The subject disclosure pertains to the field of switching devices and relays and more particularly to miniature switching devices fabricated from a number of laminated layers.
Electromechanical and solid state switches and relays have long been known in the art. More recently, the art has focused on micro electromechanical systems (MEMS) technology.
The following is a summary description of illustrative embodiments of the invention. It is provided as a preface to assist those skilled in the art to more rapidly assimilate the detailed design discussion which ensues and is not intended in any way to limit the scope of the claims which are appended hereto in order to particularly point out the invention.
According to an illustrative embodiment, a switching device structure is provided comprising a top magnet, a bottom magnet, and a movable member disposed between the top and bottom magnets. An electromagnet is positioned on the movable member.
In one embodiment, the electromagnet comprises a plurality of laminated layers, the layers including a layer bearing an iron core and a number of armature layers which establish electrical conductor windings around the iron core. The movable member further carries an electrical contact at one end positioned to close an electrical connection with a second electrical contact upon actuation of the electromagnet.
In one illustrative embodiment, the switching device structure further includes a first laminated layer located between the electromagnet and the top magnet comprising one or more posts of material suitable to channel magnetic forces from the top magnet toward the electromagnet, as well as a second laminated layer located between the electromagnet and the bottom magnet, the second laminated layer also comprising one or more posts of material suitable to channel magnetic forces from the bottom magnet toward the electromagnet.
A TEMS switching device structure 11 according to an illustrative embodiment is shown schematically in
The device structure 11 of the illustrative embodiment shown in
The top layer of the base subassembly 15 carries respective electrically conductive flapper landing pads 33, 35. Above the base subassembly 15 is a first “ring frame” layer 37, which, in an illustrative embodiment, is a polyglass spacer with a rectangular cutout exposing each of the eight (8) switches R1, R2, R3, R4, R5, R6, R7, R8.
Above the first ring frame layer 37 is an armature subassembly 40, which may, for example, in an illustrative embodiment, comprise eleven (11) layers laminated together, as discussed in more detail below. The layers of the armature subassembly 40 are processed to form electromagnets, e.g. 41, 43 having iron cores with inner and outer conductive windings. The electromagnets 41, 43 are disposed on the respective flappers 45, 47, which carry respective electrical contacts 25, 27. A second ring frame spacer 51 is added on top of the armature subassembly 40.
An iron post layer 53 is applied on top of the second ring frame spacer 51. The post layer 53 comprises, for example, sixteen (16) iron epoxy-filled cylinders forming iron posts 55, which channel the magnetic force of a rectangular top magnet 57 to the respective armature flappers 45, 47 and front and rear end 29,31. The top magnet 57 may be mounted within a top magnet frame 59 (
The top and bottom magnets 13, 57, may be, for example, Neodymium magnets formed of Neodymium alloy Nd2Fe14 B, which is nickel plated for corrosion protection. NdFeB is a “hard” magnetic material, i.e., a permanent magnet. In one embodiment, the top magnet may be 375×420×90 mils, and the bottom magnet may be 255×415×110 mils.
In illustrative operation of the device 11, a positive pulse to the armature 41 pulls the armature flapper 45, down, creating an electrical connection or signal path between flapper contact 25 and the landing pad or contact 33. The contacts 25 and 33 are thereafter maintained in a “closed” state by the bottom magnet 13. Thereafter, a negative pulse to the armature 41 repels the flapper 45 away from the bottom magnet 13 and attracts it to the top magnet 57, which holds the flapper 45 in the open position after the negative pulse has passed. In one embodiment, the driver pulse may be, for example, 3 amps at 5 milliseconds.
