Multilayer inductor and production method thereof

Information

  • Patent Grant
  • 6404318
  • Patent Number
    6,404,318
  • Date Filed
    Thursday, August 3, 2000
    23 years ago
  • Date Issued
    Tuesday, June 11, 2002
    22 years ago
Abstract
In the multilayer inductor, the substrate thereof is composed of a constituent belonging to spinel ferrite, and is furnished with internal conductors of a main constituent being silver at the interior of the substrate. The internal conductors are drawn outside of the substrate, and the drawn portions are provided with external electrodes. The internal conductors contain manganese and bismuth, and the manganese and bismuth contents at an interface between the internal conductors and the substrate are more than those of other ranges. MnO2 of 0.02 to 0.1 wt % and Bi2O3 of 0.5 to 1.2 wt % are added to a paste of the main constituent being silver to be used to the internal conductors, and the paste is baked together with spinel ferrite material.
Description




BACKGROUND OF THE INVENTION




The invention relates to a multilayer inductor which has internal conductors of a main constituent being silver at the interior of the substrate thereof composed of a constituent belonging to spinel ferrite for attenuating noise elements, and a production method thereof.




In electronic machines, element mounting densities have kept on overcrowd, and there have been actualized mutual interference between elements or problems concerned with radiation of noises. Noise controlling means of many cases are higher harmonics of used signals, and attentions are paid to controlling of the higher harmonics. As the noise controlling means, there are multilayer inductors called as beads employing ferrite magnetic materials, means which shelters areas of circuit with metal plates to prevent bad influences to other circuit blocks, or means for avoiding spreading of noises to a next step by an LC resonance circuit.




Among them, according to the filter, a noise is not controlled, but the noise element is reflected to a front step and unexpected bad influences such as oscillation are given to the circuit, but since a multilayer inductor of noise absorption type does not cause such matters, it has been broadly used as a measure against noise.




A ceramic magnetic substance enabling to be sintered at around 900° C. and internal conductors composed of silver or its alloy are combined and baked together with the multilayer inductor so as to form coil shaped conductors at the interior of the ceramic sintered body. By shaping the internal conductors in coil, impedance may be made large, and loss of materials can be efficiently avoided, and as a result, the shape of the element can be made small sized.




Ferrite to be used to such purpose is called as spinel ferrite and it is almost composed of NiCuZnFe


2


O


4


based component, and when using spinel ferrite, this kind of ferrite is sensitive to stress and an apparent permeability μ receives influence of stress and is remarkably lowered.




The multilayer inductor is baked together with silver powder for the internal conductors and ferrite powder for the substrate, and united in a one body. Since the silver is larger than the ferrite ceramic in coefficient of linear expansion, stress is, therefore, caused at the interface between silver and ferrite by baking together with, and the apparent μ of the ferrite is considerably lowered. Further, the interface therebetween is breakable, and the stress at the interface is released when heat-treating as soldering, so that problems occur that the apparent permeability μ is changed each time of the heat treatment and the characteristics are unstable.




For solving the problems, in JP-A-4-65807, a space


3


is defined as seen in

FIG. 7

between the internal conductors


2


made of silver and the substrate


1


made of ferrite, thereby easing the stress exerting between the silver internal conductor


2


and the substrate


3


so as to improve the permeability μ. Numeral


4


designates external electrodes connected to both ends of the internal conductors.




However, as the multilayer inductor is based on a premise of the mounting by soldering, it is necessary to perform an electrolytic plating on the external electrodes


4


, and a plating liquid goes into the space


3


between the internal conductor and the substrate. The plating liquid has an etching effect to ferrite and various bad influences to the ferrite substrate.




SUMMARY OF THE INVENTION




In view of the above mentioned problems, it is accordingly an object of the invention to offer multilayer inductors stable in characteristics and a production method thereof, in which a spinel ferrite is a substrate and silver or its alloy is internal conductors, thereby to ease stress between the internal conductors and the substrate.




A multilayer inductor of a first aspect of the invention carries conductors of a main constituent being silver at an interior of a substrate composed of a constituent belonging to spinel ferrite, said internal conductors being drawn outside of the substrate, and the drawn portions are provided with external electrodes, and is characterized in that manganese and bismuth are contained in the internal conductors, and the manganese and bismuth contents at an interface between the internal conductors and the substrate are more than those of other ranges.




In the invention, manganese and bismuth are interposed between the internal conductors and spinel ferrite as the substrate for moderating stress. This fact may be explained as follows. A manganese element is in general included in a ferrite crystal lattice as known in MnZn ferrite. It is known that MnZn ferrite is less effected with stress in comparison with NiCuZn ferrite used in the invention. However, MnZn ferrite is higher in a sintering temperature than a melting point of silver as the internal conductor used in the invention, and it is assumed that a portion is made where the sintering is not partially progressed with only addition of manganese.




