The present disclosure generally relates to micro light-emitting diode (LED) manufacturing technology and, more particularly, to a micro LED structure and a micro LED panel using the micro LED structure.
Inorganic micro light-emitting diodes are also called “micro LEDs.” They are increasingly important because of their use in various applications including, for example, self-emissive micro-displays, visible light communications, and opto-genetics. The micro LEDs have greater output performance than conventional LEDs, due to better strain relaxation, improved light extraction efficiency, uniform current spreading, etc. Moreover, compared with the conventional LEDs, the micro LEDs have improved thermal effects, improved operation at higher current density, better response rate, greater operating temperature range, higher resolution, higher color gamut, higher contrast, lower power consumption, etc.
A micro LED panel is manufactured by integrating an array of thousands or even millions of micro LEDs with a driver circuitry back panel. Each pixel of the micro LED panel is formed by one or more micro LEDs. The micro LED panel can be a mono-color or multi-color panel. In particular, for a multi-color LED panel, each pixel may further include multiple sub-pixels respectively formed by multiple micro LEDs, each of which corresponds to a different color. For example, three micro LEDs respectively corresponding to red, green, and blue colors may be superimposed to form one pixel. The different colors can be mixed to produce a broad array of colors. The existing micro LED technology, however, faces several challenges. For
example, one challenge is to improve the effective illumination area within each pixel when the distance between the adjacent LEDs is determined. Moreover, when a single LED illumination area is determined, further improving the overall resolution of the micro LED panel can be a difficult task because micro LEDs with different colors have to occupy their designated zones within the single pixel.
Additionally, the light emitted by the LED dies is generated from spontaneous emission and is thus not directional, resulting in a large divergence angle. The large divergence angle can cause various problems in a micro-LED panel. On one hand, due to the large divergence angle, only a small portion of the light emitted by the micro-LEDs can be utilized. This may significantly reduce the efficiency and brightness of a micro-LED display system. On the other hand, due to the large divergence angle, the light emitted by one micro-LED pixel may illuminate its adjacent pixels, resulting in light crosstalk between pixels, loss of sharpness, and loss of contrast.
The present disclosure provides a micro LED structure that addresses the problems in the related art, such as the problems described above. In particular, the disclosed micro LED structure integrates two or more vertically stacked micro LEDs, by placing them at different layers of the micro LED structure and electrically connecting them to an integrated circuit (IC) back panel. The micro LED structure effectively enhances the light illumination efficiency within a single pixel area, and at the same time, improves the resolution of the micro LED panel.
Moreover, the disclosed micro LED structure further improves the light illumination efficiency by including reflection layers that not only effectively increase the amount of light emitted by each of the vertically stacked micro LEDs, but also reduce crosstalk between the vertically stacked micro LEDs.
Consistent with the disclosed embodiments, a plurality of the disclosed micro LED structures can be arranged in a micro LED array to form a micro LED panel. Each of the plurality of micro LED structures corresponds to a pixel of the disclosed micro LED structure, and the multiple vertically stacked micro LEDs in a pixel correspond to multiple sub-pixels respectively.
In some embodiments, the disclosed micro LED structure comprises an IC back plane, at least three mesa structures stacked along a vertical axis, and a top contact formed above the at least three mesa structures.
In some embodiments, the at least three mesa structures comprises a first mesa structure formed on the IC back plane, a second mesa structure formed on the first mesa structure, and a third mesa structure formed on the second mesa structure.
In some embodiments, the second mesa structure comprises a first connecting layer, a first reflection layer formed on the first connecting layer, a first bonding layer formed on the first reflection layer, a first light emitting layer formed on the first bonding layer, and a second connecting layer formed on the first light emitting layer. In some embodiments, the first light emitting layer comprising a first semiconductor layer and a second semiconductor layer formed on the first semiconductor layer.
In some embodiments, the third mesa structure comprises a second reflection layer formed on the second connecting layer, a second bonding layer formed on the second reflection layer, a second light emitting layer formed on the second bonding layer, and a third connecting layer formed on the second light emitting layer. In some embodiments, the second light emitting layer comprises a third semiconductor layer and a fourth semiconductor layer formed on the third semiconductor layer.
