Multi-process system with pivoting process chamber

Information

  • Patent Grant
  • 6691720
  • Patent Number
    6,691,720
  • Date Filed
    Monday, July 16, 2001
    23 years ago
  • Date Issued
    Tuesday, February 17, 2004
    21 years ago
Abstract
A system for processing a workpiece includes an inner chamber pivotably supported within an outer chamber. The inner chamber has an opening to allow liquid to drain out. A motor pivots the inner chamber to bring the opening at or below the level of liquid in the inner chamber. As the inner chamber turns, liquid drains out. Workpieces within the inner chamber are supported on a holder or a rotor, which may be fixed or rotating. Multi processes may be performed within the inner chamber, reducing the need to move the workpieces between various apparatus and reducing risk of contamination.
Description




FIELD OF INVENTION




The invention relates to surface preparation of a workpiece, such as silicon or gallium arsenide wafers, flat panel displays, mask reticles, rigid disk media, thin film heads, or other substrates on which electronic, optical, or micro-mechanical components have or can be formed, collectively referred to here singly as a “workpiece”.




BACKGROUND OF THE INVENTION




Surface preparation, such as cleaning, etching, and stripping, is an essential and important element of the manufacturing process for semiconductor wafers and similar workpieces. Surface preparation steps are commonly performed, using liquid corrosive, caustic, or solvent chemicals, or using vapor phase chemicals. Surface preparation of workpieces is performed to prepare or condition the surface for a subsequent process step.




Cleaning is a critical step in manufacturing semiconductors and similar products. Cleaning involves the use of chemical formulations to remove contaminants, such as oxides, particles, metals, or organic material, while maintaining the cleanliness and integrity of the surface of the workpiece. Some liquid, gas or vapor phase chemicals when applied to a workpiece, result in surface characteristics that are more susceptible to contamination than others. For example, application of hydrofluoric acid (HF) to the surface of a workpiece will remove oxide from the silicon surface, resulting in a surface that is active. Workpieces in general, and especially workpieces having an active surface, are constantly susceptible to contamination by airborne microscopic particles. Contamination can also occur in the cleaning process, when the liquid process media is removed from the surface of the workpiece.




Thus, to minimize contamination of the workpiece, it is advantageous to perform a sequence of surface preparation steps within a controlled environment, that preferably occupies a relatively small amount of fabrication facility space, and in which exposure to contamination sources is minimized. Accordingly, it is an object of the invention to provide improved surface processing methods and apparatus.




Cleaning workpieces while avoiding or minimizing contamination has long been an engineering challenge. Workpieces are often cleaned with a spray or bath of de-ionized water. The water is then removed, often in the presence of an organic solvent vapor, such as isopropyl alcohol, which lowers the surface tension of the water. This helps to prevent droplets of water from remaining on and contaminating the workpiece.




Various cleaning methods and systems and various rinsing and drying methods and apparatus have been proposed and used. In a typical system, wafers are immersed in a vessel. A mechanism is provided to hold the wafers. Another mechanism is provided to lift the wafers out of the liquid, by pushing them up from below. While this technique has been used, it can result in trapping of liquid in or around the spaces where the wafers contact the holding mechanism, resulting in increased contamination. It is also complicated by the need for the lifting mechanism. In an alternative system, the wafers are held in a fixed position while the liquid is drained away from below. This technique has less tendency for trapping liquid. However, as the liquid level drops, the solvent vapor above the liquid is absorbed by the liquid. Consequently, the top sections of the wafer are exposed to liquid which is different from the liquid at the bottom sections of the wafers. This potentially results in non-uniform processing. Accordingly, while these and other techniques have been used with varying degrees of success, there is still a great need for improved systems and methods for cleaning workpieces.




It is therefore also an object of the invention to provide an improved system and method for cleaning workpieces.




SUMMARY OF THE INVENTION




To this end, in a first aspect, surface preparation processes on a workpiece or workpieces are performed within a single apparatus. This minimizes exposure of the workpiece to contaminants and provides an improved application of process fluids or media to the workpiece.




