The present disclosure relates to semiconductor devices and more particularly to multiple junction light-emitting diode (LED) chips and related methods.
Solid-state lighting devices such as light-emitting diodes (LEDs) are increasingly used in both consumer and commercial applications. Advancements in LED technology have resulted in highly efficient and mechanically robust light sources with a long service life. Accordingly, modern LEDs have been widely adopted in various illumination contexts, for backlighting of liquid crystal display (LCD) systems (e.g., as a substitute for cold cathode fluorescent lamps), and for direct-view LED displays. Applications utilizing LED arrays further include vehicular headlamps, roadway illumination, light fixtures, and various indoor, outdoor, and specialty contexts. Desirable characteristics of LED devices include high luminous efficacy, long lifetime, and color gamut.
LEDs convert electrical energy to light and generally include one or more active layers of semiconductor material (or an active region) arranged between oppositely doped n-type and p-type layers. When a bias is applied across the doped layers, holes and electrons are injected into the one or more active layers where they recombine to generate emissions such as visible light or ultraviolet emissions. Multiple color LED packages have been developed that include LED chips with different emission colors arranged within a same package structure. In certain applications, the LED chips can be arranged in close proximity to one another on a common submount, which can add complexity for corresponding electrical connections. As LED applications continue to advance, challenges exist in producing high quality light with desired emission characteristics while also providing high light emission efficiency.
The art continues to seek improved LEDs and solid-state lighting devices having desirable illumination characteristics capable of overcoming challenges associated with conventional lighting devices.
The present disclosure relates to semiconductor devices and more particularly to multiple junction light-emitting diode (LED) chips and related methods. LED chips include multiple active LED structures that are bonded together. The active LED structures may be vertically bonded within the LED chip. Bonding layers are provided between active LED structures with sufficient thicknesses to maintain mechanical integrity within the LED chip. Bonding layers may be formed of electrically insulating materials with electrically conductive vias formed therethrough to provide electrically conductive paths between active LED structures. Active LED structures may be connected in series for high voltage applications. Emissions from the active LED structures may have same emission colors, multiple distinct emission colors, and/or variations in peak wavelengths within a same color range.
In one aspect, an LED chip comprises: a first active LED structure comprising a first n-type layer, a first active layer, and a first p-type layer; a second active LED structure comprising a second n-type layer, a second active layer, and a second p-type layer; and a bonding layer between the first n-type layer and the second p-type layer, the bonding layer comprising a thickness of at least 100 nanometers (nm). In certain embodiments, the bonding layer comprises a thickness in a range from 100 nm to 5000 nm. In certain embodiments, the bonding layer comprises an electrically insulating material and at least one electrically conductive via, the at least one electrically conductive via forming an electrically conductive path between the first n-type layer and the second p-type layer. In certain embodiments, the at least one electrically conductive via comprises: a first sublayer with a first metal that contacts the first n-type layer; and a second sublayer with a second metal that contacts the second p-type layer, wherein the second metal is different than the first metal. In certain embodiments, the at least one electrically conductive via further comprises a third sublayer between the first sublayer and the second sublayer, and the third sublayer comprises a third metal that is different from both the first metal and the second metal. In certain embodiments, the bonding layer comprises a conductive oxide. The LED chip may further comprise an n-contact pad and a p-contact pad that are both on a same side of the first active LED structure. The LED chip may further comprise an n-contact pad and a p-contact pad, wherein the first active LED structure and the second active LED structure are between the n-contact pad and the p-contact pad. In certain embodiments, the first active LED structure and the second active LED structure are configured to provide peak wavelengths that differ in a range from 5 nanometers (nm) to 20 nm from one another. In certain embodiments, the first active LED structure and the second active LED structure are configured to provide peak wavelengths that differ in a range from 25 nm to 300 nm from one another.