On the other hand, bismuth is known to lower the temperature of the sintered. ferrite. In the invention, it is possible to provide such a multilayer inductor where the sintering does not progress with only addition of manganese, but by adding bismuth, a sintering at lower temperature is available, enabling to use silver as the internal conductor. Thus, the closeness of the inductor advances, so that stress at the interface is relieved.




A method of producing the multilayer inductor of a second aspect of the invention, is characterized in that MnO


2


of 0.02 to 0.1 wt % and Bi


2


O


3


of 0.5 to 1.2 wt % are added to a paste of a main constituent being silver to be used to the internal conductors, and the paste is baked together with spinel ferrite material.




In the production method of the invention, if an addition content of MnO


2


is less than 0.02 wt %, impedance before the plating is lowered, and as a result, the changing rate of impedance before and after the plating is large, and the changing rate of a soldering heat resistance test is also large. On the other hand, if being higher than 0.1 wt %, acquisition impedance is considerably lowered. A preferable addition amount of MnO


2


is 0.05 wt % to 0.07 wt %.




On the other hand, if the addition amount of Bi


2


O


3


is less than 0.5 wt %, the impedance before the plating is low and the changing rate of the impedance before and after the plating is large, and the changing rate of the impedance at the soldering heat resistance test is also large. If the addition amount of Bi


2


O


3


is more than 1.2 wt %, the acquisition impedance is also remarkably lower. The more preferable addition amount of Bi


2


O


3


is 0.8 wt % to 1.0 wt %.











BRIEF DESCRIPTION OF THE DRAWINGS





FIG. 1

is a perspective view showing one embodied mode of the multilayer inductor according to the invention, and B is partially cross sectional thereof view;





FIG. 2

is a view showing measured results of element distribution by EPMA at the interface between the internal conductors and the substrate;





FIG. 3

graphs the relationship between the addition amounts of MnO


2


and Bi


2


O


3


and impedance in the multilayer inductor where silver shown in Table 1 was used to the internal conductor;





FIG. 4

graphs the relationship between the addition amounts of MnO


2


and Bi


2


O


3


, change of impedance and change of the whole impedance by plating in the multilayer inductor where silver shown in Table 1 was used to the internal conductor;





FIG. 5

graphs the relationship between the addition amounts of MnO


2


and Bi


2


O


3


and impedance in the multilayer inductor where silver-palladium shown in Table 2 was used to the internal conductor;





FIG. 6

graphs the relationship between the addition amounts of MnO


2


and Bi


2


O


3


, change of impedance and change of the whole impedance by plating in the multilayer inductor where silver-palladium shown in Table 2 was used to the internal conductor; and





FIG. 7

is a cross sectional view showing one example of the prior art multilayer inductor.











DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS





FIG. 1A

is a perspective view showing one embodied mode of the multilayer inductor according to the invention, and

FIG. 1B

is partially cross sectional thereof view. With respect to the laminated ferrite inductor, internal conductors


2


of a main constituent being silver are carried in laminate structure at the interior of the substrate


1


composed of a spinel ferrite, said internal conductors being drawn outside of the substrate


1


, and the drawn portions are provided with external electrodes


4


. The internal conductor


2


is not always formed in coil, but often formed in straight or curve. Otherwise, a plurality of internal conductors are composed as an. array by arranging in the same or complement layer.




In the multilayer inductors of the invention, amounts of MnO


2


and Bi


2


O


3


to be added to the internal conductors were variously changed so as to investigate addition amounts, changes of the impedance before and after the plating and before and after the soldering tests. As to the multilayer inductors to be offered to the tests, the spinel ferrite was prepared as follows. At first, NiO, CuO, ZnO and Fe


2


O


3


were weighed to predetermined composition rates, a pulverization was carried out for 6 hours in a water of a ball mill, passed through a 20 mesh sieve after drying, and subjected to a heat-treatment at 780° C. for 2 hours. The obtained samples were again pulverized for 16 hours, passed through the 20 mesh sieve after drying, and made ceramic powder. When examining impurities in the powder by a fluorescence X-ray, bismuth was not detected and manganese was around 0.002 wt %.




The obtained slurry was cast on a mold releasing film by the doctor blade method so as to obtain a green sheet of 40 μm thickness. The green sheet was formed at predetermined positions with through-holes, and subsequently, coil pattern formation and filling of the conductor paste into the through-holes were performed at the same time by a screen process printing.




Silver powder of an apparent density of 4 g/cm


3


and a specific surface area of 0.5 m


2


/g, MnO


2


and Bi


2


O


3


of the predetermined amounts, and ethylcellulose based binder previously melted in an organic solvent were weighed respectively, and mixed by three-rolls to produce a paste of internal conductors.