In a second aspect, an apparatus has a rotor rotatably supported within a process chamber. The process chamber can pivot to move a drain outlet in the process chamber down to the level of the liquid contained in the chamber. The liquid then drains out of the chamber through the outlet. The process chamber provides for containment of process fluid. An optional second or outer containment chamber provides for containment and disposal of process fluid, and for isolating the process environment from the ambient environment, human operators, and adjacent parts and equipment. This minimizes exposure of the workpiece to contaminants and provides an improved application of process fluids or media to the workpiece.




In a third aspect, an inner chamber has a drain opening to allow process fluid to be removed from the inner process chamber. A drive motor pivots the inner process chamber at a controlled rate to bring and then maintain the opening at or below the level of the fluid in the inner chamber. The fluid then drains out from the drain opening. The drive motor may move the inner process chamber by magnetic forces, without an actual physical penetration of or connection into the process environment by a drive shaft. Optionally, the inner process chamber may be connected to the drive motor with a drive shaft, with a shaft seal sealing the shaft opening into the inner process chamber.




In a fourth aspect, the inner process chamber forms a closed chamber, without any drain opening. The workpieces remain stationary, during at least one process step, and a drive motor spins the inner process chamber around the stationary workpieces. Openings or spray nozzles on or in the inner process chamber supply a fluid onto the workpieces. To remove liquid from the chamber, the chamber is turned to or braked to a stop at a position where one or more drain ports are at a bottom position. The drain ports are then opened and the liquid drains out through them via gravity. A gas may be provided into the inner process chamber during draining, to prevent creation of a vacuum slowing or stopping the out flow of liquid. Liquid may alternatively be removed by opening the drain ports and then positioning and maintaining the drain ports at or below the liquid surface by slowly pivoting the inner process chamber, as in the third aspect described above. This allows for controlled removal of liquid, resulting is less potential for contamination of the workpieces.




In a fifth aspect, the inner chamber is closed or sealed and remains stationary and the workpieces spin within the inner chamber. This minimizes exposure of the workpiece to contaminants and provides an improved application of process fluids to the workpiece.




In a sixth aspect, sonic energy, such as ultrasonic or megasonic energy, is applied to the workpiece, preferably through liquid in which the workpiece is immersed. This improves processing as the sonic energy contributes to the processing along with the chemical reactions of the process liquids.




In a seventh aspect, the outer containment chamber is purged with a gas and/or vapor to maintain a desired environment around the workpiece. The gas or vapor may be nitrogen, or argon, or hydrofluoric acid (HF).




In an eigth aspect, unique methods for cleaning a workpiece are provided. These methods solve the problems of the known methods now used in the semiconductor manufacturing industry. Workpieces are held in a rotor within a process chamber having a drain outlet or slot. The workpieces are immersed in liquid within the process chamber. Liquid is preferably continuously supplied into the chamber so that liquid is continuously overflowing and running out of the drain outlet. The process chamber is pivoted to move the drain outlet down in a controlled movement, to lower the level of liquid in the chamber. Liquid supply to the chamber and overflow at the liquid surface preferably continues as the chamber pivots and the liquid level drops. This process continues until the liquid level drops below the workpieces and the chamber is pivoted to drain virtually all liquid out of the chamber.




By maintaining the overflow at the liquid surface, and by maintaining a constant flow towards and out of the drain outlet, impurities at the liquid surface flow away from the workpieces, reducing potential for contamination. The liquid in the chamber remains uniform at all depths, as the surface of the liquid which the solvent vapor dissolves into, is constantly being replaced with fresh liquid. After the liquid is removed from the chamber, the workpieces are advantageously rotated. Liquid droplets remaining on the workpieces or adjacent components of the apparatus are centrifugally removed. Consequently, cleaning is provided with a uniform liquid bath and with reduced potential for trapped or residual liquid remaining on the workpieces. The disadvantages associated with the machines and methods currently in use, as described above, are overcome.




