This invention relates generally to switches and, more particularly, to a micro-electro-mechanical switch (MEMS) and a method of using and making thereof.
Micro-electro-mechanical switches are operated by an electrostatic charge, thermal, piezoelectric or other actuation mechanism. Application of an electrostatic charge to a control electrode in the MEMS causes the switch to close, while removal of the electrostatic charge on the control electrode, allowing the mechanical spring restoration force of the armature to open the switch. Although these MEMS switches work problems have prevented their more widespread use.
For example, one problem with cantilever type MEMS is that they often freeze into a closed position due to a phenomenon known as stiction. These cantilever type MEMS may be actuated by electrostatic forces, however there is no convenient way to apply a force in the opposite direction to release the MEMS to the open position.
One solution to this problem is a design which uses electrostatic repulsive forces to force apart MEMS contacts, such as the one disclosed in U.S. Pat. No. 6,127,744 to R. Streeter et al. which is herein incorporated by reference. In this design, the improved switch includes an insulating substrate, a conductive contact, a cantilever support, a first conductive surface and a cantilever beam. Additionally, a first control surface is provided on the lower surface of and is insulated from the beam by a layer of insulation. A second control surface is disposed over and is separated from the first conductive surface by a layer of insulative material. A variable capacitor is formed by the two control surfaces and the dielectric between them. This capacitor must be considered in addition to the capacitors formed by the first control surface, the layer of insulation and the beam and by the second control surface, the layer of insulation and the first conductive surface.
Unfortunately, there are drawbacks to this design. As discussed above, the additional layers used for attraction or repulsion charge form capacitors which require additional power for operation and thus impose a serious limitation on this type of design. These additional layers also add mass that limits the response time of the switch. Further, this design results in a variable parasitic capacitor between the cantilever beam and contact post.
A switch in accordance with one embodiment of the present invention includes at least one portion of a conductive line in the chamber, a beam with imbedded charge, and control electrodes. The beam has a conductive section which is positioned in substantial alignment with the at least one portion of the conductive line. The conductive section of the beam has an open position spaced away from the conductive line and a closed position on the conductive line. Each of the control electrodes is spaced away from an opposing side of the beam to control movement of the beam.
A method for making a switch in accordance with another embodiment of the present invention includes forming a chamber in a switch housing, forming separated portions of a conductive line in the chamber, forming a beam with imbedded charge which extends into the chamber, and forming a pair of control electrodes spaced away from opposing sides of the beam. The beam has a conductive section located at or adjacent an edge of the beam and which is positioned in substantial alignment with the separated portions of the conductive line. The conductive section of the beam has an open position spaced away from the separated portions of the conductive line and a closed position on a part of each of the separated portions of the conductive line to couple the separated portions of the conductive line together.
A method of using a switch in accordance with another embodiment of the present invention includes applying a first potential to control electrodes and moving a conductive section on a beam to one of an open position spaced away from at least one portion of a conductive line or a closed position on the at least one portion of the conductive line in response to the applied first potential. The beam has imbedded charge and a conductive section that is located at or adjacent an edge of the beam and is positioned in substantial alignment with the at least one portion of a conductive line. Each of the control electrodes is spaced away from an opposing side of the beam to control movement of the beam.
A method for making a switch in accordance with another embodiment of the present invention includes forming at least one portion of a conductive line, forming a beam with imbedded charge, and forming control electrodes. The beam has a conductive section which is positioned in substantial alignment with the at least one portion of the conductive line. The conductive section of the beam has an open position spaced away from the at least one portion of the conductive line and a closed position on the at least one portion of the conductive line. Each of the control electrodes is spaced away from an opposing side of the beam to control movement of the beam.