In some embodiments, the first connecting layer and the third connecting layer are electrically connected with the IC back plane.
In some embodiments, the second connecting layer is connected with the top contact.
In some embodiments, the first and fourth semiconductor layers have a first conductive type, and the second and third semiconductor layers have a second conductive type.
In some embodiments, each of the light emitting layers comprises a P type semiconductor layer, a N type semiconductor layer, and a quantum well layer between the P type semiconductor layer and the N type semiconductor layer. For example, each of the light emitting layers may comprise a P type semiconductor layer at the bottom and an N type semiconductor layer on the top, thereby forming a P-N junction; or alternatively, each of the light emitting layers may comprise an N type semiconductor layer on the bottom and a P type semiconductor layer on the top, thereby forming an N-P junction.
Reference will now be made in detail to exemplary embodiments to provide a further understanding of the disclosure. The specific embodiments and the accompanying drawings discussed are merely illustrative of specific ways to make and use the disclosure, and do not limit the scope of the disclosure or the appended claims.
In some embodiments, sidewall connecting structures 205 and 305 may be formed on the bottom connecting layer 202 and interconnecting layer 201, respectively. Specifically, sidewall connecting structure 205 is formed on the bottom connecting layer 202, and may surround the sidewalls of the reflection layer 204 and the conductive bonding layer 203. The sidewall connecting structure 205 may provide electrical contact to the conductive bonding layer 203 from its sides. Similarly, sidewall connecting structure 305 is formed on the interconnecting layer 201, and may surround the sidewalls of the reflection layer 304 and the conductive bonding layer 303. The sidewall connecting structure 305 may provide electrical contact to the conductive bonding layer 303 from its sides.
Continuing referring to
In some embodiments, the light emitting layers 100, 200, 300 may emit light or light images in different colors. In some exemplary embodiments, the light emitting layer 100 is chosen as a red color light emitting layer, the light emitting layer 200 is chosen as a green color light emitting layer, and the light emitting layer 300 is chosen as a blue color light emitting layer. The above color assignment is for illustrative purpose only. Consistent with the disclosed embodiments, other combinations of light colors may be assigned to the light emitting layers to obtain any needed result.
In some embodiments, each of the light emitting layers 100, 200, 300 may comprise two semiconductor layers of different conductive types (e.g., P type and N type), and a quantum well layer between the two different type semiconductor layers. In some embodiments, the light emitting layers 100 and 200 may each have a P type semiconductor layer at the bottom and an N type semiconductor layer at the top, and the light emitting layer 300 may have an N type semiconductor layer at the bottom and a P type semiconductor layer at the top. In some other embodiments, the light emitting layers 100 and 200 each may have an N type semiconductor layer at the bottom and a P type semiconductor layer at the top, and the light emitting layer 300 may have a P type semiconductor layer at the bottom and an N type semiconductor layer at the top.
When vertically projecting the mesa structures of the micro LED structure 10 onto a horizontal plane, each of the mesa structure forms a projective area on the horizontal plane. Each projective area on the horizontal planes has an outline, which is herein referred to as projective outline in plan view (i.e., top view). In some embodiments, the disclosed micro LED structure is configured to make an upper light emitting layer's projective outline in plan view located within a lower light emitting layer's projective shape in plan view, thereby forming multiple mesa structures with different widths. Specifically,
The cross-sectional arrangement of micro LED structure 10 is not limited to the configuration shown in
In some embodiments, the conductive bonding layers may be transparent or opaque. In some embodiments, the material of the conductive bonding layers is selected from one of a metal, a composite metal, or a transparent conductive material. In some embodiments, the transparent conductive material may be made of indium tin oxide (ITO) or aluminum-doped zinc oxide (AZO). The metal may be selected from copper (Cu), gold (Au), etc. In some embodiments, the thickness of the conductive bonding layers (e.g., 103, 203, 303) can range from about 0.1 micron to about 5 microns. In some embodiments, metal compositions for the bonding layers may include Au—Au bonding, Au—Sn bonding, Au—In bonding, Ti—Ti bonding, Cu—Cu bonding, or a combination thereof. For example, when Au—Au bonding is needed, the two layers of Au each need a chrome (Cr) coating as an adhesive layer, and platinum (Pt) coating between the gold layer and the chrome coating as an anti-diffusion layer. The Cr and Pt layers may be formed on both Au layers to be bonded. In some embodiments, when the thicknesses of the two Au layers to be bonded are about the same, the mutual diffusion of Au on both Au layers may bond the two layers together under high pressure and high temperature. Example bonding techniques may include eutectic bonding, thermal compression bonding, and transient liquid phase (TLP).
