The present invention relates in general to electrical devices and, more particularly, to a multi-stage driver circuit and method of distributed driver response shaping using programmable capacitors.
Semiconductor and electrical devices are commonly found in modern electrical products. Electrical devices vary in the number and density of electrical components. Electrical devices perform a wide range of functions, such as signal processing, driving signal propagation, filtering, high-speed calculations, signal amplification, transmitting and receiving electrical signals, and controlling electrical devices. Electrical devices are found in the fields of automotive, communications, power conversion, networks, computers, and consumer products. Electrical devices are also found in military applications, aerospace, aviation, automotive, industrial controllers, and office equipment. A driver circuit is commonly used to transmit an electrical signal between two points or devices. The driver circuit should be properly tuned and calibrated to minimize transmission loss, return-loss, reflections, and other signal degradations, while maximizing bandwidth, transmission rate, and signal integrity.
A block diagram illustrating a conventional lumped driver is shown in
The present invention is described in one or more embodiments in the following description with reference to the figures, in which like numerals represent the same or similar elements. While the invention is described in terms of the best mode for achieving the invention's objectives, it will be appreciated by those skilled in the art that it is intended to cover alternatives, modifications, and equivalents as may be included within the spirit and scope of the invention as defined by the appended claims and their equivalents as supported by the following disclosure and drawings.
An exemplary 4-stage distributed driver architecture 116 is shown in
The distributed driver incorporates input and output inductor-capacitor (LC) transmission lines. The inductive features of transmission line 119 are represented by inductive elements 120. Each inductive element 120 is coupled between two nodes of transmission line 119. For example, inductive element 120a is coupled between node 121 and node 123 of transmission line 119. The capacitive features of transmission line 119 are represented by capacitive elements 130. In particular, all capacitors 130 are selectable or programmable capacitors to shape to the data signal waveform. All programmable capacitors 130 are coupled to a node of transmission line 119 and referenced to power supply conductor 154. For example, programmable capacitor 130a is coupled between node 123 and power supply conductor 154 operating at ground potential. The output of distributed driver architecture 116 is terminals 136 and 138.
The transmission line L and C components are chosen to meet both impedance and delay requirements, thereby minimizing reflections from impedance mismatch, and ensuring in-phase addition of the distributed output stages. The impedance requirement is defined in equation (1) and the delay is defined in equation (2). The L and C product in equation (3) must also be chosen small enough so that the line approximates ideal behavior over the desired bandwidth.
Z=(L/C)½ (1)
Tau=(L*C)½ (2)
Cutoff Frequency=1/(π*(L/C)½) (3)
The driver output impedance of termination resistors (RT) 122 and 124 requirement can be restricted to values such as 25Ω and 50Ω depending on the final application e.g., a DML or EML laser driver. RT 122 and 124 are coupled to power supply conductor 126 operating at a positive voltage. Each segment of the output transmission line must ideally have an impedance (1) that matches that of the output impedance (RT). If this is not the case, then reflections will be evident on the driver response. The reflection can subtract from, or add to, a response of the driver depending on whether the impedance of the segment is above or below the target impedance. The reflection coefficient is defined in equation (4), where ZL is the load impedance and Z is the line segment impedance.
P=(ZL−Z)/(ZL+Z) (4)
In
The driver response is the combination of a normal response (without any reflections) and the reflection component as dictated by the reflection coefficient multiplied by the normal response. The timing of this reflection perturbation is also impacted by the mismatched segment location in the transmission line.
The reflection perturbation can shape the response of the output driver. This offers the advantage of adjusting the driver response and this approach could also be used to filter out undesired reflections that arise from the driver integration on the end application. The application may include the integration of the driver with a channel media (such as PCB traces) and non-ideal loading, such as directly modulated laser diode (DML) or electro-absorption modulated laser (EML) loads. The channel media and the loading may not ideally match the output driver impedance. This would result in reflections that degrade the driver response. The impact of these undesired reflections can be attenuated by employing the programmable distributed driver segment impedance.
The segment impedance can be adjusted through, e.g., selectable or programmable capacitance loading. Each stage capacitor 130 can be selected or programmed individually.
Capacitors 162-168 may each have the same value or may have different values. The values of capacitors 162-168 and the selection of which capacitors to connect to ground through the respective transistor 170-176 determines the effective capacitance of capacitor bank 130. For example, if capacitor 162 is 10.0 picofarads (pf) and capacitor 164 is 10.0 pf, then turning on transistors 170 and 172 would provide 20.0 pf for capacitor bank 130. The selection of values for capacitor bank 130 can be done by observing driver 116 operational dynamics, such as bit error rate, or by observing the waveforms in
Programmable capacitors 130 facilitate a wide range of response shaping. Example differential voltage response shaping over time is shown in
The stage tuning can help or replace existing TX side filtering (such as post-tap de-emphasis or pre-emphasis) and RX side filtering, such as forward feed equalizer (FFE). One benefit of this approach is that the settled TX output voltage value is not impacted by this shaping. This compares well to traditional post-tap de-emphasis where the settled TX output voltage is decreased with de-emphasis enabled. This new approach offers potential power consumption savings.
It should be noted that the segment delay in equation (2) also changes with the load capacitance. Care should be taken that this change should not be so significant to result in response degradation because the input and out transmission line segment delays are grossly mismatched. The corresponding input line segment delay can be adjusted in the same manner as the output line segment so that their delays track. In the design contained in the present invention, the change in the output delay segment was not so significant to cause a noticeable degradation in the output response. The desired response or shape can also be obtained by tuning the load RT.
An unmatched RT would generate reflections that can result in a sharper response for lower RT and a slower response for a larger RT. This does impact the driver output swing so more, or less, current may need to be delivered to the driver stages to compensate for the adjusted driver output voltage.
While one or more embodiments of the present invention have been illustrated in detail, the skilled artisan will appreciate that modifications and adaptations to those embodiments may be made without departing from the scope of the present invention as set forth in the following claims.
The present application claims the benefit of U.S. Provisional Application No. 63/369,543, filed Jul. 27, 2022, which application is incorporated herein by reference.
Number | Date | Country | |
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63369543 | Jul 2022 | US |