1. Technical Field
The present disclosure relates to a method for measuring a dimension of a target site. More particularly, the present disclosure relates to a method of triangulation for creating an image of a predetermined size for use in measuring a dimension of a target site.
2. Background of the Related Art
Minimally invasive surgery, e.g., laparoscopic, endoscopic, and thoroscopic surgery, has many advantages over traditional open surgeries. In particular, minimally invasive surgery eliminates the need for a large incision, thereby reducing discomfort, recovery time, and many of the deleterious side effects associated with traditional open surgery.
The minimally invasive surgeries are performed through small openings in a patient's skin. These openings may be incisions in the skin or may be naturally occurring body orifices (e.g., mouth, anus, or vagina). In general, insufflation gas is used to enlarge the area surrounding the target surgical site to create a larger, more accessible work area.
During minimally invasive procedures, it is often difficult for a surgeon to determine sizes of various organs, tissues, and other structures in a surgical site. Various in-situ surgical metrology methods exist for measurement in a surgical site. Such methods require many moving parts and projection images that change size and/or focus quickly as projectors move in or out of a surface of projection. A continuing need exists for in-situ surgical metrology methods that operate with a stable focus and no moving parts.
A first metrology method includes the steps of projecting a first image and a second image, aligning the first image and the second image to form an aligned image of a known size by moving an instrument towards and away from a target object, and determining a dimension of a target object by comparing the aligned image to the target object. The aligned image may include aligned circles. The aligned image may include a single point aligned with a center point of a circle. The projecting of at least one of the first image and second image may be achieved by a point source projector. A single beam may be split to project the first image and the second image.
A second metrology method includes the steps of projecting a first image and a second image, aligning the first image and the second image to form an aligned image of a known size by synchronously adjusting a zoom factor for projecting the first image and an angle for projecting the second image, and determining a dimension of a target object by comparing the aligned image to the target object. The aligned image may include aligned circles. The aligned image may include a single point aligned with a center point of a circle. The projecting of at least one of the first image and second image may be achieved by a point source projector. A single beam may be split to project the first image and the second image.
In other embodiments the metrology system may be a standalone device, while projected pattern is observed through a separate endoscope.
The above and other aspects, features, and advantages of the present disclosure will become more apparent in light of the following detailed description when taken in conjunction with the accompanying drawings in which:
Particular embodiments of the present disclosure are described hereinbelow with reference to the accompanying drawings; however, it is to be understood that the disclosed embodiments are merely exemplary of the disclosure and may be embodied in various forms. Well-known functions or constructions are not described in detail to avoid obscuring the present disclosure in unnecessary detail. Therefore, specific structural and functional details disclosed herein are not to be interpreted as limiting, but merely as a basis for the claims and as a representative basis for teaching one skilled in the art to variously employ the present disclosure in virtually any appropriately detailed structure.
Like reference numerals may refer to similar or identical elements throughout the description of the figures. As shown in the drawings and described throughout the following description, as is traditional when referring to relative positioning on a surgical instrument, the term “proximal” refers to the end of the apparatus which is closer to the user and the term “distal” refers to the end of the apparatus which is farther away from the user. The term “clinician” refers to any medical professional (i.e., doctor, surgeon, nurse, or the like) performing a medical procedure involving the use of embodiments described herein.
As seen in
Light beams 110 form an image 120 including an image 120a from light beam 110a and an image 120b from light beam 110b. Images 120a, 120b substantially align to form a substantially aligned image 122 having a predetermined size on an image plane p2 at a distance d2 from point sources 102 (
Images 120a, 120b may be any shapes appropriate for determining an alignment of thereof. For example, images 120a, 120b may be circles that concentrically overlap on image plane p2. Images 120a, 120b have uniformly spaced markings. In other embodiments, an endoscope or other device may provide uniformly spaced markings. When image 122 is formed, the uniformly spaced markings have a predetermined distance therebetween to assist in determining a measurement of a dimension on image plane p2. The predetermined distance of the uniformly spaced markings may be determined geometrically or experimentally. Although images 120a, 120b are substantially identical in metrology system 10, other embodiments may have differing shapes of images 120a, 120b.
As seen in
A magnification factor of pattern 106 to pattern 116 is calculated according a formula: M=1+xb/xa, where M is the magnification factor, xa is a distance between point source 102 and mask 104, and xb is a distance between mask 104 and the target site. Accordingly, image 120 may be enlarged when xb is increased or xa is decreased. Image 120 may shrink upon an increase of xa or a decrease of xb. Mask 104 may be translated with respect to the target site to increase or decrease xa and xb. Metrology system 10 may be translated to increase or decrease xb. Point source 102 is sufficiently small for edges of image 120 to remain substantially sharp as a size of image 120 changes.