The aspects of the invention described above provide greatly improved processing and cleaning apparatus and methods. These aspects help to provide more reliable and efficient processing.




Further embodiments and modifications, variations and enhancements of the invention will become apparent. The invention resides as well in subcombinations of the features shown and described. Features shown in one embodiment may also be used in other embodiments as well.











BRIEF DESCRIPTION OF THE DRAWINGS




In the drawings, wherein the same reference number indicates the same element, throughout the several views:





FIG. 1

is a perspective view of a surface processing apparatus having an inner process chamber moved to a position to contain fluid for full or partial workpiece immersion processing. The fluid is omitted from this view to more clearly show the components of the apparatus.





FIG. 2

is a perspective cross-sectional view of the surface processing apparatus shown in FIG.


1


.





FIG. 3

is a perspective view of the apparatus of

FIG. 1

, with the inner chamber now moved to a position to drain out fluid.





FIG. 4

is a perspective view of the apparatus of

FIGS. 1-3

, with the inner process chamber door and the outer containment chamber door installed and closed.





FIG. 5

is a perspective view of a removable cover plate for use with the apparatus of FIGS.


1


-


3


.











DETAILED DESCRIPTION OF THE DRAWINGS




Turning now in detail to the drawings, as shown in

FIG. 1

, a surface processing system


11


is provided for processing flat workpieces, such as semiconductor wafers


15


. The apparatus or system


11


includes a process chamber


17


, optionally within an outer containment chamber


19


. The outer chamber


19


contains and disposes of process fluids, and isolates the process environment from the ambient environment, human operators, and adjacent parts and equipment. The process media or fluid may include cleaning liquid such as hydrofluoric acid (HF), a rinsing liquid such as water, a gas, as nitrogen or a mixture of a gas and an organic vapor, or any combination of them. Processing of the workpieces is performed in the process chamber


17


.




Referring now to

FIG. 2

, the chamber


17


has a shaft section


25


extending rearwardly through a back section


27


of the outer chamber


19


. The shaft section


25


is linked to an inner chamber drive motor or actuator


29


, either by a direct mechanical linkage, or via a magnetic linkage. The motor


29


can pivot the inner chamber


17


in a relatively slow continuous and controlled movement. The motor


29


can also spin the inner chamber


17


. The motor


29


can also pivot the inner chamber


17


to a desired angular orientation or position, and hold the chamber


17


in that position. The inner chamber


17


, as shown in

FIG. 3

, has a cylindrical sidewall having a drain opening, slot, or window


55


for removing liquid from the chamber. A drain edge


57


defines the lower end of the opening


55


. The drain edge


57


is preferably horizontal, and runs substantially over the entire length of the inner chamber


17


. A protrusion


59


may extend below the drain edge. Pivoting here means less than 360° movement. In contrast, rotating or spinning here means sustained 360° plus movement.




The inner chamber


17


preferably contains at least one outlet


31


such as a nozzle, for delivering process fluid


21


by spray or other technique to the workpieces


15


. The nozzle or outlet


31


may be above or below, or to one side of the workpieces


15


, so that the process fluid


21


can travel vertically up or down, or horizontally. At least one channel or pipeline


33


delivers process fluid


21


to the nozzle or outlet


31


. One or more manifolds


35


, each having an array of outlets or nozzles may be used. In an embodiment where the inner chamber


17


spins, the pipeline or base


33


is connected to a rotary fluid coupling


37


or similar device within or outside of the apparatus as shown in FIG.


2


.




Referring now to

FIGS. 1 and 2

, a rotor or workpiece support


39


for holding the workpieces


15


is positioned with the chamber


17


. Preferably, the rotor


39


has grooves, typically equally spaced apart, for holding the workpieces


15


. A rotor drive motor


41


is linked to a shaft section


43


of the rotor


39


extending through the shaft section


25


of the inner chamber


17


. Alternatively, the rotor


39


may be linked to the motor


41


with a magnetic coupling.