In some embodiments, the material of the connecting layers (e.g., 101, 201, 202, 301) may be selected from a transparent conductive material. In some embodiments, the transparent conductive material may be Indium Tin Oxide (ITO). In some embodiments, the thickness of the ITO layer can range from about 0.01 micron to about 1 micron.
In some embodiments, the second and third mesa structures are bonded by the interconnecting layer 201. In some embodiments, the light emitting layer 200 may have its entire area covered by the interconnecting layer 201 and therefore have its entire area utilized.
In some embodiments, a cathode connecting layer through via 400 filled with conductive metal may be formed next to the light emitting layers 100, 200, 300, and next to the stack of mesa structures. In some exemplary embodiments, as shown in
In some embodiments, at least one of anode connecting layer through vias (e.g., 500, 600) may be formed next to the stacked mesa structures of micro LED structure 10. The anode connecting layer through vias 500, 600 are formed at positions that are separate from the position of the cathode connecting layer through via 400. For example, the anode connecting layer through vias 500, 600 may be positioned on a different side of the mesa structures from the cathode connecting layer through via 400. The through vias 400, 500, 600 are not electrically connected to each other.
In one exemplary embodiment, as shown in
In some embodiments, reflection layers 204, 304 are formed on the bottom connecting layer 202, and on the interconnected layer 201, respectively. Specifically, the reflection layer 204 may be sandwiched between the bottom connecting layer 202 and the conductive bonding layers 203: the reflection layer 304 may be sandwiched between the interconnecting layer 201 and the conductive bonding layer 303. The sidewalls of the reflection layers 204, 304 are aligned with the sidewalls of the conductive bonding layers 203, 303 in the mesa structures, respectively. For example, in the middle mesa structure, the reflection layer 204 is formed at the bottom surface of the conductive bonding layer 203 and the sidewall of the conductive bonding layer 203 is aligned with the sidewall of the corresponding reflection layer 204; and in the top mesa structure, the reflection layer 304 is formed at the bottom surface of the conductive bonding layer 303 and sidewall of the conductive bonding layer 303 is aligned with the sidewall of the corresponding reflection layer 304. In some embodiments, each of the reflection layers in the micro LED structure 30 comprises stacked transparent layers and metal ODR layers, stacked DBR layers, or high-reflectivity metal. Note that the reflection layers may be insulating (DBR) or conducting (metal reflectors). In the case of insulating reflection layers, electrical contact from connecting layers to light emitting layer may be made by sidewall connecting structures (e.g., 205, 305.)
In some embodiments, the above-described reflection layers (e.g., 204, 304) each may be or comprise a distributed Bragg reflector (DBR) structure or a metal reflector. For example, the reflection layers may be formed by stacking multiple layers of alternating or different materials with varying refractive index. In some embodiments, each layer boundary of the DBR structure may cause a partial reflection of an optical wave. In some embodiments, a reflection layer is made of multiple layers of SiO2 and Ti3O5. In some embodiments, a reflection layer is made of multiple layers of Au and/or Indium Tin Oxide (ITO). By manipulating the thicknesses and/or numbers of layers of SiO2 and Ti3O5, or by manipulating the thicknesses and/or numbers of layers of Au and/or and ITO, selective reflection or transmission of light at specific wavelengths may be achieved. For example, in an exemplary design, the reflection layer 204 in
In some embodiments, the reflection layer 304 for a green light LED structure may have a low absorbance (e.g., equal to or less than 5%) of the light generated by different layers of the tri-color LED device. In some embodiments, the reflection layer 304 for a green light layer has a high reflectance (e.g., equal to or more than 95%) of the light generated above itself, e.g., green light and blue light.
