METHODS OF X-RAY IMAGING

Abstract

Disclosed herein is a method comprising: directing X-ray in a first wavelength range and X-ray in a second wavelength range are directed to a subject; introducing a contrast agent into the subject; capturing a first image with the X-ray in the first wavelength range and a second image with the X-ray in the second wavelength range; determining a differential image between the first image and second image; wherein strength of interaction between the contrast agent and the X-ray in the first wavelength range and the strength of interaction between the contrast agent and the X-ray in the second wavelength range are different.

Description

TECHNICAL FIELD

The disclosure herein relates to methods of X-ray imaging.

BACKGROUND

A contrast agent (also known as a contrast medium) may be used in medical imaging to enhance the contrast of structures or fluids within a subject. For example, a contrast agent may be used to enhance the visibility of blood vessels and the gastrointestinal tract.

A contrast agent used in X-ray imaging such as computed tomography (CT), radiography, and fluoroscopy, may be called a radiocontrast agent. Examples of radiocontrast agents include iodine compounds, barium compounds, air and carbon dioxide.

Using a contrast agent allows removal of the effects of overlapping structures. For example, when imaging blood vessels deep in a human body, dense structures such as bones overlapping the blood vessels may obscure the blood vessels on an X-ray radiograph. The contrast of the blood vessels may be enhanced by introducing into the blood vessels a contrast agent that does not affect the contrast of the dense structures. The difference between an X-ray image taken after the introduction of the contrast agent and an X-ray image taken before should show substantially only the enhancement caused by the contrast agent and the enhancement is localized at the blood vessels. Namely, the difference does not include the effects of the dense structures. The X-ray image taken before the introduction of the contrast agent may be called a mask.

However, the introduction of the contrast agent may take some time. The X-ray images taken before and after the introduction thus are temporally apart. Temporal changes of the scene may occur during the time of the introduction of the contrast agent, for example, due to the movement of the subject. The temporal changes may lead to artifact in the difference between the X-ray images.

SUMMARY

Disclosed herein is a method comprising: directing X-ray in a first wavelength range and X-ray in a second wavelength range are directed to a subject; introducing a contrast agent into the subject; capturing a first image with the X-ray in the first wavelength range and a second image with the X-ray in the second wavelength range; determining a differential image between the first image and second image; strength of interaction between the contrast agent and the X-ray in the first wavelength range and the strength of interaction between the contrast agent and the X-ray in the second wavelength range are different.

According to an embodiment, the first wavelength range and the second wavelength range do not overlap.

According to an embodiment, the first wavelength range and the second wavelength range do not completely overlap.

According to an embodiment, the method further comprises generating the X-ray in the first wavelength range and X-ray in the second wavelength range from a same X-ray source.

According to an embodiment, generating the X-ray in the first wavelength range and X-ray in the second wavelength range comprises filtering using different filters.

According to an embodiment, the contrasting agent is introduced by ingestion or injection.

According to an embodiment, the strengths of the interaction have a ratio of at least 1.2.

According to an embodiment, the interaction is attenuation.

According to an embodiment, the first image and the second image are both captured after introducing the contrast agent.

According to an embodiment, the first image and second image are captured at a same time.

According to an embodiment, the first image and second image are captured using a same X-ray detector.

According to an embodiment, the differential image comprises weighted location-dependent differences between the first image and the second image.

According to an embodiment, capturing the first image and the second image comprises using an X-ray detector comprising a plurality of pixels; the X-ray detector comprises: an X-ray absorption layer comprising an electric contact; a first voltage comparator configured to compare a voltage of the electric contact to a first threshold; a second voltage comparator configured to compare the voltage to a second threshold; a controller; a plurality of counters each associated with a bin and configured to register a number of X-ray photons absorbed by one of the pixels the energy of the X-ray photons falls in the bin; the controller is configured to start a time delay from a time at which the first voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the first threshold; the controller is configured to determine whether an energy of an X-ray photon falls into the bin; the controller is configured to cause the number registered by the counter associated with the bin to increase by one.

According to an embodiment, the X-ray detector further comprises a capacitor module electrically connected to the electric contact, the capacitor module is configured to collect charge carriers from the electric contact.

According to an embodiment, the controller is configured to activate the second voltage comparator at a beginning or expiration of the time delay.

According to an embodiment, the controller is configured to connect the electric contact to an electrical ground.

According to an embodiment, a rate of change of the voltage is substantially zero at expiration of the time delay.

According to an embodiment, the X-ray absorption layer comprises a diode.

According to an embodiment, the X-ray absorption layer comprises silicon, germanium, GaAs, CdTe, CdZnTe, or a combination thereof.

