Claims
- 1. An optical radiation monitor, comprising:
an input port which receives the optical radiation; a waveguide, coupled to the input port so as to receive the optical radiation therefrom and adapted to leak a predetermined fraction of the optical radiation; and a photodetector which receives at least some of the leaked optical radiation and which generates a monitoring signal responsive thereto.
- 2. A monitor according to claim 1, wherein the waveguide and photodetector are integrally formed on a single, common substrate of semiconductor material.
- 3. A monitor according to claim 2, wherein the waveguide comprises a curved waveguide having a predetermined radius of curvature and a refractive index different from a refractive index of the substrate.
- 4. A monitor according to claim 2, wherein the input port is coupled to an input waveguide and wherein the waveguide is coupled to an output waveguide, wherein the input and output waveguides are integrally formed on the single, common substrate.
- 5. An optical amplifier, comprising:
an optical gain region which is adapted to output amplified optical radiation responsive to a current injected into the section; a waveguide, coupled to receive the amplified optical radiation, and adapted to leak a predetermined fraction of the amplified optical radiation; and a photodetector which receives at least some of the leaked optical radiation and which generates a monitoring signal responsive thereto, indicative of a performance characteristic of the optical gain region.
- 6. An amplifier according to claim 5, wherein the gain region, the waveguide and photodetector are integrally formed on a single, common substrate of semiconductor material.
- 7. An amplifier according to claim 5, and comprising a feedback control, which is coupled to receive the monitoring signal and to alter the injected current responsive to the monitoring signal.
- 8. An amplifier according to claim 5, wherein the waveguide comprises a curved waveguide having a predetermined radius of curvature and a refractive index different from a refractive index of the substrate.
- 9. An amplifier according to claim 5, wherein the performance characteristic comprises at least one of a group of parameters comprising an output power level of the optical gain region, and a pulse length, an extinction ratio, and a spontaneous emission level of optical radiation therein.
- 10. A method for monitoring optical radiation, comprising:
inputting the optical radiation into a waveguide; arranging the waveguide so that a predetermined fraction of the optical radiation leaks from the waveguide; and measuring the leaked optical radiation so as to monitor a characteristic of the radiation in the waveguide.
- 11. A method according to claim 10, wherein measuring the leaked optical radiation comprises providing a photodetector to perform the measurement, and wherein arranging the waveguide comprises integrally forming the waveguide and photodetector on a single, common substrate of semiconductor material.
- 12. A method according to claim 10, wherein arranging the waveguide comprises forming a curved waveguide in a substrate, the curved waveguide having a predetermined radius of curvature and a refractive index different from a refractive index of the substrate.
- 13. A method for amplifying optical radiation, comprising:
injecting current into an optical gain region so as to engender amplification of the optical radiation in the region; coupling the amplified optical radiation into a waveguide; arranging the waveguide so that a predetermined fraction of the amplified optical radiation leaks from the waveguide; and generating a monitoring signal, indicative of a performance characteristic of the optical gain region, responsive to the leaked optical radiation.
- 14. A method according to claim 13 and comprising varying the injected current responsive to the monitoring signal.
- 15. A method according to claim 13, and comprising providing a photodetector to measure the monitoring signal, and integrally forming the optical gain region, the waveguide, and the photodetector on a single, common substrate of semiconductor material.
CROSS-REFERENCE TO RELATED APPLICATIONS
[0001] This application claims the benefit of U.S. Provisional Application 60/177,405, filed Jan. 20, 2000, which is assigned to the assignee of the present patent application and is incorporated herein by reference.
Provisional Applications (1)
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Number |
Date |
Country |
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60177405 |
Jan 2000 |
US |