A method of use of metrology system 10 will now be described. As seen in
Turning to
Metrology system 20 has a projector 200, a splitter 212, and a reflector 214. Projector 200 is substantially identical to projector 100 (
Light beams 210 form a substantially aligned image 222 on an image plane p2 at a distance d2 from a point source of projector 200. Image plane p2 is the only image plane on which a substantially aligned image is formed. Light beams 210 project a pattern having uniformly spaced markings onto image plane p2. Distance d2, a distance of the uniformly spaced markings, and a size of aligned image 222 may be determined geometrically or experimentally.
Light beams 210 produce images of any shapes appropriate for determining an alignment of thereof. In some embodiments, a total overlap of certain elements of the images of light beams 210 may not occur due to light beam 210a travelling a shorter total distance than light beam 210b to reach image plane p2. In such embodiments, an alignment of a point or a line may be an ideal indicator of alignment. For example, light beam 210a may project a circle with a center point, and light beam 210b may project a single point for aligning with the center point of the image projected by light beam 210a.
A method of use of metrology system 20 is substantially identical to the method of use of metrology system 10 described hereinabove.
Turning to
Metrology system 30 includes a projector 300, a splitter 312, a reflector 314, and an actuator 330 (
Actuator 330 is operably coupled to mask 304 and reflector 314. A manipulation of actuator 330 rotates reflector 314, thus changing an angle αn and an image plane pn on which aligned image 322 is formed. Actuator 330 translates mask 304 a distance to maintain a predetermined size of image 322. The translation of mask 304 and the rotation of reflector 314 are synchronous upon a manipulation of actuator 330. A relationship between the translation of mask 304 and the rotation of reflector 314 is described according to the following formulas:
d2/d1=tan(α1)/tan(α2)=M1/M2
M=1+xb/xa
d=xa+xb
In the formulas above, the values of d1, α1, and M1 respectively represent an initial distance dn, angle αn, and magnification Mn of system 30. The values of d2, α2, and M2 respectively represent a resulting distance dn, angle αn, and magnification Mn of system 30 after actuator 330 is manipulated.
A method of use of metrology system 30 is similar to the method of use of metrology system 10 described hereinabove. As seen in
It should be understood that the foregoing description is only illustrative of the present disclosure. Various alternatives and modifications can be devised by those skilled in the art without departing from the disclosure. Accordingly, the present disclosure is intended to embrace all such alternatives, modifications and variances. The embodiments described with reference to the attached drawing figs. are presented only to demonstrate certain examples of the disclosure. Other elements, steps, methods and techniques that are insubstantially different from those described above and/or in the appended claims are also intended to be within the scope of the disclosure.
The present application claims the benefit of and priority to U.S. Provisional Application Ser. No. 61/487,750, filed on May 19, 2011, the entire contents of which are incorporated herein by reference.
Number | Name | Date | Kind |
---|---|---|---|
2491476 | Brown | Dec 1949 | A |
2819530 | Webber | Jan 1958 | A |
3817635 | Kawahara | Jun 1974 | A |
3943361 | Miller | Mar 1976 | A |
4157859 | Terry | Jun 1979 | A |
4281931 | Chikama | Aug 1981 | A |
4570641 | Lieber et al. | Feb 1986 | A |
4660982 | Okada | Apr 1987 | A |
4834070 | Saitou | May 1989 | A |
4902123 | Yoder, Jr. | Feb 1990 | A |
4958932 | Kegelman et al. | Sep 1990 | A |
4980763 | Lia | Dec 1990 | A |
4986262 | Saito | Jan 1991 | A |
5061995 | Lia et al. | Oct 1991 | A |
5070401 | Salvati et al. | Dec 1991 | A |
5090400 | Saito | Feb 1992 | A |