According to an embodiment, each pixel of the X-ray detector is configured to count numbers of X-ray photons incident thereon whose energy falls in a plurality of bins, within a period of time; and the detector is configured to add the numbers of X-ray photons for the bins of the same energy range counted by all the pixels.

According to an embodiment, the apparatus does not comprise a scintillator.

According to an embodiment, the X-ray detector is configured to compile the added numbers as a spectrum of the X-ray photons incident on the X-ray detector.

According to an embodiment, the plurality of pixels are arranged in an array.

According to an embodiment, the pixels are configured to count the numbers of X-ray photons within a same period of time.

According to an embodiment, each of the pixels comprises an analog-to-digital converter (ADC) configured to digitize an analog signal representing the energy of an incident X-ray photon into a digital signal.

According to an embodiment, the pixels are configured to operate in parallel.

According to an embodiment, each of the pixels is configured to measure its dark current.

BRIEF DESCRIPTION OF FIGURES

FIG. 1A schematically shows taking an imaging before introducing a contrast agent into a subject.

FIG. 1B schematically shows taking an imaging after introducing a contrast agent into a subject.

FIG. 1C schematically shows obtaining a differential image.

FIG. 1D schematically shows a flow for a method, according to an embodiment.

FIG. 2 schematically shows an X-ray detector suitable for taking images at different wavelengths ranges, according to an embodiment.

FIG. 3A schematically shows a cross-sectional view of the detector, according to an embodiment.

FIG. 3B schematically shows a detailed cross-sectional view of the detector, according to an embodiment.

FIG. 3C schematically shows an alternative detailed cross-sectional view of the detector, according to an embodiment.

FIG. 4A and FIG. 4B each show a component diagram of the electronic system of the detector, according to an embodiment.

FIG. 5 schematically shows a temporal change of the electric current flowing through an electric contact (upper curve) caused by charge carriers generated by an X-ray photon incident on a pixel associated with the electric contact, and a corresponding temporal change of the voltage of the electric contact (lower curve).

FIG. 6 schematically shows a block diagram for the detector, according to an embodiment.

FIG. 7 shows an example flow chart for step 151 in FIG. 6, according to an embodiment.

FIG. 8 schematically shows a temporal change of the voltage of the electric contact caused by the dark current, according to an embodiment.

DETAILED DESCRIPTION

As FIG. 1A schematically shows, an X-ray source 11 directs X-ray toward a feature 12 and a feature 13 in a subject, and an image 14A of the subject is captured. The image 14A is captured before introducing a contrast agent into the subject. The feature 12 may have stronger interaction (e.g., attenuation) with the X-ray and obscure the feature 13 in the image 14A.

As FIG. 1B schematically shows, the contrast agent is introduced into the subject. The contrast agent changes the contrast of the feature 13 but not the contrast of the feature 12. An image 14B of the subject is captured after the introduction of the contrast agent. The feature 13 may be still obscured by the feature 12 if the interaction of the feature 13 with the X-ray is still not much stronger than the interaction of the feature 12 with the X-ray.

FIG. 1C shows that a differential image 14BA, i.e., a difference between the images 14B and 14A, may be obtained by subtracting the image 14A from the image 14B or vice versa. Because the contrast of the feature 12 is not affected by the contrast agent, the differential image 14BA substantially does not show the feature 12 but shows the difference of contrast of the feature 13 caused by the contrast agent. The feature 12 is thus not obscured by the feature 13 in the differential image 14BA.

FIG. 1D schematically shows a flow for a method, according to an embodiment. A subject (e.g., a person) is under X-ray imaging. In procedure 1010, X-ray in a first wavelength range and X-ray in a second wavelength range are directed to the subject. In an embodiment, the first wavelength range and the second wavelength range do not overlap. In an embodiment, the first wavelength range and the second wavelength range do not completely overlap, i.e., the first wavelength range is not a subset of the second wavelength range and the second wavelength range is not a subset of the first wavelength range. The X-ray in the first wavelength range and the X-ray in the second wavelength range may be generated from the same X-ray source. For example, the X-ray in the first wavelength range and the X-ray in the second wavelength range may be generated by subjecting a broad spectrum X-ray to different band pass filters. In procedure 1020, a contrast agent is introduced into the subject. For example, the contrast agent may be introduced by ingestion and injection. The strength of interaction between the contrast agent and the X-ray in the first wavelength range and the strength of interaction between the contrast agent and the X-ray in the second wavelength range are different. In various embodiments, the strengths of the interaction have a ratio of at least 1.2, at least 1.5, at least 2, at least 5, or at least 10. The interaction may be attenuation.