In another aspect, an LED chip comprises: a first active LED structure comprising a first n-type layer, a first active layer, and a first p-type layer; a second active LED structure comprising a second n-type layer, a second active layer, and a second p-type layer; and a first bonding layer between the first n-type layer and the second p-type layer, the first bonding layer comprising at least one electrically conductive via between the first n-type layer and the second p-type layer. In certain embodiments, the at least one electrically conductive via comprises: a first sublayer with a first metal that contacts the first n-type layer; and a second sublayer with a second metal that contacts the second p-type layer, wherein the second metal is different than the first metal. In certain embodiments, the at least one electrically conductive via further comprises a third sublayer between the first sublayer and the second sublayer, and the third sublayer comprises a third metal that is different from both the first metal and the second metal. The LED chip may further comprise: a third active LED structure on the first active LED structure, the third active LED structure comprising a third n-type layer, a third active layer, and a third p-type layer; and a second bonding layer between the third n-type layer and the first p-type layer. In certain embodiments, the second bonding layer comprises another electrically conductive via between the third n-type layer and the first p-type layer.
In another aspect, a method comprises: providing a first active light-emitting diode (LED) structure comprising a first n-type layer, a first active layer, and a first p-type layer; providing a second active LED structure comprising a second n-type layer, a second active layer, and a second p-type layer; and bonding the first active LED structure to the second active LED structure with a bonding layer between the first n-type layer and the second p-type layer, the bonding layer comprising a thickness of at least 100 nanometers (nm). The method may further comprise at least one electrically conductive via in the bonding layer that forms an electrically conductive path between the first n-type layer and the second p-type layer. In certain embodiments, the first active LED structure is formed on a first growth substrate and the second active LED structure is formed on a second growth substrate. The method may further comprise removing the first growth substrate from the first active LED structure before bonding the first active LED structure to the second active LED structure. The method may further comprise bonding a third active LED structure to the first active LED structure.
In another aspect, any of the foregoing aspects individually or together, and/or various separate aspects and features as described herein, may be combined for additional advantage. Any of the various features and elements as disclosed herein may be combined with one or more other disclosed features and elements unless indicated to the contrary herein.
Those skilled in the art will appreciate the scope of the present disclosure and realize additional aspects thereof after reading the following detailed description of the preferred embodiments in association with the accompanying drawing figures.
The accompanying drawing figures incorporated in and forming a part of this specification illustrate several aspects of the disclosure, and together with the description serve to explain the principles of the disclosure.
The embodiments set forth below represent the necessary information to enable those skilled in the art to practice the embodiments and illustrate the best mode of practicing the embodiments. Upon reading the following description in light of the accompanying drawing figures, those skilled in the art will understand the concepts of the disclosure and will recognize applications of these concepts not particularly addressed herein. It should be understood that these concepts and applications fall within the scope of the disclosure and the accompanying claims.
It will be understood that, although the terms first, second, etc. may be used herein to describe various elements, these elements should not be limited by these terms. These terms are only used to distinguish one element from another. For example, a first element could be termed a second element, and, similarly, a second element could be termed a first element, without departing from the scope of the present disclosure. As used herein, the term “and/or” includes any and all combinations of one or more of the associated listed items.
It will be understood that when an element such as a layer, region, or substrate is referred to as being “on” or extending “onto” another element, it can be directly on or extend directly onto the other element or intervening elements may also be present. In contrast, when an element is referred to as being “directly on” or extending “directly onto” another element, there are no intervening elements present. Likewise, it will be understood that when an element such as a layer, region, or substrate is referred to as being “over” or extending “over” another element, it can be directly over or extend directly over the other element or intervening elements may also be present. In contrast, when an element is referred to as being “directly over” or extending “directly over” another element, there are no intervening elements present. It will also be understood that when an element is referred to as being “connected” or “coupled” to another element, it can be directly connected or coupled to the other element or intervening elements may be present. In contrast, when an element is referred to as being “directly connected” or “directly coupled” to another element, there are no intervening elements present.