Layer 3-4 of
To further construct the armature, the armature layer 2-3 is laminated to layer 3 of
The next two layers, 1-2 and 5-6, of the armature subassembly 40 are illustrated in
At this point in fabrication of the illustrative armature subassembly 40, the armature electromagnet assemblies are pre-routed, outlining individual electromagnets e.g. M1, M2, M3, M4, as shown in
The final two layers 1, 6 of the armature subassembly 40 are shown in
After the lamination of the last two layers 2, 6, the electrical contacts, e.g. 25, 27 (
In one illustrative embodiment, the base subassembly 15 comprises a stack of layers 101, 102, 103, 104, 105, 106, and 107, laminated together, as shown schematically in
An illustrative top layer 101 of the base subassembly 15 of an individual 2×4 switch matrix as shown in
Along the top and bottom edges of the layer 101 are arranged conductor paths or “vias” through the layer for supplying drive pulses to the armature coils, e.g. 41, 43 formed above the layer 101. For example, “up” conductor U1 supplies input current to the coil of a first armature coil, while “down” conductor D1 conducts drive current out of the first armature coil. Similarly, U3, D3; U5, D5; U7, D7; U8, D2; U4, D4; U6, D6; and U8, D8 supply respective “up” and “down” currents to each of the respective seven other armature coils.
Top base subassembly layer 101 may be formed in one embodiment of an insulator such as polyamide glass with, for example, copper, tin or other suitable electrical conductor materials. Polyamide glass substrates plated with plated copper layers may be patterned with photo resist and etched to created the desired contact and/or conductor patterns of the base subassembly layers. The other layers of the device 11 may be similarly fabricated.
The remainder of the base subassembly 15 is concerned with routing signals from the tip and ring pads, e.g. T1i, T1o, R1i, R1o, through the device to the exterior contacts 17 of the bottom base subassembly layer 107 and routing drive current to and from the armature supply conduits, U1, D1; U2, D2; U3, D3, etc.
The pad assignments for the embodiment shown in
It will be appreciated from the pin assignments that all of the “down” armature coil supply conduits D1, D2, D3, D4, D5, D6, D7, D8 are connected in common. In this connection, the layer 102 includes a metallization border 141 forming a common ground plane for the armatures. Layer 103 (
Additionally, it will be seen from the pad assignments in the Table above that there is one pair of tip and ring conductor outputs for relays R1 and R2, one pair for R3 and R4, one pair for R5 and R6, and one pair for R7 and R8. There are also two pairs of tip and ring inputs (C0 Ring—in, C0 Tip—in, C1 Tip—in, C1 Ring—in). Thus, in the illustrative embodiment, only two of the relays of the 2×4 matrix (one odd, one even) may be closed at the same time. The metallization pattern of layer 103 reflects this tip and ring interconnection scheme. In particular, the central metallization 143 comprises two rows 145, 147 wherein the top row 145 provides tip and ring interconnections for the row “1” tip and ring inputs and the bottom row 147 provides the tip and ring interconnections for the row “2” tip and ring inputs, thus illustrating how the tips and rings are connected in common. The manner of interconnection is such that connecting opposite row 1 and row 2 switches, e.g. R1 and R2 in
The iron post layer 106 of the base subassembly is further illustrated in
The upper and lower ring frames 37, 51 are further illustrated in
The upper iron post layer 53 is illustrated further detail in
Those skilled in the art will appreciate that various adaptations and modifications of the just described preferred embodiment can be configured without departing from the scope and spirit of the invention. Therefore, it is to be understood that, within the scope of the appended claims, the invention may be practiced other than as specifically described herein.
This application claims the benefit of and priority to U.S. Provisional Application Ser. No. 61/233,073, filed Aug. 11, 2009, entitled, “Miniature Magnetic Switch Structures,” the contents of which is incorporated by reference herein in its entirety.
