The present application claims the benefit under 35 U.S.C. § 119 of German Patent Application No. DE 10 2022 200 149.4 filed on Jan. 10, 2022, which is expressly incorporated herein by reference in its entirety.
The present invention relates to a micromechanical component, in particular to a micromirror device. In addition, the present invention relates to a scanning device, in particular a microscanning device, comprising the micromechanical component.
German Patent Application No. DE 10 2016 208 924 A1 describes a micromirror device as a micromechanical component. The micromirror is resonantly driven by four bender actuators, each of which are arranged individually on wings as support structures for the respective bender actuator.
An object of the present invention is to provide a space-saving micromechanical component.
According to an example embodiment of the present invention, a micromechanical component is provided. According to an example embodiment of the present invention, the micromechanical component comprises a bracket and an adjustable portion, which is arranged in an adjustable manner on the bracket. Preferably, the adjustable portion is configured as a micromirror. Preferably, the adjustable portion has a thickness in a range of 50 to 700 μm. Additionally, the micromechanical component comprises a first bender actuator and a first support structure for the first bender actuator. Preferably, the first support structure is formed from silicon. The bender actuator is arranged in or on the first support structure, in particular on an outer surface. In this context, the first bender actuator is configured to bend the first support structure at least in the area of the first bender actuator arranged in or on the first support structure, such that the adjustable portion is displaceable relative to the bracket around a first rotational axis. In this context, the first bender actuator is in particular configured to deform and thus bend the first support structure at least in the area of the first bender actuator arranged in or on the first support structure. By this adjustment movement of the first support structure as a result of the deflection, a reaction force or reaction torque for the adjustable portion relative to the bracket around the first rotational axis and thus a rotational movement of the adjustable portion is generated. The first rotational axis is in particular a rotational axis that runs along a longitudinal axis of the adjustable portion. The first support structure is directly connected to the adjustable portion and thus additionally serves as a type of support for the adjustable portion. Additionally, the micromechanical component comprises a first spring that serves to suspend the first support structure for the first bender actuator and the adjustable portion from the bracket. Significantly less installation space is required due to the sole bender actuator and its support structure.
Preferably, according to an example embodiment of the present invention, the micromechanical component additionally comprises a second spring configured to suspend the first support structure for the first bender actuator and the adjustable portion from the bracket. The micromechanical component is thus made more stable. Preferably, a first point of application of the first spring on the first support structure and a second point of application of the second spring on the first support structure are arranged at an offset from the first rotational axis.
Preferably, according to an example embodiment of the present invention, the micromechanical component comprises a second bender actuator and a second support structure for the second bender actuator. A micromechanical component with two support structures and two associated bender actuators results in a more stable system. In particular, the position of the first rotational axis is more stable with respect to process fluctuations. Preferably, the first support structure is formed from silicon. The second bender actuator is arranged in or on the second support structure, in particular an outer surface. In this context, the second bender actuator is configured to bend the second support structure at least in the area of the second bender actuator arranged in or on the second support structure, such that the adjustable portion is displaceable relative to the bracket around the first rotational axis. In this context, the second bender actuator is in particular configured to deform and thus bend the second support structure at least in the area of the first bender actuator arranged in or on the first support structure. By this adjustment movement of the second support structure as a result of the deflection, a reaction force or reaction torque for the adjustable portion relative to the bracket around the first rotational axis and thus a rotational movement of the adjustable portion is generated. In particular, the first and second support structures are deformed in opposite directions by means of the respective bender actuator. Alternatively, the first and second support structures are deformed in the same direction. The second support structure is directly connected to the adjustable portion and thus additionally serves as a type of support for the adjustable portion. The micromechanical component comprises a third spring configured to suspend the second support structure for the second bender actuator and the adjustable portion from the bracket. Preferably, the first and second support structures engage with the adjustable portion at opposite ends of the adjustable portion. Preferably, a third point of application of the first spring on the first support structure and a fourth point of application of the third spring on the second support structure are substantially arranged on the first rotational axis. The support structures and therefore also the adjustable portion are thus more stably suspended. Some modes below the working frequency may be suppressed accordingly.
Preferably, according to an example embodiment of the present invention, the first spring is directly connected to the first support structure. Alternatively or additionally, the second spring is preferably directly connected to the first support structure. Furthermore, alternatively or additionally, the third spring is preferably directly connected to the second support structure.
Preferably, according to an example embodiment of the present invention, the first bender actuator is configured as a piezoelectric actuator. Alternatively or additionally, the second bender actuator is preferably configured as a piezoelectric actuator. A piezoelectric actuator has the advantage that it can cause relatively large forces to adjust the adjustable portion around the first rotational axis with a comparatively small change in the extension. Additionally, a resonant piezoelectric drive can be operated almost without electricity, and is therefore the ideal drive for high-frequency resonant adjustment movements of the respective adjustable portion.