The procedure 1010 and 1020 may be carried out in any order or simultaneously. In procedure 1030, a first image 1035 is captured with the X-ray in the first wavelength range and a second image 1036 is captured with the X-ray in the second wavelength range. The first image 1035 and second image 1036 are both captured after the introduction of the contrast agent in the procedure 1020. The first image 1035 and second image 1036 may be captured at the same time. The first image 1035 and second image 1036 may be captured using the same X-ray detector. In procedure 1040, a differential image 1045 is determined between the first image 1035 and second image 1036. A differential image 1045 may comprise unweighted or weighted location-dependent differences between the first image 1035 and second image 1036. In an example, where the first image 1035 and the second image 1036 may be respectively represented by functions S₁(x,y) and S₂(x,y), the differential image 1045 may be represented as S₂(x,y)−S₁(x,y), or a₂S₂(x,y)−a₁S₁(x,y), where weights a₁ and a₂ are positive numbers.

FIG. 2 schematically shows an X-ray detector 100 suitable for taking images at different wavelengths ranges, according to an embodiment. The detector has an array of pixels 150. The array may be a rectangular array, a honeycomb array, a hexagonal array or any other suitable array. Each pixel 150 is configured to detect an X-ray photon incident thereon and measure the energy of the X-ray photon. For example, each pixel 150 is configured to count numbers of X-ray photons incident thereon whose energy falls in a plurality of bins, within a period of time. All the pixels 150 may be configured to count the numbers of X-ray photons incident thereon within a plurality of bins of energy within the same period of time. Each pixel 150 may have its own analog-to-digital converter (ADC) configured to digitize an analog signal representing the energy of an incident X-ray photon into a digital signal. The ADC may have a resolution of 10 bits or higher. Each pixel 150 may be configured to measure its dark current, such as before or concurrently with each X-ray photon incident thereon. Each pixel 150 may be configured to deduct the contribution of the dark current from the energy of the X-ray photon incident thereon. The pixels 150 may be configured to operate in parallel. For example, when one pixel 150 measures an incident X-ray photon, another pixel 150 may be waiting for an X-ray photon to arrive. The pixels 150 may not have to be individually addressable.

The detector 100 may have at least 100, 2500, 10000, or more pixels 150. The detector 100 may be configured to add the numbers of X-ray photons for the bins of the same energy range counted by all the pixels 150. For example, the detector 100 may add the numbers the pixels 150 stored in a bin for energy from 80 KeV to 81 KeV, add the numbers the pixels 150 stored in a bin for energy from 81 KeV to 82 KeV, and so on. The detector 100 may compile the added numbers for the bins as a spectrum of the X-ray photons incident on the detector 100.

FIG. 3A schematically shows a cross-sectional view of the detector 100, according to an embodiment. The detector 100 may include an X-ray absorption layer 110 and an electronics layer 120 (e.g., an ASIC) for processing or analyzing electrical signals incident X-ray generates in the X-ray absorption layer 110. In an embodiment, the detector 100 does not comprise a scintillator. The X-ray absorption layer 110 may include a semiconductor material such as, silicon, germanium, GaAs, CdTe, CdZnTe, or a combination thereof. The semiconductor may have a high mass attenuation coefficient for the X-ray energy of interest.

As shown in a detailed cross-sectional view of the detector 100 in FIG. 3B, according to an embodiment, the X-ray absorption layer 110 may include one or more diodes (e.g., p-i-n or p-n) formed by a first doped region 111, one or more discrete regions 114 of a second doped region 113. The second doped region 113 may be separated from the first doped region 111 by an optional the intrinsic region 112. The discrete portions 114 are separated from one another by the first doped region 111 or the intrinsic region 112. The first doped region 111 and the second doped region 113 have opposite types of doping (e.g., region 111 is p-type and region 113 is n-type, or region 111 is n-type and region 113 is p-type). In the example in FIG. 3B, each of the discrete regions 114 of the second doped region 113 forms a diode with the first doped region 111 and the optional intrinsic region 112. Namely, in the example in FIG. 3B, the X-ray absorption layer 110 has a plurality of diodes having the first doped region 111 as a shared electrode. The first doped region 111 may also have discrete portions.

When an X-ray photon hits the X-ray absorption layer 110 including diodes, the X-ray photon may be absorbed and generate one or more charge carriers by a number of mechanisms. An X-ray photon may generate 10 to 100000 charge carriers. The charge carriers may drift to the electrodes of one of the diodes under an electric field. The field may be an external electric field. The electrical contact 119B may include discrete portions each of which is in electrical contact with the discrete regions 114. In an embodiment, the charge carriers may drift in directions such that the charge carriers generated by a single X-ray photon are not substantially shared by two different discrete regions 114 (“not substantially shared” here means less than 2%, less than 0.5%, less than 0.1%, or less than 0.01% of these charge carriers flow to a different one of the discrete regions 114 than the rest of the charge carriers). Charge carriers generated by an X-ray photon incident around the footprint of one of these discrete regions 114 are not substantially shared with another of these discrete regions 114. A pixel 150 associated with a discrete region 114 may be an area around the discrete region 114 in which substantially all (more than 98%, more than 99.5%, more than 99.9%, or more than 99.99% of) charge carriers generated by an X-ray photon incident therein flow to the discrete region 114. Namely, less than 2%, less than 1%, less than 0.1%, or less than 0.01% of these charge carriers flow beyond the pixel.