Substituting for the silver paste, silver-palladium alloy (Pt 4 wt %) having the same powder characteristics as the silver paste was made a paste as the silver paste. The paste was adjusted to have viscosity of around 100 cps by the viscosity of the organic solvent. A printing pressure was adjusted such that a print coating thickness was 15 μm.




Several sheets of the green sheets were piled, pressed under pressure of around 1 ton/cm


2


, and cut out to be elements one by one. The cut elements were baked 200° C. for 2 hours, and united in one body. The elements were


11


layers, and the space per one layer was around 34 μm, and the thickness of the internal conductors was around 10 μm.




At this stage, the baked samples were buried in the resin by


10


pieces, followed by grinding after solidification, observed at the ground phases by a microscope so as to examine peelings at the interface between the internal conductor


2


and the substrate


1


. The invention did not provide spaces at the interface as shown in JP-A-4-65807, and no peeling at the interface was observed in all the samples.




After cutting into chips, each of the chips was subjected to a barrel grinding, the external electrodes


4


were coated and baked, thereafter performed with the electroplating, and the impedance (100 MHz) before and after the electroplating was measured. Further, the samples were immersed in the soldering layer at 260° C. for 100 seconds for measuring changes of the impedance.





FIG. 2

shows the measured results of the element distribution by EPMA at the interface between the internal conductor


2


and the substrate


1


when adding MnO


2


0.05 wt % and Bi


2


O


3


0.8 wt %. From

FIG. 2

, it is seen that manganese and bismuth are concentrated at the interface, and since sulfur is scarcely traced, the plating liquid containing sulfur was scarcely invaded in the space between the internal conductor and the substrate.




Table 1 shows values of impedance when using silver for the internal conductors


2


, before and after the plating at different amounts of MnO


2


and Bi


2


O


3


, and after the soldering tests. Table 2 shows values of impedance when using silver-palladium alloy substituting for silver, before and after the plating at different amounts of MnO


2


and Bi


2


O


3


, and after the soldering tests. Each impedance is an average value when using 10 pieces of the internal conductors as to each of addition amounts.












TABLE 1









Relationship between MnO


2


and Bi


2


O


3


additive amounts and impedance






in internal conductor made of silver









































MnO


2


(wt %)




0




0.02




0.05




0.1




0.12




0.01




0.02




0.05




0.07




0.10




0.12




0.01




0.02




0.05




0.07




0.10




0.12




0.01






Bi


2


O


3


(wt %)




0




0.3 




0.3 




0.3




0.3 




0.5 




0.5 




0.5 




0.5 




0.5 




0.5 




0.8 




0.8 




0.8 




0.8 




0.8 




0.8 




1.0 









Before




355




489




488




476




490




398




602




605




610




601




485




490




590




622




635




630




480




500






plating (Ω)






After




505




510




515




501




520




530




611




607




612




611




613




510




611




623




635




635




617




578






plating (Ω)






After




574




582




594




561




620




592




622




620




631




622




626




594




621




625




634




642




648




603






soldering






test (Ω)




























MnO


2


(wt %)




0.02




0.05




0.07




0.10




0.12




0.01




0.05




0.10




0.12




0.02




0.05




0.12







Bi


2


O


3


(wt %)




1.0 




1.0 




1.0 




1.0 




1.0 




1.2 




1.2 




1.2 




1.2 




1.5 




1.6 




1.5 











Before




590




615




610




603




480




505




580




690




477




434




510




310







plating (Ω)







After




611




616




610




620




597




579




597




613




622




548




601




423







plating (Ω)







After




622




618




611




625




631




615




602




615




635




611




625




441







soldering







test (Ω)























TABLE 2









Relationship between MnO


2


and Bi


2


O


3


additive amounts and impedance






in internal conductor made of silver palladium









































MnO


2


(wt %)




0




0.02




0.05




0.1




0.12




0.01




0.02




0.05




0.07




0.10




0.12




0.01




0.02




0.05




0.07




0.10




0.12




0.01






Bi


2


O


3


(wt %)




0




0.3 




0.3 




0.3




0.3 




0.5 




0.5 




0.5 




0.5 




0.5 




0.5 




0.8 




0.8 




0.8 




0.8 




0.8 




0.8 




1.0 









Before




333




411




490




475




504




418




600




602




605




602




454




471




590




620




618




606




467




489






plating (Ω)






After




514




498




519




513




552




520




609




608




612




610




604




513




507




623




620




612




607




580






plating (Ω)






After




598




567




577




555




611




594




620




622




630




618




626




591




620




623




620




631




630




599






soldering






test (Ω)




























MnO


2


(wt %)