Preferably, according to an example embodiment of the present invention, the first bender actuator is arranged at an opposite end of the first support structure to the adjustable element. Alternatively or additionally, the second bender actuator is arranged at an opposite end of the second support structure to the adjustable element. At these positions, the largest adjustment movements of the support structures and thus also the largest reaction forces or reaction torques for the adjustable portion relative to the bracket around the first rotational axis result.
Preferably, according to an example embodiment of the present invention, the first support structure is wing-shaped, in particular in a semi-circular wing shape. Alternatively or additionally, the second support structure is wing-shaped, in particular in a semi-circular wing shape.
Preferably, according to an example embodiment of the present invention, the micromechanical component additionally comprises a control device, which is configured to control the first and/or second bender actuators by means of electrical signals such that the adjustable portion can be moved into a resonant oscillating movement around the first rotational axis relative to the bracket. In this context, the first rotational axis may also be referred to as a resonant axis. The control device is preferably configured to provide at least one electrical signal to the first and/or second bender actuators such that the adjustable portion can be moved into a resonant oscillating movement around the first rotational axis relative to the bracket. In resonant operation, the first and second support structures move in the z-direction at least in the area of the respectively arranged bender actuators. In this context, the z-direction refers to the direction that is oriented in a direction vertical to the main extension plane of the adjustable portion in a resting state of the adjustable portion. In the embodiment with only a single, first bender actuator, the resonant movement results in a comparatively higher mode of the first support structure.
Preferably, according to an example embodiment of the present invention, the first and/or second support structure is/are configured as a spring element. This means that the first and/or second support structures each have a spring function with the corresponding flexible deformation properties. Preferably, the first and/or second support structure has/have a thickness in a range from 10 to 50 μm. Preferably, the first and/or second and/or third springs have a lower, in particular a significantly lower, spring stiffness than the first support structure and/or second support structure. In this context, the first and/or second and/or third springs are preferably configured as meander-shaped springs. In contrast, the first and/or second support structure is/are preferably configured as leaf springs with torsion fractions.
A further object of the present invention is to provide a scanning device, in particular a microscanning device, with the micromechanical component described above. In this context, the scanning device is preferably configured as a LIDAR scanner. Alternatively, the scanning device is configured as a microscanner for projection onto a screen or onto the eye of a user of data glasses.
Additionally, the micromechanical component 1a has a second piezoelectric actuator as second bender actuator 20b and a second support structure 30b for the second bender actuator 20b. The second bender actuator 20b is arranged on an outer surface of the second support structure 30b. The second support structure 30b is also wing-shaped, in particular in a semi-circular wing shape. The second bender actuator 20b is configured to bend the second support structure 30b at least in the area of the second bender actuator 20b arranged on the second support structure 30b, such that the adjustable portion 15a is displaceable relative to the bracket 5 around the first rotational axis 10a. The second support structure 20b is also directly connected to the adjustable portion 15a. In this exemplary embodiment, the micromechanical component 1a comprises a third spring 25b, which is configured to suspend the second support structure 30b for the second bender actuator 20b and the adjustable portion 15a from the bracket 5.
The first 30a and the second support structure 30b are configured as spring elements in this exemplary embodiment. The two support structures 30a and 30b are formed from silicon. The first spring 25a and the third spring 25b are configured as meander-shaped springs in this exemplary embodiment and have a lower, in particular a significantly lower, spring stiffness than the first support structure 30a and the second support structure 30b.
The first bender actuator 20a and the second bender actuator 20b are arranged on an opposite end 60a and 60b of the respective support structure 30a and 30b to the adjustable portion 15a.
The first support structure 30a and the second support structure 30b engage with the adjustable portion 15a at opposite ends 50a and 50b of the adjustable portion 15a. A third point of application 45a of the first spring 25a on the first support structure 30a, as well as a fourth point of application 45b of the third spring 25b on the second support structure 30b are substantially arranged on the first rotational axis 10a. The first spring 25a and the second spring 25b are directly connected to the respective support structure 30a and 30b.
The micromechanical component 1a additionally comprises a control device (not shown here), which is configured to control the first 20a and the second bender actuator 20b by means of electrical signals such that the adjustable portion 15a can be moved into a resonant oscillating movement around the first rotational axis 10a relative to the bracket 5.
Number | Date | Country | Kind |
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10 2022 200 149.4 | Jan 2022 | DE | national |