Claims
- 1. A microscope for observing a sample, comprising:
a stage portion having a stage surface configured to permit the sample to be contacted; an image-pickup element arranged at an opposite side of the stage surface to receive an image of the object, and configured to convert an image of object into an electrical signal: an optical system, having the optical axis extending in a straight line between the stage portion and the image-pickup element, configured to guide the optical image of the sample to the image-pickup element; a light source unit including one light source configured to emit illumination light rays for illuminating the sample and a mechanism configured to alternatively locate the light source in any of first, second, and third irradiative positions for transmissive illumination, incident illumination, and oblique illumination, thereby selecting one of the transmissive illumination, incident illumination, and oblique illumination.
- 2. A microscope according to claim 1, wherein the optical system includes a zoom lens unit, and
the microscope further comprises a base portion, a plurality of support members supporting the stage portion on the base portion, a lens frame supporting the zoom lens unit on the support members, and a lens frame moving mechanism configured to move the lens frame along the optical axis.
- 3. A microscope according to claim 1, which further comprises a hollow rotating cylinder portion rotatably attached to the base portion and the stage portion, and wherein the optical system is received in the rotating cylinder portion, and the lens frame moving mechanism is actuated to move the lens frame along the optical axis as the rotating cylinder portion is rotated.
- 4. A microscope according to claim 1, wherein the optical system includes a lens for adjusting the focus of the optical system, and the microscope further comprises a fine-movement mechanism configured to finely move the focus adjusting lens in the direction of the optical axis, thereby focusing the optical system on the sample.
- 5. A microscope according to claim 1, wherein the light source unit includes an arm member configured to support the light source, which is attached to the stage portion for adjustable rotation, and the light source is alternatively located in one of the first, second, and third irradiative position as the arm member is rotated.
- 6. A microscope for observing a sample, comprising:
a stage portion having a stage surface configured to permit the sample to be contacted; an image-pickup element arranged at an opposite side of the stage surface to receive an image of the object, and configured to convert an image of the object into an electrical signal: an optical system, having the optical axis extending in a straight line between the stage portion and the image-pickup element, configured to guide the optical image of the sample to the image-pickup element; an optical lens barrel portion, the image-pickup element and the optical system being arranged in the optical lens barrel portion; and a stage moving mechanism configured to support the stage portion on the optical lens barrel portion and move the stage within a plane perpendicular to the optical axis of the optical system.
- 7. A microscope according to claim 6, wherein the optical system includes a zoom lens unit, and the microscope further comprises a base portion, a plurality of support members supporting the stage portion on the base portion, a lens frame supporting the zoom lens unit on the support members, and a lens frame moving mechanism configured to move the lens frame along the optical axis.
- 8. A microscope according to claim 6, which further comprises a hollow rotating cylinder portion rotatably attached to the base portion and the stage portion, and wherein the optical system is received in the rotating cylinder portion, and the lens frame moving mechanism is actuated to move the lens frame along the optical axis as the rotating cylinder portion is rotated.
- 9. A microscope according to claim 6, wherein the optical system includes a lens for adjusting the focus of the optical system, and which further comprises a fine-movement mechanism configured to finely move the focus adjusting lens in the direction of the optical axis, thereby focusing the optical system on the sample.
- 10. A microscope according to claim 6, which further comprises a light source unit having one light source configured to emit illumination light rays for illuminating the sample and a mechanism configured to alternatively locate the light source in any of first, second, and third irradiative positions for transmissive illumination, incident illumination, and oblique illumination, thereby selecting one of the transmissive illumination, incident illumination, and oblique illumination.
- 11. A microscope according to claim 6, wherein the stage moving mechanism includes a stage support base supporting the stage portion for movement and a regulating mechanism for regulating the movement of the stage portion on the stage support base within a plane substantially perpendicular to the optical axis.
Priority Claims (1)
Number |
Date |
Country |
Kind |
2001-223480 |
Jul 2001 |
JP |
|
CROSS-REFERENCE TO RELATED APPLICATIONS
[0001] The present application is a Divisional of U.S. application Ser. No. 10/201,067 filed Jul. 22, 2002 which is based upon and claims the benefit of priority from the prior Japanese Patent Application No. 2001-223480, filed Jul. 24, 2001, the entire contents of which are incorporated herein by reference.
Divisions (1)
|
Number |
Date |
Country |
Parent |
10201067 |
Jul 2002 |
US |
Child |
10741725 |
Dec 2003 |
US |