This application is a National Stage of International patent application PCT/EP2009/060856, filed on Aug. 24, 2009, which claims priority to foreign French patent application No. FR 0805154, filed on Sep. 19, 2008, the disclosures of which are incorporated by reference in their entirety.
The invention relates to microwave tubes with linear electron beam and notably to a device for extracting positive ions produced in the tube.
Linear-beam microwave tubes such as traveling-wave tubes (acronym TWT) or klystrons essentially comprise an electron gun having a cathode providing a cylindrical beam of electrons in an evacuated cylindrical envelope of a microwave structure of the tube. A collector, at one end of the microwave structure, gathers the electrons of the beam output by the cylindrical envelope.
The electrons output by the cathode are focused in the form of a linear beam in the evacuated cylindrical envelope by means of a magnetic field. This magnetic field may be created either by permanent magnets, or by windings around the evacuated cylindrical envelope.
The microwave structure is the element of the tube where an interaction takes place between the electron beam and an electromagnetic wave which may be, either applied to a radiofrequency input (RF) of the tube in the case of amplifier tubes, or created in the tube in the case of tubes operating as microwave oscillators. More precisely the beam of electrons yields part of its kinetic energy to the electromagnetic wave in the microwave structure.
The microwave structure comprises resonant cavities and drift tubes in the case of a klystron and of a helix or coupled cavities in the case of a TWT.
The vacuum inside an electron tube is never perfect and gas molecules present in the evacuated envelope of the tube pass into the beam and lose electrons (phenomenon of ionization) under the impact of the electrons of the beam which are very energetic (typically several Kev). Positive ions are thus formed in the beam. The positive charges being attracted by the negative charges of the beam, the positive ions remain locked in the beam in a position of radial equilibrium.
The TWT of
The microwave structure 10 comprises, in a known manner, permanent magnets separated by magnetic spacers (not represented in the figure) so as to provide a confinement field for focusing the beam 16 on the axis ZZ′ of the evacuated envelope. An RF input ensures an RF connection of the helix of the TWT with for example an external RF source.
As has been described above, the gas molecules passing into the electron beam that are struck by electrons of said beam produce positive ions 20 which move slowly, for example, from the cathode (not represented in
The axial force acting on these positive ions 20 is very weak and they may remain in the beam 16 for a very long time before their slow drift velocity removes them, either toward the cathode, or toward the collector of the tube. Consequently, a large quantity of ions may accumulate inside the beam 16 and generate a significant positive space charge that may compromise good focusing of the beam. This concentration of positive ions in the beam results in a periodic focusing instability, called ion relaxation. This is a nuisance phenomenon which disturbs the RF telecommunication signal, for example in the case of an amplifier of TWT type, and which one seeks to eliminate.
The positive ions produced by the impacting of the electrons of the beam with the gas molecules in the evacuated envelope, in addition to the ion relaxation phenomenon, present another drawback. Indeed, when these ions arrive, after their long journey in the beam, level with the cathode of the tube, the negative potential of the cathode attracts them, producing impacts on the cathode and a deterioration of its emissive surface by a phenomenon of ion erosion or “sputtering”.
To eliminate the impact of the positive ions on the cathode of the tube, state-of-the-art electron tubes are equipped with a device designated by the term “ion barrier”. The ion barrier is an electrode placed after the cathode and carried to a positive potential so as to repel or reflect the positive ions originating from the beam. The drawback of the ion barrier is that it aggravates the ion relaxation described above, disturbing yet more strongly the RF signal in the tube. Indeed the positive ions can no longer be removed via the cathode and spend more time in the electron beam.
In order to alleviate the drawbacks of the microwave electron tubes of the state of the art, the invention proposes an electron tube comprising:
the electron tube comprises, between the cathode and the microwave structure, a device for extracting positive ions comprising at least one electrode e2 carried to a negative potential with respect to the reference potential so as to extract positive ions from the evacuated envelope, these positive ions being produced by the impacting of the electrons of the electron beam with molecules of residual gas in the evacuated envelope.
Advantageously, the device for extracting positive ions comprises another electrode e1 forming with the electrode e2 a pair of electrodes e1, e2, the electrodes of the pair facing one another on either side of the electron beam, the other electrode e1 of the pair being carried to the reference potential, the electrode e2 being carried to the negative potential (Vp) with respect to the reference potential so as to create between the two electrodes an ion-extracting electric field.
In one embodiment, the electrodes facing one another comprise plane surfaces parallel to a plane passing through the axis ZZ′ creating a passage for the electron beam.
In another embodiment, each electrode e1, e2, of the pair has a cylindrical half-plate shape, the two electrodes being symmetric on either side of the axis ZZ′.
In another embodiment, the plane surfaces parallel to the plane passing through the axis ZZ′ are separated by a distance De on either side of this axis ZZ′ so as to allow the electron beam of the tube to pass through.
In another embodiment, the electron tube comprises other devices for extracting positive ions along the electron beam in the evacuated envelope.
In another embodiment, the reference potential is the earth potential of the tube.
In another embodiment, the negative potential of the other electrode e2 is typically 100 volts below the electrical earth of the tube.