The rotor


39


may alternatively have features for holding workpieces


15


within a carrier or cassette. In either case, the rotor


39


has retainers for holding the workpieces in place, for example, as descried in U.S. patent application Ser. No. 09/735,154 incorporated herein by reference.




If used, the magnetic couplings connect the rotor


39


and rotor drive


41


, and the chamber actuator


29


and the chamber


17


, respectively, by magnetic force, without an actual physical connection or penetration of the chamber


17


by a drive shaft. Hence, the space within the chamber


40


may be better closed or sealed against contaminants.




Referring once again to

FIGS. 2 and 4

, the chamber


17


has a door


47


, for containment of the process liquid


50


within the chamber


17


. The outer chamber


19


similarly has an outer door


49


. With the door


49


closed, the outer chamber


19


isolates the workpieces


15


from contaminants in the environment outside of the outer chamber


19


. The outer chamber


19


has one or more outlets


51


for removing fluids.




In use, the rotor


39


may be extended out of the inner chamber


17


through the open doors, by hand or with a robot. Workpieces


15


may then be loaded into the rotor


39


. With the rotor loaded with one or more workpieces, the doors


47


and then


49


are closed, preferably, but not necessarily, providing fluid tight and/or gas tight seals. With the doors closed, the chamber


17


, within the preferably closed or sealed outer chamber


19


, provides an entirely closed off space or environment.




Various process steps may then be performed. For immersion processes, process fluid is pumped into the chamber


17


from one or more openings or nozzles


31


via the supply line(s)


33


. The inner chamber


17


can pivot about a longitudinal (front to back) axis, via the motor


29


. This allows the opening


55


to be moved from a position above the level of the liquid in the chamber


17


, to a lower position, where liquid can drain out through the opening


55


. In an embodiment where the chamber


17


pivots, but does not spin or rotate, the supply line(s)


33


can be provided with sufficient slack to allow it to follow the pivoting movement of the chamber


17


, and no rotary coupling


37


or other fluid delivery techniques are needed.




During an immersion process, fluid is provided into the chamber


17


until the workpieces are preferably completely immersed. The chamber


17


is positioned so that the opening


55


is near the top of the chamber as shown in

FIG. 1

, preventing liquid from draining out of the chamber


17


. The rotor drive motor


41


may then spin the rotor


39


and workpieces


15


within the process fluid. This technique provides mixing and fluid movement over the workpieces


15


, via relative movement between the fluid and the workpieces. The spin speed may be low, to avoid excessive splashing and turbulence. For some applications, both the rotor


39


and chamber


17


may remain still, with the workpieces immersed in the still process fluid contained in the chamber


17


, for a desired time interval.




At an appropriate time during processing, to remove liquid, the chamber


17


is pivoted by the chamber drive


29


, so that the opening


55


is at or below the level of the liquid


21


. This allows the fluid to overflow or drain out through the opening


55


in the cylindrical sidewall of the inner process chamber


17


, as shown in FIG.


3


. The opening


55


is gradually moved down, preferably in a controlled manner, by continuing to pivot the chamber


17


, to remove fluid a controlled rate. The liquid removed from the inner chamber flows into the outer chamber


19


, where it is temporarily held, or optionally purged through and out of the outer chamber


30


via the port(s)


51


.




With the liquid removed (or if no immersion steps are performed), the workpieces


15


are in the clean ambient gas or air environment within the chamber


17


. Further process steps may then be performed. For example, the workpieces


15


may be cleaned by spraying them with a cleaning liquid (e.g., water). A gas, which is optionally heated, may then be sprayed onto the workpieces via the nozzles


31


, with or without, rotating or pivoting the chamber


17


(and the nozzles


31


on the chamber


17


), and with or without spinning the rotor holding workpieces, or both. To provide centrifugal liquid removal, the rotor


31


may be rotated at higher speeds.