Relative terms such as “below” or “above” or “upper” or “lower” or “horizontal” or “vertical” may be used herein to describe a relationship of one element, layer, or region to another element, layer, or region as illustrated in the Figures. It will be understood that these terms and those discussed above are intended to encompass different orientations of the device in addition to the orientation depicted in the Figures.
The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the disclosure. As used herein, the singular forms “a,” “an,” and “the” are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms “comprises,” “comprising,” “includes,” and/or “including” when used herein specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure belongs. It will be further understood that terms used herein should be interpreted as having a meaning that is consistent with their meaning in the context of this specification and the relevant art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein.
Embodiments are described herein with reference to schematic illustrations of embodiments of the disclosure. As such, the actual dimensions of the layers and elements can be different, and variations from the shapes of the illustrations as a result, for example, of manufacturing techniques and/or tolerances, are expected. For example, a region illustrated or described as square or rectangular can have rounded or curved features, and regions shown as straight lines may have some irregularity. Thus, the regions illustrated in the figures are schematic and their shapes are not intended to illustrate the precise shape of a region of a device and are not intended to limit the scope of the disclosure. Additionally, sizes of structures or regions may be exaggerated relative to other structures or regions for illustrative purposes and, thus, are provided to illustrate the general structures of the present subject matter and may or may not be drawn to scale. Common elements between figures may be shown herein with common element numbers and may not be subsequently re-described.
The present disclosure relates to semiconductor devices and more particularly to multiple junction light-emitting diode (LED) chips and related methods. LED chips include multiple active LED structures that are bonded together. The active LED structures may be vertically bonded within the LED chip. Bonding layers are provided between active LED structures with sufficient thicknesses to maintain mechanical integrity within the LED chip. Bonding layers may be formed of electrically insulating materials with electrically conductive vias formed therethrough to provide electrically conductive paths between active LED structures. Active LED structures may be connected in series for high voltage applications. Emissions from the active LED structures may have same emission colors, multiple distinct emission colors, and/or variations in peak wavelengths within a same color range.
Before delving into specific details of various aspects of the present disclosure, an overview of various elements that may be included in exemplary LED packages of the present disclosure is provided for context. An LED chip typically comprises an active LED structure or region that can have many different semiconductor layers arranged in different ways. The fabrication and operation of LEDs and their active structures are generally known in the art and are only briefly discussed herein. The layers of the active LED structure can be fabricated using known processes with a suitable process being fabrication using metal organic chemical vapor deposition. The layers of the active LED structure can comprise many different layers and generally comprise an active layer sandwiched between n-type and p-type oppositely doped epitaxial layers, all of which are formed successively on a growth substrate. It is understood that additional layers and elements can also be included in the active LED structure, including, but not limited to, buffer layers, nucleation layers, super lattice structures, undoped layers, cladding layers, contact layers, and current-spreading layers and light extraction layers and elements. The active layer can comprise a single quantum well, a multiple quantum well, a double heterostructure, or super lattice structures.
The active LED structure can be fabricated from different material systems, with some material systems being Group III nitride-based material systems. Group Ill nitrides refer to those semiconductor compounds formed between nitrogen (N) and the elements in Group Ill of the periodic table, usually aluminum (Al), gallium (Ga), and indium (In). Gallium nitride (GaN) is a common binary compound. Group III nitrides also refer to ternary and quaternary compounds such as aluminum gallium nitride (AlGaN), indium gallium nitride (InGaN), and aluminum indium gallium nitride (AlInGaN). For Group III nitrides, silicon (Si) is a common n-type dopant and magnesium (Mg) is a common p-type dopant. Accordingly, the active layer, n-type layer, and p-type layer may include one or more layers of GaN, AlGaN, InGaN, and AlInGaN that are either undoped or doped with Si or Mg for a material system based on Group III nitrides. Other material systems include organic semiconductor materials and other Group III-V systems such as gallium phosphide (GaP), gallium arsenide (GaAs), and related compounds. The active LED structure may be grown on a growth substrate that can include many materials, such as sapphire, silicon carbide (SIC), aluminum nitride (AlN), and GaN.