A method for making a switch in accordance with another embodiment of the present invention includes filling at least three trenches in a base material with a first conductive material. The first conductive material in two of the trenches forms separated portions of a conductive line and the first conductive material in the other trench forms a first control electrode. A first insulating layer is deposited on at least a portion of the first conductive material and the base material. A trench is formed in a portion of the first insulating layer which extends to at least a portion of the first conductive material in the trenches in the base material. The trench in the portion of the first insulating layer is filled with a first sacrificial material. A trench is formed in the first sacrificial material which is at least partially in alignment with at least a portion of the first conductive material in the trenches in the base material that form the separated portions of the conductive line. The trench in the first sacrificial material is filled with a second conductive material to form a contactor. A charge holding beam is formed over at least a portion of the first insulating layer, the first sacrificial material, and the second conductive material in the trench in the first sacrificial material. The beam is connected to the beam. A second insulating layer is deposited over at least a portion of the beam, the first sacrificial material, and the first insulating layer. A trench is formed in the second insulating layer which extends to at least a portion of the beam and the first sacrificial material. The trench in the second insulating layer is filled with a second sacrificial material. A charge is inbedded on the beam. A third conductive material is deposited over at least a portion of the second insulating layer and the second sacrificial material. A second control electrode is formed from the third conductive material over at least a portion of the second insulating layer and the second sacrificial material. A third insulating layer is deposited over at least a portion of the second control electrode, the second sacrificial material, and the second insulating layer. At least one access hole is formed to the first and second sacrificial materials. The first and second sacrificial materials are removed to form a chamber and sealing the access hole to form a vacuum or a gas filled chamber.
The present invention provides a switch that utilizes fixed static charge to apply attractive and repulsive forces for activation. With the present invention, the parasitic capacitance is minimal, while the switching speed or response is high. The switch does not add extra mass and only requires one power supply. The present invention can be used in a variety of different applications, such as wireless communications, cell phones, robotics, micro-robotics, and/or autonomous sensors.
FIGS. 3 and 5-11 are cross sectional, side views of steps in a method of making a switch in accordance with another embodiment of the present invention; and
A switch 10(1) in accordance with at least one embodiment of the present invention is illustrated in
Referring more specifically to
Referring to
Referring back to
Referring to
Referring back to
The operation of the switch 10(1) will now be described with reference to
The components and operation of the switches 10(2) 10(3), and 10(4) shown in
Referring to
Next, a conductive material 40 is deposited in the trenches in the base material 38. The conductive material 40 in the two trenches 32 and 34 with the adjacent ends forms the separated portions 16(1) and 16(2) of the conductive line. The conductive material 40 in the other trench 36 forms control electrode 22(1). Next, the conductive material 40 deposited in these trenches 32, 34, and 36 may also be planarized. Again although in this embodiment, the control electrodes 22(1) is formed in the chamber 14 of the switch housing 12, the control electrode 22(1) could be positioned outside of the switch housing 12.
Referring to
Once the insulating material 42 is deposited, the insulating material 42 is etched to extend down to a portion of the conductive material 40 in the trenches 32, 34, and 36. Next, a sacrificial material 44 is deposited in the etched opening or trench 46 in the insulating material. In this particular embodiment, polysilicon is used as the sacrificial material 44, although another material or materials can be used. Next, the sacrificial material 44 may be planarized. Although etching is used in this particular embodiment to form opening or trench 46, other techniques for forming trenches or openings can be used.
Referring to
Referring to
Referring to
Referring to
Referring to
Referring to
Referring to
Referring to
Referring to
Accordingly, the present invention provides a switch that utilizes fixed static charge to apply attractive and repulsive forces for activation and is easy to manufacture. Although one method for making a switch is disclosed, other steps in this method and other methods for making the switch can also be used. For example, other techniques for imbedding charge in the beam can be used, such as applying a bias to the beam to imbed charge.
Having thus described the basic concept of the invention, it will be rather apparent to those skilled in the art that the foregoing detailed disclosure is intended to be presented by way of example only, and is not limiting. Various alterations, improvements, and modifications will occur and are intended to those skilled in the art, though not expressly stated herein. These alterations, improvements, and modifications are intended to be suggested hereby, and are within the spirit and scope of the invention. Additionally, the recited order of processing elements or sequences, or the use of numbers, letters, or other designations therefor, is not intended to limit the claimed processes to any order except as may be specified in the claims. Accordingly, the invention is limited only by the following claims and equivalents thereto.
The present invention claims the benefit of U.S. Provisional Patent Application Ser. No. 60/275,386, filed Mar. 13, 2001, which is hereby incorporated by reference in its entirety.
