Micrometer

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Information

Patent Grant
D429172

References
Source

Patent Number
D429,172
Date Filed
Thursday, December 24, 1998
26 years ago
Date Issued
Tuesday, August 8, 2000
24 years ago

Inventors
- Jean-Claude Reymond
Original Assignees
- Brown & Sharpe Tesa S.A.
Examiners
- Davis; Antoine Duval
Agents
- Smith, Gambrell & Russell, LLP

US Classifications
- D10 - Measuring, testing, or signalling instruments
Field of Search
- US
- D10 73
- 033 783-832
- 033 DIG 12
International Classifications
- 1004
- Term of Grant
  14Years

Information

Abstract

Description

Claims

The ornamental design for a micrometer, as shown and described.

Priority Claims (1)

Number	Date	Country	Kind
DMA/004143	Jun 1998	XHX

US Referenced Citations (11)

Number	Name	Date	Kind
D334719	Yeo	Apr 1993
D344240	Schnyder	Feb 1994
D377912	Walser	Feb 1997
D386994	Reymond	Dec 1997
D387690	Reymond	Dec 1997
D401170	Reymond	Nov 1998
4578868	Sasaki et al.	Apr 1986
5383286	Kipnes	Jan 1995
5433016	Tachikake et al.	Jul 1995
5477621	Koizumi et al.	Dec 1995
5495677	Tachikake et al.	Mar 1996

Foreign Referenced Citations (9)

Number	Date	Country
0719999A1	Jul 1996	EPX
2481441	Oct 1981	FRX
2703145	Sep 1994	FRX
3434993	Nov 1985	DEX
3834306	Apr 1990	DEX
9005309 U	Nov 1990	DEX
4207142	Sep 1993	DEX
101636	Oct 1923	CHX
165061	Oct 1933	CHX

Non-Patent Literature Citations (1)

Entry
Patent Abstracts of Japan, vol. 7, No. 224 (p. 227), Oct. 5, 1983.