For sequential processing steps, different liquid, gas, or vapor (collectively referred to here as “fluids”) media may be applied to the workpieces from a fluid supply source


81


, by immersion within a liquid gas or vapor, spraying, or other application. Rinsing and/or cleaning may be performed in between processing steps. However, the workpieces can remain within the chamber


17


at all times, reducing the potential for contamination.




The removal of the process fluids


21


from the inner process chamber


17


may alternatively be accomplished by allowing the fluids


21


to escape through a switched drain


61


in the inner process chamber


17


, generally at a position opposite from the drain edge


57


. The drain


61


may be switched via external magnetic influence, or via a pneumatic or hydraulic or electrical control line on or in the chamber


17


, similar to the fluid line


33


.




For processing workpieces by immersion, a continuously refreshed bath of liquid may be provided in the inner process chamber


17


, while simultaneously and continuously draining out over the drain edge


57


in the sidewall, as the chamber


17


pivots counterclockwise in

FIGS. 1 and 3

. For some applications, the process liquid level in the chamber


17


may only cover a fraction of the workpieces. The workpieces can then be rotated in the rotor


39


, so that all surfaces of the workpieces are at least momentarily immersed.




In any of the above embodiments or methods, the workpieces can be rotated in the rotor, to provide uniform distribution of the process fluid.




In a process for removing liquid from workpieces, a surface tension gradient lowering process can be used. A rinsing fluid, such as de-ionized water is introduced into the inner process chamber


17


to remove any remaining process chemicals. A gas, such as nitrogen, and an organic vapor, such as isopropyl alcohol, is then introduced via the manifold


35


, or via a second similar manifold, to facilitate surface tension gradient removal of the rinsing fluid from the workpiece surfaces.




Referring back to

FIG. 1

, the rinsing liquid


21


is removed using the organic vapor which reduces surface tension at the liquid-gas interface


65


. Via surface tension effects, the rinsing liquid


21


can be made to move from the interface region


65


down to the bulk of the rinsing liquid


21


.




Therefore, through slow, controlled rotation of the inner process chamber


17


, the rinsing fluid level can be lowered, removing the rinsing fluid


21


and the contaminants that may reside on the surface of the rinsing fluid. This method removes liquid from the workpieces


15


by allowing the surface tension gradient induced by the organic vapor to be maintained at the surface of the workpieces


15


as the rinsing liquid recedes. A suction manifold


67


may be provided adjacent to the drain edge


57


, to draw off the surface of the liquid in the chamber


17


.




During the process of removing the rinsing fluid from the inner process chamber


17


, fresh rinsing fluid can be introduced into the inner process chamber


40


while the process chamber is pivoting to drain off fluid. The constant inflow of fresh liquid causes overflow, with the surface of the liquid flowing towards the drain slot. This allows for removal of particles and accumulated contaminants which may result from the cleaning and rinsing process, and which tend to be at the fluid surface.




The outer containment chamber


19


can be purged with a gas or vapor via a purge gas source


83


connected to a purge port


87


, to maintain a desired environment. Such a gas may be nitrogen, argon, or a vapor such as hydrofluoric acid (HF) or a combination thereof. Similarly, gas or vapor(s) can be introduced in the inner process chamber


17


to provide a controlled environment.




Sonic energy may be applied to the workpieces via a transducer


75


(such as a megasonic or ultrasonic transducer) in or on the inner chamber, as shown in FIG.


1


. The transducer


75


is positioned to transmit sonic energy through liquid in the inner chamber, to the workpieces immersed in the liquid. The sonic transducer may also be provided on the rotor, or in contact with the workpieces held by the rotor. Different types of opening, transducers may be used alone or in combination with each other. The sonic transducer


75


is powered via wires running on or through the inner chamber


17


, optionally to slip rings at the back end of the apparatus


11


, or via wires on the rotor


39


.