As shown in an alternative detailed cross-sectional view of the detector 100 in FIG. 3C, according to an embodiment, the X-ray absorption layer 110 may include a resistor of a semiconductor material such as, silicon, germanium, GaAs, CdTe, CdZnTe, or a combination thereof, but does not include a diode. The semiconductor may have a high mass attenuation coefficient for the X-ray energy of interest.

When an X-ray photon hits the X-ray absorption layer 110 including a resistor but not diodes, it may be absorbed and generate one or more charge carriers by a number of mechanisms. An X-ray photon may generate 10 to 100000 charge carriers. The charge carriers may drift to the electrical contacts 119A and 119B under an electric field. The field may be an external electric field. The electrical contact 119B includes discrete portions. In an embodiment, the charge carriers may drift in directions such that the charge carriers generated by a single X-ray photon are not substantially shared by two different discrete portions of the electrical contact 119B (“not substantially shared” here means less than 2%, less than 0.5%, less than 0.1%, or less than 0.01% of these charge carriers flow to a different one of the discrete portions than the rest of the charge carriers). Charge carriers generated by an X-ray photon incident around the footprint of one of these discrete portions of the electrical contact 119B are not substantially shared with another of these discrete portions of the electrical contact 119B. A pixel 150 associated with a discrete portion of the electrical contact 119B may be an area around the discrete portion in which substantially all (more than 98%, more than 99.5%, more than 99.9% or more than 99.99% of) charge carriers generated by an X-ray photon incident therein flow to the discrete portion of the electrical contact 119B. Namely, less than 2%, less than 0.5%, less than 0.1%, or less than 0.01% of these charge carriers flow beyond the pixel associated with the one discrete portion of the electrical contact 119B.

The electronics layer 120 may include an electronic system 121 suitable for processing or interpreting signals generated by X-ray photons incident on the X-ray absorption layer 110. The electronic system 121 may include an analog circuitry such as a filter network, amplifiers, integrators, and comparators, or a digital circuitry such as a microprocessors, and memory. The electronic system 121 may include components shared by the pixels or components dedicated to a single pixel. For example, the electronic system 121 may include an amplifier dedicated to each pixel and a microprocessor shared among all the pixels. The electronic system 121 may be electrically connected to the pixels by vias 131. Space among the vias may be filled with a filler material 130, which may increase the mechanical stability of the connection of the electronics layer 120 to the X-ray absorption layer 110. Other bonding techniques are possible to connect the electronic system 121 to the pixels without using vias.

FIG. 4A and FIG. 4B each show a component diagram of the electronic system 121, according to an embodiment. The electronic system 121 may include a first voltage comparator 301, a second voltage comparator 302, a plurality of counters 320 (including counters 320A, 320B, 320C, 320D . . . ), a switch 305, an ADC 306 and a controller 310.

The first voltage comparator 301 is configured to compare the voltage of a discrete portion of the electric contact 119B to a first threshold. The first voltage comparator 301 may be configured to monitor the voltage directly, or calculate the voltage by integrating an electric current flowing through the diode or electrical contact over a period of time. The first voltage comparator 301 may be controllably activated or deactivated by the controller 310. The first voltage comparator 301 may be a continuous comparator. Namely, the first voltage comparator 301 may be configured to be activated continuously, and monitor the voltage continuously. The first voltage comparator 301 configured as a continuous comparator reduces the chance that the system 121 misses signals generated by an incident X-ray photon. The first voltage comparator 301 configured as a continuous comparator is especially suitable when the incident X-ray intensity is relatively high. The first voltage comparator 301 may be a clocked comparator, which has the benefit of lower power consumption. The first voltage comparator 301 configured as a clocked comparator may cause the system 121 to miss signals generated by some incident X-ray photons. When the incident X-ray intensity is low, the chance of missing an incident X-ray photon is low because the time interval between two successive photons is relatively long. Therefore, the first voltage comparator 301 configured as a clocked comparator is especially suitable when the incident X-ray intensity is relatively low. The first threshold may be 1-5%, 5-10%, 10%-20%, 20-30%, 30-40% or 40-50% of the maximum voltage one incident X-ray photon may generate on the electric contact 119B. The maximum voltage may depend on the energy of the incident X-ray photon (i.e., the wavelength of the incident X-ray), the material of the X-ray absorption layer 110, and other factors. For example, the first threshold may be 50 mV, 100 mV, 150 mV, or 200 mV.