5150254 | Saitou | Sep 1992 | A |
5214538 | Lobb | May 1993 | A |
5285785 | Meyer | Feb 1994 | A |
5558666 | Dewey et al. | Sep 1996 | A |
5573492 | Dianna et al. | Nov 1996 | A |
5669871 | Sakiyama | Sep 1997 | A |
5704897 | Truppe | Jan 1998 | A |
5808813 | Lucey et al. | Sep 1998 | A |
5815274 | Dlugos | Sep 1998 | A |
6009189 | Schaack | Dec 1999 | A |
6070583 | Perelman et al. | Jun 2000 | A |
6096049 | McNeirney et al. | Aug 2000 | A |
6118535 | Goldberg et al. | Sep 2000 | A |
6121999 | Schaack | Sep 2000 | A |
6151407 | Conlon et al. | Nov 2000 | A |
6246898 | Vesely et al. | Jun 2001 | B1 |
6360012 | Kreuzer | Mar 2002 | B1 |
6451010 | Angeley | Sep 2002 | B1 |
6476979 | Schaack | Nov 2002 | B1 |
6482148 | Luke | Nov 2002 | B1 |
6508761 | Ramsbottom et al. | Jan 2003 | B1 |
6542763 | Yamashita et al. | Apr 2003 | B1 |
6611698 | Yamashita et al. | Aug 2003 | B1 |
6614036 | Reinstein | Sep 2003 | B1 |
6697664 | Kienzle III et al. | Feb 2004 | B2 |
6741338 | McArthur et al. | May 2004 | B2 |
6977732 | Chen et al. | Dec 2005 | B2 |
7389131 | Kanayama | Jun 2008 | B2 |
7486805 | Krattiger | Feb 2009 | B2 |
7556599 | Rovegno | Jul 2009 | B2 |
7720532 | Hashimshony et al. | May 2010 | B2 |
7796791 | Tsougarakis et al. | Sep 2010 | B2 |
7812968 | Bendall et al. | Oct 2010 | B2 |
7862555 | Chan et al. | Jan 2011 | B2 |
20030013973 | Georgakoudi et al. | Jan 2003 | A1 |
20030191368 | Wang et al. | Oct 2003 | A1 |
20030191397 | Webb | Oct 2003 | A1 |
20040171986 | Tremaglio, Jr. et al. | Sep 2004 | A1 |
20040176683 | Whitin et al. | Sep 2004 | A1 |
20040223118 | Jean et al. | Nov 2004 | A1 |
20050020926 | Wiklof et al. | Jan 2005 | A1 |
20050085717 | Shahidi | Apr 2005 | A1 |
20050090749 | Rubbert | Apr 2005 | A1 |
20050124988 | Terrill-Grisoni | Jun 2005 | A1 |
20050180160 | Nelson | Aug 2005 | A1 |
20050237423 | Nilson et al. | Oct 2005 | A1 |
20050261571 | Willis et al. | Nov 2005 | A1 |
20060092418 | Xu et al. | May 2006 | A1 |
20060253107 | Hashimshony et al. | Nov 2006 | A1 |
20080024793 | Gladnick | Jan 2008 | A1 |
20080027276 | Rovegno | Jan 2008 | A1 |
20080039742 | Hashimshony et al. | Feb 2008 | A1 |
20080068197 | Neubauer et al. | Mar 2008 | A1 |
20080146915 | McMorrow | Jun 2008 | A1 |
20080200808 | Leidel et al. | Aug 2008 | A1 |
20080218588 | Stetten | Sep 2008 | A1 |
20080221446 | Washburn et al. | Sep 2008 | A1 |
20080319286 | Ridder et al. | Dec 2008 | A1 |
20090002485 | Fujiwara | Jan 2009 | A1 |
20090054767 | Telischak et al. | Feb 2009 | A1 |
20090105564 | Tokita | Apr 2009 | A1 |
20090252290 | Plut et al. | Oct 2009 | A1 |
20090259114 | Johnson et al. | Oct 2009 | A1 |
20090270682 | Visser | Oct 2009 | A1 |
20090270698 | Shioi et al. | Oct 2009 | A1 |
20100022858 | Gono | Jan 2010 | A1 |
20100046004 | Lee et al. | Feb 2010 | A1 |
20100201796 | Chan | Aug 2010 | A1 |
20110019064 | Stallinga | Jan 2011 | A1 |
20110054308 | Cohen et al. | Mar 2011 | A1 |
20110279670 | Park | Nov 2011 | A1 |
20120101370 | Razzaque et al. | Apr 2012 | A1 |
Number | Date | Country |
---|---|---|
36 29 435 | Mar 1987 | DE |
10 2010 025752 | Jan 2012 | DE |
0403399 | Dec 1990 | EP |
1480067 | Nov 2004 | EP |
2106748 | Oct 2009 | EP |
2011 185767 | Sep 2011 | JP |
WO 0008415 | Feb 2000 | WO |
WO 2005013814 | Feb 2005 | WO |
Entry |
---|
European Search Report from European Application No. EP 12 16 8466 mailed Mar. 26, 2013. |
European Search Report from EP 12190094.8 dated Mar. 4, 2013 (6 pgs.). |
European Search Report from EP 13156689.5 dated Apr. 26, 2013 (7 pgs.). |
European Search Report dated Nov. 28, 2013 in European Appln. No. 13 17 7731. |
European Search Report for EP Application No. 13156676.2-1553 dated Jul. 2, 2013. (7 pages). |
European Search Report for EP Application No. 12190097.1 dated Sep. 13, 2013. (6 pgs.). |
European Search Report for EP Application No. 13172563.2 dated Oct. 1, 2013. (8 pgs.). |
Number | Date | Country | |
---|---|---|---|
20120293812 A1 | Nov 2012 | US |
Number | Date | Country | |
---|---|---|---|
61487750 | May 2011 | US |