In another embodiment, the apparatus is the same as described above in connection with

FIGS. 1-3

, except that the chamber


17


has no opening


55


. Rather, the inner chamber has continuous cylindrical sidewalls, so that it can be closed off and sealed by the door


47


. In addition, the fluid supply line


33


connects to the outlets or nozzles in the inner chamber via the rotary fluid coupling


37


. The rotary fluid coupling allows the inner chamber to rotate (not just e.g., 100° for draining liquid, but 360° plus, continuously) while it is supplied with fluid. A similar rotary connection (preferably electrical or pneumatic) links the switched drain opening


61


in the inner chamber


17


, to a controller. With this design, the inner chamber


17


is closed off, (and preferably sealed off) from even the outer chamber


19


. Consequently, contamination is further avoided. The outer chamber


19


can then be omitted. The embodiment having the drain opening


55


may be converted to the closed embodiment by installing a sidewall panel


79


shown in

FIG. 5

over the opening


55


.




For certain process steps, the workpieces


15


in the holder or rotor


39


can remain stationary, while the chamber


17


spins around them. Alternatively, both the chamber


17


and workpieces


15


in the rotor


39


may rotate or spin. Still further, the rotor


39


may be configured as a holder simply attached to a fixed (non-rotating) rear structure, in a design where the workpieces


15


remain stationary at all times, and the chamber


17


rotates around them (e.g., while draining liquid or spraying or otherwise applying process media onto the workpieces). This closed chamber embodiment may also perform immersion processing. However, as there is no opening


55


, liquid removal occurs by opening the drain


61


, with the chamber positioned so that the drain


61


is at a low point.




Thus, while several embodiments have been shown and described, various changes and substitutions may of course be made, without departing from the spirit and scope of the invention. The invention, therefore, should not be limited, except by the following claims, and their equivalents.