Number | Name | Date | Kind |
---|---|---|---|
5329520 | Richardson | Jul 1994 | A |
5475353 | Roshen et al. | Dec 1995 | A |
5479608 | Richardson | Dec 1995 | A |
5552756 | Ushiro | Sep 1996 | A |
5629918 | Ho et al. | May 1997 | A |
5787085 | Fox | Jul 1998 | A |
5790519 | Hanson et al. | Aug 1998 | A |
5872496 | Asada et al. | Feb 1999 | A |
5982746 | Hanson et al. | Nov 1999 | A |
6016092 | Qiu et al. | Jan 2000 | A |
6069540 | Berenz et al. | May 2000 | A |
6084281 | Fullin et al. | Jul 2000 | A |
6094116 | Tai et al. | Jul 2000 | A |
6169469 | Misumi et al. | Jan 2001 | B1 |
6310426 | Birchak et al. | Oct 2001 | B1 |
6310526 | Yip et al. | Oct 2001 | B1 |
6335992 | Bala et al. | Jan 2002 | B1 |
6388359 | Duelli et al. | May 2002 | B1 |
6469602 | Ruan et al. | Oct 2002 | B2 |
6469603 | Ruan et al. | Oct 2002 | B1 |
6472074 | Sugimoto | Oct 2002 | B2 |
6496612 | Ruan et al. | Dec 2002 | B1 |
6535663 | Chertkow | Mar 2003 | B1 |
6542379 | Lauffer et al. | Apr 2003 | B1 |
6633212 | Ruan et al. | Oct 2003 | B1 |
6639493 | Shen et al. | Oct 2003 | B2 |
6653929 | Hu et al. | Nov 2003 | B1 |
6710694 | Matsuta et al. | Mar 2004 | B2 |
6785038 | Hichwa et al. | Aug 2004 | B2 |
6794965 | Shen et al. | Sep 2004 | B2 |
6812814 | Ma et al. | Nov 2004 | B2 |
6904191 | Kubby | Jun 2005 | B2 |
6947624 | Kubby et al. | Sep 2005 | B2 |
7023304 | Shen et al. | Apr 2006 | B2 |
7027682 | Ruan et al. | Apr 2006 | B2 |
7071431 | Ruan et al. | Jul 2006 | B2 |
7142743 | Bernstein | Nov 2006 | B2 |
7193831 | Anthony | Mar 2007 | B2 |
7215229 | Shen et al. | May 2007 | B2 |
7266867 | Shen et al. | Sep 2007 | B2 |
7327211 | Ruan et al. | Feb 2008 | B2 |
7342473 | Joung et al. | Mar 2008 | B2 |
8143978 | Shen | Mar 2012 | B2 |
20020140533 | Miyazaki et al. | Oct 2002 | A1 |
20030011450 | Shen et al. | Jan 2003 | A1 |
20030043003 | Vollmers et al. | Mar 2003 | A1 |
20030151480 | Orr | Aug 2003 | A1 |
20050047010 | Ishiwata et al. | Mar 2005 | A1 |
20050057329 | Shen et al. | Mar 2005 | A1 |
20050270127 | Six | Dec 2005 | A1 |
20100182111 | Hagihara et al. | Jul 2010 | A1 |
20100214044 | Shen | Aug 2010 | A1 |
20110037542 | Page et al. | Feb 2011 | A1 |
20120200377 | Lee et al. | Aug 2012 | A1 |
Number | Date | Country |
---|---|---|
10-0474536 | Mar 2005 | KR |
10-2006-0078097 | Jul 2006 | KR |
10-2009-0053103 | May 2009 | KR |
WO 0157899 | Aug 2001 | WO |
Entry |
---|
Form PCT/ISA/210 in connection with PCT/US2010/042789 dated Feb. 25, 2011. |
Form PCT/ISA/237 in connection with PCT/US2010/042789 dated Feb. 25, 2011. |
Telepath Networks, Inc. et al., Form PCT/ISA/210 in connection with PCT/US2011/057907. |
Telepath Networks, Inc. et al., Form PCT/ISA/237 in connection with PCT/US2011/057907. |
Number | Date | Country | |
---|---|---|---|
20110037542 A1 | Feb 2011 | US |
Number | Date | Country | |
---|---|---|---|
61233073 | Aug 2009 | US |