In some exemplary embodiments, the light emitting layer 100 in the micro LED structure 10 (
In some embodiments, the light emitting layer 200 in the micro LED structure 10 (
In some embodiments, the light emitting layer 300 in the micro LED structure 10 (
In some embodiments, in the micro LED structure 10 (
In some embodiments, a micro lens 800 may be formed on top of a micro LED structure (e.g., the micro LED structures as shown in
The micro LEDs described in the disclosed embodiments have a very small size in volume. The micro LED may be an organic LED or an inorganic LED. In some embodiments, the micro LED may be applied in a micro LED array panel. The light emitting area of the micro LED array panel may be very small, e.g., 1 mm×1 mm, 3 mm×5 mm, etc. In some embodiments, the light emitting area may be the area of the micro LED array in the micro LED array panel. The micro LED array panel may include one or more micro LED arrays, which form a pixel array in which the micro LEDs are pixels, e.g., a 1600×1200, 680×480, or 1920×1080 pixel array. The diameter of the micro LED may be in the range of about 200 nm˜2 μm. In some embodiments, an IC backplane may be formed at the back surface of the micro LED array and electrically connected to the micro LED array. In some embodiments, the IC backplane may acquire signals, such as, for example, image data from outside via signal lines, to control the on/off of the corresponding micro LEDs (e.g., emitting light or not).
Accordingly, different types of display panels may be fabricated. For example, in some embodiments, the resolution of a display panel may range from 8×8 to 3840×2160. Common display resolutions include QVGA with 320×240 resolution and an aspect ratio of 4:3, XGA with 1024×768 resolution and an aspect ratio of 4:3, D with 1280×720 resolution and an aspect ratio of 16:9, FHD with 1920×1080 resolution and an aspect ratio of 16:9, UHD with 3840×2160 resolution and an aspect ratio of 16:9, and 4 K with 4096×2160 resolution and an aspect ratio of 1.9. There can also be a wide variety of pixel sizes, ranging from sub-micron and below to 10 mm and above. The size of the overall display region can also vary widely, ranging from diagonals as small as tens of microns or less up to hundreds of inches or more.
It is understood by those skilled in the art that, the micro LED display panel is not limited by the structure mentioned above, and may include more or less components than those as illustrated, or some components may be combined, or a different component may be utilized.
It should be noted that, the relational terms herein such as “first” and “second” are used only to differentiate an entity or operation from another entity or operation, and do not require or imply any actual relationship or sequence between these entities or operations. Moreover, the words “comprising,” “having,” “containing,” and “including,” and other similar forms are intended to be equivalent in meaning and be open ended in that an item or items following any one of these words is not meant to be an exhaustive listing of such item or items, or meant to be limited to only the listed item or items.
As used herein, unless specifically stated otherwise, the term “or” encompasses all possible combinations, except where infeasible. For example, if it is stated that a database may include A or B, then, unless specifically stated otherwise or infeasible, the database may include A, or B, or A and B. As a second example, if it is stated that a database may include A, B, or C, then, unless specifically stated otherwise or infeasible, the database may include A, or B, or C, or A and B, or A and C, or B and C, or A and B and C.
It is understood by those skilled in the art that, all or part of the steps for implementing the foregoing embodiments may be implemented by hardware or may be implemented by a program that instructs related hardware. The program may be stored in the aforementioned flash memory, in the aforementioned conventional computer device, in the aforementioned central processing module, in the aforementioned adjustment module, etc.
The above descriptions are merely embodiments of the present disclosure, and the present disclosure is not limited thereto. A modifications, equivalent substitutions and improvements made without departing from the conception and principle of the present disclosure shall fall within the protection scope of the present disclosure.
This application claims the benefit of priority of International Application No. PCT/CN2022/141527, filed Dec. 23, 2022, titled “Micro LED Structure and Micro LED Panel,” the entire disclosure of which is incorporated herein by reference.
Number | Date | Country | |
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Parent | PCT/CN2022/141527 | Dec 2022 | WO |
Child | 18542752 | US |