Different embodiments of the active LED structure can emit different wavelengths of light depending on the composition of the active layer and n-type and p-type layers. In some embodiments, the active LED structure emits blue light with a peak wavelength range in a range of 430 nanometers (nm) to 480 nm. In other embodiments, the active LED structure emits green light with a peak wavelength in a range of 500 nm to 570 nm. In other embodiments, the active LED structure emits orange and/or red light with a peak wavelength range of 600 nm to 700 nm. In still further embodiments, the active LED structure may emit cyan light with a peak wavelength in a range of 485 nm to 500 nm or violet light with a peak wavelength in a range from 400 nm to 420 nm. In certain embodiments, the active LED structure may be configured to emit light that is outside the visible spectrum, including one or more portions of the ultraviolet (UV) spectrum, the infrared (IR) or near-IR spectrum. The UV spectrum is typically divided into three wavelength range categories denotated with letters A, B, and C. In this manner, UV-A light is typically defined as a peak wavelength range from 315 nm to 400 nm, UV-B is typically defined as a peak wavelength range from 280 nm to 315 nm, and UV-C is typically defined as a peak wavelength range from 100 nm to 280 nm. UV LEDs are of particular interest for use in applications related to the disinfection of microorganisms in air, water, and surfaces, among others. In other applications, UV LEDs may also be provided with one or more lumiphoric materials to provide LED packages with aggregated emissions having a broad spectrum and improved color quality for visible light applications. Near-IR and/or IR wavelengths for LED structures of the present disclosure may have wavelengths above 700 nm, such as in a range from 700 nm to 1000 nm, or more.
As used herein, a layer or region of a light-emitting device may be considered to be “transparent” when at least 80% of emitted radiation that impinges on the layer or region emerges through the layer or region. Moreover, as used herein, a layer or region of an LED is considered to be “reflective” or embody a “mirror” or a “reflector” when at least 80% of the emitted radiation that impinges on the layer or region is reflected. In some embodiments, the emitted radiation comprises visible light such as blue and/or green LEDs with or without lumiphoric materials. In other embodiments, the emitted radiation may comprise nonvisible light. For example, in the context of GaN-based blue and/or green LEDs, silver (Ag) may be considered a reflective material (e.g., at least 80% reflective). In the case of UV LEDs, appropriate materials may be selected to provide a desired, and in some embodiments high, reflectivity and/or a desired, and in some embodiments low, absorption. In certain embodiments, a “light-transmissive”material may be configured to transmit at least 50% of emitted radiation of a desired wavelength.
In LED display applications, LED chips are typically individually addressable to provide color-changing, dynamic spectral tuning, and the like. When LED chips having different emission wavelengths are arranged in close proximity to one another, practical limitations exist for packaging the LED chips, providing electrical connections, and/or thermal management. Conventional devices for such applications may include separately packaged LED components that are clustered together, where each separately packaged LED component may include a single LED chip or a grouping of different LED chips. However, each separately packaged LED component typically includes its own submount and encapsulant, thereby providing spatial limitations in how close the separately packaged LED components may be arranged together.
According to aspects of the present disclosure, LED chips include multiple active LED structures that are bonded together. Each of the active LED structures within an exemplary LED chip form light-emitting junctions that collectively provide aggregate emissions from the LED chip when electrically activated. The active LED structures may be vertically stacked and bonded together during chip fabrication by way of one or more bonding layers. The bonding layer may have a thickness sufficient to maintain mechanical integrity within the LED chip. In certain embodiments, the bonding layer is formed of an electrically insulating material, and electrically conductive paths may be formed through the bonding layer between the active LED structures. In other embodiments, the bonding layer may embody a conductive oxide. According to principles of the present disclosure, multiple junction LED chips may be stacked on top of one another to occupy a same footprint within an LED component and/or an LED display as a single junction LED chip while advantageously providing additional light output. The additional light output may include multiple distinct emission wavelengths, such as red, green, and blue emissions, and/or the additional light output may include increased brightness from the same footprint. In other embodiments, the multiple active LED structures may emit a same or similar wavelength and the multiple junction structure provides increased brightness for a same footprint.