Claims
  • 1. A system of processing a workpiece, comprising:a containment chamber; a process chamber within the containment chamber and having a drain opening; a process chamber driver linked to the process chamber, for pivoting the process chamber, to drain liquid out of the process chamber, at a controlled rate; and a workpiece holder within the process chamber.
  • 2. The system of claim 1 further including a sonic transducer in the process chamber.
  • 3. The system of claim 1 further including a removable door on the process chamber.
  • 4. The system of claim 1 where the process chamber driver is linked to the process chamber with a magnetic coupling.
  • 5. The system of claim 1 wherein the process chamber has a cylindrical side wall, and the drain opening is in the cylindrical sidewall.
  • 6. The system of claim 1 wherein the process chamber is pivotable from a first position, where the process chamber can hold liquid at a level at least partially immersing a workpiece held in the workpiece holder, to a second position where liquid within the process chamber is able to drain out, through the opening, to a level entirely below the workpiece.
  • 7. The system of claim 6 further comprising a fluid supply system including a fluid supply line extending into the process chamber.
  • 8. The system of claim 7 further comprising at least one spray nozzle joined to the fluid supply line.
  • 9. The system of claim 7 further comprising at least one of a process liquid source, a process gas source, and a process vapor source, connected into the fluid supply system.
  • 10. The system of claim 7 wherein the fluid supply line pivots with the process chamber.
  • 11. The system of claim 1 further comprising a workpiece holder extender, for moving the workpiece holder out of the process chamber, for loading and unloading workpieces, and moving the workpiece holder into the process chamber, for processing workpieces.
  • 12. The system of claim 1 where the process chamber has cylindrical sidewalls and is pivotable about an axis parallel to the cylindrical sidewalls.
  • 13. The system of claim 1 further comprising combs on the workpiece holder.
  • 14. A system for processing a workpiece, comprising;an outer chamber; an inner chamber rotatably supported within the outer chamber; an inner chamber driver for rotating the inner chamber; a rotor within the inner chamber; and a rotor driver for rotating the rotor.
  • 15. The system of claim 14 further including a fluid delivery system having a fluid delivery line extending into the inner chamber.
  • 16. The system of claim 15 further comprising at least one opening in the inner chamber joined to the fluid delivery line.
  • 17. The system of claim 16, the at least one opening comprises at least one spray nozzle.
  • 18. The system of claim 14 further including an inner door on the inner chamber, and an outer door on the outer chamber.
  • 19. The system of claim 14 further including a drain opening in the inner chamber leading out to the outer chamber.
  • 20. The system of claim 14 further including a removable sidewall panel in the inner chamber.
  • 21. The system of claim 14 the inner chamber and the outer chamber are cylindrical.
  • 22. The system of claim 21 where the rotor is cylindrical and concentric with the inner chamber and the outer chamber.
  • 23. The system of claim 14 further comprising a purge gas system connected into at least one of the outer chamber and the inner chamber.
  • 24. A system of processing a workpiece, comprising:a containment chamber; a process chamber within the containment chamber and having a drain opening; a process chamber driver linked to the process chamber, for pivoting the process chamber, to drain liquid out of the process chamber, at a controlled rate; a workpiece holder within the process chamber; and a workpiece holder driver for rotating the workpiece holder.
  • 25. The system of claim 24 where the workpiece holder driver is linked to the workpiece holder by a magnetic coupling.
  • 26. A system of processing a batch of flat workpieces, comprising:a liquid tight process chamber capable of holding a bath of liquid; a drain opening in the process chamber; a process chamber driver linked to the process chamber, for pivoting the process chamber to a position where the liquid can drain out of the process chamber through the drain opening, at a controlled rate; and a workpiece holder within the process chamber, for holding the batch of flat workpieces in a vertically upright array.
  • 27. The system of claim 26 with the process chamber pivotable about a horizontal axis.
  • 28. The system of claim 26 further including a sonic transducer in the process chamber.
  • 29. The system of claim 26 wherein the process chamber is pivotable from a first position, where the process chamber can hold liquid at a level at least partially immersing the workpiece holder, to a second position where liquid within the process chamber is able to drain out, through the opening, to a lever entirely below the workpieces.
  • 30. The system of claim 26 wherein the drain opening comprises a slot in the process chamber.
  • 31. The system of claim 30 wherein the drain slot extends parallel to an axis of rotation of the process chamber.
  • 32. The system of claim 26 wherein the process chamber is linked to the process chamber driver by a magnetic coupling.
  • 33. The system of claim 26 wherein the drain opening comprises a drain port which is switchable between a closed position, for immersing the workpieces, and an open position, for draining liquid out of the process chamber.
  • 34. A system for rinsing and drying a batch of flat workpieces, comprising:a process chamber having a drain opening; a process chamber driver for pivoting the process chamber, to drain liquid out of the process chamber through the drain opening, at a controlled rate; a workpiece holder within the process chamber, for holding the batch of flat workpieces, a rinsing liquid source connecting into the process chamber; and an organic vapor source connecting into the process chamber.
  • 35. The system of claim 34 wherein the workpiece holder comprises a rotor for spinning the workpieces within the process chamber.
  • 36. The system of claim 34 further including a sonic transducer associated with the process chamber.
  • 37. The system of claim 34 comprising a suction manifold adjacent to the drain opening.
US Referenced Citations (21)
Number Name Date Kind
3858551 Kobayasi Jan 1975 A
3943637 Hanser Mar 1976 A
4318749 Mayer Mar 1982 A
4456022 Roberts Jun 1984 A
4596636 Lucas Jun 1986 A
4813154 Ronning Mar 1989 A
5022419 Thompson et al. Jun 1991 A
5074057 Kanai Dec 1991 A
5095927 Thompson et al. Mar 1992 A
5154199 Thompson et al. Oct 1992 A
5221360 Thompson et al. Jun 1993 A
5230163 Lease Jul 1993 A
5271165 Nguyen Dec 1993 A
5287633 Sachs Feb 1994 A
5513446 Neubauer et al. May 1996 A
5660517 Thompson et al. Aug 1997 A
5664337 Davis et al. Sep 1997 A
5740617 Rittenhouse Apr 1998 A
6076279 Saalasti Jun 2000 A
6125863 Bexten Oct 2000 A
6346126 Chao et al. Feb 2002 B1