The second voltage comparator 302 is configured to compare the voltage to a second threshold. The second voltage comparator 302 may be configured to monitor the voltage directly, or calculate the voltage by integrating an electric current flowing through the diode or the electrical contact over a period of time. The second voltage comparator 302 may be a continuous comparator. The second voltage comparator 302 may be controllably activate or deactivated by the controller 310. When the second voltage comparator 302 is deactivated, the power consumption of the second voltage comparator 302 may be less than 1%, less than 5%, less than 10% or less than 20% of the power consumption when the second voltage comparator 302 is activated. The absolute value of the second threshold is greater than the absolute value of the first threshold. As used herein, the term “absolute value” or “modulus” |x| of a real number x is the non-negative value of x without regard to its sign. Namely,

$\left|x\right|=\{\begin{array}{c}x,\mathrm{if}x\ge 0\\ -x,\mathrm{if}x\le 0\end{array}.$

The second threshold may be 200%-300% of the first threshold. For example, the second threshold may be 100 mV, 150 mV, 200 mV, 250 mV or 300 mV. The second voltage comparator 302 and the first voltage comparator 301 may be the same component. Namely, the system 121 may have one voltage comparator that can compare a voltage with two different thresholds at different times.

The first voltage comparator 301 or the second voltage comparator 302 may include one or more op-amps or any other suitable circuitry. The first voltage comparator 301 or the second voltage comparator 302 may have a high speed to allow the system 121 to operate under a high flux of incident X-ray. However, having a high speed is often at the cost of power consumption.

The counters 320 may be a software component (e.g., numbers stored in a computer memory) or a hardware component (e.g., 4017 IC and 7490 IC). Each counter 320 is associated with a bin for an energy range. For example, counter 320A may be associated with a bin for 70-71 KeV, counter 320B may be associated with a bin for 71-72 KeV, counter 320C may be associated with a bin for 72-73 KeV, counter 320D may be associated with a bin for 73-74 KeV. When the energy of an incident X-ray photon is determined by the ADC 306 to be in the bin a counter 320 is associated with, the number registered in the counter 320 is increased by one.

The controller 310 may be a hardware component such as a microcontroller and a microprocessor. The controller 310 is configured to start a time delay from a time at which the first voltage comparator 301 determines that the absolute value of the voltage equals or exceeds the absolute value of the first threshold (e.g., the absolute value of the voltage increases from below the absolute value of the first threshold to a value equal to or above the absolute value of the first threshold). The absolute value is used here because the voltage may be negative or positive, depending on whether the voltage of the cathode or the anode of the diode or which electrical contact is used. The controller 310 may be configured to keep deactivated the second voltage comparator 302, the counter 320 and any other circuits the operation of the first voltage comparator 301 does not require, before the time at which the first voltage comparator 301 determines that the absolute value of the voltage equals or exceeds the absolute value of the first threshold. The time delay may expire after the voltage becomes stable, i.e., the rate of change of the voltage is substantially zero. The phase “the rate of change is substantially zero” means that temporal change is less than 0.1%/ns. The phase “the rate of change is substantially non-zero” means that temporal change of the voltage is at least 0.1%/ns.

The controller 310 may be configured to activate the second voltage comparator during (including the beginning and the expiration) the time delay. In an embodiment, the controller 310 is configured to activate the second voltage comparator at the beginning of the time delay. The term “activate” means causing the component to enter an operational state (e.g., by sending a signal such as a voltage pulse or a logic level, by providing power, etc.). The term “deactivate” means causing the component to enter a non-operational state (e.g., by sending a signal such as a voltage pulse or a logic level, by cut off power, etc.). The operational state may have higher power consumption (e.g., 10 times higher, 100 times higher, 1000 times higher) than the non-operational state. The controller 310 itself may be deactivated until the output of the first voltage comparator 301 activates the controller 310 when the absolute value of the voltage equals or exceeds the absolute value of the first threshold.

The controller 310 may be configured to cause the number registered by one of the counters 320 to increase by one, if, during the time delay, the second voltage comparator 302 determines that the absolute value of the voltage equals or exceeds the absolute value of the second threshold, and the energy of the X-ray photon falls in the bin associated with the counter 320.

The controller 310 may be configured to cause the ADC 306 to digitize the voltage upon expiration of the time delay and determine based on the voltage which bin the energy of the X-ray photon falls in.

