Number | Date | Country | Kind |
---|---|---|---|
11-319876 | Nov 1999 | JP |
Number | Name | Date | Kind |
---|---|---|---|
5218525 | Amasaki et al. | Jun 1993 | A |
5254942 | D'Souza et al. | Oct 1993 | A |
5377198 | Simpson et al. | Dec 1994 | A |
5463637 | Hayashi | Oct 1995 | A |
5479652 | Dreyer et al. | Dec 1995 | A |
5590354 | Klapproth et al. | Dec 1996 | A |
5943498 | Yano et al. | Aug 1999 | A |
5995993 | Liang | Nov 1999 | A |
6094729 | Mann | Jul 2000 | A |
6122762 | Kim | Sep 2000 | A |
6209045 | Hasegawa et al. | Mar 2001 | B1 |
Number | Date | Country |
---|---|---|
8-185336 | Jul 1996 | JP |
9-319727 | Dec 1997 | JP |
10-214201 | Aug 1998 | JP |
Entry |
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“IEEE Standard Test Access Port and Boundary-Scan Architecture” IEEE Computer Society, Sponsored by the Test Technology Standards Committee, IEEE Std 1149.1-1990 (includes IEEE Std 1149.1a-1993), Oct. 21, 1993. |