Number | Name | Date | Kind |
---|---|---|---|
2567373 | Giacoletto et al. | Sep 1951 | A |
2588513 | Giacoletto | Mar 1952 | A |
2978066 | Nodolf | Apr 1961 | A |
3118022 | Sessler et al. | Jan 1964 | A |
3397278 | Pomerantz | Aug 1968 | A |
3405334 | Jewett et al. | Oct 1968 | A |
3487610 | Brown et al. | Jan 1970 | A |
3715500 | Sessler et al. | Feb 1973 | A |
3731163 | Shuskus | May 1973 | A |
3742767 | Bernard et al. | Jul 1973 | A |
3786495 | Spence | Jan 1974 | A |
3858307 | Yoshimura et al. | Jan 1975 | A |
3924324 | Kodera | Dec 1975 | A |
4047214 | Francombe et al. | Sep 1977 | A |
4102202 | Ferriss | Jul 1978 | A |
4115914 | Harari | Sep 1978 | A |
4126822 | Wahlstrom | Nov 1978 | A |
4160882 | Driver | Jul 1979 | A |
4166729 | Thompson et al. | Sep 1979 | A |
4285714 | Kirkpatrick | Aug 1981 | A |
4288735 | Crites | Sep 1981 | A |
4340953 | Iwamura et al. | Jul 1982 | A |
4375718 | Wadsworth et al. | Mar 1983 | A |
4490772 | Blickstein | Dec 1984 | A |
4504550 | Pook | Mar 1985 | A |
4513049 | Yamasaki et al. | Apr 1985 | A |
4581624 | O'Connor | Apr 1986 | A |
4585209 | Aine et al. | Apr 1986 | A |
4626263 | Inoue et al. | Dec 1986 | A |
4626729 | Lewiner et al. | Dec 1986 | A |
4701640 | Flygstad et al. | Oct 1987 | A |
4716331 | Higgins, Jr. | Dec 1987 | A |
4736629 | Cole | Apr 1988 | A |
4789504 | Ohmori et al. | Dec 1988 | A |
4789803 | Jacobsen et al. | Dec 1988 | A |
4794370 | Simpson et al. | Dec 1988 | A |
4874659 | Ando et al. | Oct 1989 | A |
4905701 | Cornelius | Mar 1990 | A |
4922756 | Henrion | May 1990 | A |
4944854 | Felton et al. | Jul 1990 | A |
4945068 | Sugaya | Jul 1990 | A |
4958317 | Terada et al. | Sep 1990 | A |
4965244 | Weaver et al. | Oct 1990 | A |
4996627 | Zias et al. | Feb 1991 | A |
4997521 | Howe et al. | Mar 1991 | A |
5020030 | Huber | May 1991 | A |
5050435 | Pinson | Sep 1991 | A |
5054081 | West | Oct 1991 | A |
5057710 | Nishiura et al. | Oct 1991 | A |
5081513 | Jackson et al. | Jan 1992 | A |
5082242 | Bonne et al. | Jan 1992 | A |
5088326 | Wada et al. | Feb 1992 | A |
5092174 | Reidemeister et al. | Mar 1992 | A |
5095752 | Suzuki et al. | Mar 1992 | A |
5096388 | Weinberg | Mar 1992 | A |
5108470 | Pick | Apr 1992 | A |
5112677 | Tani et al. | May 1992 | A |
5118942 | Hamade | Jun 1992 | A |
5129794 | Beatty | Jul 1992 | A |
5132934 | Quate et al. | Jul 1992 | A |
5143854 | Pirrung et al. | Sep 1992 | A |
5156810 | Ribi | Oct 1992 | A |
5164319 | Hafeman et al. | Nov 1992 | A |
5180623 | Ohnstein | Jan 1993 | A |
5189641 | Arakawa | Feb 1993 | A |
5207103 | Wise et al. | May 1993 | A |
5228373 | Welsch | Jul 1993 | A |
5231045 | Miura et al. | Jul 1993 | A |
5238223 | Mettner et al. | Aug 1993 | A |
5256176 | Matsuura et al. | Oct 1993 | A |
5284179 | Shikida et al. | Feb 1994 | A |
5284692 | Bell | Feb 1994 | A |
5323999 | Bonne et al. | Jun 1994 | A |
5334238 | Goodson et al. | Aug 1994 | A |
5336062 | Richter | Aug 1994 | A |
5336904 | Kusunoki | Aug 1994 | A |
5348571 | Weber | Sep 1994 | A |
5349492 | Kimura et al. | Sep 1994 | A |