The controller 310 may be configured to connect the electric contact 119B to an electrical ground, so as to reset the voltage and discharge any charge carriers accumulated on the electric contact 119B. In an embodiment, the electric contact 119B is connected to an electrical ground after the expiration of the time delay. In an embodiment, the electric contact 119B is connected to an electrical ground for a finite reset time period. The controller 310 may connect the electric contact 119B to the electrical ground by controlling the switch 305. The switch may be a transistor such as a field-effect transistor (FET).

In an embodiment, the system 121 has no analog filter network (e.g., a RC network). In an embodiment, the system 121 has no analog circuitry.

The ADC 306 may feed the voltage it measures to the controller 310 as an analog or digital signal. The ADC may be a successive-approximation-register (SAR) ADC (also called successive approximation ADC). An SAR ADC digitizes an analog signal via a binary search through all possible quantization levels before finally converging upon a digital output for the analog signal. An SAR ADC may have four main subcircuits: a sample and hold circuit to acquire the input voltage (V_in), an internal digital-analog converter (DAC) configured to supply an analog voltage comparator with an analog voltage equal to the digital code output of the successive approximation register (SAR), the analog voltage comparator that compares V_in to the output of the internal DAC and outputs the result of the comparison to the SAR, the SAR configured to supply an approximate digital code of V_in to the internal DAC. The SAR may be initialized so that the most significant bit (MSB) is equal to a digital 1. This code is fed into the internal DAC, which then supplies the analog equivalent of this digital code (V_ref/2) into the comparator for comparison with V_in. If this analog voltage exceeds V_in the comparator causes the SAR to reset this bit; otherwise, the bit is left a 1. Then the next bit of the SAR is set to 1 and the same test is done, continuing this binary search until every bit in the SAR has been tested. The resulting code is the digital approximation of V_in and is finally output by the SAR at the end of the digitization.

The system 121 may include a capacitor module 309 electrically connected to the electric contact 119B, wherein the capacitor module is configured to collect charge carriers from the electric contact 119B. The capacitor module can include a capacitor in the feedback path of an amplifier. The amplifier configured as such is called a capacitive transimpedance amplifier (CTIA). CTIA has high dynamic range by keeping the amplifier from saturating and improves the signal-to-noise ratio by limiting the bandwidth in the signal path. Charge carriers from the electrode accumulate on the capacitor over a period of time (“integration period”) (e.g., as shown in FIG. 5, between t_s to t₀). After the integration period has expired, the capacitor voltage is sampled by the ADC 306 and then reset by a reset switch. The capacitor module 309 can include a capacitor directly connected to the electric contact 119B.

FIG. 5 schematically shows a temporal change of the electric current flowing through the electric contact 119B (upper curve) caused by charge carriers generated by an X-ray photon incident on the pixel 150 associated with the electric contact 119B, and a corresponding temporal change of the voltage of the electric contact 119B (lower curve). The voltage may be an integral of the electric current with respect to time. At time to, the X-ray photon hits the diode or the resistor, charge carriers start being generated in the pixel 150, electric current starts to flow through the electric contact 119B, and the absolute value of the voltage of the electric contact 119B starts to increase. At time t₁, the first voltage comparator 301 determines that the absolute value of the voltage equals or exceeds the absolute value of the first threshold V1, and the controller 310 starts the time delay TD1 and the controller 310 may deactivate the first voltage comparator 301 at the beginning of TD1. If the controller 310 is deactivated before t₁, the controller 310 is activated at t₁. During TD1, the controller 310 activates the second voltage comparator 302. The term “during” a time delay as used here means the beginning and the expiration (i.e., the end) and any time in between. For example, the controller 310 may activate the second voltage comparator 302 at the expiration of TD1. If during TD1, the second voltage comparator 302 determines that the absolute value of the voltage equals or exceeds the absolute value of the second threshold at time t₂, the controller 310 waits for stabilization of the voltage to stabilize. The voltage stabilizes at time t_e, when all charge carriers generated by the X-ray photon drift out of the X-ray absorption layer 110. At time t_s, the time delay TD1 expires. At or after time t_e, the controller 310 causes the ADC 306 to digitize the voltage and determines which bin the energy of the X-ray photons falls in. The controller 310 then causes the number registered by the counter 320 corresponding to the bin to increase by one. In the example of FIG. 5, time t_s is after time t_e; namely TD1 expires after all charge carriers generated by the X-ray photon drift out of the X-ray absorption layer 110. If time t_e cannot be easily measured, TD1 can be empirically chosen to allow sufficient time to collect essentially all charge carriers generated by an X-ray photon but not too long to risk have another incident X-ray photon. Namely, TD1 can be empirically chosen so that time t_s is empirically after time t_e. Time t_s is not necessarily after time t_e because the controller 310 may disregard TD1 once V2 is reached and wait for time t_e. The rate of change of the difference between the voltage and the contribution to the voltage by the dark current is thus substantially zero at t_e. The controller 310 may be configured to deactivate the second voltage comparator 302 at expiration of TD1 or at t₂, or any time in between.

