This application claims the benefit of the filing date of provisional application Serial No. 60/201,203, filed May 2, 2000.
Number | Name | Date | Kind |
---|---|---|---|
5032805 | Elmer et al. | Jul 1991 | A |
5079557 | Hopwood et al. | Jan 1992 | A |
5212463 | Babbitt et al. | May 1993 | A |
5218358 | Harrington et al. | Jun 1993 | A |
5307033 | Koscica et al. | Apr 1994 | A |
5312790 | Sengupta et al. | May 1994 | A |
5427988 | Sengupta et al. | Jun 1995 | A |
5451567 | Das | Sep 1995 | A |
5472935 | Yandrofski et al. | Dec 1995 | A |
5479139 | Koscica et al. | Dec 1995 | A |
5486491 | Sengupta et al. | Jan 1996 | A |
5557286 | Varadan et al. | Sep 1996 | A |
5561407 | Koscica et al. | Oct 1996 | A |
5589845 | Yandrofski et al. | Dec 1996 | A |
5604375 | Findikoglu et al. | Feb 1997 | A |
5617103 | Koscica et al. | Apr 1997 | A |
5635433 | Sengupta | Jun 1997 | A |
5635434 | Sengupta | Jun 1997 | A |
5679624 | Das | Oct 1997 | A |
5693429 | Sengupta et al. | Dec 1997 | A |
5766697 | Sengupta et al. | Jun 1998 | A |
5830591 | Sengupta et al. | Nov 1998 | A |
5846893 | Sengupta et al. | Dec 1998 | A |
5917455 | Huynh et al. | Jun 1999 | A |
5940030 | Hampel et al. | Aug 1999 | A |
5965494 | Terashima et al. | Oct 1999 | A |
6078827 | Jackson | Jun 2000 | A |
6329959 | Varadan et al. | Dec 2001 | B1 |
Number | Date | Country |
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WO 0024079 | Apr 2000 | WO |
Entry |
---|
U.S. patent application Ser. No. 09/594,837, Chiu, filed Jun. 15, 2000. |
U.S. patent application Ser. No. 09/768,690, Sengupta et al., filed Jan. 24, 2001. |
A. Burgel et al, “Optical Second-Harmonic Generation at Interfaces of Ferroelectric Nanoregions in SrSiO/Sub 3/;Ca sic. SrTiO/Sub 3/:Ca,” Physical Review B (Condensed Matter), vol. 53, Mar. 1, 1996, Abstract only. |
K. Murakami et al, “Effects of Adding Various Metal Oxides on Low-Temperature Sintered Pb(Zr, Ti)O3 Ceramics,” Japan Journal of Applied Physics, vol. 35, Part 1, No. 9B, Sep. 1996, pp. 5188-5191. |
F. De Flaviis et al, “Planar Microwave Integrated Phase-Shifter Design with High Purity Ferroelectric Material,” IEEE, Theory and Techniques, vol. 45, No. 6, Jun. 1997, pp. 963-969. |
Number | Date | Country | |
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60/201203 | May 2000 | US |