addition, reducing glass level variation can also reduce inclusions that may otherwise be introduced into the glass melt by significant glass level variation. Still further, reducing fill rate variation may reduce the load on the flowbridge.
It will be apparent to those skilled in the art that various modifications and variations can be made to the present invention without departing from the spirit and scope of the invention. Thus, it is intended that the present invention cover the modifications and variations of this invention provided they come within the scope of the appended claims and their equivalents.