The voltage at time t_e is proportional to the amount of charge carriers generated by the X-ray photon, which relates to the energy of the X-ray photon. The controller 310 may be configured to determine the bin the energy of the X-ray photon falls in, based on the output of the ADC 306.

After TD1 expires or digitization by the ADC 306, whichever later, the controller 310 connects the electric contact 119B to an electric ground for a reset period RST to allow charge carriers accumulated on the electric contact 119B to flow to the ground and reset the voltage. After RST, the system 121 is ready to detect another incident X-ray photon. Implicitly, the rate of incident X-ray photons the system 121 can handle in the example of FIG. 5 is limited by 1/(TD1+RST). If the first voltage comparator 301 has been deactivated, the controller 310 can activate it at any time before RST expires. If the controller 310 has been deactivated, it may be activated before RST expires.

Because the detector 100 has many pixels 150 that may operate in parallel, the detector can handle much higher rate of incident X-ray photons. This is because the rate of incidence on a particular pixel 150 is 1/N of the rate of incidence on the entire array of pixels, where N is the number of pixels.

FIG. 6 schematically shows a block diagram for the detector 100, according to an embodiment. Each pixel 150 may measure the energy 151 of an X-ray photon incident thereon. The energy 151 of the X-ray photon is digitized (e.g., by an ADC) in step 152 into one of a plurality of bins 153A, 153B, 153C . . . . The bins 153A, 153B, 153C . . . each have a corresponding counter 154A, 154B and 154C, respectively. When the energy 151 is allocated into a bin, the number stored in the corresponding counter increases by one. The detector 100 may added the numbers stored in all the counters corresponding to bins for the same energy range in the pixels 150. For example, the numbers stored in all the counters 154C in all pixels 150 may be added and stored in a global counter 100C for the same energy range. The numbers stored in all the global counters may be compiled into an energy spectrum of the X-ray incident on the detector 100.

FIG. 7 shows an example flow chart for step 151 in FIG. 6, according to an embodiment. In step 701, compare, e.g., using the first voltage comparator 301, a voltage of an electric contact 119B of a diode or a resistor exposed to X-ray photons, to the first threshold. In step 702, determine, e.g., with the controller 310, whether the absolute value of the voltage equals or exceeds the absolute value of the first threshold V1. If the absolute value of the voltage does not equal or exceed the absolute value of the first threshold, the method goes back to step 701. If the absolute value of the voltage equals or exceeds the absolute value of the first threshold, continue to step 703. In step 703, measure T=(t₁−t₀). In step 704, start, e.g., using the controller 310, the time delay TD1. In step 705, compare, e.g., using the second voltage comparator 302, the voltage to the second threshold. In step 706, determine, e.g., using the controller 310, whether the absolute value of the voltage equals or exceeds the absolute value of the second threshold V2. If the absolute value of the voltage does not equal or exceed the absolute value of the second threshold, the method goes to step 707. In step 707, measure the contribution of the dark current to the voltage using T. In an example, determine whether T is greater than the largest T previously measured (T_max). T_max=0 if T is not previously measured. If T is greater than T_max, replace T_max with T (i.e., T becomes the new T_max). The contribution of the dark current to the voltage is at a rate of V1/T_max. If the dark current is measured as in this example, the contribution of the dark current in step 709 is ((t_m−t_r)·V1/T_max), where t_r is the end of the last reset period. (t_m−t_r), like any time intervals in this disclosure, can be measured by counting pulses (e.g., counting clock cycles or clock pulses). T_max may be reset to zero before each measurement with the detector 100. T may be measured by counting the number of pulses between t₁ and t₀, as schematically shown in FIG. 5 and FIG. 8. Another way to measure the contribution of the dark current to the voltage using T includes extracting a parameter of the distribution of T (e.g., the expected value of T (T_expected)) and estimate the rate of the contribution of the dark current to the voltage as V1/T_expected. In step 708, reset the voltage to an electrical ground, e.g., by connecting the electric contact 119B to an electrical ground. If the absolute value of the voltage equals or exceeds the absolute value of the second threshold, continue to step 709. In step 709, measure the voltage after it stabilizes, at time t_m, and subtract a contribution from a dark current to the measured voltage. Time t_m can be any time after TD1 expires and before RST. The result is provided to ADC in step 152 in FIG. 6. The time when the reset period ends (e.g., the time when the electric contact 119B is disconnected from the electrical ground) is t_r.