0.02




0.05




0.07




0.10




0.12




0.01




0.05




0.10




0.12




0.02




0.05




0.12







Bi


2


O


3


(wt %)




1.0 




1.0 




1.0 




1.0 




1.0 




1.2 




1.2 




1.2 




1.2 




1.5 




1.5 




1.5 











Before




594




616




618




605




487




500




585




587




455




422




510




380







plating (Ω)







After




621




616




617




610




597




572




599




612




600




533




600




493







plating (Ω)







After




628




617




617




622




630




610




607




617




632




610




621




516







solderinq







test (Ω)
















FIG. 3

graphs the relationship between the addition amounts of MnO


2


and Bi


2


O


3


and impedance in the multilayer inductor where silver shown in Table 1 was used for the internal conductor.

FIG. 4

graphs the relationship between the addition amounts of MnO


2


and Bi


2


O


3


, change of impedance and change of the whole impedance by plating in the multilayer inductor where silver shown in Table 1 was used for the internal conductor.




As is seen from

FIG. 3

, by adding MnO


2


0.02 to 0.1 wt % and Bi


2


O


3


0.5 to 1.2 wt %, and baking the paste and the spinel ferrite material at the same time, impedance of around 580 Ω or more can be obtained. In this range, the changing amount of impedance by plating and soldering can be controlled to be 50 Ω or lower.





FIG. 5

graphs the relationship between the addition amounts of MnO


2


and Bi


2


O


3


and impedance in the multilayer inductor where silver-palladium shown in Table 2 was used for the internal conductor.

FIG. 6

graphs the relationship between the addition amounts of MnO


2


and Bi


2


O


3


, change of impedance and change of the whole impedance by plating in the multilayer inductor where silver-palladium shown in Table 2 was used for the internal conductor.




As is seen from

FIGS. 5 and 6

, also in the case where silver-palladium was used for the internal conductor


2


, by adding MnO


2


0.02 to 0.1 wt % and Bi


2


O


3


0.5 to 1.2 wt %, and baking the paste and the spinel ferrite material at the same time, impedance of around 580 Ω or more can be obtained. In this range, the changing amount of impedance by plating and soldering can be controlled to be 50 Ω or lower.




When evaluating values of the impedance, an influence of stress exerted at the interface between the internal conductor


2


and the substrate


1


(ferrite) is reflected to the values of impedance before the plating. If the stress at the interface is eased, the value of impedance is large.




When the stress at the interface is eased, the value of impedance is large. If the plating liquid invades into the space along the interface between the internal conductor


2


and the substrate


1


, the interface is affected with etching, and moderation of the stress at the interface is progressed. However, in this case, the plating liquid remains on the interface, undesirably taking reliability for a long period of time into consideration. Further, if the interface is unstable and when the laminated chips are immersed in the soldering chamber, the stress is more moderated. If a degree of this moderation is large, it is not desirable in the reliability for a long period of time. If the stress has already been moderated immediately after baking, the value of impedance must not be changed even if passing through the plating treatment or immersing into the soldering chamber, and this is preferable. In fact, in the examples, the values of impedance before the plating are high and hardly changed by passing through the plating treatment or immersing into the soldering chamber. From these situations, it is suggested that if bismuth and manganese exist at the interface between the internal conductor and the substrate, the stress therebetween is moderated, so that it is possible to offer the multilayer inductors having the stable characteristics for long period of time without affecting of invasion of the plating liquid.




According to the invention, in the multilayer inductor composed of the internal conductors of main components being the spinel ferrite and silver, there are formed parts of much contents of manganese and bismuth at the interface between the internal conductors and the substrate, whereby the stress exerted at the interface is eased, and the inductor of excellent characteristics is available, so that it is possible to offer the multilayer inductors having the stable characteristics for long period of time without affecting of invasion of the plating liquid so that the characteristic is prevented from deterioration by the invasion of the plating liquid.



Claims
  • 1. A multilayer inductor comprising:a substrate composed of a constituent belonging to spinel ferrite; internal conductors of a main constituent being silver at the interior of the substrate, said internal conductors being drawn outside of the substrate; and external electrodes provided at the drawn portions of said internal conductors; wherein the internal conductors contain manganese and an bismuth, and the manganese and bismuth contents at an interface between the internal conductors and the substrate are more than those of other ranges.
Priority Claims (1)
Number Date Country Kind
11-224640 Aug 1999 JP
US Referenced Citations (3)
Number Name Date Kind
4808274 Nguyen Feb 1989 A
5515022 Iashiro et al. May 1996 A
6160465 Yamaguchi et al. Dec 2000 A
Foreign Referenced Citations (4)
Number Date Country
4-065807 Mar 1992 JP
4-336405 Nov 1992 JP
5-198439 Aug 1993 JP
5-205944 Aug 1993 JP