5355577 | Cohn | Oct 1994 | A |
5365790 | Chen et al. | Nov 1994 | A |
5367429 | Tsuchitani et al. | Nov 1994 | A |
5380396 | Shikida et al. | Jan 1995 | A |
5392650 | O'Brien et al. | Feb 1995 | A |
5417235 | Wise et al. | May 1995 | A |
5417312 | Tsuchitani et al. | May 1995 | A |
5419953 | Chapman | May 1995 | A |
5441597 | Bonne et al. | Aug 1995 | A |
5445008 | Wachter et al. | Aug 1995 | A |
5474599 | Cheney et al. | Dec 1995 | A |
5488864 | Stephan | Feb 1996 | A |
5491604 | Nguyen et al. | Feb 1996 | A |
5496507 | Angadjivand et al. | Mar 1996 | A |
5512882 | Stetter et al. | Apr 1996 | A |
5519240 | Suzuki | May 1996 | A |
5520522 | Rathore et al. | May 1996 | A |
5526172 | Kanack | Jun 1996 | A |
5567336 | Tatah | Oct 1996 | A |
5591679 | Jakobsen et al. | Jan 1997 | A |
5593476 | Coppom | Jan 1997 | A |
5593479 | Frey et al. | Jan 1997 | A |
5616844 | Suzuki et al. | Apr 1997 | A |
5635739 | Grieff et al. | Jun 1997 | A |
5640133 | MacDonald et al. | Jun 1997 | A |
5668303 | Giesler et al. | Sep 1997 | A |
5671905 | Hopkins, Jr. | Sep 1997 | A |
5677617 | Tokai et al. | Oct 1997 | A |
5698771 | Shields et al. | Dec 1997 | A |
5739834 | Okabe et al. | Apr 1998 | A |
5747692 | Jacobsen et al. | May 1998 | A |
5771148 | Davis | Jun 1998 | A |
5777977 | Fujiwara et al. | Jul 1998 | A |
5788468 | Dewa et al. | Aug 1998 | A |
5793485 | Gourley | Aug 1998 | A |
5798146 | Murokh et al. | Aug 1998 | A |
5807425 | Gibbs | Sep 1998 | A |
5812163 | Wong | Sep 1998 | A |
5839062 | Nguyen et al. | Nov 1998 | A |
5846302 | Putro | Dec 1998 | A |
5846708 | Hollis et al. | Dec 1998 | A |
5871567 | Covington et al. | Feb 1999 | A |
5897097 | Biegelsen et al. | Apr 1999 | A |
5908603 | Tsai et al. | Jun 1999 | A |
5914553 | Adams et al. | Jun 1999 | A |
5919364 | Lebouitz et al. | Jul 1999 | A |
5920011 | Hulsing, II | Jul 1999 | A |
5941501 | Biegelsen et al. | Aug 1999 | A |
5955932 | Nguyen et al. | Sep 1999 | A |
5959516 | Chang et al. | Sep 1999 | A |
5967163 | Pan et al. | Oct 1999 | A |
5969250 | Greiff | Oct 1999 | A |
5971355 | Biegelsen et al. | Oct 1999 | A |
5993520 | Yu | Nov 1999 | A |
5994982 | Kintis et al. | Nov 1999 | A |
6007309 | Hartley | Dec 1999 | A |
6032923 | Biegelsen et al. | Mar 2000 | A |
6033852 | Andle et al. | Mar 2000 | A |
6037797 | Lagowski et al. | Mar 2000 | A |
6048692 | Maracas et al. | Apr 2000 | A |
6051853 | Shimada et al. | Apr 2000 | A |
6089534 | Biegelsen et al. | Jul 2000 | A |
6094102 | Chang et al. | Jul 2000 | A |
6106245 | Cabuz | Aug 2000 | A |
6119691 | Angadjivand et al. | Sep 2000 | A |
6120002 | Biegelsen et al. | Sep 2000 | A |
6123316 | Biegelsen et al. | Sep 2000 | A |
6124632 | Lo et al. | Sep 2000 | A |
6126140 | Johnson et al. | Oct 2000 | A |
6127812 | Ghezzo et al. | Oct 2000 | A |
6149190 | Galvin et al. | Nov 2000 | A |
6168395 | Quenzer et al. | Jan 2001 | B1 |
6168948 | Anderson et al. | Jan 2001 | B1 |
6170332 | MacDonald et al. | Jan 2001 | B1 |
6177351 | Beratan et al. | Jan 2001 | B1 |