FIG. 8 schematically shows a temporal change of the voltage of the electric contact 119B caused by the dark current, according to an embodiment. After RST, the voltage increase due to the dark current. The higher the dark current, the less time it takes for the voltage to reach V1 (namely shorter T). Therefore, T is a measure of the dark current. The dark current is unlikely large enough to cause the voltage to reach V2 during TD1 but current caused by an incident X-ray photon is probably large enough to do so. This difference may be used to identify the effect of the dark current. The flow in FIG. 8 may be carried out in each pixel 150 as the pixel 150 measures a series of incident X-ray photons, which will allow capturing the changes of the dark current (e.g., caused by changing environment such as temperature).

While various aspects and embodiments have been disclosed herein, other aspects and embodiments will be apparent to those skilled in the art. The various aspects and embodiments disclosed herein are for purposes of illustration and are not intended to be limiting, with the true scope and spirit being indicated by the following claims.

Claims

1. A method comprising: directing X-ray in a first wavelength range and X-ray in a second wavelength range to a subject;introducing a contrast agent into the subject;capturing a first image with the X-ray in the first wavelength range and a second image with the X-ray in the second wavelength range;determining a differential image between the first image and second image;wherein strength of interaction between the contrast agent and the X-ray in the first wavelength range and strength of interaction between the contrast agent and the X-ray in the second wavelength range are different.

2. The method of claim 1, wherein the first wavelength range and the second wavelength range do not overlap.

3. The method of claim 1, wherein the first wavelength range and the second wavelength range do not completely overlap.

4. The method of claim 1, further comprising generating the X-ray in the first wavelength range and X-ray in the second wavelength range from a same X-ray source.

5. The method of claim 4, wherein generating the X-ray in the first wavelength range and X-ray in the second wavelength range comprises filtering using different filters.

6. The method of claim 1, wherein the contrasting agent is introduced by ingestion or injection.

7. The method of claim 1, wherein the strengths of the interaction have a ratio of at least 1.2.

8. The method of claim 1, wherein the interaction is attenuation.

9. The method of claim 1, wherein the first image and the second image are both captured after introducing the contrast agent.

10. The method of claim 1, wherein the first image and second image are captured at a same time.

11. The method of claim 1, wherein the first image and second image are captured using a same X-ray detector.

12. The method of claim 1, wherein the differential image comprises weighted location-dependent differences between the first image and the second image.

13. The method of claim 1, wherein capturing the first image and the second image comprises using an X-ray detector comprising a plurality of pixels; wherein the X-ray detector comprises: an X-ray absorption layer comprising an electric contact;a first voltage comparator configured to compare a voltage of the electric contact to a first threshold;a second voltage comparator configured to compare the voltage to a second threshold;a controller;a plurality of counters each associated with a bin and configured to register a number of X-ray photons absorbed by one of the pixels wherein the energy of the X-ray photons falls in the bin;wherein the controller is configured to start a time delay from a time at which the first voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the first threshold;wherein the controller is configured to determine whether an energy of an X-ray photon falls into the bin;wherein the controller is configured to cause the number registered by the counter associated with the bin to increase by one.

14. The method of claim 13, wherein the X-ray detector further comprises a capacitor module electrically connected to the electric contact, wherein the capacitor module is configured to collect charge carriers from the electric contact.

15. The method of claim 13, wherein the controller is configured to activate the second voltage comparator at a beginning or expiration of the time delay.

16. The method of claim 13, wherein the controller is configured to connect the electric contact to an electrical ground.

17. The method of claim 13, wherein a rate of change of the voltage is substantially zero at expiration of the time delay.

18. The method of claim 13, wherein the X-ray absorption layer comprises a diode.

19. The method of claim 13, wherein the X-ray absorption layer comprises silicon, germanium, GaAs, CdTe, CdZnTe, or a combination thereof.

20. The method of claim 13, wherein each pixel of the X-ray detector is configured to count numbers of X-ray photons incident thereon whose energy falls in a plurality of bins, within a period of time; and wherein the X-ray detector is configured to add the numbers of X-ray photons for the bins of the same energy range counted by all the pixels.

21. The method of claim 13, wherein the X-ray detector does not comprise a scintillator.

22. The method of claim 20, wherein the X-ray detector is configured to compile the added numbers as a spectrum of the X-ray photons incident on the X-ray detector.

23. The method of claim 13, wherein the plurality of pixels are arranged in an array.

24. The method of claim 13, wherein the pixels are configured to count the numbers of X-ray photons within a same period of time.

25. The method of claim 13, wherein each of the pixels comprises an analog-to-digital converter (ADC) configured to digitize an analog signal representing the energy of an incident X-ray photon into a digital signal.

26. The method of claim 13, wherein the pixels are configured to operate in parallel.

27. The method of claim 13, wherein each of the pixels is configured to measure its dark current.