Claims
- 1. A connector, comprising:
a housing having a comb structure; a plurality of contact blades pivotally disposed within the comb structure of the housing; and a biasing element coupled to each of the contact blades and opposing pivotal movement of the contact blades in one direction.
- 2. The connector of claim 1, further comprising a rod coupled to each of the contact blades, the rod rotatably coupled to the housing.
- 3. The connector of claim 2, wherein the rod extends through the contact blades.
- 4. The connector of claim 1, wherein the biasing element is a flexible pin.
- 5. The connector of claim 4, further comprising an output pin conductively coupled to the flexible pin.
- 6. The connector of claim 1, wherein the biasing element is a spring.
- 7. The connector of claim 1, wherein each of the contact blades is comprised of a contact portion, a central portion, and a base portion, and wherein the contact portion includes an angled contact surface and the central portion has an aperture extending therethrough.
- 8. The connector of claim 7, further comprising a plurality of non-conductive spacers, and wherein the rod extends through the spacers, the spacers are disposed between the blade contacts in the comb structure.
- 9. The connector of claim 1, wherein the comb structure includes a plurality of slots and slot division walls between the slots.
- 10. The connector of claim 8, wherein the comb structure includes a plurality of slots and slot division walls between the slots, each of the spacers is disposed in each of the slots, and each of the contact blades is aligned with each of the slot division walls.
- 11. A method of manufacturing a connector, comprising:
coupling a plurality of contact blades to a rod; rotatably mounting the rod to a housing having a comb structure including a plurality of slots and slot division walls between the slots; placing a spacer between the contact blades, wherein each of the spacers is disposed in each of the slots, and each of the contact blades is aligned with each of the slot division walls; and coupling a biasing element to the contact blades.
- 12. The method of claim 11, wherein the step of coupling the contact blades to a rod includes extending the rod through the blades.
- 13. The method of claim 11, wherein each of the blades is comprised of a contact portion, a central portion and a base portion, and wherein a flexible pin is coupled to the base portion of the blade.
- 14. The method of claim 11, further comprising extending a first rod through a first set of blades and extending a second rod through a second set of blades, and aligning the first and second set of blades generally parallel to each other.
- 15. The method of claim 14, wherein the biasing element includes a first biasing member and a second biasing member, the first set of blades are biased to in one direction by the first biased member and the second set of blades are biased in an opposite direction by the second biasing member.
- 16. A testing apparatus, comprising:
a base; a housing, having a comb structure, mounted to the base; a first set and a second set of contact blades, each blade pivotally connected to the housing; and first and second biasing members coupled to the first and second set of contact blades, respectively, the first biasing member biasing the first set of blades in one direction and the second biasing member biasing the second set of blades in an opposite direction.
- 17. The testing apparatus of claim 16, further comprising a pair of rods rotatively disposed within the housing, the rods being positioned parallel to each other and coupled to the first and second set of contact blades, respectively.
- 18. The testing apparatus of claim 17, wherein each contact blade has an aperture therethrough sized to allow the disposal of one of the rods therein, and wherein rods extend through the first and second set of blades, respectively.
- 19. The testing apparatus of claim 18, wherein the comb structure includes a plurality of slots and slot division walls between the slots.
- 20. The testing apparatus of claim 19, further comprising a plurality of non-conductive spacers, and wherein the rod extends through the spacers, wherein the spacers are disposed between the blade contacts in the comb structure, each of the spacers is disposed in each of the slots, and each of the contact blades is aligned with each of the slot division walls.
CROSS-REFERENCE TO RELATED APPLICATION(S)
[0001] This application is a Continuation-In-Part (CIP) patent application of non-provisional patent application, Ser. No. 10/190,329, filed on Jul. 3, 2002, which claims priority from U.S. Provisional Application No. 60/308,514 entitled “Micro Connector to Facilitate Testing of Micro Electronic Components and Subassemblies,” filed on Jul. 27, 2001 the subject matter of which are hereby incorporated by reference.
Provisional Applications (1)
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Number |
Date |
Country |
|
60308514 |
Jul 2001 |
US |
Continuation in Parts (1)
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Number |
Date |
Country |
Parent |
10190329 |
Jul 2002 |
US |
Child |
10301433 |
Nov 2002 |
US |