Micrometer

Information

  • Patent Grant
  • D893327
  • Patent Number
    D893,327
  • Date Filed
    Wednesday, January 9, 2019
    5 years ago
  • Date Issued
    Tuesday, August 18, 2020
    3 years ago
Abstract
Description


FIG. 1 is a front elevational view of the micrometer;



FIG. 2 is a rear elevational view thereof;



FIG. 3 is a right-side elevational view thereof;



FIG. 4 is a left-side elevational view thereof;



FIG. 5 is a top plan view thereof;



FIG. 6 is a bottom plan view thereof;



FIG. 7 is a front, left-side, top perspective view thereof; and,



FIG. 8 is a front, right-side, bottom perspective view thereof.


The broken lines depict portions of the micrometer that form no part of the claimed design.


Claims
  • The ornamental design for a micrometer, as shown and described.
Priority Claims (1)
Number Date Country Kind
2018-018673 Aug 2018 JP national
US Referenced Citations (4)
Number Name Date Kind
D611371 Ohtani et al. Mar 2010 S
D729659 Asano May 2015 S
D740142 Zhang et al. Oct 2015 S
10451450 Niwano Oct 2019 B2
Foreign Referenced Citations (1)
Number Date Country
D1189771 Nov 2003 JP
Non-Patent Literature Citations (1)
Entry
Dec. 18, 2018 Decision to Grant issued in Japanese Application No. 2018-018673.