6181009 | Takahashi et al. | Jan 2001 | B1 |
6197139 | Ju et al. | Mar 2001 | B1 |
6199874 | Galvin et al. | Mar 2001 | B1 |
6204737 | Ellä | Mar 2001 | B1 |
6214094 | Rousseau et al. | Apr 2001 | B1 |
6238946 | Ziegler | May 2001 | B1 |
6255758 | Cabuz et al. | Jul 2001 | B1 |
6265758 | Takahashi | Jul 2001 | B1 |
6275122 | Speidell et al. | Aug 2001 | B1 |
6287776 | Hefti | Sep 2001 | B1 |
6324914 | Xue et al. | Dec 2001 | B1 |
6336353 | Matsiev et al. | Jan 2002 | B2 |
6384353 | Huang et al. | May 2002 | B1 |
6393895 | Matsiev et al. | May 2002 | B1 |
6395638 | Linnemann et al. | May 2002 | B1 |
6423148 | Aoki | Jul 2002 | B1 |
6431212 | Hayenga et al. | Aug 2002 | B1 |
6469785 | Duveneck et al. | Oct 2002 | B1 |
6470754 | Gianchandani | Oct 2002 | B1 |
6485273 | Goodwin-Johansson | Nov 2002 | B1 |
6496348 | McIntosh | Dec 2002 | B2 |
6504118 | Hyman et al. | Jan 2003 | B2 |
6580280 | Nakae et al. | Jun 2003 | B2 |
6597560 | Potter | Jul 2003 | B2 |
6626417 | Winger et al. | Sep 2003 | B2 |
6638627 | Potter | Oct 2003 | B2 |
6673677 | Hofmann et al. | Jan 2004 | B2 |
6674132 | Willer | Jan 2004 | B2 |
6688179 | Potter et al. | Feb 2004 | B2 |
6707355 | Yee | Mar 2004 | B1 |
6717488 | Potter | Apr 2004 | B2 |
6734770 | Aigner et al. | May 2004 | B2 |
6750590 | Potter | Jun 2004 | B2 |
6773488 | Potter | Aug 2004 | B2 |
6787438 | Nelson | Sep 2004 | B1 |
6798132 | Satake | Sep 2004 | B2 |
6841917 | Potter | Jan 2005 | B2 |
6842009 | Potter | Jan 2005 | B2 |
6854330 | Potter | Feb 2005 | B2 |
7195393 | Potter | Mar 2007 | B2 |
7211923 | Potter | May 2007 | B2 |
7217582 | Potter | May 2007 | B2 |
20010047689 | McIntosh | Dec 2001 | A1 |
20020000649 | Tilmans et al. | Jan 2002 | A1 |
20020012937 | Tender et al. | Jan 2002 | A1 |
20020072201 | Potter | Jun 2002 | A1 |
20020131230 | Potter | Sep 2002 | A1 |
20020182091 | Potter | Dec 2002 | A1 |
20020185003 | Potter | Dec 2002 | A1 |
20020187618 | Potter | Dec 2002 | A1 |
20020197761 | Patel et al. | Dec 2002 | A1 |
20030079543 | Potter | May 2003 | A1 |
20030079548 | Potter et al. | May 2003 | A1 |
20030080839 | Wong | May 2003 | A1 |
20030081397 | Potter | May 2003 | A1 |
20030112096 | Potter | Jun 2003 | A1 |
20030201784 | Potter | Oct 2003 | A1 |
20040023236 | Potter et al. | Feb 2004 | A1 |
20040113752 | Schuster | Jun 2004 | A1 |
20040145271 | Potter | Jul 2004 | A1 |
20040155555 | Potter | Aug 2004 | A1 |
20050035683 | Raisanen | Feb 2005 | A1 |
20050044955 | Potter | Mar 2005 | A1 |
20050079640 | Potter | Apr 2005 | A1 |
20050186117 | Uchiyama et al. | Aug 2005 | A1 |
20050205966 | Potter | Sep 2005 | A1 |
20060131692 | Saitoh et al. | Jun 2006 | A1 |
20070074731 | Potter | Apr 2007 | A1 |
Number | Date | Country |
---|---|---|
58-029379 | Feb 1983 | JP |
62-297534 | Dec 1987 | JP |
02-219478 | Sep 1990 | JP |
4-236172 | Aug 1992 | JP |
08-308258 | Nov 1996 | JP |
2000-304567 | Nov 2000 | JP |
Number | Date | Country | |
---|---|---|---|
20020131228 A1 | Sep 2002 | US |
Number | Date | Country | |
---|---|---|---|
60275386 | Mar 2001 | US |