The bonding layer 20 may embody one or more electrically insulating materials with a thickness sufficient to maintain mechanical integrity after bonding the active LED structures 12-1, 12-2 together. In certain embodiments, a thickness of the bonding layer 20 is at least 100 nm, or in a range from 100 nm to 5000 nm, or in a range from 250 nm to 750 nm. Depending on the structure, thickness values below about 100 nm may provide insufficient bonding strength. Additionally, thicknesses below about 10 nm or below about 5 nm may promote formation of tunnel junction structures, which may be ineffective at conducting sufficient current flow for the LED chip 10. As such, the principles of the present disclosure provide thick bonding layers for maintaining mechanical integrity while also avoiding tunnel junction structures.
In certain embodiments, the bonding layer 20 may embody a transparent conductive oxide, such as indium tin oxide (ITO), zinc oxide (ZnO), molybdenum oxide (MoO3), and/or tantalum oxide (TaO), among others. In other embodiments, the bonding layer 20 comprises an electrically insulating material, such as silicon dioxide (SiO2) and/or silicon nitride (SiN), among others. When the bonding layer 20 is electrically insulating, electrically conductive vias 24, such as metal vias, may extend through the bonding layer 20 to electrically couple a first n-type layer 16-1 to a second p-type layer 18-2. The electrically conducive vias 24 may have thicknesses that are the same as the bonding layer 20. Diameters of the electrically conductive vias 24, as measured laterally, may be in a range from 500 nm up to about 30 microns (μm). In certain embodiments, the bonding layer 20 is light-transmissive and/or light-transparent to light emitted by the active LED structures 12-1, 12-2, thereby allowing light to freely pass therethrough. By electrically coupling the first n-type layer 16-1 to the second p-type layer 18-2, the active LED structures 12-1, 12-2 may be electrically coupled in series to provide higher voltage operation for the LED chip.
As described above, the LED chip 10 of
Electrical connections between the n-contact 36 and one or more of the n-type layers 16-1, 16-2 may be provided by one or more n-type interconnects 42. The n-type interconnects 42 form electrically conductive paths between the n-contact 36 and at least one of the n-type layers 16-1, 16-2. In
In the context of GaN-based materials for the first n-type layer 16-1 and the second p-type layer 18-2, the first sublayer 24-1 may comprise one or more of chromium (Cr), molybdenum (Mo), Al, titanium (Ti), and ruthenium (Ru) for providing ohmic behavior with the first n-type layer 16-1. The second sublayer 24-2 may comprise one or more of nickel (Ni), Ag, cadmium (Cd), In, and zinc (Zn) for providing ohmic behavior with the second p-type layer 18-2. The third sublayer 24-3 may have a larger thickness than the other sublayers 24-1, 24-2 and may therefore occupy a majority of the electrically conductive via 24 and facilitate electrical conduction therethrough. The third sublayer 24-3 may comprise a different metal than both the first and second sublayers 24-1, 24-2, such as gold tin (AuSn) or tin silver copper alloys, among others. In this manner, the first and second metals may diffuse into portions of the third sublayer 24-3 from opposite sides of the electrically conductive via 24.
It is contemplated that any of the foregoing aspects, and/or various separate aspects and features as described herein, may be combined for additional advantage. Any of the various embodiments as disclosed herein may be combined with one or more other disclosed embodiments unless indicated to the contrary herein.
Those skilled in the art will recognize improvements and modifications to the preferred embodiments of the present disclosure. All such improvements and modifications are considered within the scope of the concepts disclosed herein and the claims that follow.