A main objective of the invention is to make microwave tubes eliminating the ion relaxation phenomenon by removing positive ions from the tube.
Another objective is to protect the cathode of the tube against impacts by the positive ions.
Another objective of the invention is to shift the impacts by the ions extracted from the tube onto a predetermined surface chosen by the tube designer.
The invention will be better understood via the description of a microwave tube according to the invention via indexed figures in which:
The microwave tube of
An electron gun 34 comprising a cathode 36 at a high-voltage potential HT that is negative with respect to an earth E of the tube (reference potential) provides a cylindrical beam of high-velocity electrons 38 along the axis ZZ′ at one of the ends of the evacuated cylindrical envelope.
The tube comprises a collector 40 for gathering the electrons output by the microwave structure 30, at the other end of the evacuated cylindrical envelope.
The evacuated cylindrical envelope 32 comprises a helix 42 along the axis ZZ′, acting as waveguide. In the exemplary embodiment of
The microwave structure 30 of the TWT comprises, around the axis ZZ′, coils 60 providing a magnetic confinement field for focusing the electron beam 38 along the axis ZZ′.
The device for extracting positive ions from the microwave tube of
Each electrode of the pair Pe is in one and the same radial plane Pr perpendicular to the axis ZZ′ of the tube.
The device for extracting positive ions comprises a first electrode el linked to the earth E of the tube and according to a main characteristic of the invention, a second electrode e2 linked to a potential Vp which is negative with respect to the earth of the tube. This negative potential Vp is also designated by ion purge potential.
The ion purge potential Vp applied to the second electrode e2 is typically 100 volts below the electrical earth E of the tube, but this voltage Vp may be of significantly different value as a function of the chosen spacing between the electrodes of the device for extracting positive ions.
The positive ions In arriving in proximity to the pair Pe of electrodes e1, e2 are extracted from the beam 38 laterally. The ions In in the electron beam 38 take a radial velocity which extracts them from the beam toward the second electrode e2, also designated by ion purge electrode, and moves them away from the axis ZZ′.
The ions In, in this configuration according to the invention, are projected onto a tube surface chosen by the tube designer thus avoiding their projection onto the cathode 36 and consequently eliminating the erosion of the cathode (sputtering).
The axial view of
Each electrode e1, e2 of the pair Pe has a cylindrical half-plate shape, the two electrodes e1, e2 being symmetric on either side of the axis ZZ′ of the evacuated envelope, each comprising a rectilinear edge b1, b2 in the form of a plane surface. The plane surfaces of the rectilinear edges of the cylindrical half-plates are parallel and separated by a distance De on either side of this axis ZZ′ so as to allow the electron beam of the tube to pass through.
The electrode e1 is linked to the earth of the tube and the electrode e2 (or ion extractor) is linked to a source Ep providing the negative potential Vp with respect to this earth E.
The positive ions in the beam of electrons passing between the two half-plates e1, e2 are attracted by the negative potential Vp when they arrive in proximity to the electrode e2 (or to the ion extractor). The negative ions extracted from the electron beam 38 pass through the half-plate e2 and are conducted by the electrical connection 62 linking the half-plate e2 to the source Ep of negative potential Vp toward an ion projection surface determined by the tube designer (surface not represented in
As represented in
The positive ions are projected onto the projection surface chosen by the designer and on which the sputtering does not endanger the operation of the tube.
The electrostatic field produced by the electrodes e1, e2 is too weak to significantly influence the trajectories of the electrons of the electron beam of the tube, only the trajectories of the positive ions are deviated.
The device for extracting positive ions according to the invention removes the positive ions from the beam thus appreciably reducing the problem of ion relaxation and makes it possible to choose the ion impact surface thereby avoiding erosion of the sensitive surfaces of the tube, and notably that of the cathode, endangering the operation of the tube.
In other embodiments of the electron tube according to the invention, the evacuated envelope can comprise several ion purges, either several pairs of electrodes for extracting positive ions along the trajectory of the electron beam, or along the axis ZZ′, so as to more effectively eliminate the influence of the positive ions in the microwave tube.
The exemplary TWT described is not limiting and the invention can be applied to other types of electron tubes, shapes of evacuated envelopes and electron beams. For example in certain electron tubes the electron beam may be of rectangular cross section.
The invention applies to electron tubes comprising either a hot cathode or a cold cathode.
The axis ZZ′ is, in other electron tubes, the output axis for the electrons that can propagate thereafter in other directions in microwave structures of various shapes according to the applications.
Number | Date | Country | Kind |
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08 05154 | Sep 2008 | FR | national |
Filing Document | Filing Date | Country | Kind | 371c Date |
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PCT/EP2009/060856 | 8/24/2009 | WO | 00 | 6/13/2011 |
Publishing Document | Publishing Date | Country | Kind |
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WO2010/031655 | 3/25/2010 | WO | A |
Number | Name | Date | Kind |
---|---|---|---|
2963605 | Jepsen et al. | Dec 1960 | A |
4489254 | Koinuma et al. | Dec 1984 | A |
6310438 | Tsuida et al. | Oct 2001 | B1 |
7071624 | Tsuchida | Jul 2006 | B2 |
Number | Date | Country | |
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20110266951 A1 | Nov 2011 | US |